Photosensitive resin composition and photoresist
By compounding two photosensitive resins and introducing initiators and photopolymerizable monomers, the problems of insufficient adhesion and developability of photosensitive resins in black matrix photoresist are solved, and a black matrix material with high sensitivity and uniform CD is achieved.
Patent Information
- Application Number
- CN201910937146.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2019-09-29
- Publication Date
- 2025-09-05
- Estimated Expiration
- 2039-09-29
AI Technical Summary
Existing photosensitive resins are difficult to achieve both high adhesion and high developability in black matrix photoresists, resulting in the photoresist being easily peeled off or having an excessively high residual film rate after alkaline washing and development.
A compounding scheme of two photosensitive resins is adopted, one of which is a high molecular weight photosensitive resin (weight average molecular weight of 6300-7800) and the other is a low molecular weight photosensitive resin (weight average molecular weight of 5000-5500). Initiators and photopolymerizable monomers are added, and their proportion and composition are optimized to improve adhesion and developability.
A high-sensitivity, CD-uniform black matrix is achieved, which improves the light-curing performance, adhesion and alkali solvent resistance, and reduces the residual film rate.