Processing method and device of flicker pulse, equipment and storage medium

Abstract

The application discloses a scintillation pulse processing method, device, equipment and storage medium. The method comprises the following steps: presetting two trigger thresholds, and performing multi-threshold sampling on at least two scintillation pulses based on the two trigger thresholds to obtain first sampling data; determining one or more effective scintillation pulses from the at least two scintillation pulses based on the first sampling data; superimposing the effective scintillation pulses to obtain a target scintillation pulse; presetting a plurality of sampling thresholds, and performing multi-threshold sampling on the target scintillation pulse based on the plurality of sampling thresholds to obtain second sampling data; determining whether the target scintillation pulse corresponds to a real single event based on the second sampling data; and if yes, determining event information of the real single event based on the first sampling data and the second sampling data. The application can limit the time information and energy amplitude of the real single event through double-threshold duration, has high reliability, and avoids false sampling.

Description

Technical Field

[0001] This application relates to the field of data processing, and in particular to a method, apparatus, device, and storage medium for processing flicker pulses. Background Technology

[0002] Positron emission tomography (PET) is a widely used nuclear medicine imaging diagnostic technique in clinical practice. It provides functional information such as metabolism in living organisms by imaging radioactive tracers injected into them. It plays an important role in clinical diagnosis, efficacy evaluation, basic medical research, and new drug development.

[0003] In existing technologies, digital sampling of scintillation pulses output by detectors in PET systems can be achieved using multi-voltage threshold (MVT) circuits. However, due to Compton scattering during the propagation of gamma photons, their energy changes and their direction shifts, resulting in energy deposition on multiple crystal channels of the detector. This phenomenon is called intercrystalline scattering. Therefore, it is necessary to recover intercrystalline scattering events to improve the system's sensitivity.

[0004] After gamma photons are scattered, they generate one or more low-energy pulses. The signal acquired by the crystal channel is relatively small, and coupled with signal interference from the source, when using an independent sampling scheme for each channel, it may be possible to fail to acquire the scintillation pulse or acquire an incorrect scintillation pulse (e.g., interference signal) when the energy is low. Furthermore, the MVT method will have a large deviation in energy calculation for low-energy pulses, resulting in inaccurate recovered event energy information. Summary of the Invention

[0005] The technical problem to be solved by the embodiments of this application is how to achieve high-precision and high-sensitivity sampling of scintillation pulses and avoid false sampling.

[0006] To address the aforementioned problems, this application discloses a method, apparatus, device, and storage medium for processing flicker pulses.

[0007] According to a first aspect of this application, a method for processing flicker pulses is provided. The method includes: presetting two trigger thresholds, and performing multi-threshold sampling on at least two flicker pulses based on the two trigger thresholds to obtain first sampling data; determining one or more valid flicker pulses from the at least two flicker pulses based on the first sampling data; superimposing the one or more valid flicker pulses to obtain a target flicker pulse; presetting multiple sampling thresholds, and performing multi-threshold sampling on the target flicker pulse based on the multiple sampling thresholds to obtain second sampling data; determining whether the target flicker pulse corresponds to a real single event based on the second sampling data; if so, determining event information of the real single event based on the first sampling data and the second sampling data.

[0008] According to some embodiments of this application, determining one or more valid flash pulses from the at least two flash pulses based on the first sampling data includes: for any flash pulse, determining whether the first sampling data contains the higher trigger threshold among the trigger thresholds; if so, designating the flash pulse as the valid flash pulse.

[0009] According to some embodiments of this application, the superposition of one or more effective flashing pulses to obtain a target flashing pulse includes: amplifying the effective flashing pulses respectively through one or more first amplification circuits arranged in parallel to obtain one or more amplified flashing pulses; and amplifying the input intermediate flashing pulse, which is the sum of one or more amplified flashing pulses, through a second amplification circuit arranged in series with the one or more first amplification circuits arranged in parallel to obtain the target flashing pulse.

