Real-time image enhancement method and system based on CD-SEM raster scanning partitioning
The real-time image enhancement method based on CD-SEM raster scanning blocks solves the problems of low contrast and latency in high-resolution images, achieving efficient and low-memory image enhancement that meets the real-time and accuracy requirements of semiconductor detection.
Patent Information
- Application Number
- CN202610112058.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-27
- Publication Date
- 2026-05-08
AI Technical Summary
In semiconductor manufacturing, existing technologies such as CD-SEM for high-resolution images suffer from low overall contrast and blurred details, resulting in low accuracy in automatic measurement and defect identification. Furthermore, traditional image enhancement algorithms require huge amounts of memory and processing latency, which cannot meet the needs of real-time detection.
A real-time image enhancement method based on CD-SEM raster scanning blocks is adopted. By presetting the image processing block size and overlapping region parameters, the electron beam scanning is controlled and local histogram statistics, cropping and equalization are performed in real time. Combined with a weighted average algorithm, image fusion is performed to generate an efficient and low-memory enhanced image.
The image enhancement and acquisition processes are parallelized, significantly reducing memory usage and processing latency, generating continuous, natural, and detailed images to meet real-time detection requirements and improve detection efficiency and accuracy.