Radiographic image acquisition device and radiographic image acquisition method

The radiation image acquisition device and method address the challenge of inconsistent magnification in X-ray tomography by controlling beam positions based on magnification ratios, enabling high-accuracy detection of objects with varying sizes and shapes by aligning image parts with adjacent pixels.

WO2026126292A1 Publication Date: 2026-06-18HAMAMATSU PHOTONICS KK

Patent Information

Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
HAMAMATSU PHOTONICS KK
Filing Date
2024-12-09
Publication Date
2026-06-18

AI Technical Summary

Technical Problem

Existing X-ray tomography systems fail to accurately set the magnification for objects with high accuracy in X-ray tomography systems, as they fail to account for the magnification required in X-ray tomosynthesis, especially when dealing with objects of varying sizes, shapes, and aspect ratios, leading to inconsistent positional relationships between the radiation source, object, and detection unit.

Method used

A radiation image acquisition device and method that controls the incident position of a radiation beam between two positions based on the difference in magnification ratios, allowing the image of a region of interest to straddle pixel boundaries, thereby accurately detecting objects with varying heights by separating the image into parts that align with adjacent pixels.

🎯Benefits of technology

Enables high-accuracy detection of objects by accurately separating and aligning images of different parts of the object, even when the positional relationship between the radiation source, object, and detection unit changes, ensuring precise shape data acquisition.

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Abstract

An X-ray image acquisition device 1 comprises: an X-ray source 2 having an electron gun 21 and a target 22; a control unit 3 that controls an incident position of an electron beam EB between a first incident position and a second incident position; an X-ray detection unit 4 that acquires an X-ray image of an object OJ; and a processing unit that acquires shape data relating to the shape of the object OJ on the basis of a first image acquired as an X-ray image in a first state in which the incident position is the first incident position and a second image acquired as an X-ray image in a second state in which the incident position is the second incident position. On the basis of the difference between a first magnification ratio M1 and a second magnification ratio M2, the control unit 3 controls the incident position of the electron beam EB between the first incident position and the second incident position, thereby moving at least a part of the image of the object OJ between the first state and the second state so as to straddle the boundary between adjacent pixels 41.
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