A wiring quality detection method and device and a storage medium

Abstract

This application provides a cabling quality inspection method, apparatus, and storage medium. The method includes: determining the resulting cabling topology and expected topology for each signal to be inspected in a set of signals to be inspected based on the existing cabling layout; comparing the resulting cabling topology and expected topology for each signal to be inspected to obtain a topology comparison result for each signal; if the topology comparison result is greater than a preset threshold, determining that the corresponding signal to be inspected has an unreasonable cabling detection result; and generating a quality inspection report based on the detection result for each signal to be inspected. This application can quickly complete cabling quality inspection, automate cabling quality inspection, and save inspection time.

Description

Technical Field

[0001] This application relates to the field of integrated circuit design, and in particular to a wiring quality inspection method, apparatus and storage medium. Background Technology

[0002] With the continuous development of semiconductor technology, the number of electronic components in integrated circuits is increasing and their internal structure is becoming more and more complex, which brings greater challenges to the design of integrated circuits.

[0003] In integrated circuit layout design and development, after the routing design is completed, the routing quality needs to be inspected. If the routing quality is inspected manually and through post-simulation verification, the inspection time will be too long. Summary of the Invention

[0004] This application aims to provide a cabling quality inspection method, apparatus, and storage medium that can quickly complete cabling quality inspection, automate cabling quality inspection, and save inspection time.

[0005] The technical solution of this application is implemented as follows:

[0006] This application provides a wiring quality inspection method, the method comprising:

[0007] Based on the existing routing layout, determine the routing result topology and expected topology for each signal to be detected in the set of signals to be detected; the expected topology is obtained based on the connection point positions in the existing routing layout.

[0008] For each signal to be detected, the topology of the wiring result is compared with the expected topology to obtain the topology comparison result corresponding to each signal to be detected;

[0009] If the topology comparison result is greater than a preset threshold, it is determined that the corresponding signal to be detected has an unreasonable wiring detection result;

[0010] A quality inspection report is generated based on the detection results of each signal to be detected.

[0011] This application embodiment also provides a wiring quality testing device, including:

[0012] The determining unit is used to determine the routing result topology and expected topology for each signal to be detected in the set of signals to be detected, based on the existing routing layout; the expected topology is obtained based on the connection point positions in the existing routing layout.

[0013] The comparison unit is used to compare the wiring result topology with the expected topology for each signal to be detected, and obtain the topology comparison result corresponding to each signal to be detected.

[0014] The determining unit is further configured to determine that the corresponding signal to be detected has an unreasonable wiring detection result if the topology comparison result is greater than a preset threshold.

[0015] The generation unit is used to generate a quality inspection report based on the detection results of each signal to be detected.

[0016] This application embodiment also provides a wiring quality testing device, including:

[0017] Memory, used to store executable instructions;

[0018] The processor, when executing executable instructions stored in the memory, implements the wiring quality detection method in the above scheme.

[0019] This application also provides a storage medium storing executable instructions for inducing a processor to execute the wiring quality detection method described above.

[0020] Therefore, the embodiments of this application provide a cabling quality inspection method, apparatus, and storage medium. Based on the existing cabling layout, it can determine the resulting cabling topology and the expected topology for each signal in the set of signals to be inspected. Then, for each signal to be inspected, the resulting cabling topology and the expected topology are compared to obtain a topology comparison result for each signal. The topology comparison result is then judged; if the result exceeds a preset threshold, the corresponding signal to be inspected is determined to have unreasonable cabling. Finally, a quality inspection report is generated based on the inspection result for each signal to be inspected. In this way, the automatic cabling results can be inspected simply by running the program, eliminating the need for designers to search and verify each result individually. This quickly completes the cabling quality inspection, automates the cabling quality inspection process, and saves inspection time. Attached Figure Description

[0021] Figure 1 A flowchart of a wiring quality inspection method provided in this application embodiment Figure 1 ;

[0022] Figure 2 This is an example diagram of the expected topology in the embodiments of this application;

[0023] Figure 3A This is a schematic diagram of obtaining the actual wiring pattern in an embodiment of this application. Figure 1 ;

[0024] Figure 3B This is a schematic diagram of obtaining the actual wiring pattern in an embodiment of this application. Figure 2 ;

[0025] Figure 3C This is Schematic diagram three illustrating the acquisition of the actual wiring pattern in an embodiment of this application;

[0026] Figure 4A This is a schematic diagram of the actual wiring pattern type in the embodiments of this application. Figure 1 ;

[0027] Figure 4B This is a schematic diagram of the actual wiring pattern type in the embodiments of this application. Figure 2 ;

[0028] Figure 4C This is a schematic diagram of the actual wiring pattern type in the embodiments of this application;

[0029] Figure 5 A flowchart of a wiring quality inspection method provided in this application embodiment Figure 2 ;

[0030] Figure 6 This is a diagram illustrating the detection results in an embodiment of this application.

[0031] Figure 7 Flowchart 3 shows a wiring quality inspection method provided in this application embodiment;

[0032] Figure 8 Flowchart four of a wiring quality inspection method provided in this application embodiment;

[0033] Figure 9 A flowchart of a wiring quality inspection method provided in this application embodiment Figure 5 ;

[0034] Figure 10 A flowchart of a wiring quality inspection method provided in this application embodiment Figure 6 ;

[0035] Figure 11 A flowchart of a wiring quality inspection method provided in this application embodiment Figure 7 ;

[0036] Figure 12 A flowchart of a wiring quality inspection method provided in this application embodiment Figure 8 ;

[0037] Figure 13 A flowchart of a wiring quality inspection method provided in this application embodiment Figure 9 ;

[0038] Figure 14 A flowchart of a wiring quality inspection method provided in this application embodiment Figure 10 ;

[0039] Figure 15 A flowchart of a wiring quality inspection method provided in this application embodiment Figure 10 one;

[0040] Figure 16 A flowchart of a wiring quality inspection method provided in this application embodiment Figure 10 two;

[0041] Figure 17 A schematic diagram of the structure of a wiring quality testing device provided in this application embodiment. Figure 1 ;

[0042] Figure 18 A schematic diagram of the structure of a wiring quality testing device provided in this application embodiment. Figure 2 . Detailed Implementation

[0043] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions of this application are further described in detail below with reference to the accompanying drawings and embodiments. The described embodiments should not be regarded as limitations on this application. All other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0044] In the following description, references are made to “some embodiments,” which describe a subset of all possible embodiments. However, it is understood that “some embodiments” may be the same subset or different subsets of all possible embodiments and may be combined with each other without conflict.

[0045] If the invention document contains similar descriptions such as "first / second", the following explanation shall be added: In the following description, the terms "first / second / third" are used only to distinguish similar objects and do not represent a specific order of objects. It is understood that "first / second / third" may be interchanged in a specific order or sequence where permitted, so that the embodiments of this application described herein can be implemented in an order other than that illustrated or described herein.

[0046] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of this application only and is not intended to limit this application.

[0047] In integrated circuit layout design and development, the layout contains a large number of signal lines. For example, the peripheral layer of a DRAM (Dynamic Random Access Memory) chip layout contains more than 15,000 signal lines. Therefore, it is necessary to use automatic routing tools to complete the connection of a large number of signal lines, i.e., to perform a large amount of automatic routing, in order to meet the project deadline.

[0048] However, automated routing cannot always perfectly meet design requirements. For example, excessively long routing lines or excessively long high-resistance metal lines used for critical signals can lead to signal failure. Therefore, after automated routing is completed, the layout must be inspected for routing quality.

[0049] Among related technologies, only methods such as manual inspection and post-simulation verification exist, which have problems such as excessively long cycles and difficulties in later modifications.

[0050] Figure 1 This is an optional flowchart illustrating the cabling quality inspection method provided in this application embodiment, which will be combined with... Figure 1 The steps shown are explained.

[0051] S101. Based on the existing wiring layout, determine the wiring result topology and expected topology for each signal to be detected in the set of signals to be detected; the expected topology is obtained based on the connection point positions in the existing wiring layout.

[0052] In this embodiment, the cabling quality inspection device can determine the resulting cabling topology and the expected topology for each signal in the set of signals to be inspected, based on the existing cabling layout. The expected topology is obtained based on the connection point positions in the existing cabling layout.

[0053] It should be noted that integrated circuits require multiple signals, each passing through its own portion of the circuit's interconnects. Therefore, in the already routed layout, the actual routing pattern corresponding to the interconnects through which the signal to be detected passes can be determined.

[0054] In this embodiment, before determining the topology of the wiring result and the expected topology, the wiring quality inspection device needs to first determine the connection points (pins) along the path of the signal to be tested. Since it may be difficult to clearly show all the connection objects and connection points along the path of the signal to be tested in the existing wiring layout, the wiring quality inspection device can first obtain the wiring circuit diagram corresponding to the existing wiring layout. Then, based on the existing wiring layout and the wiring circuit diagram, it determines at least one connection point corresponding to each signal to be tested. This process may include the following steps:

[0055] Step 1: Obtain the connection object identifier in the existing wiring diagram. The wiring quality inspection device can first obtain at least one connection object identifier corresponding to each signal to be tested in the existing wiring diagram.

[0056] It should be noted that a connection object identifier is a symbol for an electrically connected object in a routed circuit diagram, representing a module (instance) with a specific function in the circuit. Every connection object identifier in a routed circuit diagram has a corresponding connection object in the routed layout. A connection object is a graphic in the routed layout, representing that the corresponding physical area in the chip can form that module and implement its function.

[0057] Step 2: Match connection objects in the existing cabling layout. After obtaining at least one connection object identifier, the cabling quality inspection device can match at least one connection object corresponding to at least one connection object identifier in the existing cabling layout.

[0058] Step 3: Determine connection points in the existing wiring layout. After the wiring quality inspection device has matched at least one connection object, it can determine at least one connection point corresponding to each signal to be tested in the existing wiring layout based on at least one connection object. It should be noted that the connection objects are electrically connected through the connection points; determining the connection points determines the endpoints that the signal to be tested will pass through along the connection path.

