Scattering Properties Measurements TRIZ Cases
- Dual-Sided Laser Particle Detection on Glass Substrates
Dual laser irradiators detect particles on glass substrates via scattered light, compensating for flatness changes without distance adjustment devices.
- Movable Panel Reflectivity Measurement for Painted Objects
A movable panel adjusts the incident angle of electromagnetic waves to measure reflectivity intensity across a predetermined range.
- Rotating Turntable Optical Sensor for Curved Surface Roughness
Stationary optical sensor measures rotating object surface roughness with consistent light path geometry.
- Wafer Inspection System Oblique Illumination Segmentation
Oblique illumination subsystem directs light to wafer surface for simultaneous multi-spot collection and focusing.
- Adjustable Cross-Sectional Sample Container for Stability Testing
Flexible sidewalls adjust container volume to eliminate multiple fixed-size units, improving testing efficiency.
- Skin Analysis Using Segmented Photodetector Channels
Segmenting spectroscopic functions into discrete photodetector channels reduces device complexity and cost while maintaining measurement precision.
- Iterative Defect Classifier Training for Semiconductor Inspection
An inspection algorithm iteratively refines classification boundaries using minimal instructive defects to optimize performance.
- Semiconductor Wafer Optical Characteristic Calculation via Field Segmentation
Segments electromagnetic problems into periodic background and localized defect fields, reducing computation time while maintaining measurement precision.
- Diffuse Optical Imaging System for Turbid Media Analysis
Broadband speckle projections enable rapid measurement of bulk optical properties in turbid media, reducing hardware complexity while maintaining accuracy.
- Metamaterial Nano-Sensing System with Ultra-Narrow Line Width
A metamaterial nano-sensing system couples surface plasmons and Tamm excitons to generate an ultra-narrow line width spectral response.
- Equal-Interval Wavenumber Spectral Conversion for OCT Imaging
A wavelength spectrum analysis unit converts optical data into equal-interval wavenumber spectra using interpolation and resampling techniques.
- Sample Analyzer Autocorrelation Displacement Filtering
A sample analyzer determines autocorrelation function displacement to filter signals for accurate particle analysis.
- Optical Detection of Media in Two Layers with Optical Separation
A microfluidic insert uses total internal reflection to detect liquid presence within a measuring region.
- Uniaxial Crystal Flow Cell C-Axis Orientation for SNR
A uniaxial crystal flow cell orients the c-axis perpendicular to scattered light paths.
- Pupil Plane Calibration for Scatterometry Overlay Metrology
Minimizes tool-induced shift variance through pupil center calibration, enhancing metrology accuracy without electromagnetic modeling.
- Smoke Detector Light Shielding and Gas Flow Optimization
A smoke detector design accelerates gas inflow through optimized guiding mechanisms.
- Low Coherence Interferometry for Real-Time Coating Thickness Monitoring
A monitoring apparatus uses low coherence interferometry to measure coating thickness on solid dosage forms during the manufacturing process.
- Compact Edge Detection for Sapphire Substrates
A compact edge detection device uses beam oscillation parallel to the objective lens center axis.
- Flow Cytometry Myeloblast Classification via Hemolysis and Fluorescence
A flow cytometry method classifies myeloblasts using hemolytic reagent treatment and fluorescent nucleic acid staining.
- Ring-Form Particle Concentration Measuring Device
A particle concentration measuring device uses a ring-form measurement region and planar light curtain to detect scattered light from passing particles.
- Lithography Apparatus Rotational Inspection Reducing Vibrations
Rotating the substrate table and detector captures angle-resolved spectra while minimizing vibrations generated by linear acceleration forces.
- Optical Inspection Light Direction Distribution Analysis
Wavelength selection and multi-channel imaging capture signal vectors to estimate light spread.
- Multiwell Plate Lid with Protruding Element for Light Scattering
A multiwell plate lid features a protruding surface element that captures and directs light beams into fluid samples.
- Particle Measurement Device Using Diffractive Optical Element Flat Top Beam
A particle measurement device employs a diffractive optical element to shape irradiation light into a flat top beam with uniform intensity.
- Print Media Surface Status Assessment via Optical Luminance Analysis
A printing device calculates surface status values from reflected light luminance to determine print medium appropriateness.
- ATR Optical Sensor Uniform Light Distribution
Aspherical lenses redistribute non-uniform light intensity to eliminate normalization errors in surface plasmon resonance sensors.
- Curved Lighting Device for Gloss Inspection
An extendable honeycomb member adjusts light parallelism to resolve gloss inspection errors on non-perfect planes.
- Infrared Surface Inspection Apparatus for Metal Roughness
An inspection apparatus uses infrared light and dual sensors to image surface irregularities on metal.
- Electromagnetic Wave Detection Device Axis Alignment
A detection apparatus adjusts reflecting surface orientation to align optical axes.
- Lensless Imaging Device Thermal Management
A lensless imaging device uses a ventilation system to circulate air between the sensor and sample.