A method for measuring laser power based on thermoelectric elements

Abstract

The application provides a laser power measurement method based on a thermoelectric element, the method comprising: obtaining an initial temperature of the thermoelectric element, obtaining a first temperature of the thermoelectric element after the thermoelectric element is irradiated by a laser for a first time, obtaining a second temperature of the thermoelectric element after the thermoelectric element is irradiated by the laser for a second time, obtaining a maximum temperature reached by the thermoelectric element after the thermoelectric element is irradiated by the laser by using the initial temperature, the first temperature and the second temperature, and obtaining the power of the laser by using the maximum temperature. The laser power measurement method provided by the application obtains the maximum temperature reached by the thermoelectric element after the thermoelectric element is irradiated by the laser by using the initial temperature, the first temperature and the second temperature, and does not need to wait for the thermoelectric element to reach the maximum temperature after the thermoelectric element is irradiated by the laser, thereby reducing the time required for laser power measurement.

Description

Technical Field

[0001] This application relates to the field of parameter measurement technology, and in particular to a method for measuring laser power based on a thermopile. Background Technology

[0002] With the continuous development of technology, people have developed various applications for lasers in different fields, and the power of lasers used for different applications also varies. One application of lasers is to locally melt materials such as metals, and this requires a relatively large laser power.

[0003] Existing technology measures laser power by irradiating a thermopile with a laser. The thermopile's temperature rises under laser irradiation, and after a period of time, it reaches its maximum temperature and remains stable. The laser power is then obtained from this maximum temperature. However, measuring laser power using existing technology requires a considerable waiting time.

[0004] Therefore, how to quickly measure the power of a laser has become a problem that those skilled in the art urgently need to solve. Summary of the Invention

[0005] To address the aforementioned issues, this application provides a laser power measurement method based on a thermopile to solve the problem of slow laser power measurement speed in existing technologies.

[0006] This application discloses a laser power measurement method based on a thermopile, the method comprising:

[0007] Obtain the initial temperature of the thermopile;

[0008] The first temperature of the thermopile is obtained after the first time of laser irradiation of the thermopile.

[0009] The second temperature of the thermopile is obtained after the laser irradiates the thermopile for a second time;

[0010] The highest temperature reached by the thermopile when irradiated by the laser is obtained using the initial temperature, the first temperature, and the second temperature.

[0011] The power of the laser is obtained using the highest temperature.

[0012] Optionally, the step of obtaining the first temperature of the thermopile after the first time of laser irradiation further includes:

[0013] Obtain the power range of the laser to be tested;

[0014] Determine whether the maximum value of the range of laser power to be tested is less than a threshold;

[0015] If the maximum value of the power range of the laser under test is less than the threshold, the power of the laser under test will be amplified by a preset factor.

[0016] The test laser with a power amplification of a preset factor is used as the laser to perform the step of obtaining the first temperature of the thermopile after the laser irradiates the thermopile for a first time.

[0017] Optionally, obtaining the highest temperature reached by the thermopile when irradiated by the laser using the initial temperature, the first temperature, and the second temperature includes:

[0018] The difference between the first temperature and the initial temperature is taken as the first difference;

[0019] The difference between the second temperature and the first temperature is taken as the second difference.

[0020] The highest temperature reached by the thermopile when irradiated by the laser is obtained by using the first difference and the second difference.

[0021] Optionally, the thermopile-based laser power measurement method further includes:

[0022] A temperature function is fitted based on the first difference and the second difference;

[0023] The step of using the first difference and the second difference to obtain the highest temperature reached by the thermopile when irradiated by the laser includes:

[0024] The highest temperature reached by the thermopile when irradiated by the laser is obtained using the temperature function.

[0025] Optionally, the thermopile-based laser power measurement method further includes:

[0026] Obtain the laser spectral width range corresponding to the thermopile;

[0027] Determine whether the spectral width of the laser is within the range of the laser spectral width corresponding to the thermopile;

[0028] If so, then the step of obtaining the first temperature of the thermopile after the first time of laser irradiation of the thermopile is performed.