[0010] According to some embodiments of this application, the plurality of sampling thresholds are determined based on empirical data and / or prior information of the flicker pulse, and the maximum sampling threshold among the plurality of sampling thresholds approaches the maximum amplitude of the flicker pulse corresponding to a real single event.

[0011] According to some embodiments of this application, determining whether the target flashing pulse corresponds to a real single event based on the second sampling data includes: determining whether the second sampling data contains the maximum sampling threshold; if so, determining that the target flashing pulse corresponds to a real single event.

[0012] According to some embodiments of this application, determining whether the target flashing pulse corresponds to a real single event based on the second sampling data includes: performing pulse fitting on the target flashing pulse based on the second sampling data to determine the fitted pulse waveform; determining the energy value corresponding to the target flashing pulse based on the fitted pulse waveform; determining whether the energy value meets a preset condition; and if so, determining that the target flashing pulse corresponds to a real single event.

[0013] According to some embodiments of this application, the event information includes energy information, and determining the energy information includes: if the target flashing pulse corresponds to a real single event, determining the energy information based on the energy value.

[0014] According to some embodiments of this application, for any valid flash pulse, the first sampling data includes the first rise time when the valid flash pulse first crosses the lower trigger threshold and the first fall time when it crosses the lower trigger threshold for the second time, as well as the second rise time when it first crosses the higher trigger threshold and the second fall time when it crosses the higher trigger threshold for the second time.

[0015] According to some embodiments of this application, the event information includes time information, and determining the time information includes: determining the minimum rise time among the first rise times corresponding to the one or more valid flashing pulses; and specifying the minimum rise time as the time information.

[0016] According to some embodiments of this application, the event information includes time information, and determining the time information includes: determining the relative energy corresponding to each valid flash pulse, wherein the relative energy is the difference between the second fall time and the first rise time; and specifying the first rise time corresponding to the maximum relative energy among the relative energies as the time information.

[0017] According to some embodiments of this application, the at least two scintillation pulses are generated by the crystal path of the radiation detection device, the event information includes location information, and determining the location information includes: determining the location identifier of the crystal path corresponding to the valid scintillation pulse corresponding to the time information; and designating the location identifier as the location information.

[0018] According to a second aspect of this application, a method for processing flickering pulses is provided. The method includes: presetting two trigger thresholds, and performing multi-threshold sampling on at least two flickering pulses based on the two trigger thresholds to obtain first sampling data; superimposing the at least two flickering pulses to obtain a target flickering pulse; presetting multiple sampling thresholds, and performing multi-threshold sampling on the target flickering pulse based on the multiple sampling thresholds to obtain second sampling data; determining whether the target flickering pulse corresponds to a real single event based on the second sampling data; if so, determining event information of the real single event based on the first sampling data and the second sampling data.

[0019] According to some embodiments of this application, the superposition of the at least two flashing pulses to obtain a target flashing pulse includes: amplifying the at least two flashing pulses respectively through at least two first amplification circuits arranged in parallel to obtain at least two amplified flashing pulses; and amplifying the input intermediate flashing pulse, which is the sum of the at least two amplified flashing pulses, through a second amplification circuit arranged in series with the at least two first amplification circuits arranged in parallel to obtain the target flashing pulse.

[0020] According to some embodiments of this application, the plurality of sampling thresholds are determined based on empirical data and / or prior information of the flicker pulse, and the maximum sampling threshold among the plurality of sampling thresholds approaches the maximum amplitude of the flicker pulse corresponding to a real single event.

[0021] According to some embodiments of this application, determining whether the target flashing pulse corresponds to a real single event based on the second sampling data includes: determining whether the second sampling data contains the maximum sampling threshold; if so, determining that the target flashing pulse corresponds to a real single event.