[0059] In this embodiment, after determining at least one connection point corresponding to each signal to be tested, the routing quality inspection device can determine the expected topology and the final routing topology for each signal to be tested in the already routed layout based on the at least one connection point. The expected topology reflects the desired result of the layout routing, while the final routing topology reflects the actual result of the layout routing. The expected topology can serve as a standard and reference for the final routing topology, guiding the actual layout routing work.

[0060] It should be noted that the topology in this application embodiment is an abstract description of signal lines in the layout using two graphic elements: points and lines. Points are used to describe at least one connection point corresponding to each signal to be detected, clarifying the position of these connection points in the already routed layout; lines are used to describe the routing pattern between at least one connection point, clarifying the path and length of the signal line.

[0061] In this embodiment, the cabling quality inspection device can classify and determine N-level expected connections (N greater than or equal to 1) to form an expected topology, which includes at least one connection point and N-level expected connections. This process may include the following steps:

[0062] Step 1: Determine the N-level intermediate baseline. The cabling quality inspection device can use at least one connection point as a Level 1 connection point in the cabling layout; then, it determines the two Level 1 edge connection points that are farthest apart along the first axis among the Level 1 connection points, and then determines the Level 1 intermediate baseline along the second axis by passing through the midpoint of the line connecting the two Level 1 edge connection points.

[0063] After determining the first-level intermediate baseline, the cabling quality inspection device can identify connection points in the first-level connection points whose axial distance is less than the second-level preset threshold as second-level connection points; where the axial distance is the distance along the first or second axis, with the first axis perpendicular to the second axis. Furthermore, the cabling quality inspection device can use a method similar to that used to determine the first-level intermediate baseline to determine the second-level intermediate baseline among the second-level connection points. That is, the cabling quality inspection device can identify the two second-level edge connection points that are furthest apart along the first axis, and then, by passing through the midpoint of the line connecting these two second-level edge connection points, determine the second-level intermediate baseline along the second axis.

[0064] After determining the second-level intermediate baseline, the cabling quality inspection device can determine the third-level intermediate baseline using a similar method, and so on, until the Nth intermediate baseline is determined. That is, the cabling quality inspection device can identify connection points in the (i-1)th level whose axial distance is less than the preset threshold for the i-th level as i-level connection points; where i is greater than or equal to 2 and less than or equal to N-1. Then, it identifies the two i-th level edge connection points with the greatest distance along the first axial direction, and then determines the i-th level intermediate baseline along the second axial direction through the midpoint of the line connecting these two i-th level edge connection points. This process continues until the Nth level connection points and the Nth level intermediate baseline are determined, thus establishing the Nth level intermediate baseline.

[0065] Step 2: Determine the expected connections for level N. The cabling quality inspection device can determine the expected connections for each level based on the connection points and intermediate baselines of level N, thereby determining the expected connections for level N.

[0066] For the first connection point in each level of the N-level connection points that does not meet the preset distance condition, the cabling quality inspection device can connect the first connection point in each level to the foot of the perpendicular from its corresponding intermediate baseline of each level to obtain the first sub-expected connection corresponding to the first connection point; wherein, the preset distance condition for each level connection point is that the axial distance is less than the preset threshold of the next level. For the second connection point in each level of the N-level connection points that meets the preset distance condition, the cabling quality inspection device can connect the common perpendicular segment from the intermediate baseline of the second connection point in each level to the intermediate baseline of the next level to obtain the second sub-expected connection corresponding to the second connection point. The first and second sub-expected connections are used as the expected connections for each level until the N-level connection points are connected, thus determining the N-level expected connections.

[0067] On the other hand, in some embodiments of this application, after determining the Nth-level intermediate baseline, the cabling quality inspection device can first determine the Nth-level expected connection based on the Nth-level connection point and the Nth-level intermediate baseline, and then determine the expected connection of the next higher level step by step, finally determining the first-level expected connection. That is, the cabling quality inspection device can determine the jth-level expected connection based on the jth-level connection point, the jth-level intermediate baseline, and the (j+1)th-level expected connection, where j is greater than or equal to 2 and j is less than or equal to N-1. Then, the determination of the (j-1)th-level expected connection continues until the first-level expected connection is determined, thereby determining the Nth-level expected connection.

[0068] The cabling quality inspection device can first determine the expected N-level connections based on the N-level connection points and the N-level intermediate baseline. Within the N-level connection points, the device can establish perpendicular segments from each group of N-level connection points to the corresponding N-level intermediate baseline, thus obtaining the N-level connection point lines; where each group of N-level connection points is defined as connection points whose axial distances to each other are all less than a preset N-level threshold. Then, the device connects the perpendicular feet of the N-level connection point lines to the corresponding N-level intermediate baselines, thus obtaining the N-level baseline lines, thereby obtaining the expected N-level connections including the N-level connection point lines and the N-level baseline lines.

[0069] After determining the expected connections for level N, the cabling quality inspection device can establish perpendicular segments from each group of level N-1 connection points to the corresponding level N-1 intermediate baseline, and common perpendicular segments from the level N baseline connection to the corresponding level N-1 intermediate baseline, thus obtaining the level N-1 connection point connections. Each group of level N-1 connection points is defined as connection points whose axial distance to each other is less than a preset level N-1 threshold. Then, the perpendicular feet of the level N-1 connection point connections to the corresponding level N-1 intermediate baselines are connected to obtain the level N-1 baseline connections, thereby obtaining the expected level N-1 connections, which include both the level N-1 connection point connections and the level N-1 baseline connections. This process is repeated sequentially until the expected level 1 connections are determined. In other words, the cabling quality inspection device can establish perpendicular segments from each group of j-th level connection points to the corresponding j-th level intermediate baseline, and common perpendicular segments from the (j+1)-th level baseline connection line to the corresponding j-th level intermediate baseline, thus obtaining the j-th level connection point connection line; wherein, the axial distance between each group of j-th level connection points is less than the j-th level preset threshold. Then, the perpendicular feet of the j-th level connection point connection lines to the corresponding j-th level intermediate baselines are connected to obtain the j-th level baseline connection lines, thereby obtaining the j-th level expected connection line including the j-th level connection point connection lines and the j-th level baseline connection lines.

[0070] In some embodiments of this application, N = 2. Figure 2 This is an optional example diagram of the expected topology provided in the embodiments of this application, such as... Figure 2 As shown, at least one connection point includes connection points p1, p2, p3, p4, p5, p6, and p7, which correspond to connection objects I1, I2, I3, I4, I5, I6, and I7, respectively. The cabling quality inspection device can first identify connection points p1, p2, p3, p4, p5, p6, and p7 as first-level connection points, and then determine the two first-level edge connection points p3 and p7 that are furthest along the Y-axis. First-level edge lines L1 and L2 extend along the X-axis, passing through p3 and p7 respectively, characterizing the positions of p3 and p7 along the Y-axis. Based on the positions of p3 and p7 along the Y-axis, the cabling quality inspection device can determine the first-level intermediate reference line L3, where L3 is a parallel line between L1 and L2, and the distances from L3 to L1 and L2 are equal.

[0071] Continue to refer to Figure 2After determining the first-level intermediate baseline L3, the cabling quality inspection device can identify second-level connection points among the first-level connection points p1, p2, p3, p4, p5, p6, and p7 whose axial distance is less than the second-level preset threshold. For example, if the second-level preset threshold is 150, and the axial distances between p3 and p4 in both the X and Y axes are less than 150, then p3 and p4 are identified as a group of second-level connection points; if the axial distances between any two points among p5, p6, and p7 in both the X and Y axes are less than 150, then p5, p6, and p7 are identified as another group of second-level connection points; that is, each group of second-level connection points is within a range of 150×150.

[0072] Continue to refer to Figure 2 After determining each group of Level 2 connection points, the cabling quality inspection device can determine the corresponding Level 2 intermediate reference line for each group of Level 2 connection points. For example, for the group of Level 2 connection points p3 and p4, the cabling quality inspection device first determines the two Level 2 edge connection points furthest along the Y-axis. Since this group of Level 2 connection points has only two members, they are directly used as Level 2 edge connection points. The corresponding Level 2 edge lines L1 and L4 extend along the X-axis (L1 is also a Level 1 edge line), passing through p3 and p4 respectively, representing the positions of p3 and p4 in the Y-axis. Based on the positions of p3 and p4 in the Y-axis, the cabling quality inspection device can determine the corresponding Level 2 intermediate reference line L6 for this group of Level 2 connection points. Here, L6 is the intermediate parallel line between L1 and L4, and the distance from L6 to L1 and L4 is equal. For example, for the group of Level 2 connection points p5, p6, and p7, the cabling quality inspection device first identifies the two farthest Level 2 edge connection points p5 and p7 along the Y-axis. The corresponding Level 2 edge lines L5 and L2 extend along the X-axis (L2 is also a Level 1 edge line), passing through p5 and p7 respectively, thus representing the positions of p5 and p7 in the Y-axis. Based on the positions of p5 and p7 in the Y-axis, the cabling quality inspection device can determine the Level 2 intermediate reference line L7 corresponding to this group of Level 2 connection points. Here, L7 is the intermediate parallel line between L5 and L2, and the distance from L7 to L5 and L2 is equal.

[0073] Continue to refer to Figure 2After determining the first-level and second-level intermediate reference lines, the cabling quality inspection device can construct the perpendicular segments from each connection point to the corresponding intermediate reference line. Specifically, it can construct the perpendicular segments y1 and y2 from p1 and p2 to L3, the perpendicular segments ys1 and ys2 from p3 and p4 to L6, and the perpendicular segments ys3, ys4, and ys5 from p5, p6, and p7 to L7. Simultaneously, the cabling quality inspection device can construct the common perpendicular segments yb1 and yb2 from the second-level intermediate reference lines L6 and L7 to the first-level intermediate reference line L3. Then, the cabling quality inspection device can connect the feet of all perpendicular segments and common perpendicular segments on each intermediate baseline; that is, connect the feet of ys1 and ys2 on L6 to obtain x1; connect the feet of y1, y2, yb1 and yb2 on L3 to obtain x2; and connect the feet of ys3, ys4 and ys5 on L7 to obtain x3. In this way, the expected topology structure is obtained, consisting of connection points p1, p2, p3, p4, p5, p6 and p7, and line segments x1, x2, x3, y1, y2, ys1, ys2, ys3, ys4 and ys5.

