Test plan determination method, device, medium and electronic device

Abstract

The embodiments of the present application disclose a method, device, medium and electronic device for determining a test plan. The method includes: obtaining a to-do work item, and determining the test requirement type corresponding to the to-do work item as the to-be-tested requirement type; mapping the to-be-tested requirement type based on the UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as the target template type; and determining a target test plan template to be recommended from the candidate test plan templates according to the target template type. By implementing the technical solution of the present application, it is realized to intelligently recommend a matching test plan template for the to-do work item, improving the test efficiency.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of computer application technologies, and in particular, to a method, device, medium, and electronic device for determining a test plan. Background Art

[0002] In agile development, a feature work item is a collection of related user stories. User stories within the same feature work item share commonalities, and related user stories can be associated through feature work items. In agile development, in order to deliver valuable software products to customers as early as possible, testing needs to be involved during the development phase of the software product.

[0003] A feature work item is a development unit in agile development. When testing a software product, the feature work item is also used as a test unit to implement the testing of the software product. To test a feature work item, a test plan needs to be formulated. Currently, test plans mainly rely on testers to manually formulate them, and there are generally problems of low test efficiency and waste of human resources. Summary of the Invention

[0004] The embodiments of the present application provide a method, device, medium, and electronic device for determining a test plan, which can intelligently recommend a matching test plan template for a to-do work item, thereby achieving the purpose of improving test efficiency.

[0005] In a first aspect, the embodiments of the present application provide a method for determining a test plan, the method comprising:

[0006] Obtain a to-do work item, and determine the test requirement type corresponding to the to-do work item as the to-be-tested requirement type;

[0007] Map the to-be-tested requirement type based on a UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as the target template type;

[0008] Determine a target test plan template to be recommended from candidate test plan templates according to the target template type.

[0009] In a second aspect, the embodiments of the present application provide a device for determining a test plan, the device comprising:

[0010] A to-be-tested requirement type determination module, configured to obtain a to-do work item, and determine the test requirement type corresponding to the to-do work item as the to-be-tested requirement type;

[0011] A target template type determination module, configured to map the to-be-tested requirement type based on a UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as the target template type;

[0012] A target test plan template determination module to be recommended is used to determine a target test plan template to be recommended from candidate test plan templates according to the target template type.

[0013] In a third aspect, an embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored. When the program is executed by a processor, it implements the test plan determination method as described in the embodiment of the present application.

[0014] In a fourth aspect, an embodiment of the present application provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor. When the processor executes the computer program, it implements the test plan determination method as described in the embodiment of the present application.

[0015] The technical solution provided by the embodiment of the present application obtains a to-do work item, determines the test requirement type corresponding to the to-do work item as the to-be-tested requirement type, maps the to-be-tested requirement type based on the UV recommendation matrix, and obtains a test plan template type associated with the to-be-tested requirement type as the target template type. According to the target template type, a target test plan template to be recommended is determined from candidate test plan templates. By executing the technical solution provided by the present application, according to the test requirement type corresponding to the to-do work item, the UV recommendation matrix can be used to intelligently recommend a test technology template suitable for the to-do work item to the user from candidate test plan templates, greatly reducing the repetitive work done by testers in the process of formulating test plans, improving test efficiency, promoting the product R & D process, and accelerating the product delivery progress. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 is a flowchart of a test plan determination method provided by Embodiment 1 of the present application;

[0017] Figure 2 is a flowchart of another test plan determination method provided by Embodiment 2 of the present application;

[0018] Figure 3 is a schematic structural diagram of a test plan determination device provided by Embodiment 3 of the present application;

[0019] Figure 4 is a schematic structural diagram of an electronic device provided by Embodiment 5 of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0020] The present application will be further described in detail below with reference to the drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the present application, rather than limiting the present application. Additionally, it should be noted that for the sake of description, only parts related to the present application are shown in the drawings rather than all structures.

[0021] Before discussing the exemplary embodiments in more detail, it should be mentioned that some exemplary embodiments are described as processes or methods depicted as flowcharts. Although the flowcharts describe the steps as sequential processes, many of the steps can be implemented in parallel, concurrently, or simultaneously. In addition, the order of the steps can be rearranged. The process can be terminated when its operations are completed, but it can also have additional steps not included in the drawings. The process can correspond to a method, function, procedure, subroutine, subprogram, and so on.