[0022] According to some embodiments of this application, determining whether the target flashing pulse corresponds to a real single event based on the second sampling data includes: performing pulse fitting on the target flashing pulse based on the second sampling data to determine the fitted pulse waveform; determining the energy value corresponding to the target flashing pulse based on the fitted pulse waveform; determining whether the energy value meets a preset condition; and if so, determining that the target flashing pulse corresponds to a real single event.

[0023] According to some embodiments of this application, the event information includes energy information, and determining the energy information includes: if the target flashing pulse corresponds to a real single event, determining the energy information based on the energy value.

[0024] According to some embodiments of this application, the first sampling data includes flash pulses with a higher trigger threshold as valid flash pulses; for any valid flash pulse, the first sampling data includes a first rise time when the valid flash pulse first crosses the lower trigger threshold and a first fall time when it crosses the lower trigger threshold for the second time, as well as a second rise time when it first crosses the higher trigger threshold and a second fall time when it crosses the higher trigger threshold for the second time.

[0025] According to some embodiments of this application, the event information includes time information, and determining the time information includes: determining the minimum rise time among the first rise times corresponding to the one or more valid flashing pulses; and specifying the minimum rise time as the time information.

[0026] According to some embodiments of this application, the event information includes time information, and determining the time information includes: determining the relative energy corresponding to each valid flash pulse, wherein the relative energy is the difference between the second fall time and the first rise time; and specifying the first rise time corresponding to the maximum relative energy among the relative energies as the time information.

[0027] According to some embodiments of this application, the at least two scintillation pulses are generated by the crystal path of the radiation detection device, the event information includes location information, and determining the location information includes: determining the location identifier of the crystal path corresponding to the valid scintillation pulse corresponding to the time information; and designating the location identifier as the location information.

[0028] According to a third aspect of this application, a processing apparatus for flicker pulses is provided. The apparatus includes: a first sampling module, a first determining module, a first summing module, a second sampling module, a second determining module, and a first information acquisition module; the first sampling module is used to preset two trigger thresholds and perform multi-threshold sampling on at least two flicker pulses based on the two trigger thresholds to acquire first sampling data; the first determining module is used to determine one or more valid flicker pulses from the at least two flicker pulses based on the first sampling data; the first summing module is used to superimpose the one or more valid flicker pulses to acquire a target flicker pulse; the second sampling module is used to preset multiple sampling thresholds and perform multi-threshold sampling on the target flicker pulse based on the multiple sampling thresholds to acquire second sampling data; the second determining module is used to determine whether the target flicker pulse corresponds to a real single event based on the second sampling data; the first information acquisition module is used to determine event information of the real single event based on the first sampling data and / or the second sampling data when the target flicker pulse corresponds to a real single event.

[0029] According to some embodiments of this application, in order to determine one or more valid flash pulses from at least two flash pulses based on first sampling data, the first determining module is configured to: for any flash pulse, determine whether the first sampling data contains a higher trigger threshold among the trigger thresholds; if so, designate the flash pulse as the valid flash pulse.

[0030] According to some embodiments of this application, in order to superimpose the one or more effective flashing pulses to obtain a target flashing pulse, the first summing module is configured to: amplify the effective flashing pulses respectively through one or more first amplification circuits connected in parallel to obtain one or more amplified flashing pulses; and amplify the input intermediate flashing pulse, which is the sum of one or more amplified flashing pulses, through a second amplification circuit connected in series with the one or more first amplification circuits connected in parallel to obtain the target flashing pulse.

[0031] According to some embodiments of this application, the plurality of sampling thresholds are determined based on empirical data and / or prior information of the flicker pulse, and the maximum sampling threshold among the plurality of sampling thresholds approaches the maximum amplitude of the flicker pulse corresponding to a real single event.

[0032] According to some embodiments of this application, in order to determine whether the target flashing pulse corresponds to a real single event based on the second sampling data, the second determining module is used to: determine whether the second sampling data contains the maximum sampling threshold; if so, determine that the target flashing pulse corresponds to a real single event.

