Semiconductor device and electronic apparatus equipped with semiconductor device

The semiconductor device addresses temperature-related malfunctions by detecting and compensating for temperature variations through a control circuit, ensuring reliable operation and cost-effective integration.

JP2025141192APending Publication Date: 2025-09-29ROHM CO LTD
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Patent Information

Application Number
JP2024041014
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-03-15
Publication Date
2025-09-29

AI Technical Summary

Technical Problem

Semiconductor devices face malfunctions and damage due to changes in internal temperature, such as abnormal heat generation, and there is a need for effective utilization of temperature information to mitigate these issues.

Method used

The semiconductor device incorporates a control circuit that detects temperature by comparing a compensation voltage with a reference voltage, adjusts the reference voltage through variable resistors, and outputs temperature information externally, thereby compensating for temperature variations and process deviations.

Benefits of technology

This solution allows for accurate temperature detection within the semiconductor device without additional components, preventing malfunctions and damage, and enables cost-effective integration into existing systems by providing temperature information for proactive control.

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Abstract

To solve the problem of a semiconductor device that there is room of examination regarding utilization of temperature information.SOLUTION: A semiconductor device (100) comprises: a semiconductor element (D1) constituted to output a compensation voltage (V1); a constant current circuit (9) constituted to output a constant current (Iref) so as to compensate for temperature dependency in accordance with comparison of the compensation voltage (V1) with a reference voltage (Vref); an oscillation circuit (8) constituted to output an oscillation signal (PCLK) in accordance with the constant current (Iref); a reference voltage generation circuit (13) constituted to output a reference voltage (V4); and a signal generation circuit (CP1) constituted to output a temperature information signal (S1) corresponding to the compensation voltage (V1) and the reference voltage (V4).SELECTED DRAWING: Figure 2
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