Systems and methods for measuring the concentration of analytes
A hybrid III-V/IV semiconductor SoC addresses scalability and complexity issues in spectroscopic analyte measurement, enabling accurate, real-time monitoring of analytes in wearable devices through scattering corrections and multivariate regression.
Patent Information
- Application Number
- KR1020227022133
- Authority / Receiving Office
- KR · KR
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2019-12-06
- Filing Date
- 2020-12-03
- Publication Date
- 2026-09-02
- Estimated Expiration
- 2040-12-03
AI Technical Summary
Existing spectroscopic non-invasive analyte measurement techniques, such as near-infrared spectroscopy, are cumbersome and impractical for consumer electronics due to their large and complex structures, while hybrid III-V/IV semiconductor photonic systems face scalability issues with high absorption and optical confinement, limiting their application in consumer electronics and wearable devices.
A hybrid III-V/IV semiconductor photonic system-on-a-chip (SoC) with integrated emission wavelength tuning and absolute wavelength correction is used for non-invasive analyte measurement, employing optical communication with biological materials to correct for complex biological signals, utilizing scattering corrections and multivariate regression to derive accurate analyte concentrations.
Enables accurate, real-time monitoring of analytes like glucose and lactate in wearable devices by correcting for tissue scattering and absorption, providing precise concentration levels despite complex biological environments.