[0029] This application also provides a laser power measurement device based on a thermopile, the device comprising:

[0030] Initial temperature acquisition module, used to acquire the initial temperature of the thermopile;

[0031] The first temperature acquisition module is used to acquire the first temperature of the thermopile after the laser irradiates the thermopile for a first time.

[0032] The second temperature acquisition module is used to acquire the second temperature of the thermopile after the laser irradiates the thermopile for a second time.

[0033] The maximum temperature calculation module uses the initial temperature, the first temperature, and the second temperature to obtain the maximum temperature reached by the thermopile when irradiated by the laser.

[0034] The power conversion module uses the highest temperature to obtain the power of the laser.

[0035] Optionally, the thermopile-based laser power measurement device further includes:

[0036] The judgment module determines whether the maximum value of the range of laser power to be tested is less than a threshold.

[0037] The power amplification module amplifies the power of the laser under test by a preset factor if the maximum value of the power range of the laser under test is less than a threshold.

[0038] The test laser with a power amplification of a preset factor is used as the laser to perform the step of obtaining the first temperature of the thermopile after the laser irradiates the thermopile for a first time.

[0039] Optionally, the maximum temperature calculation module includes:

[0040] The first difference calculation unit uses the difference between the first temperature and the initial temperature as the first difference.

[0041] The second difference calculation unit uses the difference between the second temperature and the first temperature as the second difference.

[0042] The highest temperature acquisition unit uses the first difference and the second difference to obtain the highest temperature reached by the thermopile when the laser irradiates the thermopile.

[0043] Optionally, the maximum temperature calculation module includes:

[0044] The fitting unit fits a temperature function based on the first difference and the second difference.

[0045] The highest temperature acquisition unit is specifically used to obtain the highest temperature reached by the thermopile when the laser irradiates the thermopile using the temperature function.

[0046] This application also provides an electronic device, including a memory and a processor, wherein:

[0047] The memory is used to store computer programs;

[0048] The processor is used to execute the computer program to implement the above-described thermopile-based laser power measurement method.

[0049] This application also provides a computer-readable storage medium for storing a computer program, wherein the computer program, when executed by a processor, implements the above-described thermopile-based laser power measurement method.

[0050] Compared with the prior art, this application has the following beneficial effects:

[0051] This application obtains three temperatures: the initial temperature of the thermopile, the first temperature of the thermopile after a first period of laser irradiation, and the second temperature of the thermopile after a second period of laser irradiation. These three temperatures are then used to determine the maximum temperature achievable by the thermopile, and the laser power is obtained from this maximum temperature. The method provided in this application eliminates the need to wait for the thermopile to reach its maximum temperature through laser irradiation; instead, it uses the initial temperature and two temperature values ​​after a period of laser irradiation to obtain the maximum temperature value, thus reducing the time required to measure laser power compared to existing technologies. Attached Figure Description

[0052] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0053] Figure 1 A flowchart of a laser power measurement method based on a thermopile provided for this application;

[0054] Figure 2 A flowchart of another laser power measurement method based on a thermopile provided in this application;

[0055] Figure 3 A flowchart of another laser power measurement method based on a thermopile provided in this application;

[0056] Figure 4 This is a schematic diagram of a laser power measurement device based on a thermopile, provided in this application. Detailed Implementation

[0057] As described earlier, current methods for measuring laser power typically involve irradiating a thermopile with a laser. The thermopile's temperature rises under laser irradiation, and after a period of time, it reaches its maximum temperature and remains stable. The laser power value is then obtained from this maximum temperature. However, measuring laser power using existing technology requires a considerable amount of waiting time.

[0058] Research has revealed that the process of laser irradiation causing a thermopile to reach its maximum temperature and maintain stability requires a considerable amount of time, often on the order of minutes. During this temperature rise, the thermopile exhibits a predictable temperature change over time. By combining the initial temperature, the first temperature after the first moment of laser irradiation, and the second temperature after the second moment of irradiation, this predictable pattern can be obtained to determine the maximum temperature reached by the thermopile. This maximum temperature value can then be used to determine the laser power. This method reduces the time required to measure laser power.

[0059] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.

