Semiconductor device and electronic apparatus equipped with semiconductor device
The semiconductor device addresses temperature-related malfunctions by detecting and compensating for temperature variations through a control circuit, ensuring reliable operation and cost-effective integration.
Patent Information
- Application Number
- JP2024041014
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-03-15
- Publication Date
- 2025-09-29
AI Technical Summary
Semiconductor devices face malfunctions and damage due to changes in internal temperature, such as abnormal heat generation, and there is a need for effective utilization of temperature information to mitigate these issues.
The semiconductor device incorporates a control circuit that detects temperature by comparing a compensation voltage with a reference voltage, adjusts the reference voltage through variable resistors, and outputs temperature information externally, thereby compensating for temperature variations and process deviations.
This solution allows for accurate temperature detection within the semiconductor device without additional components, preventing malfunctions and damage, and enables cost-effective integration into existing systems by providing temperature information for proactive control.