A structured light super-depth-of-field measurement system based on in-focus and out-of-focus algorithms
The structured light ultra-depth-of-field measurement system based on focusing and defocusing algorithms solves the problems of 3D imaging quality and low measurement efficiency for objects without obvious texture features, and achieves high-precision and high-speed 3D measurement, which is suitable for non-contact measurement of complex shapes and objects with high detail.
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- BEIJING BOVISION TECH CO LTD
- Filing Date
- 2026-04-14
- Publication Date
- 2026-07-10
AI Technical Summary
Existing technologies struggle to extract effective feature points when processing objects without obvious texture features, resulting in poor 3D imaging quality. Furthermore, traditional structured light measurement systems have low measurement efficiency, making it difficult to meet the high-speed requirements of industrial automation online inspection.
A structured light ultra-depth measurement system based on focusing and defocusing algorithms is adopted. A linear motor drives the microscope objective to scan longitudinally, and a periodic grating phase-shifting stripe is projected by a structured light projector. Images are acquired using a high-speed industrial camera, and three-dimensional coordinate information is calculated through modulation demodulation and peak positioning algorithms to generate a three-dimensional topographic image.
It achieves high-precision 3D measurement over a large depth range, is suitable for complex shapes and highly detailed objects, has non-contact measurement capabilities, is suitable for sensitive or fragile objects, and has a fast measurement speed, making it suitable for industrial automation and online inspection.
Smart Images

Figure CN122360342A_ABST