A device and method for measuring thickness parameters of spherical cover optical element

Abstract

A device and method for measuring thickness parameters of a spherical cover optical element, including a dial base, a bottom plate, an active dial rod, a micrometer, an adjustment clip, a fastening screw, a slot screw and a rotating stud; the micrometer is connected to the active dial rod, the active dial rod is fixed to the dial base, and the dial base is fixed to one end of the bottom plate by adsorption. The invention is used for rapid measurement of thickness parameters of spherical cover optical elements, has high accuracy, simple operation, high efficiency, is suitable for manual operation on site in a workshop, and can provide data reference for further processing for front-line workers.

Description

Technical Field

[0001] The present invention relates to the field of optical element processing parameter detection, and is mainly used for simple measurement of thickness parameters of spherical cover optical elements, and is particularly suitable for measurement of thickness parameters of spherical cover optical elements with large aperture, large steepness, super hemispherical, and easily deformed. The device is simple to operate, has high efficiency and accuracy, is suitable for manual operation on site in the workshop, and can provide data reference for further processing for front-line workers. Background Art

[0002] Spherical cover optical components have always been a difficult problem in the field of optical processing and detection due to their large aperture and steepness, some of which are even super-hemispherical. Among them, the equal thickness parameter of the spherical cover component is a key indicator, which directly affects the imaging quality and use effect of this type of component. If the equal thickness parameter of this type of component is not properly controlled, it will cause stress concentration, which will not only cause later imaging distortion, but also cause serious damage to this type of component. At present, the processing of this type of component generally uses CNC milling machines to mill the appearance, and then uses high-polishing machines to polish the surface and ensure a series of indicators such as equal thickness and parallelism. When measuring the equal thickness parameters, the spherical cover component is generally placed on the workbench, and the worker uses a micrometer to manually slowly translate and measure multiple times to find the center point to obtain the actual equal thickness value. This method has large errors and relies entirely on the workers' experience and feel, and cannot fully represent the actual equal thickness value. Once the error is too large, it will directly lead to the scrapping of the subsequent repair processing. This poses a great risk to both the processing indicators and the surface quality of ultra-high precision optical components. Therefore, there is an urgent need for a simple and fast spherical cover component equal thickness parameter measurement device to achieve rapid measurement and feedback of equal thickness data, providing workers with first-hand reference. Summary of the invention

[0003] The purpose of the present invention is to provide a simple measuring device and method for thickness parameters of spherical cover optical elements, which overcomes the shortcomings of large error and large empirical ratio in current thickness parameter measurement data of spherical cover optical elements and improves the accuracy and efficiency of detection.

[0004] The technical solution of the present invention is as follows:

[0005] A measuring device for measuring thickness parameters of a spherical cover optical element, characterized in that the measuring device comprises a table base, a bottom plate, a movable table rod, a micrometer, an adjustment clamping strip, a fastening screw, a clamping screw and a rotating stud;

[0006] The micrometer is connected to a movable dial rod, the movable dial rod is fixed on a dial base, and the dial base is adsorbed and fixed on one end of the bottom plate;

[0007] The bottom plate is provided with a circular groove and at least three strip grooves, one end of each strip groove is connected with the circular groove, each strip groove is provided with an adjustment clip, and each adjustment clip is fixed with the fastening screw, the clip screw and the rotating stud in sequence from the end close to the circular groove to the outer end;

[0008] The adjusting clamping strip can be moved in the strip groove and fixed by a fastening screw. The height of each rotating stud is the same, which is used for the in-situ rotation of the ball cover element to measure the equal thickness data under the same sagittal height. The height of each clamping screw is the same, which is used to clamp the upper edge of the ball cover element.

[0009] During measurement, the needle of the micrometer contacts the ball cover element.

[0010] The circular groove is located at the center of the bottom plate.

[0011] The adjusting clip strip, the fastening screw, the slot screw rod and the rotating stud can be replaced and adjusted according to the sizes of different ball cover elements.

