A chip testing and sorting device
By designing a chip testing and sorting device that integrates conveying, detection, correction, and orientation collection components, the problems of inaccurate detection and imprecise sorting in traditional devices have been solved. This achieves accurate chip detection and efficient sorting, thereby improving production efficiency and product quality.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN PAISIDI POWER SEMICON CO LTD
- Filing Date
- 2025-04-09
- Publication Date
- 2026-06-09
AI Technical Summary
Traditional chip testing and sorting devices cannot achieve precise sorting, resulting in inaccurate test results, increased labor costs, and failure to meet the stringent performance requirements of high-end electronic products, leading to resource waste and potential quality risks.
A chip testing and sorting device is designed, which includes conveying, detection, correction, and orientation collection components. The chip is pushed by a conveyor belt for position correction and detection. The correction and pushing components ensure detection accuracy, and the orientation collection components realize the classification and collection of chips.
It achieves accurate and efficient chip detection and sorting, reduces resource waste, improves production efficiency and product yield, and meets the quality requirements of high-end electronic products.
Smart Images
Figure CN224343747U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of chip testing technology, specifically a chip testing and sorting device. Background Technology
[0002] In the current booming development of the chip manufacturing industry, chip testing and sorting are crucial for ensuring product quality and performance, and their importance is self-evident. However, traditional chip testing and sorting devices have gradually revealed many limitations in long-term application. Most traditional devices adopt a one-way unqualified and qualified testing and sorting mode. With the increasing complexity of modern chip manufacturing processes and the increasingly diverse application scenarios of products, this simple and extensive sorting method can no longer meet the needs of enterprises for refined chip processing. For example, in the chip applications of some high-end electronic products such as smartphones and aerospace equipment, the requirements for chip performance are extremely stringent. It is necessary not only to distinguish between qualified and unqualified products, but also to further subdivide chip grades according to different performance indicators. Traditional sorting devices cannot achieve this function, which may require subsequent testing and screening of sorted chips. This will undoubtedly increase labor costs and reduce production efficiency.
[0003] Furthermore, with the continuous advancement of chip manufacturing technology, the trend of chip miniaturization and integration is becoming increasingly significant. When faced with smaller chips with denser pins, traditional sorting devices are increasingly disadvantaged in terms of detection accuracy and sorting precision. Due to the inability to precisely correct the chip's position, positional deviations often lead to inaccurate detection results, which in turn affect the reliability of the entire production process and the yield rate of products. This may not only result in the misjudgment of a large number of chips with potential application value, causing a waste of resources, but may also allow some defective chips to enter subsequent production stages, posing quality risks to end products and damaging the company's reputation. Improvements are needed, and to this end, we propose a chip testing and sorting device. Utility Model Content
[0004] Technical problems to be solved
[0005] To address the shortcomings of existing technologies, this invention provides a chip testing and sorting device that solves the aforementioned problems.
[0006] (II) Technical Solution
[0007] To achieve the above-mentioned objectives, this utility model provides the following technical solution:
[0008] A chip testing and sorting device includes a working support platform, a conveying drive motor fixedly connected to the top surface of the working support platform, a conveying assembly disposed on the output shaft of the conveying drive motor, a detection support platform fixedly connected to the top surface of the working support platform, a chip detection assembly disposed on the top surface of the detection support platform, a correction support platform fixedly connected to the top surface of the working support platform, a correction pushing assembly disposed on the top surface of the correction support platform, a guiding support platform fixedly connected to the top surface of the working support platform, and a guiding collection assembly disposed on the top surface of the guiding support platform.
[0009] Preferably, the top surface of the working support platform is fixedly connected to two rotating support platforms that are equidistantly distributed, the top surface of the working support platform is provided with a transmission groove, the top surface of the working support platform is fixedly connected to symmetrically distributed correction support platforms, and the top surface of the working support platform is fixedly connected to a detection support platform.