[0074] In this embodiment of the application, the cabling quality inspection device can determine at least one actual cabling pattern connected to at least one connection point in the cabling layout; then determine the category of each actual cabling pattern according to a preset classification rule, and simplify each actual cabling pattern to obtain at least one corresponding actual connection line, thereby obtaining a cabling result topology structure including at least one connection point and at least one actual connection line.

[0075] Figure 3A , Figure 3B and Figure 3C The process of obtaining the actual wiring pattern is illustrated and will be explained with reference to diagrams. For example... Figure 3A As shown, the wiring quality inspection device can determine connection points p11, p12, p13, p14, p15, p16, p17, and p18 in the wiring diagram. Then, as... Figure 3B As shown, the cabling quality inspection device can determine the corresponding positions of connection points p11, p12, p13, p14, p15, p16, p17, and p18 in the existing cabling layout, and determine the actual cabling pattern connecting these connection points in the existing cabling layout. Finally, as... Figure 3C As shown, the actual wiring pattern obtained is extracted.

[0076] In some embodiments of this application, the actual wiring patterns include: rectangles, paths, and polygons. Figure 4A , Figure 4B and Figure 4CExamples of obtaining at least one actual connection corresponding to the actual wiring diagrams for these three categories are provided, and will be explained with reference to the illustrations.

[0077] like Figure 4A As shown, the actual wiring pattern G1 is a rectangle. The wiring quality inspection device can take the perpendicular bisector a of the short side of the rectangle in G1 as the actual connection line corresponding to G1.

[0078] like Figure 4B As shown, the actual wiring pattern G2 is a path. The wiring quality inspection device can connect the center point along the path axis in G2 to obtain the actual connection b, c and d corresponding to G2.

[0079] like Figure 4C As shown, the actual routing patterns G3 and G4 are polygons. G3 is connected to the through-hole V1 via the through-hole connection line j, and G4 is connected to the through-hole V2 via the through-hole connection line k. The through-holes V1 and V2 have a "next" label, indicating that they can connect to the next layer of routing. For G3, the routing quality inspection device can take the perpendicular bisector g of the through-hole connection line j as the actual connection line corresponding to G3, and determine the actual connections e and f according to the method corresponding to the actual routing pattern of the path category, thus obtaining the actual connections e, f, and g corresponding to G3. For G4, the routing quality inspection device can take the perpendicular bisector i of the through-hole connection line k as the actual connection line corresponding to G4, and determine the actual connection h according to the method corresponding to the actual routing pattern of the rectangle category, thus obtaining the actual connections h and i corresponding to G4.

[0080] S102. For each signal to be tested, compare the wiring result topology with the expected topology to obtain the topology comparison result corresponding to each signal to be tested.

[0081] In this embodiment of the application, after obtaining the topology of the wiring result and the expected topology, the wiring quality detection device can compare the topology of the wiring result and the expected topology to obtain the topology comparison result corresponding to each signal to be detected.

[0082] In this embodiment of the application, the cabling quality detection device can calculate the expected cabling length of the expected topology and the actual cabling length of the cabling result topology, and compare the actual cabling length with the expected cabling length to obtain the topology comparison result.

[0083] The expected wiring length includes the total expected wiring length, which is the total length of all expected connections in the expected topology; the actual wiring length includes the total actual wiring length, which is the total length of all actual connections in the resulting wiring topology. The wiring quality inspection device can use the ratio of the actual total wiring length to the expected total wiring length as the topology comparison result. As shown in Table 1:

[0084] signal name Actual total wiring length Total expected wiring length ratio netA 963.417 679.419 141.8％ netB 5691.201 5169.737 110.1％ netC 2134.079 944.885 225.9％

[0085] Table 1

[0086] Table 1 above lists the actual total wiring length, expected total wiring length, and their ratios for the three signals to be detected: netA, netB, and netC. ​​The ratio of the actual total wiring length to the expected total wiring length for netA is 141.8%, for netB it is 110.1%, and for netC it is 225.9%.

[0087] In addition, the expected wiring length includes at least one expected wiring layer length, i.e., the expected interconnect length corresponding to at least one metal layer; the actual wiring length also includes at least one actual wiring layer length, i.e., the actual interconnect length corresponding to at least one metal layer. The wiring quality inspection device can compare each actual wiring layer length with the expected wiring layer length corresponding to the same metal layer to obtain at least one metal layer ratio as the topology comparison result. It should be noted that the routed layout includes at least one metal layer, and the metal interconnects in different metal layers are located in different positions in the actual chip structure, i.e., the upper layer metal interconnect is located above the lower layer metal interconnect.

[0088] In some embodiments of this application, at least one expected wiring layer length may be a preset length corresponding to at least one metal layer, that is, the expected interconnect length may be a preset value. As illustrated in Table 2:

[0089] signal name Actual cabling layer length (Mx) Expected cabling layer length (Mx) netA - 150 netB 615.245 150 netC 246.874 150

[0090] Table 2

[0091] Table 2 above lists the actual and expected routing layer lengths of the three signals to be detected, netA, netB, and netC, on the Mx metal layer. netA has no actual routing layer length on Mx, meaning there is no metal routing for netA on this metal layer. The actual routing layer length of netB on Mx is 615.245; the actual routing layer length of netC on Mx is 246.874. The expected routing layer lengths of netA, netB, and netC on Mx are all preset to 150.

[0092] S103. If the topology comparison result is greater than the preset threshold, then it is determined that the corresponding signal to be detected has an unreasonable wiring detection result.

[0093] In this embodiment of the application, the cabling quality detection device can compare the topology comparison result of each signal to be detected with a preset threshold; if the topology comparison result is greater than the preset threshold, it can be determined that the corresponding signal to be detected has an unreasonable cabling detection result.

[0094] In this embodiment, the cabling quality detection device can compare the ratio of the actual total cabling length to the expected total cabling length corresponding to the signal to be detected with a preset threshold for the corresponding total length ratio. For example, if the preset threshold is 120%, then the ratios of netA and netC in Table 1 are both greater than the preset threshold, and it can be determined that netA and netC have detection results of unreasonable cabling.

[0095] In this embodiment, the cabling quality inspection device can also compare the ratio of the actual cabling layer length to the expected cabling layer length with a preset threshold for the corresponding layer length ratio for any metal layer. For example, if the preset threshold is 100%, then the ratios of netB and netC in Table 2 are both greater than the preset threshold, indicating that netB and netC have unreasonable cabling detection results. It can be understood that setting the preset threshold for the layer length ratio to 100% indicates that the actual cabling layer length should not exceed the corresponding expected cabling layer length.

[0096] S104. Generate a quality inspection report based on the detection results of each signal to be detected.

[0097] In this embodiment, after determining the detection result of each signal to be tested, the cabling quality inspection device can generate a quality inspection report based on the detection result of each signal to be tested. The quality inspection report may include the topology comparison result and cabling location information for each signal to be tested. The cabling location information is used to display the actual cabling pattern corresponding to the signal to be tested in the cabling layout, and may be the coordinate information of the connection points.

[0098] Understandably, wiring quality inspection devices can identify unreasonable wiring by comparing and judging the resulting wiring topology with the expected topology. This allows for automatic wiring quality inspection simply by running a program, eliminating the need for designers to manually check and verify each result. This automates wiring quality inspection, saving inspection time. Consequently, it facilitates later modifications and improvements to the automatic wiring by designers, shortening the chip development cycle.

[0099] In some embodiments of this application, in Figure 1The S104 shown also includes Figure 5 S105, shown below, will be explained in conjunction with each step.

[0100] S105. Based on the quality inspection report, display the inspection results in the already routed layout.

[0101] In this embodiment, the cabling quality inspection device can display inspection results in the cabling layout based on a quality inspection report to assist designers in viewing and locating unreasonable cabling. After opening the cabling layout, designers can read the quality inspection report and select the signal to be displayed from the set of signals to be inspected. The cabling quality inspection device can receive the selection operation of the set of signals to be inspected, determine the signal to be displayed, and determine the corresponding inspection result based on the quality inspection report; if the inspection result indicates that the signal to be displayed has unreasonable cabling, the cabling quality inspection device can highlight the unreasonable cabling in the cabling layout. For example, the unreasonable cabling can be highlighted, such as... Figure 6 As shown, the cabling quality inspection device highlights unreasonable cabling passing through connection points p21, p22, p23, and p24 in the cabling layout. The direct connections between p21, p22, p23, and p24 are not actual cabling but are used to help designers locate connection points. This completes the display of the inspection results in the cabling layout.

[0102] In this embodiment, after an unreasonable routing for a signal to be tested is displayed in the wiring layout, the designer can modify the unreasonable routing. After modification, the designer clicks on the signal to be tested again in the set of signals to be tested. The wiring quality testing device then repeats the wiring quality testing method described above for the signal to be tested, obtaining the corresponding test result. If the test result does not show any unreasonable routing, the wiring quality testing device displays a "Pass" message in the viewing interface and removes the highlight of the signal to be tested. If the test result still shows unreasonable routing, the wiring quality testing device displays the unreasonable item information of the test result in the viewing interface and highlights the unreasonable routing of the signal to be tested again to prompt the designer to continue modification. This process is repeated until the test results for all signals to be tested show no unreasonable routing.

[0103] It should be noted that modifications to unreasonable wiring can also be accomplished through automatic wiring, and there are no restrictions on this.

[0104] Understandably, cabling quality inspection devices highlight unreasonable cabling in the cabling layout, which helps designers modify and improve unreasonable cabling, thereby optimizing the actual cabling into the best solution.

[0105] In some embodiments of this application, it can be achieved through Figure 7 The shown S201 to S204 are implemented to achieve this. Figure 1 S101, shown below, will be explained in conjunction with each step.

[0106] S201. Obtain the routed circuit diagram corresponding to the routed layout.

[0107] In this embodiment of the application, since it may be difficult to clearly show all the connection objects and connection points through which the signal to be detected passes in the existing wiring layout, the wiring quality detection device can first obtain the wiring circuit diagram corresponding to the existing wiring layout.

