Inspection system, image management method, and sorting method
The inspection system addresses the challenge of managing and tracing inspection images by assigning codes to images, enhancing traceability and security, facilitating efficient re-inspection and result access.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD
- Filing Date
- 2025-10-31
- Publication Date
- 2026-06-11
AI Technical Summary
Existing inspection systems lack effective methods for managing and tracing inspection images of objects, particularly for identifying and re-inspecting workpieces like batteries, and do not provide efficient traceability and security against tampering.
An inspection system that includes an imaging device to generate inspection images, an image processing device to assign codes like QR codes, and a management computer to manage and sort images, enabling traceability and security through encoded information.
Enables efficient management, re-inspection, and secure traceability of inspection images by incorporating codes with manufacturing information, facilitating easy access to inspection results and secure tamper-proof images.
Smart Images
Figure JP2025038259_11062026_PF_FP_ABST
Abstract
Description
Inspection System, Image Management Method, and Sorting Method 【0001】 The present disclosure relates to an inspection system, an image management method, and a sorting method. 【0002】 An imaging device is used to image an inspection target, and the obtained image is used for inspecting the inspection target. Patent Document 1 describes inspecting the unevenness and dirt of a workpiece using an image. 【0003】 Japanese Patent Application Laid-Open No. 2013-242256 【0004】 The present disclosure provides a technique useful for managing images including an inspection target. 【0005】 The present disclosure provides an inspection system including an imaging device that images an inspection target to generate an inspection image for inspecting the inspection target, and an image processing device that performs image processing on the inspection image and assigns a code to the inspection image. 【0006】 The technology according to the present disclosure is useful for managing images including an inspection target. 【0007】 FIG. 1 is a schematic configuration diagram of an inspection system according to Embodiment 1. FIG. 2 is a schematic diagram of an inspection image before a code is assigned. FIG. 3 is a schematic diagram of an inspection image after a code is assigned. FIG. 4 is a schematic configuration diagram of an inspection system according to Embodiment 2. 【0008】 Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. The present disclosure is not limited to the following embodiments. 【0009】 (Embodiment 1) FIG. 1 is a schematic configuration diagram of an inspection system 200 according to Embodiment 1. 【0010】 The inspection system 200 inspects an inspection target 10. For example, dirt, scratches, etc. on the inspection target 10 are inspected. The inspection system 200 includes a transport device 20, an imaging device 30, a lighting device 40, an inspection device 60, and a management computer 70. The management computer 70 includes an image processing device 71 and a recording device 72. The management computer 70 is, for example, a personal computer. 【0011】The transport device 20 transports the object to be inspected 10. The transport device 20 includes a conveyor. In this embodiment, the object to be inspected 10 is a workpiece, specifically a battery, and more specifically a cylindrical battery. 【0012】 The imaging device 30 images the inspection target 10, which is being transported by the transport device 20 and illuminated by the illumination device 40. This generates an inspection image 81 of the inspection target 10 as data. The inspection device 60 inspects the inspection target 10 using the inspection image 81. Figure 2 is a schematic diagram of the inspection image 81. 【0013】 Information representing the inspection results of the inspection target 10 is transmitted from the inspection device 60 to the management computer 70 and recorded in the recording device 72. Specifically, the information representing the inspection results is managed in the form of a file. In addition, the inspection image 81 is transmitted from the inspection device 60 to the management computer 70 and recorded in the recording device 72 of the management computer 70. In the management computer 70, the image processing device 71 assigns a code 85 to the inspection image 81 by image processing. In this way, the inspection image 82 with the code 85 assigned is generated as data. The code 85 is useful for managing images including the inspection target 10. The code 85 can be obtained by converting information using an algorithm. The inspection image 82 is recorded in the recording device 72. Figure 3 is a schematic diagram of the inspection image 82. 【0014】 In this embodiment, the code 85 contains information about the object to be inspected 10. Such a code 85 is useful for managing images that include the object to be inspected 10. Furthermore, an inspection image 82 that includes such a code 85 may be useful in re-inspecting the object to be inspected 10, as described below. 【0015】 In other words, the inspection image 82 to be used for re-examination of the inspection target 10 can be identified by its code 85. The inspection device 60 can perform a re-examination using the image of the inspection target 10 in the identified inspection image 82. Since the inspection image 82 includes the code 85 in addition to the image of the inspection target 10, it is easy to link the results of the re-examination with information about the inspection target 10. 【0016】In this embodiment, the information regarding the object to be inspected 10 in code 85 includes information representing the manufacturing date of the object to be inspected 10. The date may be in years, months, days, or hours. 