[0022] Embodiment 1

[0023] Figure 1 It is a flowchart of a test plan determination method provided in Embodiment 1 of this application. This embodiment is applicable to the situation of automatically recommending a matching test plan template for a feature work item in agile test development. This method can be executed by the test plan determination device provided in the embodiments of this application. The device can be implemented in a software and / or hardware manner and can be integrated into an electronic device running this system.

[0024] As Figure 1 shown, the test plan determination method includes:

[0025] S110. Obtain a to-do work item and determine the test requirement type corresponding to the to-do work item as the to-be-tested requirement type.

[0026] Among them, the to-do work item refers to a feature work item to be tested. In agile development, the work item, the feature work item includes: user requirements, features, and user stories. A feature work item is a collection of related user stories. User stories in the same feature work item have commonalities, and related user stories can be associated through the feature work item.

[0027] The software testing process is actually a process of verifying a software product during or after development. Test requirements are closely related to development requirements. The test requirement type of a to-do work item can be determined according to the development requirements in the to-do work item. Specifically, the development requirements can be divided from the functional dimension to obtain the test requirement type of the to-do work item. Both test requirements and development requirements are related to the business scenarios to which the software product is applied.

[0028] Each to-do work item has a corresponding test requirement type, and each test requirement type has a corresponding type identifier. The type identifier is used to distinguish different test requirement types. One type identifier uniquely and determinately represents one type of test requirement.

[0029] Obtain the to-do work items. One, two, or multiple to-do work items can be obtained at one time. The specific number of to-do work items is not limited here and can be determined according to the actual situation.

[0030] S120. Map the to-be-tested requirement type based on the UV recommendation matrix to obtain the test plan template type associated with the to-be-tested requirement type as the target template type.

[0031] Among them, the UV recommendation matrix is a matrix used to characterize the association relationship between the test requirement type and the test plan template type. The UV recommendation matrix can be decomposed into a test requirement type factor matrix U and a test plan template type factor matrix V. The UV recommendation matrix is determined according to the test requirement type of the historical work items and the historical test plan template type used to execute the historical work items. The UV recommendation matrix is pre-constructed and configured in the test plan determination system. On the premise of knowing the UV recommendation matrix, the test plan template type associated with the to-be-tested requirement type can be determined according to the test plan template type as the target template type. Among them, the target template type refers to the test plan template type associated with the to-be-tested requirement type. That is, the test plan template corresponding to the target template type is adapted to the to-do work items.

[0032] In an optional embodiment, before mapping the to-be-tested requirement type based on the UV recommendation matrix to obtain the test plan template type associated with the to-be-tested requirement type as the target template type, the method further includes: the determination process of the UV recommendation matrix.

[0033] The specific determination process of the UV recommendation matrix includes: obtaining the historical work items within a preset time period, and determining the test requirement type corresponding to the historical work items to obtain the historical requirement type, and using the historical requirement type as the eigenvalue of the U matrix; obtaining the historical test plan template used to execute the historical work items, and using the historical test plan template type as the eigenvalue of the V matrix; based on the eigenvalue of the U matrix and the eigenvalue of the V matrix, performing UV recommendation matrix fitting to obtain at least two UV recommendation matrix fitting results; screening the UV recommendation matrix fitting results according to the test pass rate of the historical work items to obtain the UV recommendation matrix.

[0034] Since the UV recommendation matrix can be decomposed into a test requirement type factor matrix U and a test plan template type factor matrix V, after the test requirement type factor matrix U and the test plan template type factor matrix V are determined respectively, the UV recommendation matrix can be obtained through matrix fitting.

[0035] Among them, the eigenvalues in the factor matrix U are the test requirement types of the characteristic work items. Generally speaking, there is a certain correlation between the quality of the fitting result and the amount of data during the matrix fitting process. To ensure sufficient data for the fitting of the UV recommendation matrix, according to the historical work items and historical test plan templates within a preset time period, the eigenvalues of the U matrix and the V matrix are determined respectively.

[0036] Among them, the preset time period is determined by relevant technical personnel according to the actual situation and is not limited here. It is determined according to the actual effect of the specific UV recommendation matrix fitting. Exemplarily, the preset time period can be several months, such as three months or two months. If the fitting effect of the UV recommendation matrix is not ideal, the length of the preset time period can be appropriately extended.

