High-speed enameled wire surface defect detection system and method
By combining a line-scan camera, an electric zoom lens, a multispectral combined light source, and an optimized YOLO11 model, the problems of missed detection, false alarms, and imaging distortion in high-speed enameled wire inspection were solved, achieving high-precision, low-latency defect detection.
Patent Information
- Application Number
- CN202511461731.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-10-14
- Publication Date
- 2025-12-02
AI Technical Summary
Existing technologies for high-speed enameled wire inspection suffer from issues of high frame rate and resolution, as well as high cost. Low frame rate and low resolution lead to a high false negative rate. Existing solutions also suffer from high imaging distortion and large synchronization errors at high speeds, failing to meet the requirements for continuous inspection. Furthermore, the spatiotemporal misalignment between electrical and visual defects results in a high false alarm rate.
Employing a line array camera with a line frequency ≥80kHz, an electric zoom lens, and a multispectral combined light source, combined with a real-time diameter measurement module and a high-pressure pinhole detection module, defect identification is achieved by optimizing the YOLO11 model, realizing synchronization between visual imaging and electrical signals, dynamically matching the detection speed, and using a multispectral combined light source and polarization module to reduce reflection interference.
It achieves a high detection rate of pinholes down to 0.1mm, reduces false alarm and missed detection rates, improves detection accuracy and speed, and meets the requirements of high-speed continuous detection.