[0033] According to some embodiments of this application, in order to determine whether the target flashing pulse corresponds to a real single event based on the second sampling data, the second determining module is configured to: perform pulse fitting on the target flashing pulse based on the second sampling data to determine the fitted pulse waveform; determine the energy value corresponding to the target flashing pulse based on the fitted pulse waveform; determine whether the energy value meets a preset condition; if so, determine that the target flashing pulse corresponds to a real single event.

[0034] According to some embodiments of this application, the event information includes energy information. To determine the energy information, the first information acquisition module is used to: if the target flashing pulse corresponds to a real single event, determine the energy information based on the energy value.

[0035] According to some embodiments of this application, for any valid flash pulse, the first sampling data includes the first rise time when the valid flash pulse first crosses the lower trigger threshold and the first fall time when it crosses the lower trigger threshold for the second time, as well as the second rise time when it first crosses the higher trigger threshold and the second fall time when it crosses the higher trigger threshold for the second time.

[0036] According to some embodiments of this application, the event information includes time information. To determine the time information, the first information acquisition module is used to: determine the minimum rise time among the first rise times corresponding to the one or more valid flashing pulses; and designate the minimum rise time as the time information.

[0037] According to some embodiments of this application, the event information includes time information. To determine the time information, the first information acquisition module is used to: determine the relative energy corresponding to each valid flashing pulse, wherein the relative energy is the difference between the second fall time and the first rise time; and specify the first rise time corresponding to the maximum relative energy among the relative energies as the time information.

[0038] According to some embodiments of this application, the at least two scintillation pulses are generated by the crystal path of the radiation detection device, and the event information includes location information. To determine the location information, the first information acquisition module is used to: determine the location identifier of the crystal path corresponding to the valid scintillation pulse corresponding to the time information; and designate the location identifier as the location information.

[0039] According to a fourth aspect of this application, a processing apparatus for flicker pulses is provided. The apparatus includes: a third sampling module, a second summing module, a fourth sampling module, a third determination module, and a second information acquisition module; the third sampling module is used to preset two trigger thresholds and perform multi-threshold sampling on at least two flicker pulses based on the two trigger thresholds to acquire first sampling data; the second summing module is used to superimpose the at least two flicker pulses to acquire a target flicker pulse; the fourth sampling module is used to preset multiple sampling thresholds and perform multi-threshold sampling on the target flicker pulse based on the multiple sampling thresholds to acquire second sampling data; the third determination module is used to determine whether the target flicker pulse corresponds to a real single event based on the second sampling data; the second information acquisition module is used to determine event information of the real single event based on the first sampling data and / or the second sampling data when the target flicker pulse corresponds to a real single event.

[0040] According to some embodiments of this application, in order to superimpose the at least two flashing pulses to obtain a target flashing pulse, the second summing module is used to: amplify the at least two flashing pulses respectively through at least two first amplification circuits arranged in parallel to obtain at least two amplified flashing pulses; and amplify the intermediate flashing pulse input by the sum of the at least two amplified flashing pulses through a second amplification circuit arranged in series with the at least two first amplification circuits arranged in parallel to obtain the target flashing pulse.

[0041] According to some embodiments of this application, the plurality of sampling thresholds are determined based on empirical data and / or prior information of the flicker pulse, and the maximum sampling threshold among the plurality of sampling thresholds approaches the maximum amplitude of the flicker pulse corresponding to a real single event.

[0042] According to some embodiments of this application, in order to determine whether the target flashing pulse corresponds to a real single event based on the second sampling data, the third determining module is used to: determine whether the second sampling data contains the maximum sampling threshold; if so, determine that the target flashing pulse corresponds to a real single event.

[0043] According to some embodiments of this application, in order to determine whether the target flashing pulse corresponds to a real single event based on the second sampling data, the third determining module is used to: perform pulse fitting on the target flashing pulse based on the second sampling data to determine the fitted pulse waveform; determine the energy value corresponding to the target flashing pulse based on the fitted pulse waveform; determine whether the energy value meets a preset condition; if so, determine that the target flashing pulse corresponds to a real single event.