[0108] S202. Based on the existing wiring layout and the existing wiring circuit diagram, determine at least one connection point corresponding to each signal to be detected.

[0109] In this embodiment, after acquiring the wiring diagram, the wiring quality inspection device can determine at least one connection point corresponding to each signal to be tested based on the wiring layout and the wiring diagram. The wiring quality inspection device can first obtain the connection object identifier in the wiring diagram, then match the connection object in the wiring layout, and determine the connection point.

[0110] S203. Based on at least one connection point corresponding to each signal to be detected, determine the expected topology corresponding to each signal to be detected in the set of signals to be detected from the routing layout.

[0111] In this embodiment, after determining at least one connection point corresponding to each signal to be tested, the cabling quality inspection device can determine the expected topology corresponding to each signal to be tested from the cabling layout based on at least one connection point. The cabling quality inspection device can determine N levels of expected connections (N greater than or equal to 1) in a hierarchical manner, thereby forming the expected topology.

[0112] S204. Based on at least one connection point corresponding to each signal to be detected, determine the routing result topology of each signal to be detected in the set of signals to be detected from the existing routing layout.

[0113] In this embodiment, after determining at least one connection point corresponding to each signal to be tested, the cabling quality inspection device can also determine the cabling result topology corresponding to each signal to be tested from the cabling layout based on at least one connection point. The cabling quality inspection device can first determine at least one actual cabling pattern connected to at least one connection point in the cabling layout; then, it can simplify each actual cabling pattern according to its category to obtain at least one corresponding actual connection, thereby forming the cabling result topology.

[0114] Understandably, the cabling quality inspection device first determines the location of at least one connection point along the route in the existing cabling layout, and then obtains the cabling result topology and the expected topology based on at least one connection point. In this way, the obtained expected topology is more consistent with the actual situation, and it is more accurate as a comparison object for the cabling result topology, thus enabling more accurate determination of unreasonable cabling.

[0115] In some embodiments of this application, at least one connection point includes N-level connection points, where N is greater than or equal to 1; it can be achieved through... Figure 8 The shown S301 to S305 are implemented to achieve this. Figure 7 S203, shown below, will be explained in conjunction with each step.

[0116] S301. In the existing wiring layout, at least one connection point corresponding to each signal to be detected is taken as the first-level connection point; based on the first-level connection points, the first-level intermediate baseline is determined.

[0117] In this embodiment of the application, the cabling quality inspection device can first take at least one connection point as a first-level connection point in the cabling layout, and determine the first-level intermediate baseline based on the first-level connection point.

[0118] S302. Determine the connection points of the i-1th level whose axial distance is less than the preset threshold of the i-th level as the i-th level connection points; determine the intermediate baseline of the i-th level based on the i-th level connection points; wherein i is greater than or equal to 2 and i is less than or equal to N-1; the axial distance is the distance along the first axis or the second axis; the first axis is perpendicular to the second axis.

[0119] In this embodiment, the cabling quality detection device can start by determining the second-level intermediate baseline, identify connection points in the (i-1)th-level connection points whose axial distance is less than the i-th-level preset threshold as i-th-level connection points, and determine the i-th-level intermediate baseline based on the i-th-level connection points. Here, i is greater than or equal to 2 and less than or equal to N-1; the axial distance is the distance along the first axial direction or the second axial direction, and the first axial direction is perpendicular to the second axial direction.

[0120] S303. Continue to determine the (i+1)th level connection point and the (i+1)th level intermediate baseline until the Nth level connection point and the Nth level intermediate baseline are determined.

[0121] In this embodiment of the application, the cabling quality detection device can continue to determine the (i+1)th level connection point and the (i+1)th level intermediate baseline until the Nth level connection point and the Nth level intermediate baseline are determined. In this way, the Nth level connection point and the Nth level intermediate baseline are obtained.

[0122] S304. Based on the N-level connection points and N-level intermediate baselines, determine the expected connection for each level, thereby determining the expected connection for the N-level.

[0123] In this embodiment of the application, the cabling quality detection device can determine the expected connection of each level based on each connection point and each intermediate baseline in the N-level connection points and N-level intermediate baselines, thereby determining the expected connection of the N-level.

[0124] S305. At least one connection point and N levels of expected connections form the expected topology structure corresponding to each signal to be detected in the set of signals to be detected.

[0125] In this embodiment of the application, the cabling quality inspection device can form the expected topology structure corresponding to each signal to be inspected in the set of signals to be inspected by at least one connection point and N-level expected connections.

[0126] Understandably, the cabling quality inspection device classifies all connection points according to the axial distance between them, and determines the expected connection of level N step by step. This can reduce the total length of the expected connection. At the same time, the determined expected connection is more in line with the design habits in actual cabling, so as to more accurately judge unreasonable cabling.

[0127] In some embodiments of this application, it can be implemented via S3041 to S3043. Figure 8 The S304 shown will be explained in conjunction with each step.

[0128] S3041. Based on the Nth level connection point and the Nth level intermediate baseline, determine the expected Nth level connection.

[0129] In this embodiment of the application, after determining the Nth level connection point and the Nth level intermediate baseline, the cabling quality detection device can first determine the expected Nth level connection based on the Nth level connection point and the Nth level intermediate baseline.

[0130] S3042. Based on the j-th level connection point, the j-th level intermediate baseline, and the j+1-th level expected connection, determine the j-th level expected connection; where j is greater than or equal to 2 and j is less than or equal to N-1.

[0131] In this embodiment of the application, the cabling quality detection device can start from the (N-1)th level expected connection and determine the j-th level expected connection based on the j-th level connection point, the j-th level intermediate baseline and the j+1th level expected connection; wherein, j is greater than or equal to 2 and j is less than or equal to N-1.

[0132] S3043. Continue to determine the expected connection of level j-1 until the expected connection of level 1 is determined, thereby determining the expected connection of level N.

[0133] In this embodiment of the application, the cabling quality detection device can continue to determine the expected connection of level j-1 until the expected connection of level 1 is determined, thereby determining the expected connection of level N.

[0134] Understandably, the cabling quality inspection device can first determine the expected connections at level N, and then determine the expected connections at the next higher level in reverse order until the expected connections at level 1 are determined, thus completing the determination of the expected connections at level N. Since the expected connections include the connections between the intermediate baselines of each level and the intermediate baselines of the next higher level, the reverse order determination can effectively ensure that no connection between these baselines is missed.

[0135] In some embodiments of this application, it can be implemented via S3011 to S3012. Figure 8 The steps shown in S301 will be explained in conjunction with each step.

[0136] S3011. Determine the two first-level edge connection points that are furthest apart along the first axis among the first-level connection points.

[0137] In this embodiment of the application, after the wiring quality detection device identifies at least one connection point as a first-level connection point, it can determine the two first-level edge connection points that are furthest apart along the first axial direction among the first-level connection points. For example... Figure 2 As shown in the example, p3 and p7 are the two farthest first-order edge connection points along the Y-axis (i.e., the first axis).

[0138] S3012. The first-level intermediate baseline is determined along the second axis by passing through the midpoint of the line connecting the two first-level edge connection points.

[0139] In this embodiment of the application, after the wiring quality detection device determines two first-level edge connection points, it can determine the first-level intermediate reference line along the second axis through the midpoint of the line connecting the two first-level edge connection points. For example... Figure 2 As shown in the example, L3 is the first intermediate reference line along the X-axis (i.e., the second axis) passing through the midpoint of the line connecting p3 and p7.

[0140] In some embodiments of this application, it can be implemented via S3021 to S3022. Figure 8 The step S302 shown will be explained in conjunction with each step.

[0141] S3021. Determine the two i-th level edge connection points that are farthest apart along the first axis among the i-th level connection points.

[0142] In this embodiment of the application, starting from determining the intermediate baseline of the second level, the wiring quality detection device can determine the connection point in the (i-1)th level connection point whose axial distance is less than the preset threshold of the i-th level as the i-th level connection point, and then determine the two i-th level edge connection points with the farthest distance along the first axial direction among the i-th level connection points.

[0143] S3022. The midpoint of the line connecting the two i-th level edge connection points is used to determine the i-th level intermediate baseline along the second axis.

[0144] In this embodiment, after the wiring quality detection device determines two i-th level edge connection points, it can determine the i-th level intermediate reference line along the second axis through the midpoint of the line connecting the two i-th level edge connection points. In this way, the intermediate reference line can be determined sequentially up to the N-th level.

[0145] In some embodiments of this application, it can be implemented via S3044 to S3046. Figure 8 The S304 shown will be explained in conjunction with each step.

[0146] S3044. For the first connection point in each level of N-level connection points that does not meet the preset distance condition, connect the first connection point of each level to the foot of the perpendicular of its corresponding intermediate baseline of each level to obtain the first sub-expected connection line corresponding to the first connection point.

[0147] In this embodiment of the application, for the first connection point in each level of N-level connection points that does not meet the preset distance condition, the wiring quality detection device can connect the first connection point of each level to the foot of the perpendicular of its corresponding intermediate baseline of each level to obtain the first sub-expected connection corresponding to the first connection point; wherein, the preset distance condition corresponding to each level of connection point is that the axial distance is less than the preset threshold of the next level.

[0148] S3045. For each level of N-level connection points, the second connection point that meets the preset distance condition is connected to the common perpendicular line segment from the intermediate baseline of the level corresponding to the second connection point to the intermediate baseline of the next level, to obtain the second sub-expected connection line corresponding to the second connection point; wherein, the first sub-expected connection line and the second sub-expected connection line are the expected connection lines of each level.

[0149] In this embodiment, for the second connection point in each level of N-level connection points that meets the preset distance condition, the cabling quality detection device can connect the common perpendicular segment from the intermediate baseline of the level corresponding to the second connection point to the intermediate baseline of the next level, to obtain the second sub-expected connection corresponding to the second connection point. The first sub-expected connection and the second sub-expected connection serve as the expected connection for each level.

[0150] S3046. Until the N-level connection points are connected, determine the expected N-level connection.

[0151] In this embodiment of the application, the cabling quality detection device completes the above process sequentially until the N-level connection point is connected, and the expected N-level connection can be determined.