[0037] The characteristic work items processed within the preset time period are historical work items. To obtain the historical work items within the preset time period, specifically, the processed characteristic work items within the preset time period can be obtained from the local database. Each historical work item has a corresponding historical test plan template, and the test plan template used to execute the historical work item is the historical test plan template. The historical test plan template is generated from the candidate test plan templates. The candidate test plan templates are constructed according to business requirements and pre-deployed in the test technology determination system, and the template types of the candidate test plan templates are known. The candidate test plan template types are used as the eigenvalues of the V matrix.

[0038] The eigenvalues of the U matrix are determined according to the corresponding test requirement types of the historical work items. When both the eigenvalues of the V matrix and the U matrix are determined, based on the eigenvalues of the U matrix and the V matrix, the UV recommendation matrix fitting is performed to obtain at least two UV recommendation matrix fitting results.

[0039] Whether the test plan matches a specific work item directly affects the test pass rate of the specific work item, because the mismatch between the test time and test resources in the test plan and the specific work item often leads to test failure. The test pass rate of the characteristic work item can be used as a reference for evaluating the fitting effect of the UV recommendation matrix.

[0040] The UV recommendation matrix fitting results are screened according to the test pass rate of the historical work items. Specifically, the UV recommendation matrix fitting results can be screened by comparing the test pass rate with the set threshold, and the UV recommendation matrix fitting results with a test pass rate greater than or equal to the set threshold are used as the final UV recommendation matrix, so that the UV recommendation matrix can reliably recommend an adapted test plan for the feature work item. In the case where the number of historical work items is multiple, the average value of the test pass rate of each historical work item can be taken as a reference for evaluating the UV recommendation matrix fitting results. The threshold is set by relevant technical personnel based on actual business needs and is not limited here. For example, the threshold can be set to 95%. Recommending a test plan template for to-do work items based on the UV recommendation matrix can improve the adaptability of the to-do work items and the test plan template, improve the test pass rate of the to-do work items, thereby improving the testing efficiency and accelerating the software product delivery progress.

[0041] S130. Determine a target test plan template to be recommended from candidate test plan templates according to the target template type.

[0042] There is a corresponding relationship between the target template type and the requirement type to be tested, and the test plan template corresponding to the target template type is the target test plan template. The target test plan template is generated in the candidate test plan template. Generally, the candidate test plan template covers common test requirements in business scenarios. Configuring an adaptive test plan template for common test requirements can greatly reduce the repetitive work of testers and improve test efficiency. In an optional embodiment, the candidate test plan template includes: at least one of a new transaction test plan template, a query transaction test plan template, a delete transaction test plan template and a batch transaction test plan template. Each candidate test plan template corresponds to a unique and determined template type, and the template type can be represented by a number.

[0043] The candidate test plan template is built according to business requirements and pre-deployed in the test technology determination system. Specifically, the commonalities of development requirements can be extracted from the functional dimension, and the basic version of the test plan template can be built based on the commonalities of development requirements. The test plan template can be used to implement basic testing of software product functions. The test plan template generally includes dimensions such as test object, test scope, test method and expected results. Test plan templates developed for different types of test requirements have differences in the corresponding content of each dimension.

[0044] The technical solution provided by the embodiment of this application obtains a to-do work item, determines the test requirement type corresponding to the to-do work item as the to-be-tested requirement type, maps the to-be-tested requirement type based on the UV recommendation matrix, and obtains the test plan template type associated with the to-be-tested requirement type as the target template type. According to the target template type, the target test plan template to be recommended is determined from the candidate test plan templates. Implementing the technical solution provided by this application can, based on the test requirement type corresponding to the to-do work item, intelligently recommend a test technology template suitable for the to-do work item for the user from the candidate test plan templates based on the UV recommendation matrix, greatly reducing the repetitive work done by testers during the test plan formulation process, improving the test efficiency, advancing the product R & D process, and accelerating the product delivery schedule.

