Process control system

JP7874673B2Active Publication Date: 2026-06-16CLEANSOLUTION CO LTD

Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Patents
Current Assignee / Owner
CLEANSOLUTION CO LTD
Filing Date
2024-02-29
Publication Date
2026-06-16

AI Technical Summary

Benefits of technology

【0009】 本発明の一実施例によると、炭素鋼製品の長さ方向に定義される各領域がエッチング溶液と接触する間、最適の制御データに基づいてエッチング工程を制御することで、エッチング工程の生産性及び効率性を改善することができる工程制御システム及びその動作方法を提供することができる。

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Abstract

To provide a process control system for improving efficiency and productivity of an etching process, and an operating method thereof.SOLUTION: There is provided a process control system comprising: a first system for generating thickness information about an internal defect layer included in a carbon steel product; and a second system which receives the thickness information about the internal defect layer from the first system through a network, and which controls an etching process for removing at least a part of the internal defect layer from the carbon steel product by using the thickness information about the internal defect layer, wherein the first system provides the second system with a calculation module necessary for the second system to control the etching process, and the second system provides the first system with the information necessary for the first system to update the calculation module.SELECTED DRAWING: Figure 3
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Claims

1. A process control system, A storage device for storing control data necessary for controlling an etching apparatus that removes at least a portion of the internal defect layer contained in carbon steel products, A processor that controls the etching apparatus based on the control data. Includes, The carbon steel product includes a first region and a second region different from the first region, wherein the thickness of the internal defect layer included in the first region and the thickness of the internal defect layer included in the second region are different from each other. The control data includes the thickness of the internal defect layer, a first transfer speed at which the first region passes through the etching apparatus, and a second transfer speed at which the second region passes through the etching apparatus, wherein the first transfer speed and the second transfer speed are different from each other. The thickness of the internal defect layer is calculated using at least one of the following: the composition of the carbon steel product, the phase fraction of the carbon steel product, and the temperature of the carbon steel product. A process control system in which the thickness of the internal defect layer included in the first region is smaller than the thickness of the internal defect layer included in the second region, and the first transfer speed is faster than the second transfer speed.

2. The process control system according to claim 1, wherein the storage stores the arithmetic module that generates the control data.

3. It further includes a communication unit connected to a network, The process control system according to claim 1 or 2, wherein the processor receives the arithmetic module that generates the control data via the communication unit and stores it in the storage.

4. It further includes a communication unit connected to a network, The process control system according to claim 1 or 3, wherein the processor receives information related to the thickness of the internal defect layer via the communication unit, and inputs the information related to the thickness of the internal defect layer to a calculation module that generates the control data to obtain the control data.

5. It further includes a communication unit connected to a network, The process control system according to claim 1 or 4, wherein the processor receives information about the carbon steel product via the communication unit, inputs the information about the carbon steel product to a calculation module that generates the control data, and obtains the control data.

6. The process control system according to claim 5, wherein the information on the carbon steel product includes at least one of phase fraction-related information of the carbon steel product, temperature-related information of the carbon steel product, and component-related information of the carbon steel product.

7. It further includes a communication unit connected to a network, The process control system according to claim 1 or 6, wherein the processor receives the control data via the communication unit and stores it in the storage.

8. The process control system according to claim 1 or 7, wherein the control data further includes at least one of the concentration of the etching solution that comes into contact with the carbon steel product in the etching apparatus, the temperature of the etching solution, the components of the etching solution, and whether or not an accelerator is used.

9. The process control system according to claim 1 or 8, wherein the etching apparatus is at least one of a pickling apparatus, a dry etching apparatus, and a wet etching apparatus.

10. The processor receives the transfer speed of the carbon steel product, the characteristics of the etching solution used in the etching process, and the first thickness of the internal defect layer removed by the etching apparatus. The storage includes a calculation module that calculates the second thickness of the internal defect layer expected to be removed by the etching apparatus using at least one of the transfer speed of the carbon steel product and the properties of the etching solution. The process control system according to claim 1, wherein the processor compares the second thickness of the internal defect layer with the first thickness of the internal defect layer to train the arithmetic module.

11. The storage includes a calculation module that receives control data measured from the etching apparatus and calculates the expected thickness of the remaining internal defect layer that is expected to be removed by the etching apparatus based on the measured control data. The process control system according to claim 1 or 10, wherein the processor causes the calculation module to learn by comparing the expected thickness of the remaining internal defect layer with the thickness of the remaining internal defect layer measured from the pickled carbon steel product after the etching process is completed.