[0060] Understandably, this method can be applied to processing devices capable of data processing, such as terminal devices or servers. This method can be executed independently by a terminal device or server, or it can be applied in network scenarios where a terminal device and a server communicate, executing in cooperation. The terminal device can be a computer, mobile phone, or similar device. The server can be an application server or a web server; in actual deployment, this server can be a standalone server or a cluster of servers.

[0061] Figure 1 A flowchart of a laser power measurement method based on a thermopile is provided for this application. The method includes the following steps:

[0062] S101: Obtain the initial temperature of the thermopile.

[0063] A thermopile is a type of pyroelectric infrared sensor, a device composed of thermocouples. Pyroelectric infrared sensors utilize infrared light for data processing. The detection element is primarily made of a material with a high pyroelectric coefficient, such as lead zirconate titanate ceramics, lithium tantalate, or triglycan sulfate.

[0064] The temperature of a thermopile may vary depending on the ambient temperature in which it is located. The processing equipment can obtain the initial temperature of the thermopile in the measurement environment for laser power measurement.

[0065] S102: Obtain the first temperature of the thermopile after the first moment of laser irradiation.

[0066] Laser, short for Light Amplification by Stimulated Emission of Radiation, is a type of light emitted by atoms through stimulated emission of radiation. When an electron in an atom absorbs energy and transitions from a lower energy level to a higher energy level, and then falls back down from the higher energy level, the released energy is emitted in the form of photons.

[0067] Irradiating a thermopile with a laser converts the laser's light energy into heat energy, and the thermopile's temperature increases with the irradiation time. The "first time" chosen here refers to the duration of laser irradiation of the thermopile. This first time can be pre-set by the processing equipment, manually selected based on the laser and the thermopile, or determined through other methods; all such first times fall within the scope of this application. The first time can be arbitrary, but is generally on the order of seconds. In practical applications, one second is typically chosen as the first time.

[0068] Immediately after the laser irradiates the thermopile, the processing equipment obtains the first temperature of the thermopile.

[0069] S103: Obtain the second temperature of the thermopile after the second time of laser irradiation.

[0070] The second time here also refers to the duration of laser irradiation of the thermopile. This second time can be any time different from the first time. For example, if the first time is 1 second, the second time can be 0.5 seconds or 2 seconds, or any other time, all of which should fall within the scope of protection of this application. In practical applications, the first time is generally 1 second, and the second time is generally 2 seconds.

[0071] After the laser irradiates the thermopile for a second time, the processing device obtains the second temperature of the thermopile.

[0072] S104: The highest temperature reached by the thermopile when irradiated by laser is obtained by using the initial temperature, the first temperature, and the second temperature.

[0073] The processing device can use the difference between the initial temperature and the first temperature as the first difference, and the difference between the first temperature and the second temperature as the second difference. The processing device fits the first difference and the second difference into a temperature function, and can use this temperature function to obtain the highest temperature reached by the thermopile when irradiated by the laser.

[0074] S105: The power of the laser is obtained by utilizing the highest temperature.

[0075] The highest temperature is the highest temperature obtained by laser irradiation of the thermopile, and the processing equipment can convert the highest temperature into laser power.

[0076] The aforementioned thermopile-based laser power measurement method takes into account the influence of the thermopile's initial temperature on laser measurement, obtaining the initial temperature of the thermopile under the measurement environment, thus improving the accuracy of power measurement. By obtaining the two temperatures corresponding to two different times after laser irradiation of the thermopile and the initial temperature, the highest temperature reached by the thermopile due to laser irradiation is obtained, reducing the time required to measure laser power compared to existing technologies.

[0077] The degree of temperature change in a thermopile caused by laser irradiation is related to the laser power; the higher the laser power, the more significant the temperature change. However, measuring the temperature change caused by lasers that produce relatively small temperature variations in thermopile irradiation can be relatively difficult.

[0078] Therefore, this application provides another method for measuring laser power based on a thermopile. Figure 2 Another flowchart of a laser power measurement method based on a thermopile provided in this application, the method comprising the following steps:

[0079] S201: Obtain the power range of the laser to be tested.

