Method of analyzing spectral peaks

By generating interference curve parameters and fitting multiple curves to the interference peaks of the optical spectrometer, the problem of analytical errors caused by overlapping spectral peaks was solved, thus improving the accuracy and efficiency of spectral analysis.

CN116265917BActive Publication Date: 2026-07-21THERMO FISHER SCI BREMEN
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Patent Information

Application Number
CN202211623392.8
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Priority Date
2021-12-17
Filing Date
2022-12-16
Publication Date
2026-07-21
Estimated Expiration
2042-12-16

AI Technical Summary

Technical Problem

When analyzing samples, existing optical spectrometers suffer from overlapping spectral peaks, leading to misidentification and increased analysis time. Existing inter-element correction algorithms are not suitable for resolving all overlapping peaks, and the resolution depends on the optical spectrometer.

Method used

By generating interference curve parameters, based on the expected curve parameter model of the optical spectrometer and the detector position, multiple curves are fitted to the interference peak. The interference peak is analyzed using a double Gaussian curve model and regression algorithm, and the peak wavelength and intensity are optimized.

Benefits of technology

It enables efficient analysis of overlapping spectral peaks, simplifies user operation, improves analysis accuracy and efficiency, and reduces dependence on the resolution of optical spectrometers.

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Abstract

A method of analyzing an interference peak of a sample spectrum generated using a detector of an optical spectrometer is provided. The interference peak is produced by a plurality of spectral emissions of different wavelengths. The method includes generating, based on a model of expected curve parameters of the optical spectrometer and a location of the sample peak on the detector of the optical spectrometer, interference curve parameters representing a shape of each spectral emission in the interference peak. The method further includes fitting a plurality of curves to the interference peak, each curve corresponding to one of the plurality of spectral emissions of different wavelengths that form the interference peak, wherein each curve is fitted using the interference curve parameters provided by the model of expected peak parameters. The plurality of curves are output for further analysis.
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