Terahertz wave observation device
The terahertz wave observation apparatus facilitates direct observation of terahertz waves within a nonlinear crystal by employing excitation, probe, and optional injection light sources, along with prism couplers and imaging, enhancing observation capabilities for practical applications.
Patent Information
- Application Number
- JP2024227634
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-12-24
- Publication Date
- 2026-07-06
AI Technical Summary
Direct observation of terahertz waves generated inside a nonlinear crystal is difficult due to the complex wavelength conversion process in terahertz wave parametric generation, despite numerical simulations being available.
A terahertz wave observation apparatus comprising a nonlinear crystal, excitation and probe light sources, prism couplers, and an imaging device to capture detected Stokes light generated by the interaction between probe light and terahertz waves, with optional amplification and injection light for enhanced observation.
Enables direct observation of terahertz waves within the nonlinear crystal, allowing for optimization of parameters and system checks for practical applications, using a CMOS camera for imaging.