【0017】 In this embodiment, the information regarding the object to be inspected 10 in code 85 includes information representing the manufacturing conditions of the object to be inspected 10. For example, the manufacturing conditions include at least one selected from the group consisting of the manufacturing site where the object to be inspected 10 was manufactured, the manufacturing line on which the object to be inspected 10 was manufactured, the manufacturing equipment used to manufacture the object to be inspected 10, the settings of the manufacturing equipment used to manufacture the object to be inspected 10, and some or all of the steps in the manufacturing method of the object to be inspected 10. 【0018】 By including information representing the manufacturing date and / or manufacturing conditions in code 85, traceability regarding the inspection target 10 can be provided to the inspection image 82. 【0019】 In this embodiment, the information regarding the object to be inspected 10 in code 85 includes information representing the specifications of the object to be inspected 10. The specifications of the object to be inspected 10 are, for example, the type of the object to be inspected 10. The type may also be the model. When the object to be inspected 10 is a battery, the specifications of the object to be inspected 10 include, for example, at least one selected from the group consisting of battery performance, battery material, battery shape, and battery dimensions (diameter, etc.). The battery performance includes, for example, at least one selected from the group consisting of battery output voltage, battery life, and battery capacity. 【0020】 In this embodiment, code 85 includes a two-dimensional code. Specifically, the two-dimensional code is a QR code (registered trademark). 【0021】In this embodiment, information representing the inspection results of the inspection target 10 is accessible via code 85. With this configuration, when a user of the inspection system 200 provides an inspection image 82 to another party, that party can access the inspection results via code 85. This other party could be, for example, the user's customer or a department other than the one the user belongs to. In one example, code 85 contains the address of the recording device 72. Based on the address contained in code 85, it is possible to access the information representing the inspection results in the recording device 72. 【0022】 As shown in Figure 3, in the inspection image 82, the inspection target 10 and the code 85 are spaced apart from each other. This is advantageous from the viewpoint of using the inspection image 82 to inspect the inspection target 10. For example, the imaging device 30 is configured such that in the inspection image 81, the inspection target 10 is contained within a predetermined area (hereinafter referred to as the target area). Similarly to the inspection image 81, in the inspection image 82, the inspection target 10 is contained within the target area. The image processing device 71 is configured such that in the inspection image 82, the code 85 is contained within a predetermined area outside the target area. In this embodiment, in the inspection image 82, the code 85 is provided in one location. 【0023】 In this embodiment, multiple inspection targets 10 are sequentially transported by a transport device 20. The image processing device 71 generates inspection images 82 relating to the multiple inspection targets 10. 【0024】 In this embodiment, the inspection device 60 also functions as a sorting device. The sorting device can be implemented by installing a computer program. The sorting device sorts the generated inspection images 82 based on the codes 85 of the inspection images 82. Specifically, sorting can be performed based on the manufacturing date of the inspection target 10, the manufacturing conditions of the inspection target 10, the specifications of the inspection target 10, etc. 【0025】In this embodiment, the inspection device 60 can inspect multiple inspection targets 10 using a plurality of sorted inspection images 82. Specifically, this inspection is a re-inspection of the plurality of inspection targets 10. More specifically, the inspection device 60 inspects the plurality of inspection targets 10 using a plurality of inspection images 81, and then re-inspects the plurality of inspection targets 10 using a plurality of sorted inspection images 82. 【0026】 The inspection image 82 has high security against tampering with code 85. This is because if code 85 in the inspection image 82 is tampered with, visible traces of the tampering will appear in the inspection image 82. For example, if code 85 is tampered with, distortion may occur in the image of the object being inspected 10 in the inspection image 82. 【0027】 Information can be obtained through Code 85 by a reading device (not shown). The reading device may be included in the inspection device 60, the management computer 70, and terminals (not shown). The reading device can be implemented by installing a computer program. 【0028】 Other embodiments will be described below. In the following, elements common to embodiments already described and those described later will be given the same reference numerals, and their descriptions may be omitted. 【0029】 (Embodiment 2) Figure 4 is a schematic diagram of the inspection system 500 according to Embodiment 2. The inspection system 500 includes an inspection device 90. The inspection device 90 has the functions of the inspection device 60 of Embodiment 1. The inspection device 90 also includes an image processing device 71 and a recording device 72. 【0030】 The inspection device 90 performs the inspection of the object to be inspected 10 using the inspection image 81, followed by image processing of the inspection image 81, in this order. In this way, the inspection and the assignment of the code 85 can be performed continuously. 【0031】 Specifically, the imaging device 30 sequentially images multiple inspection targets 10 while they are being transported. This generates multiple inspection images 81. For each of the multiple inspection targets 10, the inspection device 90 performs inspection of the inspection target 10 using the inspection image 81, followed by image processing of the inspection image 81, in this order. 