[0152] Understandably, the cabling quality inspection device determines the expected N-level connections step by step, which can reduce the total length of the expected connections. At the same time, the determined expected connections are more in line with the design habits in actual cabling, thus enabling more accurate identification of unreasonable cabling.

[0153] In some embodiments of this application, it can be achieved through Figure 9 The shown S401 to S403 are implemented to achieve this. Figure 7 S204, shown below, will be explained in conjunction with each step.

[0154] S401. In the existing wiring layout, identify at least one actual wiring pattern that is connected to at least one connection point.

[0155] In this embodiment of the application, during the process of obtaining the topology of the wiring result, the wiring quality inspection device can first determine at least one actual wiring pattern connected to at least one connection point in the already wired layout. The actual wiring pattern is the metal wire that electrically connects each connection point in the layout.

[0156] S402. Determine the category of each actual wiring pattern in at least one actual wiring pattern, and simplify each actual wiring pattern to obtain at least one actual connection corresponding to at least one actual wiring pattern.

[0157] In this embodiment of the application, after determining at least one actual wiring pattern, the wiring quality detection device can first determine the category of each actual wiring pattern, and then simplify the corresponding actual wiring pattern according to the corresponding category, thereby obtaining at least one actual connection corresponding to at least one actual wiring pattern.

[0158] S403. At least one connection point and at least one actual connection line form the wiring result topology corresponding to each signal to be tested in the set of signals to be tested.

[0159] In this embodiment of the application, after the wiring quality detection device obtains at least one actual connection, it can form the wiring result topology structure corresponding to each signal to be detected by at least one connection point and at least one actual connection.

[0160] In some embodiments of this application, it can be implemented via S4021 to S4024. Figure 9 The S402 shown will be explained in conjunction with each step.

[0161] S4021. Determine if each actual wiring pattern belongs to one of the following: rectangle, path, or polygon.

[0162] In this embodiment, the actual wiring pattern can be categorized as a rectangle, path, or polygon. The wiring quality inspection device can determine that each actual wiring pattern belongs to one of these categories.

[0163] S4022. If any actual wiring pattern is a rectangle, then the perpendicular bisector of the short side of the rectangle in the actual wiring pattern shall be taken as at least one corresponding actual connection line.

[0164] In this embodiment of the application, if the wiring quality detection device determines that any actual wiring pattern belongs to a rectangle, it can take the perpendicular bisector of the short side of the rectangle in the actual wiring pattern as at least one corresponding actual connection line. For example... Figure 4A As shown, the actual wiring pattern G1 is a rectangle. The wiring quality inspection device can take the perpendicular bisector a of the short side of the rectangle in G1 as the actual connection line corresponding to G1.

[0165] S4023. If any actual wiring pattern belongs to a path, then connect the center point along the path axis in the actual wiring pattern as at least one corresponding actual connection line.

[0166] In this embodiment of the application, if the wiring quality detection device determines that any actual wiring pattern belongs to a path, it can connect the center point along the path axis of the actual wiring pattern as at least one corresponding actual connection line. For example... Figure 4B As shown, the actual wiring pattern G2 is a path. The wiring quality inspection device can connect the center point along the path axis in G2 to obtain the actual connection b, c and d corresponding to G2.

[0167] S4024. If any actual wiring pattern is a polygon, it indicates that the actual wiring pattern is connected to the through-hole by the through-hole connection line. Then, the perpendicular bisector of the through-hole connection line in the actual wiring pattern is taken as at least one actual connection line, thereby obtaining at least one actual connection line corresponding to at least one actual wiring pattern.

[0168] In this embodiment, if the wiring quality inspection device determines that any actual wiring pattern belongs to a polygon, it can take the perpendicular bisector of the layer via connection line in the actual wiring pattern as at least one corresponding actual connection line, thereby obtaining at least one actual connection line corresponding to at least one actual wiring pattern. Here, belonging to a polygon indicates that the actual wiring pattern is connected to the layer via connection line. For example... Figure 4C As shown, the actual wiring patterns G3 and G4 are polygons. For G3, the wiring quality inspection device can take the perpendicular bisector g of the through-hole connection line j as the actual connection line corresponding to G3. For G4, the wiring quality inspection device can take the perpendicular bisector i of the through-hole connection line k as the actual connection line corresponding to G4.

[0169] Understandably, the cabling quality inspection device simplifies the actual cabling pattern according to its type, and the resulting actual connection is more in line with the design concept and habits of the layout cabling design. It can more accurately reflect the electrical meaning of the layout cabling design, and thus obtain a more accurate cabling topology.

[0170] In some embodiments of this application, it can be achieved through Figure 10 The shown S2021 to S2023 are implemented. Figure 7 The step S202 shown will be explained in conjunction with each step.

[0171] S2021. In the wiring diagram, obtain at least one connection object identifier corresponding to each signal to be detected.

[0172] In this embodiment of the application, when the wiring quality detection device acquires at least one connection point, it can first acquire at least one connection object identifier corresponding to each signal to be detected in the wiring circuit diagram.

[0173] It should be noted that a connection object identifier is a symbol for an electrically connected object in a routed circuit diagram, representing a module (instance) with a specific function in the circuit. Every connection object identifier in a routed circuit diagram has a corresponding connection object in the routed layout. A connection object is a graphic in the routed layout, representing that the corresponding physical area in the chip can form that module and implement its function.

[0174] S2022. In the already routed layout, match at least one connection object corresponding to at least one connection object identifier.

[0175] In this embodiment of the application, after the cabling quality inspection device determines at least one connection object identifier, it can match at least one connection object corresponding to at least one connection object identifier in the cabling layout.

[0176] S2023. In the existing wiring layout, based on at least one connection object, determine at least one connection point corresponding to each signal to be detected.

[0177] In this embodiment of the application, after the cabling quality detection device has matched at least one connection object, it can determine at least one connection point corresponding to each signal to be detected in the cabling layout based on at least one connection object.

[0178] It should be noted that the objects being connected are electrically connected through connection points. Once the connection points are determined, the endpoints through which the signal to be detected will pass are also determined.

[0179] Understandably, wiring quality inspection devices determine at least one connection point based on the wiring diagram, enabling a more comprehensive identification of the required connection points and avoiding omissions.

[0180] In some embodiments of this application, it can be implemented via S1021 to S1022. Figure 1 S102, shown below, will be explained in conjunction with each step.

[0181] S1021. Calculate the actual wiring length corresponding to the topology of the wiring result and the expected wiring length corresponding to the expected topology.

[0182] In this embodiment of the application, when comparing the topology of the wiring result with the expected topology, the wiring quality detection device can first calculate the expected wiring length of the expected topology and the actual wiring length of the wiring result topology.

[0183] S1022. Compare the actual wiring length with the expected wiring length to obtain the topology comparison results.

[0184] In this embodiment of the application, the cabling quality detection device can compare the actual cabling length with the expected cabling length to obtain the topology comparison result.

[0185] Understandably, the wiring quality inspection device compares the actual wiring length with the expected wiring length, which helps to adjust the actual wiring length, appropriately reduce the actual wiring length, thereby reducing the area occupied in the processing, shrinking the chip size, and saving processing costs.

[0186] In some embodiments of this application, the actual wiring length includes: the total actual wiring length; the total actual wiring length is the total length of all actual connections in the wiring result topology; the expected wiring length includes: the total expected wiring length; the total expected wiring length is the total length of all expected connections in the expected topology; the above-mentioned S1022 can be implemented by S1023, which will be explained in conjunction with each step.

[0187] S1023. The ratio of the actual total wiring length to the expected total wiring length is used as the topology comparison result.

[0188] In this embodiment of the application, the cabling quality detection device can use the ratio of the actual total cabling length to the expected total cabling length as the topology comparison result.

[0189] In some embodiments of this application, the actual wiring length further includes: at least one actual wiring layer length; the at least one actual wiring layer length is the actual connection length corresponding to at least one metal layer in the wiring result topology; the expected wiring length further includes: at least one expected wiring layer length; the at least one expected wiring layer length is the expected connection length corresponding to at least one metal layer; the above-mentioned S1022 can be implemented by S1024, which will be described in conjunction with each step.

[0190] S1024. Compare each actual wiring layer length in at least one actual wiring layer length with the corresponding expected wiring layer length in at least one expected wiring layer length, and use the resulting ratio of at least one metal layer as the topology comparison result.

[0191] In this embodiment of the application, the cabling quality testing device can compare each actual cabling layer length in at least one actual cabling layer length with the corresponding expected cabling layer length in at least one expected cabling layer length, and the resulting ratio of at least one metal layer can be used as the topology comparison result.

[0192] Understandably, cabling quality testing devices employ diverse comparison methods, such as total length comparison and layer length comparison, to more comprehensively evaluate actual cabling, thereby helping designers optimize actual cabling into the best solution.

[0193] In some embodiments of this application, it can be implemented via S1051 to S1053. Figure 5 S105, shown below, will be explained in conjunction with each step.

[0194] S1051, Receive the selection operation of the set of signals to be detected, and determine the signal to be displayed.

[0195] In this embodiment of the application, after generating a quality inspection report, the cabling quality inspection device can receive the selection operation of the set of signals to be inspected by the designer and determine the signals to be displayed.

[0196] S1052. Based on the quality inspection report, determine the test result corresponding to the signal to be displayed.

[0197] In this embodiment of the application, after the wiring quality detection device determines the signal to be displayed, it can determine the detection result corresponding to the signal to be displayed based on the quality detection report. The detection result can characterize whether the signal to be displayed has unreasonable wiring.

[0198] S1053. If the test result indicates that the signal to be displayed has unreasonable wiring, then the unreasonable wiring will be highlighted in the already wired layout, thus completing the display of the test result in the already wired layout.

[0199] In this embodiment of the application, if the detection result indicates that the signal to be displayed has unreasonable wiring, the wiring quality detection device can highlight the unreasonable wiring in the wiring layout, for example, by highlighting the unreasonable wiring. Figure 6 As shown. This completes the process of displaying the test results in the already routed layout.

[0200] Understandably, the cabling quality inspection device receives viewing and selection operations from designers, highlights unreasonable cabling in the cabling layout, and helps designers modify and improve unreasonable cabling, thereby optimizing the actual cabling into the optimal solution.

