Graphical user interface for chip mass production burn-in test of electronic devices

Abstract

1. Name of the product in this design: Graphical User Interface for Chip Mass Production Aging Test in Electronic Devices. 2. Intended use of this design: for use in electronic devices. 3. The key design features of this product are: the interface content of the graphical user interface for chip mass production aging test. 4. The picture or photo that best illustrates the key design points: Design 1 front view. 5. The product carrier is a conventional design, and the rear view, left view, right view, top view, and bottom view of each design are omitted. 6. Design 1 is designated as the basic design. 7. Purpose of the graphical user interface: Used for displaying chip aging status and results, and providing aging process testing. 8. Human-computer interaction method of graphical user interface: Design 1 main view initial running interface, click Refreshbib in the toolbar of Design 1 main view to identify the resource card information of the inserted device, enter Design 1 change state diagram 1, displaying the relevant information of the resource card; click Setup in the toolbar of Design 1 change state diagram 1 to enter Design 1 change state diagram 2 to start aging test settings; click Pretest in the toolbar of Design 1 change state diagram 2 to enter Design 1 change state diagram 3 to execute the pre-test; click Test in the toolbar of Design 1 change state diagram 3 to enter Design 1 change state diagram 4 to execute the aging test, and execute the automatic door opening process after the aging test is completed. In the initial running interface of the main view of Design 2, clicking Refreshbib in the toolbar of the main view of Design 2 identifies the resource card information inserted by the device and enters the Design 2 Change State Figure 1, which displays the relevant information of the resource card; clicking Setup in the toolbar of the Design 2 Change State Figure 1 enters the Design 2 Change State Figure 2 to start the aging test settings; clicking Pretest in the toolbar of the Design 2 Change State Figure 2 enters the Design 2 Change State Figure 3 to execute the pretest; clicking the Current Monitor property page in the middle of the Design 2 Change State Figure 3 enters the Design 2 Change State Figure 4 to display the current. In the initial running interface of the main view of Design 3, clicking Refreshbib in the toolbar of the main view of Design 3 identifies the resource card information inserted by the device and enters the Design 3 change state diagram 1, which displays the relevant information of the resource card; clicking Setup in the toolbar of the Design 3 change state diagram 1 enters the Design 3 change state diagram 2 to start the aging test settings; clicking Pretest in the toolbar of the Design 3 change state diagram 2 enters the Design 3 change state diagram 3 to execute the pretest; clicking the Voltage Monitor property page in the middle of the Design 3 change state diagram 3 enters the Design 3 change state diagram 4 to display the voltage.

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