Tunable electron transparent substrates for high-resolution characterization
Tunable electron transparent substrates with large-area windows and sectioning trenches address the size limitations of conventional substrates, enabling high-resolution characterization of materials beyond the conventional substrate size, facilitating the analysis of larger-area samples and nanomaterial libraries.
Patent Information
- Application Number
- PCT/US2024/047884
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2023-09-22
- Filing Date
- 2024-09-21
- Publication Date
- 2025-03-27
AI Technical Summary
Existing electron transparent substrates for high-resolution characterization, such as those used in transmission electron microscopy (TEM), are limited by their small size, which restricts the fabrication of micro- and nanostructured materials and the analysis of larger-area samples or materials with dimensions exceeding the substrate size.
The development of tunable electron transparent substrates with large-area electron transparent windows and trenches for sectioning, allowing for the fabrication of nanomaterial libraries and high-resolution characterization of materials with dimensions beyond the limits of conventional substrates.
The proposed solution enables the fabrication of large-area electron transparent substrates that are compatible with high-resolution characterization techniques, allowing for the analysis of materials with dimensions exceeding conventional substrate sizes, thus overcoming the limitations of existing technologies.