Foreign matter measurement method, foreign matter measurement device and calibration substrate
The foreign substance measuring method and device utilize a dual-light imaging approach with a dome-shaped illumination unit to accurately count reflective and non-reflective foreign substances on automotive parts, addressing the limitations of existing systems with high precision and cost-effectiveness.
Patent Information
- Application Number
- JP2023189667
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2023-11-06
- Publication Date
- 2025-05-19
- Estimated Expiration
- 2043-11-06
AI Technical Summary
Existing foreign matter measurement systems struggle to accurately differentiate and count reflective and non-reflective foreign substances on automotive parts, while also being cost-effective and requiring high precision.
A foreign substance measuring method and device that uses a combination of transmitted and reflected light imaging, with a dome-shaped reflection illumination unit, to capture and count foreign substances, including reflective and non-reflective types, using a relatively inexpensive imaging unit and calibration substrate.
The method achieves high-precision measurement of foreign substances by accurately differentiating and counting reflective and non-reflective particles, while the device is cost-effective due to the use of a single imaging unit for both light types, and the calibration substrate ensures accurate calibration.