Electromagnetic resonating structure and a method of measuring a material parameter of a flat sample
By using channels connected to absorbing material to guide parasitic modes away from the cavity, the resonating structure effectively suppresses unwanted modes, improving the accuracy of measurements in axially symmetrical cavity resonators.
WO2025062194A1 Publication Date: 2025-03-27QWED SP ZOO
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Patent Information
- Application Number
- PCT/IB2024/056934
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2023-09-18
- Filing Date
- 2024-07-17
- Publication Date
- 2025-03-27
AI Technical Summary
Technical Problem
Axially symmetrical cavity resonators face challenges in separating the desired TEOnp mode from parasitic modes, especially when measuring samples between dielectric plates, leading to ambiguous and inaccurate measurements.
Method used
The resonating structure incorporates channels connected to absorbing material, which guide parasitic modes to the absorbers while reflecting working modes back to the cavity, effectively suppressing unwanted modes and enhancing measurement accuracy.
Benefits of technology
This configuration, known as a Q-Choke, significantly reduces the impact of parasitic modes, allowing for more accurate and unambiguous measurements across a wide range of samples and frequencies.
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Abstract
Electromagnetic resonating structure (400) for measurements of flat sample (403) under test. The structure comprises a conducting wall (411, 412) defining substantially axially symmetrical cavity (401) which has an axis of symmetry (Z) and is at least partially surrounded by said wall (411, 412). The wall is made of conducting material and comprises two bases and a side wall. The structure is adapted to support electromagnetic resonance at multiple working transverse electric modes having axially symmetrical all field components and electric field restricted to angular direction. The structure comprises plurality of channels (420) with the volumes of absorbing material (430) provided in each base of the wall (411, 412). The channels (420) are configured to receive and guide towards absorbing material (430) a field distributed according to at least one mode other than working modes and reflect back to the cavity (401) field distributed according to the working modes. The structure further comprises two flat dielectric inserts (404) arranged across the cavity symmetrically to the axis of symmetry (Z) of the cavity in the middle of the side wall. The inserts (404) are adapted for sandwiching the sample (403) between them. The conducting wall (411, 412) comprises additional channel (421) beginning next to the slot fitting the insert (404) and extending within the side wall. The channel (421) has a volume of absorbing material (431) at its end. The invention further concerns a method of measuring parameter of a material according to the invention involves comparison of multimode measurements done using an empty resonating structure according to the invention and resonating structure according to the invention with a sample under test inside.
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