Method, system and device for analyzing leaf area of living long leaves based on image stitching
Through image stitching technology, the problem of long leaf area measurement was solved, and high-precision, non-destructive leaf parameter measurement was achieved, which is suitable for the analysis of insect damage and lesions on living leaves.
CN112700488BActive Publication Date: 2025-09-12ZHEJIANG TUOPUYUN AGRI SCI & TECH CO LTD
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Patent Information
- Application Number
- CN202011461462.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2020-12-11
- Publication Date
- 2025-09-12
- Estimated Expiration
- 2040-12-11
AI Technical Summary
Technical Problem
Existing technologies make it difficult to measure the area of long leaves efficiently and non-destructively, and existing equipment is complex or highly destructive, making it unsuitable for analyzing insect damage and lesions on living leaves.
Method used
An image stitching-based method is used to obtain a complete picture of the long leaf through color segmentation, shadow interference removal and image stitching, and its related parameters are calculated.
Benefits of technology
It achieves high-precision, non-destructive measurement of long leaf areas, is easy to carry, suitable for indoor and outdoor use, and can preserve leaf characteristics for subsequent analysis.
✦ Generated by Eureka AI based on patent content.
Abstract
The present invention discloses a method for analyzing the leaf area of living long leaves based on image stitching, comprising the following steps: in response to receiving a request to calculate the leaf area, segmenting the leaf image to be analyzed to obtain a color segmented image of the leaf, wherein the leaf image to be analyzed is a leaf image in which at least one-fifth of adjacent images are repeated; stitching all the color segmented images of the leaf in pairs to obtain a complete leaf image; obtaining the outer contour of the leaf through the complete leaf image, and obtaining relevant parameters of the leaf, wherein the relevant parameters are one or more of the leaf area, leaf circumference, leaf length and width, shape factor and shape coefficient. The method has high measurement accuracy, is simple, does not damage the leaf, is easy to carry, can be used indoors and outdoors, and has strong anti-interference ability. The leaf result obtained by the invention is a color image, which not only retains the leaf characteristics, but also facilitates the subsequent analysis of leaf insect damage, lesions and other characteristics.
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