Storage system for detecting faults in a signal transmission path
By utilizing the signal transmission path detection of the basic die in the stacked memory system, the problem of signal transmission path detection in the prior art is solved, and the stability of the system and the data transmission efficiency are improved.
CN122417119APending Publication Date: 2026-07-17SK HYNIX INC
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-17
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
In existing stacked storage systems, fault detection of signal transmission paths is difficult to perform effectively, affecting the stability and efficiency of the system.
Method used
After the basic die is tested on the wafer, command addresses and data are received and generated using the first and second signal transmission paths. Faults in the signal transmission paths are detected based on logic levels, including latching operations of the command address TSV and data TSV regions.
Benefits of technology
It enables efficient fault detection of signal transmission paths in stacked storage systems, ensuring the reliability of data transmission and the stability of the system.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN122417119A_ABST
Abstract
本公开涉及用于检测信号传输路径中的故障的存储系统。一种存储系统，包括基础裸片，该基础裸片控制多个核心裸片的操作。基础裸片在晶片测试操作开始后，通过经由第一信号传输路径接收命令地址，将命令地址施加至命令地址硅通孔（TSV）；在读取操作开始后，通过第二信号传输路径来将基于命令地址TSV的逻辑电平生成的锁存命令地址作为数据输出；以及基于数据的逻辑电平来检测第一信号传输路径中的故障。
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Citation Information
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