[0010] Preferably, the conveying assembly includes a conveying drive motor, a transmission wheel, a conveyor belt, and push rods. The output shaft of the conveying drive motor is fixedly connected to the transmission wheel, and the top surface of the rotating support platform is rotatably connected to the transmission wheel. The outer side of the transmission wheel is frictionally connected to the conveyor belt, and the outer side of the conveyor belt is fixedly connected to push rods that are evenly distributed.
[0011] Preferably, the chip testing component includes a controller and a chip tester, with the controller fixedly connected to the top surface of the testing support platform and the chip tester fixedly connected to the bottom surface of the controller.
[0012] Preferably, the correction pushing assembly includes a correction pushing cylinder, a correction pushing plate, and a drive push rod. The correction pushing cylinder is fixedly connected to the top surface of the correction support platform, the drive push rod is slidably connected to the inner side of the correction pushing cylinder, the correction pushing plate is fixedly connected to the inner side of the drive push rod, and the correction pushing assembly is provided on the inner bottom surface of the detection support platform.
[0013] Preferably, the diversion and collection assembly includes a flow direction support plate, a chip collection box, a diversion rotation rod, and a diversion drive motor. The top surface of the working support platform is fixedly connected with symmetrically distributed flow direction support plates, and the top surface of the working support platform is fixedly connected with symmetrically distributed chip collection boxes. The top of the diversion support platform is fixedly connected with a rotating support platform, and the bottom of the rotating support platform has a rotation hole. The top of the rotating support platform is fixedly connected with a diversion drive motor, and the output shaft of the diversion drive motor is fixedly connected with a diversion rotation rod. The diversion rotation rod is rotatably connected to the inner side of the rotation hole.
[0014] (III) Beneficial Effects
[0015] Compared with the prior art, the advantages of this utility model are:
[0016] This invention, through the design of the correction and pushing component, corrects the position of the chip during testing to facilitate comprehensive testing and avoid inaccurate test results due to positional deviation. At the same time, the correction and pushing component at the rear pushes the tested chip to the correct position, and finally pushes the chip into the collection box through the guiding and collecting component. Attached Figure Description
[0017] Figure 1 This is a schematic diagram of the overall structure of this utility model;
[0018] Figure 2 This is a schematic diagram showing the overall structure of this utility model disassembled;
[0019] Figure 3 This is a cross-sectional view of the overall structure of this utility model;
[0020] Figure 4 This is a cross-sectional schematic diagram of the correction and detection component in part of the structure of this utility model.
[0021] In the diagram: 1. Working support platform; 2. Conveyor drive motor; 3. Transmission wheel; 4. Conveyor belt; 5. Push rod; 6. Correction support platform; 7. Correction push cylinder; 8. Flow direction support plate; 9. Chip collection box; 10. Direction rotation rod; 11. Direction support platform; 12. Rotation support platform one; 13. Direction drive motor; 14. Correction push plate; 15. Detection support platform; 16. Controller; 17. Chip tester; 18. Rotation support platform two; 19. Transmission groove; 20. Drive push rod; 21. Rotation hole. Detailed Implementation
[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0023] Please see Figure 1-4 This utility model provides a technical solution;
[0024] A chip testing and sorting device includes a working support platform 1, a conveying drive motor 2 fixedly connected to the top surface of the working support platform 1, a conveying component provided on the output shaft of the conveying drive motor 2, a detection support platform 15 fixedly connected to the top surface of the working support platform 1, a chip detection component provided on the top surface of the detection support platform 15, a correction support platform 6 fixedly connected to the top surface of the working support platform 1, a correction pushing component provided on the top surface of the correction support platform 6, and a guiding support platform 11 fixedly connected to the top surface of the working support platform 1, a guiding collection component provided on the top surface of the guiding support platform 11.
[0025] Furthermore, the top surface of the working support platform 1 is fixedly connected with equidistantly distributed rotating support platforms 18, the top surface of the working support platform 1 is provided with a transmission groove 19, the top surface of the working support platform 1 is fixedly connected with symmetrically distributed correction support platforms 6, and the top surface of the working support platform 1 is fixedly connected with a detection support platform 15.