[0080] Before measuring the power of a laser, the processing equipment obtains the power range of the laser to be measured. This power range is an estimate of the laser's power. The laser's power range is related to the device emitting the laser, and the processing equipment can use this information to obtain the power range of the laser to be measured. The power range of the laser to be measured is related to its actual power value. For example, if the actual power of a laser beam is 443W, the power range obtained from the emitting device might be 400W to 500W; if the actual power of a laser beam is 4100W, the power range obtained from the emitting device might be 4000W to 5000W.

[0081] S202: Determine whether the maximum value of the range of laser power to be tested is less than the threshold.

[0082] After obtaining the power range of the laser to be tested, the processing device can determine the relationship between the maximum value of the power range and the threshold value. The threshold value can be any power value set manually. For example, if the processing device obtains that the power range of a laser beam is 400W to 500W, and the threshold value is 600W, the processing device can determine the relationship between the maximum value of the laser beam's power range, 500W, and the threshold value of 600W.

[0083] S203: If the maximum value of the power range of the laser to be tested is less than the threshold, the power of the laser to be tested will be amplified by a preset factor.

[0084] Using the same example from S202, if the processing device determines that the maximum value of the laser power range to be measured is less than the threshold, i.e., 500w is less than 600w, then the processing device needs to amplify the power of the laser to be measured. The amplification factor can be any preset factor, such as 100 times, 1000 times, etc.

[0085] S204: If the maximum value of the power range of the laser to be tested is not less than the threshold, then the laser to be tested will be used as the laser to execute S102.

[0086] S205: Use the laser to be tested with a power amplification factor of a preset factor as the laser to execute S102.

[0087] The alternative laser power measurement method based on thermopile provided in this application takes into account the difference in the laser power to be measured in actual applications. If the laser power to be measured is small, the power of the laser to be measured is amplified by a preset factor. The laser to be measured is then measured by the preset factor. Finally, the power value obtained only needs to be reduced by the corresponding factor to obtain the power value of the laser to be measured. This method can more easily measure smaller laser powers.

[0088] Considering practical applications, this application also provides another method for measuring laser power based on a thermopile. Figure 3 A flowchart of another laser power measurement method based on a thermopile provided in this application, the method comprising the following steps:

[0089] S301: Obtain the initial temperature of the thermopile.

[0090] S302: Obtain the laser spectral width range corresponding to the thermopile.

[0091] A laser spectrum is a pattern of laser light arranged sequentially according to wavelength or frequency. The processing equipment acquires the laser spectral width range corresponding to the thermopile. Laser light within this spectral width range can achieve optimal measurement results using the corresponding thermopile. Generally, the laser spectral width range corresponding to a thermopile is between 1 micrometer and 10 micrometers.

[0092] S303: Determine whether the spectral width of the laser is within the range of the laser spectral width corresponding to the thermopile.

[0093] The processing device determines whether the spectral width of the laser is within the range of the laser spectral width corresponding to the thermopile. If not, it executes S304; if it is, it executes S305.

[0094] S304: Replace the thermopile.

[0095] If the processing equipment determines that the spectral width of the laser is not within the range of the laser spectral width corresponding to the thermopile, the thermopile can be replaced with other pyroelectric infrared sensors or other measuring instruments that match the laser to be tested, and the operation of S302 can be performed using the replaced measuring equipment.

[0096] S305: Obtain the power range of the laser to be tested.

[0097] Taking laser A as an example, the device that emits laser A can emit lasers with a power of 400w-500w, so the power range of laser A is 400w-500w.

[0098] S306: Determine whether the maximum value of the range of laser power to be tested is less than the threshold.

[0099] The set threshold is 600W. The processing device determines that the maximum power range of laser A, 500W, is less than the threshold of 600W, and executes S306. In other cases, if the processing device determines that the maximum power range of the laser under test is less than the threshold, it will use the laser under test as the laser to irradiate the thermopile and execute S308.

[0100] S307: Amplify the power of the laser under test by a preset factor.

[0101] Here, the preset multiplier can be 100 times. The processing device amplifies the power of laser A by 100 times, and uses the laser A with the power amplified by 100 times as the laser to irradiate the thermopile, executing S308.

