Ceramic electronic devices
By adjusting the polarization conditions and structure in the dielectric layer of ceramic electronic devices, the movement of oxygen vacancies and the interface resistance are effectively controlled, solving the problem of degradation of insulation performance caused by oxygen vacancies accumulation, and achieving long life and high reliability of the device.
Patent Information
- Application Number
- CN202110727009.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Priority Date
- 2021-04-05
- Filing Date
- 2021-06-29
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2041-06-29
AI Technical Summary
The accumulation of oxygen vacancy and reduced interface resistance of existing ceramic electronic devices in the dielectric layer leads to a decrease in insulation performance, affecting device life.
The structure of the dielectric layer is adjusted under the TSDC conditions where the polarization temperature is 150°C, the polarization electric field is 15V/μm to 20V/μm, the polarization time is 60 minutes, and the temperature rise rate is 10°C/min, the structure of the dielectric layer is so that the ratio IA/IB of the peak current is greater than 0.30, and the peak current IB is 100pA/mm2 or less.
The long life and high reliability of ceramic electronic devices are achieved, and good insulation performance can be maintained even under relatively high electric fields.