[0045] Embodiment 2

[0046] Figure 2 It is a flowchart of another test plan determination method provided by the second embodiment of this application. This embodiment is further optimized on the basis of the above embodiment. Specifically, the optimization is that the mapping of the to-be-tested requirement type based on the UV recommendation matrix to obtain the test plan template type associated with the to-be-tested requirement type as the target template type includes: taking the to-be-tested requirement type as the eigenvalue of the U matrix of the UV recommendation matrix; based on the UV recommendation matrix, mapping the eigenvalue of the U matrix to obtain the eigenvalue of the V matrix of the UV recommendation matrix; according to the eigenvalue of the V matrix, determining the test plan template type associated with the to-be-tested requirement type as the target template type.

[0047] As Figure 2 shown, the test plan determination method includes:

[0048] S210. Obtain a to-do work item, and determine the test requirement type corresponding to the to-do work item as the to-be-tested requirement type.

[0049] In an optional embodiment, determining the test requirement type corresponding to the to-do work item as the to-be-tested requirement type includes: based on the key content location algorithm, determining the location of the development requirement in the to-do work item; based on the key content recognition algorithm, extracting the development steps in the development requirement; according to the development steps, determining the test requirement type corresponding to the to-do work item as the to-be-tested requirement type.

[0050] A to-do work item refers to a feature work item to be tested. Feature work items include: user requirements, features, and user stories. A feature work item is a collection of related user stories. There is a large amount of content in a feature work item, and some of it has little reference value for determining the corresponding test requirement type of the to-do work item. Since the software testing process is actually a process of verifying the developed or developed software product. Test requirements are closely related to development requirements, and the test requirement type of the feature work item can be determined based on the development requirements in the to-do work item.

[0051] Among them, the key content location algorithm is an algorithm used to determine the location of development requirements in the to-do work item. Usually, the to-do work item is written according to a certain format specification. As an important piece of information in agile development, development requirements are generally highlighted in the document by setting a title or font in a specific format, or the development requirements are written in a separate requirements design attachment. Therefore, the key content location algorithm can be used to locate the development requirements in the to-do work item. Specifically, it can determine the document where the development requirements are located based on information such as the number of documents, document titles, and document formats, and determine the location of the development requirements in the document based on paragraph settings, font formats, and text content in the document.

[0052] The development steps can more directly and objectively reflect the development requirements. After locating the location of the development requirements, the development steps in the development requirements are extracted through the key content recognition algorithm. Specifically, the keyword recognition algorithm can be combined with the paragraph format to extract the development steps. Then, based on the development steps, the corresponding test requirement type of the to-do work item is determined. This can automate the process of determining the corresponding test requirement type of the to-do work item and improve the test efficiency.

[0053] S220. Use the to-be-tested requirement type as the U matrix eigenvalue of the UV recommendation matrix.

[0054] Among them, the to-be-tested requirement type refers to the test requirement type corresponding to the to-do work item. The to-be-tested requirement type can be represented by numbers, and the U matrix is generated according to the to-be-tested requirement type.

[0055] S230. Based on the UV recommendation matrix, map the U matrix eigenvalue to obtain the V matrix eigenvalue of the UV recommendation matrix.

[0056] Among them, the UV recommendation matrix is determined based on the test requirement type of historical work items and the type of historical test plan template used to execute the historical work items. The UV recommendation matrix is pre-constructed and configured in the test plan determination system. When the UV recommendation matrix is determined and the test requirement type factor matrix U is known, the test plan template type factor matrix V can be obtained by mapping the U matrix eigenvalue through the UV recommendation matrix.

[0057] S240. Determine the type of the test plan template associated with the type of the requirement to be tested as the target template type according to the eigenvalue of the V matrix.

[0058] The eigenvalue of the V matrix is the digital identifier of the type of the test plan template associated with the type of the requirement to be tested. The target template type can be determined according to the eigenvalue of the V matrix.

[0059] S250. Determine the target test plan template to be recommended from the candidate test plan templates according to the target template type.

[0060] In the case where the target test plan template with basic test functions cannot meet the personalized business requirements of the user, the technical solution provided by this application can customize a test plan for the user based on the candidate test plan templates according to the user's test requirements. In an optional embodiment, after determining the target test plan template to be recommended from the candidate test plan templates according to the target template type, the method further includes: in response to receiving a test plan template customization request, changing the data items in the target test plan template according to the test plan template customization request to obtain a customized test plan template; and executing a test task according to the customized test plan template.

