Probe head provided with metallized guide holes
The probe head addresses the issue of exposed metallization in high-frequency applications by using partially metalized guide holes with tapered designs, enhancing performance and preventing short circuits.
WO2025068161A1 Publication Date: 2025-04-03TECHNOPROBE
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Patent Information
- Application Number
- PCT/EP2024/076750
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2023-09-26
- Filing Date
- 2024-09-24
- Publication Date
- 2025-04-03
AI Technical Summary
Technical Problem
Existing probe heads in high-frequency applications face issues with exposed metallization portions on the opposite face of the guide, which can cause short circuits and other unwanted effects.
Method used
The probe head features metallization on a guide with guide holes that are only partially metalized, and the guide holes are tapered on the opposite face to prevent exposure of metallization, thus avoiding short circuits and enhancing performance.
Benefits of technology
This design prevents exposed metallization on the opposite face of the guide, reducing the risk of short circuits and improving the probe head's performance in high-frequency applications by ensuring proper signal distribution and reducing noise.
✦ Generated by Eureka AI based on patent content.
Abstract
A probe head (100) for testing a device under test (DUT) is herein disclosed, said probe head having a plurality of contact probes (10) with a body (10p) extended between a first end portion (10a) and a second end portion (10b), which are adapted to contact respective contact pads, at least one guide (40) comprising guide holes (40h) for housing at least a portion of the contact probes (10), each guide hole (40h) being defined by a plurality of walls, and at least one conductive portion (30) which is formed on a first face (FA) of the guide (40) and includes at least one group (40hg) of the guide holes (40h), said conductive portion (30) being configured to contact and short-circuit a corresponding group (10g) of contact probes that are housed in said group (40hg) of guide holes and are intended to carry a same type of signal. At least one of the guide holes of the group (40hg) of guide holes includes at least one wall (40hw) of said walls which is coated by the conductive portion (30) through a part thereof extending inside said guide hole (40h), wherein said wall (40hw) of the guide hole (40h) is only partially coated by the conductive portion (30), which extends along said wall (40hw) up to a terminal portion (30t) of said conductive portion, said wall (40hw) thus comprising an uncovered portion (40hp) which extends from the terminal portion (30t) of the conductive portion (30) up to a second face (FB) of the guide (40), said second face being opposite the first face (FA) on which the conductive portion (30) is formed, and wherein the walls of said guide hole (40h) are shaped so as to define a tapered portion (40hr) which extends from the second face (FB) to a hole inner position (Z), said tapered portion (40hr) of the hole having a variation of its sectional dimensions from the second face (FB) up to the hole inner position (Z), the guide hole (40h) having substantially constant sectional dimensions from said hole inner position (Z) up to the first face (FA).
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