Reverse bias test sample protection method and device

A technology for testing samples and samples, which is applied in the field of reverse bias test protection, can solve the problems of slow withstand voltage, high test cost, high hardware cost, etc., and achieve accurate and timely protection, increased complexity, and high protection precision.

CN109406980BActive Publication Date: 2020-07-28PRIME REL ELECTRONIC TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Publication Date
2020-07-28

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Abstract

The present invention relates to a reverse bias test sample protection method and device. The method provides a plurality of samples to be tested, a gate bias voltage circuit and a reverse bias voltage circuit. The device further comprises a fuse group and a low-voltage relay group, the fuse group comprises protection fuses having the same quantity as the samples to be tested, the low-voltage relay group comprises low-voltage relays having the same quantity as the samples to be tested, the first end of each sample to be tested is electrically connected with the gate bias voltage circuit, the second end of each sample to be tested is connected with the first end of a corresponding protection fuse in the fuse group and the first end of a normally open contact of a corresponding low-voltage relay in the low-voltage relay set, the second end of each fuse is electrically connected with the reverse bias voltage circuit, the second end of the normally open contact of each low-voltage relay isconnected with one end of the normally open contact of a high-voltage relay KM0, and the other end of the normally open contact of the high-voltage relay KM0 is earthed. The protection trigger current can be flexibly set to improve the response speed and protection accuracy of the protection motion.
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Description

technical field

[0001] The invention relates to a method and a device, in particular to a reverse bias test sample protection method and device, belonging to the technical field of reverse bias test protection. Background technique

[0002] HTRB (High Temperature Reverse Bias, high temperature reverse bias test) is an accelerated life test. During the test, specific electrical conditions are applied to the sample to be tested, and then the sample is placed in a high temperature environment at a specific temperature (such as 125°C) for a specific time ( such as 1000 hours). By applying such harsh environment and electrical stress to the device to be tested to investigate whether the characteristics of the sample to be tested will be degraded, thereby judging or evaluating the quality of the sample to be tested.

[0003] h 3 TRB (High Temperature High Humidity Reverse Bias, high temperature and high humidity reverse bias test) is an accelerated life test. During the test, sp...

Examples

Embodiment Construction

[0065] The present invention will be further described below in conjunction with specific drawings and embodiments.

[0066] like Image 6Shown: In order to achieve the flexible setting of the protection trigger current and improve the response speed and protection accuracy of the protection action, the present invention provides several samples to be tested, a grid bias voltage circuit for loading the grid bias voltage to the samples to be tested, and a grid bias voltage circuit for applying The sample to be tested is loaded with a reverse bias voltage circuit; it also includes a fuse group and a low-voltage relay group that are adapted to be connected to the sample to be tested, and the fuse group includes protective fuses that are consistent with the number of samples to be tested, The low-voltage relay group includes low-voltage relays consistent with the number of samples to be tested;

[0067] The first end of each sample to be tested is electrically connected to the gr...