[0061] Among them, the test plan template customization request is a request for constructing a personalized test plan, and the test plan template customization request is generated according to the template customization requirements of the user. A customized test plan template that meets the personalized needs of the user can be constructed based on the target test plan template according to the test plan template customization request. By changing the data items in the target test plan template according to the test plan customization request, specifically, adding data items to the target test plan template, deleting or replacing the existing data items in the target test plan template. Exemplarily, in the case where the target test plan template is a query transaction test plan template, a data item for querying business objects is added to the test method of the target test plan template according to the user's needs.

[0062] The customized test plan template is a template that can meet the personalized test requirements of the user obtained by changing the data items in the target test plan template according to the test plan template customization request. Executing a test task according to the customized test plan template, specifically, using the test method in the customized test plan template to test the test object within the test scope and obtaining a test result, obtaining a test evaluation result of the software product according to the test result and the expected result, and feeding back the test evaluation result to the user. It meets the personalized test requirements of the user and improves the user experience.

[0063] It should be noted that in this application, the candidate test plan template and the to-do work item are configured in the same system, both are configured in the test plan determination system. The test plan determination system supports the entry of test cases, the establishment of test suites, and the association of test cases with test plans, facilitating subsequent testing. It solves the problems of cumbersome local registration of test plans and easy forgetting. The test plan determination system also supports test configuration, facilitating the storage of information such as test entities and test environments, avoiding the need to configure test environments, databases, etc. when conducting tests again, and facilitating the use of testers. The test plan determination system can also export test reports for the convenience of testers, and the page of the test plan determination system can associate test configurations with feature work items.

[0064] Optionally, the test plan determination system of the executable test plan determination method provided in this application is built based on a microservices basic framework. The microservices basic framework architecture includes: service framework, runtime support service, service security, background service, service monitoring, and service deployment platform. Among them, the runtime support service includes: service gateway, registry center, and configuration center; service security includes: JWT authorization authentication; background service includes: message system and data access layer; service monitoring includes: log monitoring, alarm notification, and health check; service deployment platform includes: image governance and release pipeline, etc.

[0065] Optionally, the microservices basic framework is the SPEED4J framework. SPEED4J uses MyBatis as the persistence layer ORM tool at runtime, providing data layer management-related tools to facilitate the project team to generate entity Beans, edit mapping files, and use Beans to generate relevant management-end functions. It generates data operation interface classes, request service classes, request control classes, and front-end code for the addition, deletion, modification, and query operations of relevant data tables based on Java Beans, facilitating the rapid implementation of single-table and multi-table management operations.

[0066] The technical solution provided by the embodiments of this application obtains a to-do work item, determines the test requirement type corresponding to the to-do work item as the to-be-tested requirement type, uses the to-be-tested requirement type as the U matrix eigenvalue of the UV recommendation matrix, maps the U matrix eigenvalue based on the UV recommendation matrix to obtain the V matrix eigenvalue of the UV recommendation matrix, determines the test plan template type associated with the to-be-tested requirement type as the target template type according to the V matrix eigenvalue, and determines the target test plan template to be recommended from the candidate test plan templates according to the target template type. This application can accurately and reliably recommend a suitable test plan template for the to-do feature work item based on the UV recommendation matrix, effectively ensuring the test pass rate of the to-do work item, thereby improving the test efficiency, promoting the product R & D process, and accelerating the product delivery progress.

[0067] Embodiment 3

[0068] Figure 3 A test plan determination device provided in Embodiment 3 of the present application is applicable to the situation of automatically recommending a matching test plan template for a feature work item in agile test development. The device can be implemented by software and / or hardware and can be integrated into an electronic device such as a smart terminal.

[0069] As Figure 3 shown, the device may include: a to-be-tested requirement type determination module 310, a target template type determination module 320, and a target test plan template to be recommended determination module 330.

[0070] Among them, the to-be-tested requirement type determination module 310 is configured to obtain a to-do work item and determine the test requirement type corresponding to the to-do work item as the to-be-tested requirement type;

[0071] The target template type determination module 320 is configured to map the to-be-tested requirement type based on the UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as the target template type;

[0072] The target test plan template to be recommended determination module 330 is configured to determine the target test plan template to be recommended from the candidate test plan templates according to the target template type.