【0032】 Various modifications can be applied to the techniques described in Embodiment 1 and Embodiment 2. 【0033】 Code 85 may include a one-dimensional code along with, or in place of, a two-dimensional code. The one-dimensional code is, for example, a barcode. Code 85 may also include a digital signature. 【0034】 In the inspection image 82, the code 85 may be provided at multiple locations spaced apart from each other. This can contribute to realizing a configuration in which the inspection target 10 and the code 85 are spaced apart from each other in the inspection image 82. 【0035】 Assigning code 85 to inspection image 81 may also involve superimposing code 85 onto inspection image 81. With superimposition, in the resulting inspection image 82, some or all of the parts that inspection image 81 originally had before code 85 was assigned (for example, the background of the subject of inspection 10) may be visible behind code 85. Therefore, if code 85 is tampered with, distortion may occur in the image of the aforementioned parts behind code 85. 【0036】 The inspection of the inspection target 10 using inspection image 81 may be omitted, and the inspection of the inspection target 10 using inspection image 82 may be performed as the initial inspection of the inspection target 10. The inspection device 60 or 90 may perform the initial inspection of multiple inspection targets 10 using a sorted set of inspection images 82. The expression "inspection image 81 for inspection of inspection target 10" is intended to encompass the form in which the inspection image 82 obtained by assigning a code 85 to the inspection image 81 is used for the initial inspection of the inspection target 10. 【0037】 In a system that links the results of a re-examination of subject 10 with information about subject 10, it is not essential that code 85 is information about subject 10. 【0038】In one configuration example, code 85 includes information about the object to be inspected 10. The inspection system 200 or 500 includes a display and a reader. When the reader reads code 85 in the inspection image 82, the display simultaneously displays the inspection image 82, information about the object to be inspected 10, and the inspection result. Reading and simultaneous display may also be performed when the user interface accepts input. A touch panel may serve as both the display and the user interface. The display may be included in the inspection device 60 or 90, the management computer 70, a terminal (not shown), etc. The user interface may be included in the inspection device 60 or 90, the management computer 70, a terminal (not shown), etc. 【0039】 The sorting device may be a separate device from the inspection device 60 or 90. For example, the management computer 70 may include the sorting device. 【0040】 The system may be configured to allow access to information representing the test results of the 10 subjects of inspection via code 85, or alternatively, to include information representing the test results in code 85. 【0041】 After multiple inspection images 81 are recorded in the recording device 72, image processing of the multiple inspection images 81 may be performed. After recording and image processing of one inspection image 81 is performed, recording and image processing of the next inspection image 81 may be performed. 【0042】 The recording device 72 may be a device independent of the management computer 70 and the inspection device 90. For example, an independent device could be a server device. The server device may be an on-premise device or a cloud device. 【0043】As can be understood from the above description, the present disclosure discloses a sorting method. The sorting method includes sorting a plurality of inspection images 82 to which a code 85 is assigned, based on the codes 85 of the plurality of inspection images 82. A computer program provided with an instruction to cause a computer to execute the sorting method when executed by the computer may be configured. A computer-readable non-transitory recording medium on which the computer program is recorded may be configured. The recording medium is, for example, a semiconductor recording medium, a magnetic recording medium, a magneto-optical recording medium, an optical recording medium, etc. The semiconductor recording medium is, for example, an SD (Secure Digital) card, a USB (Universal Serial Bus) memory, an SSD (Solid State Drive), etc. The magnetic recording medium is, for example, an HDD (Hard Disk Drive), a flexible disk, etc. The magneto-optical recording medium is, for example, a MO (Magneto Optical Disk), etc. The optical recording medium is, for example, a CD (Compact Disc), a DVD (Digital Versatile Disc), etc. 【0044】 (Supplementary Note) By the present disclosure, the following technologies are disclosed. 【0045】 (Technology 1) An inspection system including an imaging device that images an inspection target and generates an inspection image for inspecting the inspection target, and an image processing device that performs image processing on the inspection image and assigns a code to the inspection image. 【0046】 (Technology 2) The inspection system according to Technology 1, wherein the code includes information regarding the inspection target. 【0047】 (Technology 3) The inspection system according to Technology 1 or 2, wherein the code includes a two-dimensional code. 【0048】 (Technology 4) The inspection system according to any one of Technologies 1 to 3, wherein the code includes information representing the manufacturing time of the inspection target. 【0049】 (Technology 5) The inspection system according to any one of Technologies 1 to 4, wherein the code includes information representing the manufacturing conditions of the inspection target. 【0050】(Technical 6) An inspection system according to any one of Technical 1 to 5, wherein the code includes information representing the specifications of the object to be inspected. 