[0102] S308: Obtain the first temperature of the thermopile after the first moment of laser irradiation.

[0103] The first time point selected here is 1 second, that is, the thermopile is irradiated by laser A with a power amplification of 100 times for 1 second, and then the processing equipment obtains the first temperature of the thermopile.

[0104] S309: Obtain the second temperature of the thermopile after the second time of laser irradiation.

[0105] The second time selected here is 2 seconds, that is, the thermopile is irradiated by laser A with a power amplification of 100 times for 2 seconds, and then the second temperature of the thermopile is obtained by the processing equipment.

[0106] S310: The highest temperature reached by the thermopile when irradiated by laser is obtained by using the initial temperature, the first temperature, and the second temperature.

[0107] S311: The power of the laser is obtained by utilizing the highest temperature.

[0108] The power corresponding to the highest temperature here is 100 times the power of laser A. For example, if the power obtained by converting the highest temperature is 4430w, then 4430w needs to be reduced to 1 / 100 of the original. The reduced power of 443w is the power of laser A.

[0109] Figure 4 This application provides a schematic diagram of a thermopile-based laser power measurement device, which includes:

[0110] The initial temperature acquisition module 401 is used to acquire the initial temperature of the thermopile;

[0111] The first temperature acquisition module 402 is used to acquire the first temperature of the thermopile after the laser irradiates the thermopile for a first time.

[0112] The second temperature acquisition module 403 is used to acquire the second temperature of the thermopile after the laser irradiates the thermopile for a second time.

[0113] The maximum temperature calculation module 404 uses the initial temperature, the first temperature, and the second temperature to obtain the maximum temperature reached by the thermopile when the laser irradiates the thermopile.

[0114] The power conversion module 405 uses the highest temperature to obtain the power of the laser.

[0115] The thermopile-based laser power measurement device may further include the following modules:

[0116] The judgment module determines whether the maximum value of the range of laser power to be tested is less than a threshold.

[0117] The power amplification module amplifies the power of the laser under test by a preset factor if the maximum value of the power range of the laser under test is less than a threshold.

[0118] The test laser with a power amplification of a preset factor is used as the laser to perform the step of obtaining the first temperature of the thermopile after the laser irradiates the thermopile for a first time.

[0119] The maximum temperature calculation module may also include the following units:

[0120] The first difference calculation unit uses the difference between the first temperature and the initial temperature as the first difference.

[0121] The second difference calculation unit uses the difference between the second temperature and the first temperature as the second difference.

[0122] The highest temperature acquisition unit uses the first difference and the second difference to obtain the highest temperature reached by the thermopile when the laser irradiates the thermopile.

[0123] The maximum temperature calculation module may also include the following units:

[0124] The fitting unit fits a temperature function based on the first difference and the second difference.

[0125] The highest temperature acquisition unit is specifically used to obtain the highest temperature reached by the thermopile when the laser irradiates the thermopile using the temperature function.

[0126] In practical applications, the computer-readable storage medium can be any combination of one or more computer-readable media. The computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium.

[0127] Computer-readable storage media can be, for example, but not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatuses, or devices, or any combination thereof. More specific examples of computer-readable storage media (a non-exhaustive list) include: electrical connections having one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof. In this embodiment, a computer-readable storage medium can be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, apparatus, or device.

[0128] Computer-readable signal media may include data signals propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media may also be any computer-readable medium other than computer-readable storage media, capable of sending, propagating, or transmitting programs for use by or in connection with an instruction execution system, apparatus, or device.

[0129] Program code contained on a computer-readable medium may be transmitted using any suitable medium, including but not limited to wireless, wire, optical fiber, RF, etc., or any suitable combination thereof.

[0130] Computer program code for performing the operations of this invention can be written in one or more programming languages ​​or a combination thereof, including object-oriented programming languages ​​such as Java, Smalltalk, and C++, as well as conventional procedural programming languages ​​such as "C" or similar programming languages. The program code can be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network—including a local area network (LAN) or a wide area network (WAN)—or can be connected to an external computer (e.g., via the Internet using an Internet service provider).