[0073] The technical solution provided in the embodiment of the present application includes: obtaining a to-do work item and determining the test requirement type corresponding to the to-do work item as the to-be-tested requirement type; mapping the to-be-tested requirement type based on the UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as the target template type; determining the target test plan template to be recommended from the candidate test plan templates according to the target template type. By executing the technical solution provided in the present application, a test technology template adapted to the to-do work item can be intelligently recommended to the user from the candidate test plan templates according to the test requirement type corresponding to the to-do work item through the UV recommendation matrix, greatly reducing the repetitive work done by testers in the process of formulating a test plan, improving the test efficiency, promoting the product R & D process, and accelerating the product delivery progress.

[0074] Optionally, the target template type determination module 320 includes: a U-matrix eigenvalue determination sub-module, configured to use the to-be-tested requirement type as the U-matrix eigenvalue of the UV recommendation matrix; a V-matrix eigenvalue determination sub-module, configured to map the U-matrix eigenvalue based on the UV recommendation matrix to obtain the V-matrix eigenvalue of the UV recommendation matrix; and a target template type determination sub-module, configured to determine, according to the V-matrix eigenvalue, the test plan template type associated with the to-be-tested requirement type as the target template type.

[0075] Optionally, the apparatus further includes: a U-matrix eigenvalue determination module, configured to, before mapping the to-be-tested requirement type based on the UV recommendation matrix to obtain the test plan template type associated with the to-be-tested requirement type as the target template type, obtain historical work items within a preset time period, determine the test requirement type corresponding to the historical work items to obtain a historical requirement type, and use the historical requirement type as the U-matrix eigenvalue; a V-matrix eigenvalue determination module, configured to obtain the historical test plan template used for executing the historical work items and use the historical test plan template type as the V-matrix eigenvalue; a UV recommendation matrix fitting module, configured to perform UV recommendation matrix fitting based on the U-matrix eigenvalue and the V-matrix eigenvalue to obtain at least two UV recommendation matrix fitting results; and a UV recommendation matrix fitting result screening module, configured to screen the UV recommendation matrix fitting results according to the test pass rate of the historical work items to obtain the UV recommendation matrix.

[0076] Optionally, the to-be-tested requirement type determination module 310 includes: a to-be-done work item acquisition sub-module, specifically configured to acquire to-be-done work items; and a to-be-tested requirement type determination sub-module, specifically configured to determine the test requirement type corresponding to the to-be-done work items as the to-be-tested requirement type. The to-be-tested requirement type determination sub-module includes: a development requirement location unit, configured to determine the location of the development requirement in the to-be-done work item based on a key content location algorithm; a development requirement content extraction unit, configured to extract the development steps in the development requirement based on a key content recognition algorithm; and a to-be-tested requirement type determination unit, configured to determine, according to the development steps, the test requirement type corresponding to the to-be-done work items as the to-be-tested requirement type.

[0077] Optionally, the apparatus further includes: a test plan template customization module, configured to, after determining the target test plan template to be recommended from candidate test plan templates according to the target template type, in response to receiving a test plan template customization request, change the data items in the target test plan template according to the test plan template customization request to obtain a customized test plan template; and a test task execution module, configured to execute a test task according to the customized test plan template.

[0078] Optionally, the candidate test plan template includes at least one of a new transaction test plan template, a query transaction test plan template, a delete transaction test plan template, and a batch transaction test plan template.

[0079] The test plan determination device provided by an embodiment of the present invention can execute the test plan determination method provided by any embodiment of the present invention, and has the performance modules and beneficial effects corresponding to executing a test plan determination method.

[0080] Embodiment 4

[0081] Embodiment 4 of the present application further provides a storage medium containing computer-executable instructions, and the computer-executable instructions are used to execute a test plan determination method when executed by a computer processor. The method includes:

[0082] Obtain a to-do work item, and determine the test requirement type corresponding to the to-do work item as the to-be-tested requirement type;

[0083] Map the to-be-tested requirement type based on the UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as the target template type;

[0084] Determine a target test plan template to be recommended from the candidate test plan templates according to the target template type.

[0085] A storage medium refers to any various types of memory electronic devices or storage electronic devices. The term "storage medium" is intended to include: installation media, such as CD-ROMs, floppy disks, or magnetic tape devices; computer system memories or random access memories, such as DRAM, DDR RAM, SRAM, EDO RAM, Rambus RAM, etc.; non-volatile memories, such as flash memories, magnetic media (such as hard disks or optical storage); register or other similar types of memory elements, etc. The storage medium may further include other types of memories or combinations thereof. Additionally, the storage medium may be located in the computer system in which the program is executed, or may be located in a different second computer system, and the second computer system is connected to the computer system through a network (such as the Internet). The second computer system may provide program instructions to the computer for execution. The term "storage medium" may include two or more storage media that may reside in different locations (such as in different computer systems connected through a network). The storage medium may store program instructions executable by one or more processors (such as specifically implemented as a computer program).