[0012] A motor is also provided, the rotating shaft of which is connected to the rotating stud, so that automatic rotation measurement of the component can be realized.

[0013] A method for measuring thickness parameters of a spherical cover optical element, characterized in that the method comprises the following steps:

[0014] Step 1) adjusting the positions of the adjusting strips, the slot screws and the rotating studs according to the diameter of the spherical cover element, so that the upper edge of the spherical cover element is stuck in the plane formed by all the slot screws, and fixing the adjusting strips by tightening the screws;

[0015] Step 2) adjusting the dial gauge so that the needle of the dial gauge vertically contacts the outer edge or the inner edge of the ball cover element;

[0016] Step 3) Ensure that the ball cover element rotates in the same sagittal height plane, and observe and record the micrometer at the same time;

[0017] Step 4) Adjust the micrometer so that the needle of the micrometer vertically contacts different positions of the spherical cover element, and rotate the spherical cover element at the same time, so as to complete the measurement of equal thickness parameters of the spherical cover element under different sagittal height conditions.

[0018] Compared with the prior art, the present invention has the following beneficial effects:

[0019] 1) Suitable for measuring the thickness parameters of other spherical elements.

[0020] 2) The micrometer can realize digital detection.

[0021] 3) It is simple to operate, with high efficiency and precision, suitable for manual operation on site in the workshop, and can provide data reference for further processing for front-line workers. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 : Diagram of the measuring device for the thickness parameters of the spherical cover element;

[0023] In the figure: 1-meter base, 2-movable meter rod, 3-micrometer, 4-ball cover element, 5-slot screw, 6-base plate, 7-adjusting clip strip, 8-fastening screw, 9-rotating stud. DETAILED DESCRIPTION

[0024] The present invention will be further described below in conjunction with embodiments and drawings, but the protection scope of the present invention shall not be limited thereto.

[0025] See the attached embodiment Figure 1 , which is a simple measuring device and method for equal thickness parameters of a spherical cover-shaped optical element of the present invention, characterized in that the measuring device mainly comprises a base plate 6, a micrometer 3, three adjusting clips 7, three fastening screws 8, three slot screws 5, three rotating studs 9 and a spherical cover element 4; wherein the micrometer 3 is connected to the movable table rod 2, and the movable table rod 2 is fixed on the table base 1; the table base 1 is adsorbed and fixed on one end of the base plate 6; a circular groove is opened in the center of the base plate 6, and strip grooves are opened along the 120° direction of the circular groove respectively, and three adjusting clips 7 are respectively embedded in the middle of the strip grooves, and the adjusting clips 7 can move back and forth in the strip grooves to adjust the spacing; fastening screws 8, slot screws 5 and rotating studs 9 are respectively fixed on each adjusting clip 7 from the outside to the inside, wherein the three fastening screws 8 respectively fix the three adjusting clips 7, the three slot screws 5 have the same height and are used to clamp the upper edge of the spherical cover element 4, and the three rotating studs 9 have the same height and are used for in-situ rotation of the spherical cover element 4 during measurement to measure equal thickness data under the same vector height;

[0026] The simple measuring device and method for the equal thickness parameters of the spherical cover optical element described above, the operation process is to first calculate the relative positions of the three adjustment clips 7, three fastening screws 8, three slot screws 5 and three rotating studs 9 according to the caliber of the spherical cover element; then use the three fastening screws 8 to fix the three adjustment clips 7, and then fix the three rotating studs 9 to the corresponding positions of the three adjustment clips 7, and then place the measured spherical cover element 4 flat on the three rotating studs 9, and adjust the position so that the upper edge of the measured spherical cover element 4 is just stuck in the plane formed by the three slot screws 5; then adjust the micrometer 3 so that its needle vertically contacts the outer edge or inner edge of the spherical cover element 4; rotate the spherical cover element 4 to keep it in the same sagittal height plane, and observe the micrometer reading to complete the equal thickness parameter measurement of the spherical cover element 4 under the sagittal height condition. Adjusting the micrometer 3 so that it vertically contacts different positions of the spherical cover element 4, and rotating the spherical cover element 4 can complete the measurement of the equal thickness parameters of the spherical cover element 4 under different sagittal height conditions.