[0201] Figure 11 This is an optional flowchart illustrating the cabling quality inspection method provided in this application embodiment, which will be combined with... Figure 11 The steps shown are explained.

[0202] S501. Obtain the list of signals to be detected.

[0203] In this embodiment, the cabling quality inspection device first acquires a list of signals to be inspected. This list includes all signals requiring cabling quality inspection.

[0204] S502. Extract the topology of the routing results from the already routed layout.

[0205] In this embodiment of the application, the cabling quality inspection device can extract the cabling result topology corresponding to each signal to be inspected from the cabling layout.

[0206] S503, Generate the expected topology.

[0207] In this embodiment, the cabling quality detection device generates the expected topology for each signal to be detected.

[0208] S504. Analyze and compare the two topologies to determine whether the automatic routing meets the design expectations.

[0209] In this embodiment, the cabling quality detection device analyzes and compares the two topologies to determine whether the automatic cabling meets expectations.

[0210] S505. Generate a wiring error report, which reports the type and location of the signal to be tested that does not meet expectations.

[0211] In this embodiment of the application, if the wiring quality inspection device determines that the automatic wiring of any signal to be inspected does not meet the design expectations, it generates a wiring error report for the signal to be inspected, reporting the type and location of the non-compliance. The type of non-compliance may include: exceeding the total wiring length limit, and exceeding the layer length limit.

[0212] S506. Visualize the test results.

[0213] In this embodiment of the application, after obtaining the detection results including the wiring error report, the wiring quality detection device can visualize the detection results, making it easier for designers to modify and improve them.

[0214] In some embodiments of this application, it can be achieved through Figure 12 The shown S5021 to S5027 implement this. Figure 11 The S502 shown will be explained in conjunction with each step.

[0215] S5021. Obtain all instance (module) identifiers and pin (connection point) identifiers for the signal to be tested from the wiring diagram.

[0216] In this embodiment, since the routing layout may lack the pins or labels corresponding to the signal to be tested, the routing quality inspection device can capture the identifiers of all instances and pins connected to the specified signal to be tested in the routing circuit diagram corresponding to the layout. The names of the corresponding instances in the routing circuit diagram completely match those in the routing layout.

[0217] S5022. Match the corresponding instance and pin in the already routed layout.

[0218] In this embodiment of the application, the cabling quality detection device can match the corresponding instance in the layout and find the pin that needs to be connected.

[0219] S5023. Obtain the actual routing pattern from the already routed layout.

[0220] In the embodiments of this application, such as Figure 3B As shown, the cabling quality inspection device can obtain the actual cabling pattern of pin connections and the actual cabling pattern of connections through CT (Contect) or Via (through hole) in the cabling layout.

[0221] S5024. Extract the obtained actual wiring pattern.

[0222] In the embodiments of this application, such as Figure 3C As shown, the cabling quality inspection device can extract the actual cabling pattern obtained for subsequent simplification and calculation.

[0223] S5025, Read the actual wiring diagram.

[0224] In this embodiment of the application, the wiring quality detection device can read all the actual wiring patterns obtained in S5024.

[0225] S5026. Classify the actual wiring diagrams.

[0226] In this embodiment of the application, the wiring quality inspection device can classify actual wiring patterns:

[0227] I. Classify according to the metal layers of the actual wiring pattern;

[0228] Second, based on the type of actual routing pattern, actual routing patterns can be classified into rectangles, paths, and polygons, and simplified accordingly. Simplification methods can be found in [reference needed]. Figure 4A , Figure 4B and Figure 4C .

[0229] S5027. Calculate the length of the actual wiring diagram.

[0230] In this embodiment, the wiring quality inspection device can form a wiring result topology structure by combining the simplified actual connections obtained in S5026 with the connection points obtained in S5022. Simultaneously, the wiring quality inspection device can calculate the length of each actual wiring pattern and summarize the total wiring length and wiring layer length corresponding to the signal to be inspected. This yields the physical connection calculation result of the automatic wiring. The total wiring length is the length of all actual connections corresponding to the signal to be inspected, and the wiring layer length is the length of the actual connections corresponding to different metal layers obtained by adding the actual connections corresponding to each metal layer.

[0231] In some embodiments of this application, it can be achieved through Figure 13 The shown S5031 to S5035 implement this. Figure 11 The S503 shown will be explained in conjunction with each step.

[0232] S5031, Obtain the position coordinates of all pins.

[0233] In this embodiment of the application, the wiring quality inspection device can obtain the position coordinates of all pins of the signal connection to be inspected in the existing wiring layout. For example... Figure 2 As shown, I1, I2, I3, I4, I5, I6 and I7 represent the instances to which the signal to be detected is connected; p1, p2, p3, p4, p5, p6 and p7 represent the pins to which the signal to be detected is connected, and the position coordinates of all pins can be obtained.

[0234] S5032. Calculate the maximum and minimum Y coordinates of all pin coordinates to obtain the intermediate baseline.

[0235] In this embodiment of the application, the wiring quality detection device can calculate the maximum and minimum Y coordinates of all pin coordinates, such as... Figure 2 As shown, the Y-coordinates of p3 and p7 are the maximum and minimum Y-coordinates, represented by L1 and L2. The wiring quality inspection device can obtain the intermediate parallel line L3 between L1 and L2, and L3 is the intermediate reference line.

[0236] S5033, Establish the connection between each pin and the intermediate baseline.

[0237] In this embodiment of the application, the wiring quality detection device can establish a connection from the pin to the intermediate reference line, such as... Figure 2 The figures y1 and y2 are shown.

[0238] S5034. Determine the intermediate sub-baseline and connection line for each group separately.

[0239] In this embodiment, when the coordinates of multiple pin positions are within a 150×150 range, these pins form a group. The wiring quality inspection device can individually calculate the intermediate sub-baseline and connections of each group, which better conforms to the design expectations of the layout. Figure 2 As shown, p3 and p4 can form one group, and p5, p6 and p7 can form another group. The wiring quality inspection device can calculate the maximum and minimum Y coordinates of the pins within the group to obtain the intermediate sub-baselines L6 and L7. Then, establish the connections ys1 and ys2 from the pins to the sub-baselines, as well as ys3, ys4 and ys5, which are formed separately. Finally, establish the connections yb1 and yb2 from the intermediate sub-baselines L6 and L7 to the intermediate baseline L3.

[0240] S5035, Generate X-direction connection lines.

[0241] In this embodiment, the cabling quality inspection device can ultimately generate X-direction connecting lines at the intermediate baseline and intermediate sub-baseline positions, thereby forming the desired topology. This desired topology can be used to calculate the total desired cabling length as a benchmark for comparison.

[0242] In some embodiments of this application, it can be achieved through Figure 14 The shown S5041 to S5043 implement this. Figure 11 The S504 shown will be explained in conjunction with each step.

[0243] S5041. Extract the wiring layer length corresponding to different metal layers.

[0244] In this embodiment of the application, the wiring quality detection device can extract the wiring layer length corresponding to different metal layers from the length of the actual wiring pattern obtained in S5027.

[0245] S5042. Determine whether the wiring layer length exceeds the limit.

[0246] In this embodiment, the cabling quality inspection device can obtain the limiting conditions for each metal layer in the quality inspection, and compare the cabling layer length corresponding to different metal layers with the limiting conditions to determine whether the cabling layer length exceeds the limit. If the cabling layer length is greater than the limiting value, it is determined that the cabling layer length exceeds the limit.

[0247] S5043, Generate a layered length wiring error report.

[0248] In this embodiment of the application, if the wiring quality detection device determines that the wiring layer length exceeds the limit, it generates a wiring error report with information such as the report signal name and the corresponding metal layer position.

[0249] In some embodiments of this application, it can be achieved through Figure 15 The shown S5044 to S5046 implement this. Figure 11 The S504 shown will be explained in conjunction with each step.

[0250] S5044. Extract the total length of the wiring.

[0251] In this embodiment of the application, the wiring quality detection device can extract the total wiring length of all actual connections from the length of the actual wiring pattern obtained in S5027.

[0252] S5045. Determine whether the total length of the cabling exceeds the expected proportion.

[0253] In this embodiment, the cabling quality detection device can compare the total cabling length with a defined condition. If the ratio of the total cabling length to the expected value exceeds the defined condition, it is determined that the total cabling length exceeds the expected proportion.

[0254] S5046, Generate a total length wiring error report.

[0255] In this embodiment of the application, if the wiring quality detection device determines that the total wiring length exceeds the expected proportion, it generates a total length wiring error report, which includes information such as the report signal name and automatic wiring path.

[0256] In some embodiments of this application, it can be achieved through Figure 16 The shown S5061 to S5065 implement this. Figure 11 S506, shown below, will be explained in conjunction with each step.

[0257] S5061, The cabling quality testing device reads all test results.

[0258] In this embodiment of the application, after receiving an instruction from the designer to open the layout, the cabling quality inspection device can read all the inspection results corresponding to the layout.

[0259] S5062, The wiring quality testing device window displays all signals and their corresponding test results.

[0260] In this embodiment, the cabling quality testing device can display all signals and corresponding test results in a window for designers to click and operate.

[0261] S5063. When the designer clicks on the signal name, the corresponding wiring quality detection device will display the information visually.

[0262] In this embodiment, designers can click on signal names to visualize the wiring quality inspection device, thus assisting them in modifying and improving the layout. Specifically, the wiring quality inspection device can highlight physical paths of unreasonable wiring in the layout, such as... Figure 6 The bolded path in [the text]. Figure 6 In the diagram, the direct connection between p21, p22, p23, and p24 is not actual wiring, but is used to help designers locate the connection points.

[0263] S5064, Designers modify layout routing.

[0264] In this embodiment, designers can rearrange unreasonable wiring to modify and improve it.

[0265] S5065, Designers click on the signal name to re-detect and display it.

[0266] In this embodiment, after making modifications, the designer can click on the signal name to re-perform the wiring quality testing methods S501 to S505. If the signal passes the test, meaning it no longer has unreasonable wiring, the wiring quality testing device will display a "Pass" message and remove all highlighting of the signal. If the signal fails the test, meaning it still has unreasonable wiring, the wiring quality testing device will display the unreasonable items in the test result and highlight the unreasonable wiring of the signal again to prompt the designer to continue making modifications.