[0086] Of course, the storage medium containing computer-executable instructions provided by the embodiments of the present application is not limited to the test plan determination operations described above, and can also execute the related operations in the test plan determination method provided by any embodiment of the present application.

[0087] Embodiment Five

[0088] Embodiment Five of the present application provides an electronic device, in which the test plan determination device provided by the embodiments of the present application can be integrated. The electronic device can be configured within a system or can be a device that executes some or all of the performance within the system. Figure 4 It is a schematic structural diagram of an electronic device provided by Embodiment Five of the present application. As Figure 4 shown, the present embodiment provides an electronic device 400, which includes: one or more processors 420; a storage device 410 for storing one or more programs. When the one or more programs are executed by the one or more processors 420, the one or more processors 420 implement the test plan determination method provided by the embodiments of the present application, and the method includes:

[0089] Obtain a to-do work item, and determine the test requirement type corresponding to the to-do work item as the to-be-tested requirement type;

[0090] Based on the UV recommendation matrix, map the to-be-tested requirement type to obtain a test plan template type associated with the to-be-tested requirement type as the target template type;

[0091] According to the target template type, determine the target test plan template to be recommended from the candidate test plan templates.

[0092] Of course, those skilled in the art can understand that the processor 420 also implements the technical solutions of the test plan determination method provided by any embodiment of the present application.

[0093] Figure 4 The shown electronic device 400 is only an example and should not impose any limitations on the performance and usage scope of the embodiments of the present application.

[0094] As Figure 4 shown, the electronic device 400 includes a processor 420, a storage device 410, an input device 430, and an output device 440; the number of processors 420 in the electronic device can be one or more, Figure 4 and one processor 420 is taken as an example here; the processor 420, the storage device 410, the input device 430, and the output device 440 in the electronic device can be connected through a bus or other means, Figure 4 and connected through the bus 450 is taken as an example here.

[0095] The storage device 410, as a computer-readable storage medium, can be used to store software programs, computer-executable programs, and module units, such as the program instructions corresponding to the test plan determination method in the embodiments of the present application.

[0096] The storage device 410 may mainly include a program storage area and a data storage area. Among them, the program storage area can store an operating system and at least one application program required for performance; the data storage area can store data created according to the use of the terminal, etc. In addition, the storage device 410 may include high-speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, a flash memory device, or other non-volatile solid-state storage devices. In some instances, the storage device 410 may further include a memory remotely set relative to the processor 420, and these remote memories can be connected through a network. Examples of the above network include but are not limited to the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0097] The input device 430 can be used to receive input digital, character information, or voice information, and generate key signal inputs related to the user settings and performance control of the electronic device. The output device 440 may include electronic devices such as a display screen and a speaker.

[0098] The test plan determination device, medium, and electronic device provided in the above embodiments can execute the test plan determination method provided in any embodiment of the present application, and have the corresponding performance modules and beneficial effects for executing this method. Technical details not described in detail in the above embodiments can be referred to the test plan determination method provided in any embodiment of the present application.

[0099] Note that the above is only the preferred embodiment of the present application and the applied technical principles. Those skilled in the art will understand that the present application is not limited to the specific embodiments described here, and various obvious changes, re-adjustments, and substitutions can be made by those skilled in the art without departing from the protection scope of the present application. Therefore, although the present application has been described in more detail through the above embodiments, the present application is not limited to the above embodiments. Without departing from the concept of the present application, it may also include more other equivalent embodiments, and the scope of the present application is determined by the scope of the appended claims.