[0026] Furthermore, the conveying assembly includes a conveying drive motor 2, a transmission wheel 3, a conveyor belt 4, and push rods 5. The output shaft of the conveying drive motor 2 is fixedly connected to the transmission wheel 3, and the top surface of the rotating support platform 18 is rotatably connected to the transmission wheel 3. The outer side of the transmission wheel 3 is frictionally connected to the conveyor belt 4, and the outer side of the conveyor belt 4 is fixedly connected to push rods 5 distributed at equal intervals. Through the action of the conveying assembly, the chip is transported for testing, and the chip is pushed and transported by the push rods 5 on the surface of the conveyor belt 4.
[0027] Furthermore, the chip testing component includes a controller 16 and a chip tester 17. The controller 16 is fixedly connected to the top surface of the testing support platform 15, and the chip tester 17 is fixedly connected to the bottom surface of the controller 16. Through the function of the chip testing component, comprehensive testing of the chip can be achieved.
[0028] Furthermore, the correction and pushing assembly includes a correction and pushing cylinder 7, a correction and pushing plate 14, and a drive push rod 20. The correction and pushing cylinder 7 is fixedly connected to the top surface of the correction support platform 6, and the drive push rod 20 is slidably connected to the inner side of the correction and pushing cylinder 7. The correction and pushing plate 14 is fixedly connected to the inner side of the drive push rod 20. The correction and pushing assembly is provided on the inner bottom surface of the detection support platform 15. Through the action of the correction and pushing assembly on the right, the chip is corrected in position for comprehensive detection. At the same time, through the action of the correction and pushing assembly on the left, the chip after detection is pushed in position to facilitate the subsequent sorting and collection by the diversion and collection assembly.
[0029] Furthermore, the diversion collection assembly includes a flow support plate 8, a chip collection box 9, a diversion rotation rod 10, and a diversion drive motor 13. The top surface of the working support platform 1 is fixedly connected to symmetrically distributed flow support plates 8, and the top surface of the working support platform 1 is fixedly connected to symmetrically distributed chip collection boxes 9. The top of the diversion support platform 11 is fixedly connected to a rotating support platform 12, the bottom of the rotating support platform 12 is provided with a rotation hole 21, the top of the rotating support platform 12 is fixedly connected to a diversion drive motor 13, the output shaft of the diversion drive motor 13 is fixedly connected to a diversion rotation rod 10, and the inner side of the rotation hole 21 is rotatably connected to the diversion rotation rod 10. Through the action of the diversion collection assembly, the detected chips are classified and collected.
[0030] Working principle: When this utility model is needed, the conveyor drive motor 2 is started, driving the transmission wheel 3 on the output shaft to rotate. Since the transmission wheel 3 is frictionally connected to the outer side of the conveyor belt 4, and the rotating support platform 18 provides rotational support for the transmission wheel 3, the rotation of the transmission wheel 3 drives the conveyor belt 4 to circulate. The push rods 5, which are equidistantly distributed on the outer side of the conveyor belt 4, move together with the conveyor belt 4. The push rods 5 push the chip placed on the conveyor belt 4 forward for transport, realizing the transport of the chip. Before the chip is transported to the detection area, the correction push cylinder 7 on the right correction support platform 6 is activated, pushing the drive push rod 20, which is slidably connected to its inner side, to move inward. The drive push rod 20 drives the correction push plate 14, which is fixed on the inner side, to move inward. The correction push plate 14 corrects the position of the chip, ensuring that the chip is accurately positioned when entering the detection area, so that the chip detection component can perform comprehensive detection of the chip. After correction, the chip continues to be transported by the conveyor belt 4 to the bottom of the detection support platform 15. The controller 1 is fixed on the top surface of the detection support platform 15. The chip tester 17 on the control bottom surface performs a comprehensive test on the chip, obtaining various performance parameters and other information to determine whether the chip is qualified and other related characteristics. After the test is completed, the correction push assembly on the left correction support platform 6 works, and the correction push cylinder 7 pushes the drive push rod 20, which in turn drives the correction push plate 14 to push the tested chip away from the conveyor belt 4 to the area where the diversion collection assembly is located. The diversion drive motor 13 on the rotating support platform 12 fixed at the top of the diversion support platform 11 starts, driving the diversion rotation rod 10 on the output shaft to rotate in the rotation hole 21. According to the chip test results, the diversion rotation rod 10 rotates to the appropriate position and diverts the chip to the corresponding flow support plate 8. The chip slides along the flow support plate 8 into the corresponding chip collection box 9, realizing the classification and collection of the tested chips. For example, qualified chips are diverted to one flow support plate 8 and enter one chip collection box 9, while unqualified chips are diverted to another flow support plate 8 and enter another chip collection box 9, meeting different processing and sorting requirements.