[0027] The simple measuring device and method for thickness parameters of a spherical cover optical element are characterized in that the three adjustment clips 7, three fastening screws 8, three slot screws 5 and three rotating studs 9 can be replaced and adjusted according to the sizes of different spherical cover elements.

[0028] The simple measuring device and method for equal thickness parameters of a spherical cover optical element are characterized in that the method can be applied to the measurement of equal thickness parameters of other spherical elements.

[0029] The simple measuring device and method for thickness parameters of a spherical cover optical element are characterized in that the micrometer can realize digital detection.

Claims

1. A device for measuring thickness parameters of spherical cover optical elements, characterized in that The measuring device comprises a meter base (1), a bottom plate (6), a movable meter rod (2), a dial gauge (3), an adjustment clip (7), a fastening screw (8), a slot screw (5) and a rotating stud (9); The micrometer (3) is connected to the movable dial rod (2), the movable dial rod (2) is fixed on the dial base (1), and the dial base (1) is adsorbed and fixed on one end of the bottom plate (6); The bottom plate (6) is provided with a circular groove and at least three strip grooves, one end of each strip groove is connected to the circular groove, and an adjustment clip (7) is provided in each strip groove, and each adjustment clip (7) is fixed with the fastening screw (8), the slot screw (5) and the rotating stud (9) in sequence from the end close to the circular groove to the outer end; The adjusting clamping strip (7) moves in the strip groove and is fixed by a fastening screw (8). Each rotating stud (9) has the same height and is used for the in-situ rotation of the spherical cover element (4) to measure the equal thickness data under the same sagittal height. Each clamping screw (5) has the same height and is used for clamping the upper edge of the spherical cover element (4). During measurement, the needle of the micrometer (3) contacts the ball cover element (4), and the upper edge of the ball cover element (4) is clamped in the plane formed by all the clamping screws (5) by adjusting the positions of the adjusting clips (7), the clipping screws (5) and the rotating studs (9).

2. The device for measuring thickness parameters of a spherical cover optical element according to claim 1, characterized in that The circular groove is located at the center of the bottom plate (6).

3. The device for measuring thickness parameters of a spherical cover optical element according to claim 1, characterized in that The adjusting clip strip (7), the fastening screw (8), the slot screw rod (5) and the rotating stud (9) are replaced and adjusted according to the sizes of different ball cover elements.

4. The device for measuring thickness parameters of a spherical cover optical element according to any one of claims 1 to 3, characterized in that A motor is also provided, the rotating shaft of the motor is connected to the rotating stud (9), so as to realize automatic rotation measurement of the spherical cover element.

5. A method for measuring thickness parameters of a spherical cover-shaped optical element using the device for measuring thickness parameters of a spherical cover-shaped optical element according to claim 1, characterized in that: The method comprises the following steps: Step 1) adjusting the positions of the adjusting strips (7), the slot screws (5) and the rotating studs (9) according to the diameter of the spherical cover element, so that the upper edge of the spherical cover element (4) is stuck in the plane formed by all the slot screws (5), and the adjusting strips (7) are fixed by tightening screws (8); Step 2) adjusting the dial gauge (3) so that the needle of the dial gauge (3) vertically contacts the outer edge or the inner edge of the ball cover element (4); Step 3) Ensure that the ball cover element (4) rotates in the same sagittal height plane, and observe and record the micrometer (3); Step 4) adjusting the micrometer (3) so that the needle of the micrometer (3) vertically contacts different positions of the spherical cover element (4), and rotating the spherical cover element (4) to complete the measurement of equal thickness parameters of the spherical cover element (4) under different sagittal height conditions.

Images