Using Optical Means TRIZ Cases

This coordinate measuring case uses actual temperature data and expansion coefficients to correct 3D coordinates during measurement.

Multi-order beam detection improves lithographic alignment measurement precision.

Three sensing areas use phased patterns for precise, pollution-resistant encoder positioning.

A standard surface and interferometer adjust interference intensity to keep detector signals within range and improve position accuracy.

An optical absorber boosts cavity sensitivity for 1-nm, three-dimensional displacement measurement without complex multibeam alignment.

This case maps ground height and compensates service outputs, enabling accurate alignment and sensor calibration without a level lift.

Angled end faces distort vertical core-pitch readings; trigonometric adjustment improves tolerance assessment and helps reduce yield losses.

Dynamic projection image groups adapt structured light measurements to varying scenarios for robust 3D surface reconstruction.

This case adapts light emissions and accumulations per pixel to balance accurate dToF measurement with shorter processing time.

Separate exposure times capture ultraviolet and visible spectra, then combine wavelength data for accurate in-line film thickness analysis.

Orthogonal cameras measure part straightness in flight without mechanical contact.

A DLP projector, camera, controller, and onboard image processor synchronize capture to obtain 3D information without a PC.

Displacement sensors calculate angular motion and trigger alarms or shutdowns when shaker overturning moments exceed limits.

Transmissive and reflective diffractive marks, beam splitting, and image sensing address alignment errors across different die sizes.

This case combines positioning and measurement data through GenICam, supporting evaluation software with less proprietary programming.

This FMCW LiDAR case adjusts optical split ratio and exposure to improve distance resolution and maximum measurement distance.

Preconfigured beam-modifying modules let metrology tools switch radiation attributes quickly while preserving measurement throughput.

A fiber coupler and tuned optical path lengths separate multi-channel interference signals, reducing size, noise, and processing complexity.

K-space resampling adjusts OCT imaging windows and resolution from one measurement.

Spatial filtering reduces non-target reflections for precise eccentricity measurement.

A transparent oblique scale measures optical depth of field in one image, avoiding mechanical shifting and focusing delays.

Measure vaccine coating on microprojections rapidly and aseptically using reflected or fluorescent light without destroying the patch.

This case uses split waves traveling through different-speed media to detect phase, frequency, and time-of-flight changes.

Cross-time-shift detection compares reference-tap samples to compensate pixel offsets and gain deviations in ToF distance sensing.

Known-shift targets calibrate optical signal response across patterning layers, improving non-destructive overlay accuracy and throughput.

A beamsplitter and segmented GRIN lens compensate optical paths, improving reference collection and OCT image stability.

Different absorption axes help the sensing module separate projected structured light from ambient illumination and improve depth accuracy outdoors.

Rapid sparse OCT scanning combines overlapping frames and visible-light pixels to create dense, color-mapped dental images.

Optical sensing replaces contact alignment to handle tight fiber-to-microlens tolerances and measure cleave angles accurately.

A Vernier scan uses chirp pairs with varied intervals to resolve phase rollover ambiguity and improve SMI velocity accuracy.

Miniature solid-state LIDAR measures distance and velocity while identifying object shape.

Balanced coupler split ratios improve returning-light uniformity for precise range sensing.

Measure thread ridge and root widths accurately by switching illumination directions and shifting focus for each overhanging flank.

A feedback controller adjusts camera and projector parameters for 3D reconstruction, balancing fine-detail resolution with power efficiency.

An etalon sparsely samples the FMCW signal, enabling nonlinearity correction without a dedicated reference arm or added hardware.

A two-stage process separates shape-difference candidates from local roughness checks to detect tunnel surface defects more accurately.

This case combines 3D foot scans, user preferences, and history for virtual fitting and personalized product matching.

A PIC uses dual Mach-Zehnder interferometers and sine/cosine processing for fast, precise, polarization-insensitive frequency detection.

This case uses multiple diffraction orders and numerically calculated complex filters to improve extrinsic phase reconstruction in one shot.

An optical amplifier, gain feedback, and turnaround checks correct power imbalance and delay errors in OFDR measurements.

Analyze FFF printer X/Y dynamics through imaged line width and centerline variation.

A portable scanner and app capture 3D instrument data for consistent QC, diagnosis, and manufacturing decisions.

A storage-stage contactless scan finds post-cut bar deformation and supports reject sorting and straightener adjustment.

A reference geometry and evaluation device correct scanner data during motion, compensating for vibration and stick-slip interference.

A compact handheld OCT uses modular optics, phase compensation, and self-guided operation for reproducible home retinal monitoring.

Collimated reflected light and grating patterns address limited triangulation range, surface texture effects, and detector sampling errors.

A reference geometry and evaluation device continuously correct vibration and stick-slip interference during movable geometric data capture.

A detector array compares reconstructed light with expected signals, enabling intensity adjustment or shutdown when faults threaten eye safety.

Radiation-reflecting fibers replace damage-prone strips, supporting non-destructive monitoring of embedded layers and components.

This detector combines chromatic aberration with central and edge intensity sensing to extend confocal distance measurement.