[0267] It is understood that the routing quality inspection method proposed in this application establishes a expected layout topology and compares it with the automatic routing results. If the specified metal layer usage exceeds limits or the routing path is unreasonable, the method reports the signal names that need correction, as well as the corresponding connection relationships and location information. Furthermore, based on the generated inspection report, it assists designers in correcting signal routing. In this way, problems can be detected in time before the simulation stage, effectively saving manual inspection time and shortening the project development cycle. In other words, this application achieves the following effects: it realizes automatic and efficient detection of automatic routing quality, enabling early detection of problems such as unreasonable automatic routing and excessive use of specified metal layers, helping designers to extract and improve solutions, and shortening the chip development cycle; the automatic routing quality inspection results are visualized, assisting layout designers in making rapid modifications and improvements.

[0268] Figure 17This is a schematic diagram of an optional structure of the wiring quality inspection device provided in an embodiment of this application. For example... Figure 17 As shown in the figure, this application embodiment also provides a cabling quality inspection device 800, including: a determining unit 804, a comparing unit 805, and a generating unit 806, wherein:

[0269] The determining unit 804 is used to determine the routing result topology and expected topology for each signal to be detected in the set of signals to be detected, based on the existing routing layout; the expected topology is obtained based on the connection point positions in the existing routing layout.

[0270] The comparison unit 805 is used to compare the wiring result topology with the expected topology for each signal to be detected, and obtain the topology comparison result corresponding to each signal to be detected.

[0271] The determining unit 804 is further configured to determine that the corresponding signal to be detected has an unreasonable wiring detection result if the topology comparison result is greater than a preset threshold.

[0272] The generation unit 806 is used to generate a quality inspection report based on the detection result of each signal to be detected.

[0273] In some embodiments of this application, the wiring quality detection device 800 further includes: a display unit 807, wherein:

[0274] Display unit 807 is used to display the test results in the wiring layout based on the quality inspection report.

[0275] In some embodiments of this application, the wiring quality inspection device 800 further includes: an acquisition unit 808, wherein:

[0276] The acquisition unit 808 is used to acquire the routed circuit diagram corresponding to the routed layout.

[0277] The determining unit 804 is further configured to: determine at least one connection point corresponding to each signal to be detected based on the already routed layout and the already routed circuit diagram; determine the expected topology corresponding to each signal to be detected in the set of signals to be detected from the already routed layout based on the at least one connection point corresponding to each signal to be detected; and determine the routing result topology corresponding to each signal to be detected in the set of signals to be detected from the already routed layout based on the at least one connection point corresponding to each signal to be detected.

[0278] In some embodiments of this application, the determining unit 804 is further configured to: in the routed layout, designate at least one connection point corresponding to each signal to be detected as a first-level connection point; determine a first-level intermediate baseline based on the first-level connection point; determine connection points in the (i-1)th level connection points whose axial distance is less than a preset threshold for the i-th level as i-level connection points; determine an i-level intermediate baseline based on the i-level connection point; wherein i is greater than or equal to 2 and i is less than or equal to N-1; the axial distance is the distance along a first axial direction or a second axial direction; the first axial direction is perpendicular to the second axial direction; continue to determine the (i+1)th level connection point and the (i+1)th level intermediate baseline until the Nth level connection point and the Nth level intermediate baseline are determined; determine the expected connection for each level based on the N-level connection point and the N-level intermediate baseline, thereby determining the N-level expected connection; the at least one connection point and the N-level expected connection form the expected topology corresponding to each signal to be detected in the set of signals to be detected.

[0279] In some embodiments of this application, the determining unit 804 is further configured to determine the expected connection of level N based on the level N connection point and the level N intermediate baseline; determine the expected connection of level j based on the level j connection point, the level j intermediate baseline and the expected connection of level j+1; wherein j is greater than or equal to 2 and j is less than or equal to N-1; continue to determine the expected connection of level j-1 until the expected connection of level 1 is determined, thereby determining the expected connection of level N.

[0280] In some embodiments of this application, the determining unit 804 is further configured to determine the two first-level edge connection points that are farthest apart along the first axial direction among the first-level connection points; and to determine the first-level intermediate reference line along the second axial direction by passing through the midpoint of the line connecting the two first-level edge connection points.

[0281] In some embodiments of this application, the determining unit 804 is further configured to determine the two i-th level edge connection points that are farthest apart along the first axial direction among the i-th level connection points; and to determine the i-th level intermediate reference line along the second axial direction by passing through the midpoint of the line connecting the two i-th level edge connection points.

[0282] In some embodiments of this application, the determining unit 804 is further configured to: for a first connection point in each level of N-level connection points that does not meet the preset distance condition, connect the first connection point in each level to the foot of the perpendicular from its corresponding intermediate baseline in each level, to obtain a first sub-expected connection line corresponding to the first connection point; for a second connection point in each level of N-level connection points that meets the preset distance condition, connect the common perpendicular segment from the intermediate baseline corresponding to the second connection point in each level to the intermediate baseline of the next level, to obtain a second sub-expected connection line corresponding to the second connection point; wherein the first sub-expected connection line and the second sub-expected connection line serve as expected connections in each level; until the N-level connection points are connected, the N-level expected connection line is determined.

[0283] In some embodiments of this application, the determining unit 804 is further configured to: determine at least one actual wiring pattern connected to the at least one connection point in the already wired layout; determine the category of each actual wiring pattern in the at least one actual wiring pattern; and simplify the correspondence of each actual wiring pattern to obtain at least one actual connection line corresponding to the at least one actual wiring pattern; the at least one connection point and the at least one actual connection line form the wiring result topology structure corresponding to each signal to be detected in the set of signals to be detected.

[0284] In some embodiments of this application, the determining unit 804 is further configured to determine that each actual wiring pattern belongs to one of rectangle, path, and polygon; if any actual wiring pattern belongs to rectangle, then the perpendicular bisector of the short side of the rectangle in the actual wiring pattern is taken as at least one corresponding actual connection line; or, if any actual wiring pattern belongs to path, then the center point along the path axis in the actual wiring pattern is connected as at least one corresponding actual connection line; or, if any actual wiring pattern belongs to polygon, indicating that the actual wiring pattern is connected to the via at the via connection line, then the perpendicular bisector of the via connection line in the actual wiring pattern is taken as at least one corresponding actual connection line, thereby obtaining at least one actual connection line corresponding to the at least one actual wiring pattern.

[0285] In some embodiments of this application, the acquisition unit 808 is further configured to acquire at least one connection object identifier corresponding to each signal to be detected in the wiring diagram; and match at least one connection object corresponding to the at least one connection object identifier in the wiring layout.

[0286] The determining unit 804 is further configured to determine, based on the at least one connection object, the at least one connection point corresponding to each signal to be detected in the wiring layout.

[0287] In some embodiments of this application, the wiring quality detection device 800 further includes: a calculation unit 809, wherein:

[0288] The calculation unit 809 is used to calculate the actual wiring length corresponding to the wiring result topology and the expected wiring length corresponding to the expected topology, respectively.

[0289] The comparison unit 805 is also used to compare the actual wiring length with the expected wiring length to obtain the topology comparison result.

[0290] In some embodiments of this application, the actual wiring length includes: the total actual wiring length; the total actual wiring length is the total length of all actual connections in the wiring result topology; the expected wiring length includes: the total expected wiring length; the total expected wiring length is the total length of all expected connections in the expected topology; the comparison unit 805 is further configured to use the ratio of the total actual wiring length to the total expected wiring length as the topology comparison result.

[0291] In some embodiments of this application, the actual wiring length further includes: at least one actual wiring layer length; the at least one actual wiring layer length is the actual connection length corresponding to at least one metal layer in the wiring result topology; the expected wiring length further includes: at least one expected wiring layer length; the at least one expected wiring layer length is the expected connection length corresponding to the at least one metal layer; the comparison unit 805 is further configured to compare each of the at least one actual wiring layer lengths with the corresponding expected wiring layer length in the at least one expected wiring layer length, and the resulting at least one metal layer ratio is used as the topology comparison result.

[0292] In some embodiments of this application, the determining unit 804 is further configured to receive a selection operation on the set of signals to be detected, determine the signal to be displayed, and determine the detection result corresponding to the signal to be displayed based on the quality inspection report.

[0293] The display unit 807 is further configured to, if the detection result indicates that the signal to be displayed has unreasonable wiring, highlight the unreasonable wiring in the wiring layout, thereby completing the display of the detection result in the wiring layout.

[0294] It should be noted that, Figure 18 An optional structural schematic diagram of the wiring quality testing device provided in the embodiments of this application is shown below. Figure 18 As shown, the hardware entity of the cabling quality inspection device 800 includes: a processor 801, a communication interface 802, and a memory 803, wherein:

[0295] The processor 801 typically controls the overall operation of the wiring quality inspection device 800.

[0296] The communication interface 802 enables the wiring quality inspection device 800 to communicate with other devices or equipment via a network.

[0297] The memory 803 is configured to store instructions and applications executable by the processor 801, and can also cache data to be processed or already processed (e.g., image data, audio data, voice communication data and video communication data) in the processor 801 and the wiring quality inspection device 800. It can be implemented by flash memory or random access memory (RAM).

[0298] It should be noted that, in the embodiments of this application, if the above-mentioned method for executing timed tasks is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the embodiments of this application, or the part that contributes to the related technology, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause the wiring quality inspection device 800 (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, mobile hard drives, read-only memory (ROM), magnetic disks, or optical disks. Thus, the embodiments of this application are not limited to any specific hardware and software combination.

[0299] Correspondingly, embodiments of this application provide a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the steps in the method corresponding to the above-described wiring quality detection device.

[0300] It should be noted that the descriptions of the storage medium and device embodiments above are similar to those of the method embodiments above, and have similar beneficial effects. For technical details not disclosed in the storage medium and device embodiments of this application, please refer to the descriptions of the method embodiments of this application for understanding.

[0301] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0302] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components can be combined, or integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the various components shown or discussed can be through some interfaces, and the indirect coupling or communication connection between devices or units can be electrical, mechanical, or other forms.