【0051】 (Technical 7) An inspection system according to any one of Technical 1 to 6, wherein information representing the results of the inspection is accessible via the code, and / or the code includes information representing the results of the inspection. 【0052】 (Technical 8) The inspection system according to any one of Technical 1 to 7, wherein the object to be inspected is a battery. 【0053】 (Technical 9) An inspection system according to any one of Technical 1 to 8, comprising an inspection device that performs the inspection of the object to be inspected using the inspection image to which the code has been assigned. 【0054】 (Technical 10) An inspection system according to Technical 9, comprising a display and a reading device, wherein the code includes information relating to the object to be inspected, and when the reading device reads the code, the display simultaneously displays the inspection image, the information relating to the object to be inspected, and the inspection result. 【0055】 (Technical 11) The inspection system according to any one of Technical 1 to 10, wherein in the inspection image to which the code is assigned, the object to be inspected and the code are spaced apart from each other. 【0056】 (Technical 12) An inspection system according to any one of Technical 1 to 11, comprising an inspection device including the image processing device, wherein the inspection device performs the inspection and the image processing in this order. 【0057】 (Technical 13) An inspection system according to any one of Technical 1 to 12, comprising a sorting device, wherein the image processing device performs the image processing of the inspection images relating to a plurality of objects, the sorting device sorts a plurality of images relating to each of the plurality of objects, each of the plurality of objects constitutes the inspection object, each of the plurality of images constitutes the inspection image to which the code is assigned, and the sorting is performed based on the code of the plurality of images. 【0058】(Technical 14) The inspection system according to Technical 13, comprising an inspection device that performs the inspection of the plurality of objects using the plurality of sorted images. 【0059】 (Technical 15) An image management method comprising: capturing an image of an object to be inspected and generating an inspection image for inspecting the object to be inspected; and performing image processing on the inspection image to assign a code to the inspection image. 【0060】 (Technical 16) A sorting method comprising sorting multiple inspection images for the inspection of multiple objects to be inspected based on codes contained in the multiple inspection images. 【0061】 The technology described herein is useful for managing images, including those being inspected.
Claims
1. An inspection system comprising: an imaging device that captures an image of an object to be inspected and generates an inspection image for the inspection of the object; and an image processing device that processes the inspection image and assigns a code to the inspection image.
2. The inspection system according to claim 1, wherein the code includes information relating to the object to be inspected.
3. The inspection system according to claim 1, wherein the code includes a two-dimensional code.
4. The inspection system according to claim 1, wherein the code includes information indicating the manufacturing date of the object to be inspected.
5. The inspection system according to claim 1, wherein the code includes information representing the manufacturing conditions of the object to be inspected.
6. The inspection system according to claim 1, wherein the code includes information representing the specifications of the object to be inspected.
7. The inspection system according to claim 1, wherein information representing the results of the inspection is accessible via the code, and / or the code includes information representing the results of the inspection.
8. The inspection system according to claim 1, wherein the object to be inspected is a battery.
9. The inspection system according to claim 1, comprising an inspection device that performs the inspection of the object to be inspected using the inspection image to which the code has been assigned.
10. An inspection system according to claim 9, comprising a display and a reader, wherein the code includes information relating to the object to be inspected, and when the reader reads the code, the display simultaneously displays the inspection image, the information relating to the object to be inspected, and the result of the inspection.
11. The inspection system according to claim 1, wherein in the inspection image to which the code is assigned, the object to be inspected and the code are spaced apart from each other.
12. The inspection system according to claim 1, comprising an inspection apparatus including the image processing apparatus, wherein the inspection apparatus performs the inspection and the image processing in this order.
13. An inspection system according to claim 1, comprising a sorting device, wherein the image processing device performs the image processing of the inspection images relating to a plurality of objects, the sorting device sorts a plurality of images relating to each of the plurality of objects, each of the plurality of objects constitutes the inspection object, each of the plurality of images constitutes the inspection image to which the code is assigned, and the sorting is performed based on the code of the plurality of images.
14. The inspection system according to claim 13, comprising an inspection device that performs the inspection of the plurality of objects using the plurality of sorted images.
15. An image management method comprising: capturing an image of an object to be inspected and generating an inspection image for the inspection of the object to be inspected; and performing image processing on the inspection image and assigning a code to the inspection image.
16. A sorting method comprising sorting multiple inspection images for the inspection of multiple objects to be inspected based on codes contained in the multiple inspection images.