Power Supply Testing TRIZ Cases
- Voltage Detector Circuit Segmentation for Low Voltage Detection
Segmented voltage detection circuits maintain accurate monitoring when power supply voltages drop below operational thresholds, preventing device malfunctions.
- Multi-Phase Power System Fault Detection via Cross-Phase Signal Products
Computes cross-phase voltage current products and applies frequency analysis to detect incipient faults while reducing computational intensity.
- Power and Ground Pin Testing via Segmented Resistor Networks
A semiconductor test circuit segments power pins through resistors to common nodes for automated voltage comparison.
- Energy Gateway TIC Signal Analysis for Power Outage Origin
An energy gateway analyzes TIC signals to differentiate power failure origins using a state machine.
- Context-Aware Block IR Drop Analysis for VLSI Design
Segmenting full-chip analysis into block-level units with simulated boundary conditions accelerates IR drop fixing while maintaining accuracy.
- Voltage Estimation for Power Distribution Anomaly Detection
Estimates voltage at common coupling points using downstream branch measurements to detect non-technical losses and topology errors.
- Variable Slope Current Regulation for VRM Dynamic Testing
A power supply test device generates square-wave signals to actively regulate output current slopes via a controller and loading circuit.
- Closed-Loop Oscillation Detector Circuit
Integrated detector monitors closed-loop output signals using a band-pass filter and comparator circuit to identify unwanted oscillations.