[0031] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.
Claims
1. A chip testing and sorting device, comprising a work support stage (1), characterized in that: The top surface of the working support platform (1) is fixedly connected to a conveying drive motor (2), and the output shaft of the conveying drive motor (2) is provided with a conveying component. The top surface of the working support platform (1) is fixedly connected to a detection support platform (15), and the top surface of the detection support platform (15) is provided with a chip detection component. The top surface of the working support platform (1) is fixedly connected to a correction support platform (6), and the top surface of the correction support platform (6) is provided with a correction pushing component. The top surface of the working support platform (1) is fixedly connected to a steering support platform (11), and the top surface of the steering support platform (11) is provided with a steering collection component.
2. The chip testing and sorting device according to claim 1, characterized in that: The top surface of the working support platform (1) is fixedly connected to two rotating support platforms (18) that are evenly distributed. The top surface of the working support platform (1) is provided with a transmission groove (19). The top surface of the working support platform (1) is fixedly connected to a symmetrically distributed correction support platform (6). The top surface of the working support platform (1) is fixedly connected to a detection support platform (15).
3. The chip testing and sorting device according to claim 2, characterized in that: The conveying assembly includes a conveying drive motor (2), a transmission wheel (3), a conveyor belt (4), and push rods (5). The output shaft of the conveying drive motor (2) is fixedly connected to the transmission wheel (3). The top surface of the rotating support platform (18) is rotatably connected to the transmission wheel (3). The outer side of the transmission wheel (3) is frictionally connected to the conveyor belt (4). The outer side of the conveyor belt (4) is fixedly connected to push rods (5) that are evenly distributed.
4. The chip testing and sorting device according to claim 2, characterized in that: The chip testing assembly includes a controller (16) and a chip tester (17). The top surface of the testing support platform (15) is fixedly connected to the controller (16), and the bottom surface of the controller (16) is fixedly connected to the chip tester (17).
5. The chip testing and sorting device according to claim 2, characterized in that: The correction pushing assembly includes a correction pushing cylinder (7), a correction pushing plate (14), and a drive push rod (20). The top surface of the correction support platform (6) is fixedly connected to the correction pushing cylinder (7). The inner side of the correction pushing cylinder (7) is slidably connected to the drive push rod (20). The inner side of the drive push rod (20) is fixedly connected to the correction pushing plate (14). The bottom surface of the detection support platform (15) is provided with the correction pushing assembly.
6. The chip testing and sorting device according to claim 1, characterized in that: The diversion and collection assembly includes a flow support plate (8), a chip collection box (9), a diversion rotation rod (10), and a diversion drive motor (13). The top surface of the working support platform (1) is fixedly connected with symmetrically distributed flow support plates (8). The top surface of the working support platform (1) is fixedly connected with symmetrically distributed chip collection boxes (9). The top of the diversion support platform (11) is fixedly connected with a rotating support platform (12). The bottom of the rotating support platform (12) is provided with a rotation hole (21). The top of the rotating support platform (12) is fixedly connected with a diversion drive motor (13). The output shaft of the diversion drive motor (13) is fixedly connected with a diversion rotation rod (10). The inner side of the rotation hole (21) is rotatably connected with the diversion rotation rod (10).