Analysis By Electrical Excitation TRIZ Cases
- Color and luminance measuring device with filter unit
A color and luminance measuring device uses a filter unit to control incident light.
- Plasma Spectroscopy Analysis for DMSA-Administered Specimens
Plasma spectroscopy analysis method adds a bonding agent to specimens collected after meso-2,3-dimercaptosuccinic acid administration.
- Steel Inclusion Analysis via OES and CPM/EDX Calibration
Calibrate optical emission spectrometry using charged-particle microscopy correction factors for steel inclusion analysis.
- Electrophoretic Collision Imaging for Reaction Kinetics
Separate reagent loading regions enable real-time collision visualization, resolving reaction kinetics beyond traditional gel dead time limitations.
- Transient Absorption Spectrometer Pulse Current Excitation
A transient absorption spectrometer uses pulse current excitation to generate non-luminous excited states in samples for optical detection.
- Plasma Spectrometry Reproducibility via Periodic Voltage Control
Periodic voltage cycling manages air bubble growth to improve plasma light emission reproducibility.
- Alkyl Diethanolamine ECL Coreactants for Stable Assays
Alkyl diethanolamines replace tripropylamine to eliminate volatility and pH sensitivity, ensuring consistent assay performance.
- Auxiliary Layer Adhesion for Photoresist Uniformity
An auxiliary layer between the metal gate electrode and organic photoresist ensures uniform film formation.
- Microwave Sensor for Combustible Gas Air Ratio
A microwave sensor induces exothermic reactions in gas mixtures, measured by optical detection.
- Electroluminescent Imaging for Biological Specimens
A manganese-doped zinc sulfide nanocrystal layer converts electrical signals into light to visualize biological specimens.
- HF Monitoring in Buffered Hydrofluoric Acid via SiO2 Etching
A method determines HF concentration in buffered hydrofluoric acid by measuring etched silicon and ammonium fluoride levels.
- Electron Beam Stress Measuring Device for Nano-Resolution
An electron beam stress measuring device replaces optical lasers with focused beams under 100 nm to resolve nano-level stress concentrations.
- SCGD Purging Device for Molecular Background Emission Reduction
A hollow enclosure purges atmospheric gases from a solution cathode glow discharge plasma to reduce molecular background emission.
- Homogeneous Assay Surface Amplification Layer
A homogeneous assay device uses a surface amplification layer to enhance optical signals from bound labels for rapid detection.