[0131] It should be noted that the various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, for the device embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the description of the method embodiments. The device embodiments described above are merely illustrative, and the units described as separate components may or may not be physically separate. The components indicated as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment solution according to actual needs. Those skilled in the art can understand and implement this without creative effort.

[0132] The above description is merely one specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A laser power measurement method based on a thermopile, characterized in that, include: Obtain the initial temperature of the thermopile; The first temperature of the thermopile is obtained after the first time of laser irradiation of the thermopile. The second temperature of the thermopile is obtained after the laser irradiates the thermopile for a second time; The highest temperature reached by the thermopile when irradiated by the laser is obtained using the initial temperature, the first temperature, and the second temperature. The power of the laser is obtained using the highest temperature. The step of obtaining the first temperature of the thermopile after the first time of laser irradiation of the thermopile further includes: Obtain the power range of the laser to be tested; Determine whether the maximum value of the range of laser power to be tested is less than a threshold; If the maximum value of the power range of the laser under test is less than the threshold, the power of the laser under test will be amplified by a preset factor. The test laser with a power amplification of a preset factor is used as the laser to perform the step of obtaining the first temperature of the thermopile after the laser irradiates the thermopile for a first time. The step of obtaining the highest temperature reached by the thermopile when irradiated by the laser using the initial temperature, the first temperature, and the second temperature includes: The difference between the first temperature and the initial temperature is taken as the first difference; The difference between the second temperature and the first temperature is taken as the second difference. The highest temperature reached by the thermopile when irradiated by the laser is obtained by using the first difference and the second difference. The method further includes: A temperature function is fitted based on the first difference and the second difference; The step of using the first difference and the second difference to obtain the highest temperature reached by the thermopile when irradiated by the laser includes: The highest temperature reached by the thermopile when irradiated by the laser is obtained using the temperature function.

2. The method according to claim 1, characterized in that, The method further includes: Obtain the laser spectral width range corresponding to the thermopile; Determine whether the spectral width of the laser is within the range of the laser spectral width corresponding to the thermopile; If so, then the step of obtaining the first temperature of the thermopile after the first time of laser irradiation of the thermopile is performed.

3. A laser power measurement device based on a thermopile, characterized in that, include: Initial temperature acquisition module, used to acquire the initial temperature of the thermopile; The first temperature acquisition module is used to acquire the first temperature of the thermopile after the laser irradiates the thermopile for a first time. The second temperature acquisition module is used to acquire the second temperature of the thermopile after the laser irradiates the thermopile for a second time. The maximum temperature calculation module uses the initial temperature, the first temperature, and the second temperature to obtain the maximum temperature reached by the thermopile when irradiated by the laser. A power conversion module that uses the highest temperature to obtain the power of the laser; The device further includes: The judgment module determines whether the maximum value of the range of laser power to be tested is less than a threshold. The power amplification module amplifies the power of the laser under test by a preset factor if the maximum value of the power range of the laser under test is less than a threshold. The test laser with a power amplification of a preset factor is used as the laser to perform the step of obtaining the first temperature of the thermopile after the laser irradiates the thermopile for a first time. The maximum temperature calculation module includes: The first difference calculation unit uses the difference between the first temperature and the initial temperature as the first difference. The second difference calculation unit uses the difference between the second temperature and the first temperature as the second difference. The highest temperature acquisition unit uses the first difference and the second difference to obtain the highest temperature reached by the thermopile when the laser irradiates the thermopile. The maximum temperature calculation module includes: The fitting unit fits a temperature function based on the first difference and the second difference; The highest temperature acquisition unit is specifically used to obtain the highest temperature reached by the thermopile when the laser irradiates the thermopile using the temperature function.

4. An electronic device, characterized in that, Includes memory and processor, wherein: The memory is used to store computer programs; The processor is configured to execute the computer program to implement the thermopile-based laser power measurement method as described in any one of claims 1-2.

5. A computer-readable storage medium, characterized in that, Used to store a computer program, wherein the computer program, when executed by a processor, implements the thermopile-based laser power measurement method as described in any one of claims 1-2.

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