Claims

1. A method for determining a test plan, characterized in that, The method includes: Obtain a to-do work item, and determine the test requirement type corresponding to the to-do work item as the to-be-tested requirement type; Map the to-be-tested requirement type based on the UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as the target template type; Determine a target test plan template to be recommended from the candidate test plan templates according to the target template type; Wherein, before mapping the to-be-tested requirement type based on the UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as the target template type, the method further includes: Obtain historical work items within a preset time period, and determine the test requirement type corresponding to the historical work items to obtain historical requirement types, and use the historical requirement types as U matrix eigenvalues; wherein, the U matrix eigenvalues are the test requirement types of characteristic work items; Obtain the historical test plan templates used to execute the historical work items, and use the historical test plan template types as V matrix eigenvalues; wherein, the historical test plan templates are generated from the candidate test plan templates, and the V matrix eigenvalues are the candidate test plan template types; Perform UV recommendation matrix fitting based on the U matrix eigenvalues and the V matrix eigenvalues to obtain at least two UV recommendation matrix fitting results; Screen the UV recommendation matrix fitting results according to the test pass rate of the historical work items to obtain the UV recommendation matrix.

2. The method according to claim 1, characterized in that, The mapping of the to-be-tested requirement type based on the UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as the target template type includes: Use the to-be-tested requirement type as the U matrix eigenvalue of the UV recommendation matrix; Based on the UV recommendation matrix, map the U matrix eigenvalue to obtain the V matrix eigenvalue of the UV recommendation matrix; Determine a test plan template type associated with the to-be-tested requirement type according to the V matrix eigenvalue as the target template type.

3. The method according to claim 1, wherein Determining the test requirement type corresponding to the to-do work item as the to-be-tested requirement type includes: Based on the key content location algorithm, determine the location of the development requirement in the to-do work item; Based on the key content recognition algorithm, extract the development steps in the development requirement; Determine the test requirement type corresponding to the to-do work item according to the development steps as the to-be-tested requirement type.

4. The method according to claim 1, characterized in that After determining the target test plan template to be recommended from the candidate test plan templates according to the target template type, the method further includes: In response to receiving a test plan template customization request, change the data items in the target test plan template according to the test plan template customization request to obtain a customized test plan template; Execute test tasks according to the customized test plan template.

5. The method according to claim 1, wherein The candidate test plan templates include at least one of a new transaction test plan template, a query transaction test plan template, a delete transaction test plan template, and a batch transaction test plan template.

6. A test plan determination device, characterized in that, The device includes: A to-be-tested requirement type determination module, configured to obtain a to-do work item and determine a test requirement type corresponding to the to-do work item as a to-be-tested requirement type; A target template type determination module, configured to map the to-be-tested requirement type based on a UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as a target template type; A target test plan template to be recommended determination module, configured to determine a target test plan template to be recommended in candidate test plan templates according to the target template type; Wherein, the apparatus further includes: A U matrix eigenvalue determination module, configured to, before mapping the to-be-tested requirement type based on the UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as a target template type, obtain historical work items within a preset time period, determine a test requirement type corresponding to the historical work items to obtain a historical requirement type, and use the historical requirement type as a U matrix eigenvalue; wherein, the U matrix eigenvalue is a test requirement type of a characteristic work item; A V matrix eigenvalue determination module, configured to, before mapping the to-be-tested requirement type based on the UV recommendation matrix to obtain a test plan template type associated with the to-be-tested requirement type as a target template type, obtain a historical test plan template used for executing the historical work items, and use the historical test plan template type as a V matrix eigenvalue; wherein, the historical test plan template is generated from candidate test plan templates, and the V matrix eigenvalue is a candidate test plan template type; A UV recommendation matrix fitting module, configured to perform UV recommendation matrix fitting based on the U matrix eigenvalue and the V matrix eigenvalue to obtain at least two UV recommendation matrix fitting results; A UV recommendation matrix fitting result screening module, configured to screen the UV recommendation matrix fitting results according to the test pass rate of the historical work items to obtain the UV recommendation matrix.

7. The device according to claim 6, characterized in that, The target template type determination module includes: A U matrix eigenvalue determination sub-module, configured to use the to-be-tested requirement type as a U matrix eigenvalue of the UV recommendation matrix; A V matrix eigenvalue determination sub-module, configured to map the U matrix eigenvalue based on the UV recommendation matrix to obtain a V matrix eigenvalue of the UV recommendation matrix; A target template type determination sub-module, configured to determine a test plan template type associated with the to-be-tested requirement type as a target template type according to the V matrix eigenvalue.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by a processor, it implements the test plan determination method according to any one of claims 1-5.

9. An electronic device, comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the test plan determination method according to any one of claims 1-5.

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