[0303] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units. They may be located in one place or distributed across multiple network units. Some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs.

[0304] In addition, each functional unit in the various embodiments of this application can be integrated into one processing unit, or each unit can be a separate unit, or two or more units can be integrated into one unit; the integrated unit can be implemented in hardware or in the form of hardware plus software functional units.

[0305] The above description is merely an embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A method for inspecting cabling quality, characterized in that, The method includes: Based on the existing routing layout, determine the routing result topology and expected topology for each signal to be detected in the set of signals to be detected; the expected topology is obtained based on the connection point positions in the existing routing layout. For each signal to be detected, the topology of the wiring result is compared with the expected topology to obtain the topology comparison result corresponding to each signal to be detected; If the topology comparison result is greater than a preset threshold, it is determined that the corresponding signal to be detected has an unreasonable wiring detection result; A quality inspection report is generated based on the detection results of each signal to be detected; The step of determining the routing result topology and expected topology for each signal to be detected in the set of signals to be detected based on the already routed layout includes: Obtain the routed circuit diagram corresponding to the routed layout; Based on the existing wiring layout and the existing wiring circuit diagram, at least one connection point corresponding to each signal to be detected is determined. Based on at least one connection point corresponding to each signal to be detected, the expected topology corresponding to each signal to be detected in the set of signals to be detected is determined from the routing layout; and, Based on at least one connection point corresponding to each signal to be detected, the routing result topology corresponding to each signal to be detected in the set of signals to be detected is determined from the routing layout; The at least one connection point includes N levels of connection points; N is greater than or equal to 1; determining the expected topology corresponding to each signal to be detected in the set of signals to be detected from the routed layout based on the at least one connection point corresponding to each signal to be detected includes: In the already routed layout, at least one connection point corresponding to each signal to be detected is designated as a first-level connection point; based on the first-level connection points, a first-level intermediate baseline is determined; The connection points with an axial distance less than the preset threshold of the i-1th level are identified as the i-th level connection points; based on the i-th level connection points, the intermediate baseline of the i-th level is determined; wherein i is greater than or equal to 2 and i is less than or equal to N-1; the axial distance is the distance along the first axis or the second axis; the first axis is perpendicular to the second axis; Continue determining the (i+1)th level connection point and the (i+1)th level intermediate baseline until the Nth level connection point and the Nth level intermediate baseline are determined; Based on the N-level connection points and N-level intermediate baselines, the expected connection at each level is determined, thereby determining the N-level expected connection. The at least one connection point and the N-level expected connection form the expected topology structure corresponding to each signal to be detected in the set of signals to be detected.

2. The wiring quality inspection method according to claim 1, characterized in that, The method for determining the expected connection at each level based on N-level connection points and N-level intermediate baselines, thereby determining the expected connection at the N-level, includes: Based on the Nth level connection point and the Nth level intermediate baseline, determine the expected Nth level connection. Based on the j-th level connection point, the j-th level intermediate baseline, and the (j+1)-th level expected connection, determine the j-th level expected connection; where j is greater than or equal to 2 and j is less than or equal to N-1; Continue determining the expected connection at level j-1 until the expected connection at level 1 is determined, thereby determining the expected connection at level N.

3. The wiring quality inspection method according to claim 1, characterized in that, The determination of the first-level intermediate baseline based on the first-level connection point includes: Identify the two first-level edge connection points that are furthest apart along the first axial direction among the first-level connection points; The first-level intermediate baseline is determined by passing through the midpoint of the line connecting the two first-level edge connection points and along the second axis.

4. The wiring quality inspection method according to claim 3, characterized in that, The determination of the i-th level intermediate baseline based on the i-th level connection point includes: Identify the two i-th level edge connection points that are furthest apart along the first axial direction among the i-th level connection points; The intermediate baseline of the i-th level is determined along the second axis by passing through the midpoint of the line connecting the two i-th level edge connection points.

5. The cabling quality inspection method according to claim 1, characterized in that, The method for determining the expected connection at each level based on N-level connection points and N-level intermediate baselines, thereby determining the expected connection at the N-level, includes: For the first connection point in each level of N-level connection points that does not meet the preset distance condition, connect the first connection point in each level to the foot of the perpendicular from the corresponding intermediate baseline of each level to obtain the first sub-expected connection line corresponding to the first connection point. For each level of N-level connection points, a second connection point that meets the preset distance condition is connected to the common perpendicular segment of the intermediate baseline of the level corresponding to the second connection point of each level to the intermediate baseline of the next level, to obtain the second sub-expected connection line corresponding to the second connection point. Among them, the first sub-expected connection and the second sub-expected connection are each level of expected connection; The expected N-level connection is determined when the N-level connection points are connected.

6. The cabling quality inspection method according to claim 1, characterized in that, The step of determining at least one connection point corresponding to each signal to be detected based on the existing wiring layout and the existing wiring circuit diagram includes: In the wiring diagram, obtain at least one connection object identifier corresponding to each signal to be detected; In the routed layout, at least one connection object is matched to the at least one connection object identifier; In the existing wiring layout, based on the at least one connection object, the at least one connection point corresponding to each signal to be detected is determined.

7. The wiring quality inspection method according to claim 1, characterized in that, For each signal to be detected, the topology of the wiring result is compared with the expected topology to obtain a topology comparison result corresponding to each signal to be detected, including: Calculate the actual wiring length corresponding to the topology of the wiring result and the expected wiring length corresponding to the expected topology, respectively. The actual wiring length is compared with the expected wiring length to obtain the topology comparison result.

8. The cabling quality inspection method according to claim 7, characterized in that, The actual wiring length includes: the total actual wiring length; the total actual wiring length is the total length of all actual connections in the wiring result topology; the expected wiring length includes: the total expected wiring length; the total expected wiring length is the total length of all expected connections in the expected topology. The actual wiring length is compared with the expected wiring length to obtain the topology comparison result, including: The ratio of the actual total wiring length to the expected total wiring length is used as the topology comparison result.

9. The wiring quality inspection method according to claim 7, characterized in that, The actual wiring length further includes: at least one actual wiring layer length; the at least one actual wiring layer length is the actual connection length corresponding to at least one metal layer in the wiring result topology; the expected wiring length further includes: at least one expected wiring layer length; the at least one expected wiring layer length is the expected connection length corresponding to at least one metal layer; The comparison of the actual wiring length with the expected wiring length to obtain the topology comparison result also includes: Each actual wiring layer length in the at least one actual wiring layer length is compared with the corresponding expected wiring layer length in the at least one expected wiring layer length, and the resulting at least one metal layer ratio is used as the topology comparison result.

10. The wiring quality inspection method according to claim 1, characterized in that, After generating a quality inspection report based on the detection results of each signal to be detected, the method further includes: Based on the quality inspection report, the inspection results are displayed in the wiring diagram.

11. The wiring quality inspection method according to claim 10, characterized in that, The step of displaying the inspection results in the routed layout based on the quality inspection report includes: Receive a selection operation on the set of signals to be detected, and determine the signal to be displayed; Based on the quality inspection report, determine the detection result corresponding to the signal to be displayed; If the detection result indicates that the signal to be displayed has unreasonable wiring, then the unreasonable wiring is highlighted in the already wired layout, thereby completing the display of the detection result in the already wired layout.

12. A method for inspecting wiring quality, characterized in that, The method includes: Based on the existing routing layout, determine the routing result topology and expected topology for each signal to be detected in the set of signals to be detected; the expected topology is obtained based on the connection point positions in the existing routing layout. For each signal to be detected, the topology of the wiring result is compared with the expected topology to obtain the topology comparison result corresponding to each signal to be detected; If the topology comparison result is greater than a preset threshold, it is determined that the corresponding signal to be detected has an unreasonable wiring detection result; A quality inspection report is generated based on the detection results of each signal to be detected; The step of determining the routing result topology and expected topology for each signal to be detected in the set of signals to be detected based on the already routed layout includes: Obtain the routed circuit diagram corresponding to the routed layout; Based on the existing wiring layout and the existing wiring circuit diagram, at least one connection point corresponding to each signal to be detected is determined. Based on at least one connection point corresponding to each signal to be detected, the expected topology corresponding to each signal to be detected in the set of signals to be detected is determined from the routing layout; and, Based on at least one connection point corresponding to each signal to be detected, the routing result topology corresponding to each signal to be detected in the set of signals to be detected is determined from the routing layout; The step of determining the routing topology corresponding to each signal to be detected in the set of signals to be detected from the already routed layout, based on at least one connection point corresponding to each signal to be detected, includes: In the existing wiring layout, at least one actual wiring pattern is determined that is connected to the at least one connection point; The category of each actual wiring pattern in the at least one actual wiring pattern is determined, and the corresponding actual wiring pattern is simplified to obtain at least one actual connection corresponding to the at least one actual wiring pattern. The at least one connection point and the at least one actual connection line form the wiring result topology corresponding to each signal to be detected in the set of signals to be detected.

13. The wiring quality inspection method according to claim 12, characterized in that, The step of determining the category of each actual wiring pattern in the at least one actual wiring pattern, and simplifying each actual wiring pattern to obtain at least one actual connection corresponding to the at least one actual wiring pattern, includes: Determine that each actual wiring pattern belongs to one of the following: rectangle, path, and polygon; If any actual routing pattern is a rectangle, then the perpendicular bisector of the shorter side of the rectangle in that actual routing pattern is taken as at least one corresponding actual connection; or, If any actual routing pattern is a path, then connect the center points along the path axis in that actual routing pattern to form at least one corresponding actual connection; or, If any actual wiring pattern is a polygon, it indicates that the actual wiring pattern is connected to the via by the via connection line. Then, the perpendicular bisector of the via connection line in the actual wiring pattern is taken as at least one actual connection line, thereby obtaining at least one actual connection line corresponding to the at least one actual wiring pattern.

14. A wiring quality testing device, characterized in that, include: Memory, used to store executable instructions; A processor, when executing executable instructions stored in the memory, implements the method according to any one of claims 1 to 11.

15. A storage medium, characterized in that, It stores executable instructions for causing a processor to execute, thereby implementing the method of any one of claims 1 to 11.

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