[0044] According to some embodiments of this application, the event information includes energy information. To determine the energy information, the second information acquisition module is used to: if the target flashing pulse corresponds to a real single event, determine the energy information based on the energy value.

[0045] According to some embodiments of this application, the first sampling data indicates that a flash pulse that crosses the higher of the two trigger thresholds is a valid flash pulse; for any valid flash pulse, the first sampling data includes the first rise time when the valid flash pulse first crosses the lower trigger threshold and the first fall time when it crosses the lower trigger threshold for the second time, as well as the second rise time when it first crosses the higher trigger threshold and the second fall time when it crosses the higher trigger threshold for the second time.

[0046] According to some embodiments of this application, the event information includes time information. To determine the time information, the second information acquisition module is used to: determine the minimum rise time among the first rise times corresponding to the one or more valid flashing pulses; and designate the minimum rise time as the time information.

[0047] According to some embodiments of this application, the event information includes time information. To determine the time information, the second information acquisition module is used to: determine the relative energy corresponding to each valid flashing pulse, wherein the relative energy is the difference between the second fall time and the first rise time; and specify the first rise time corresponding to the maximum relative energy among the relative energies as the time information.

[0048] According to some embodiments of this application, the at least two scintillation pulses are generated by the crystal path of the radiation detection device, and the event information includes location information. To determine the location information, the second information acquisition module is used to: determine the location identifier of the crystal path corresponding to the valid scintillation pulse corresponding to the time information; and designate the location identifier as the location information.

[0049] According to a fifth aspect of this application, a flash pulse processing apparatus is provided. The apparatus includes a flash pulse processing circuit board configured to perform a multi-threshold sampling operation on the flash pulse and implement the flash pulse processing method described above.

[0050] According to a sixth aspect of this application, a processing apparatus is provided. The processing apparatus includes a processing device for the flashing pulse as described above.

[0051] According to a seventh aspect of this application, a processing apparatus is provided. The processing apparatus includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, performs the steps of the method described above.

[0052] According to an eighth aspect of this application, a computer-readable storage medium is provided. A computer program is stored on the storage medium, which, when executed by a processor, implements the steps of the method described above.

[0053] The scintillation pulse processing method, apparatus, device, and storage medium disclosed in this application can limit the time information and energy amplitude of a real single event through dual-threshold duration, resulting in high reliability and avoiding false sampling. Furthermore, combining multi-threshold sampling can accurately reconstruct the time, position, and energy information of high-energy particle incidence. Attached Figure Description

[0054] This application will be further described by way of exemplary embodiments, which will be described in detail with reference to the accompanying drawings. These embodiments are not limiting; in these embodiments, the same reference numerals denote the same structures, wherein:

[0055] Figure 1 This is an exemplary flowchart of a method for processing flashing pulses according to some embodiments of this application;

[0056] Figure 2 This is an exemplary schematic diagram of the crystal path of a radiation detection device according to some embodiments of this application;

[0057] Figure 3 This is an exemplary schematic diagram of scintillation pulse sampling according to some embodiments of this application;

[0058] Figure 4 This is an exemplary schematic diagram of a scintillation pulse sampling circuit according to some embodiments of this application;

[0059] Figure 5 This is an exemplary schematic diagram of a flash pulse superposition circuit according to some embodiments of this application;

[0060] Figure 6 This is an exemplary flowchart of another processing method for flashing pulses according to some embodiments of this application;

[0061] Figure 7This is an exemplary schematic diagram of a flash pulse processing circuit according to some embodiments of this application;

[0062] Figure 8 This is an exemplary block diagram of a data processing system for scintillation pulse processing according to some embodiments of this application;

[0063] Figure 9 This is an exemplary block diagram of another data processing system for flash pulse processing, shown according to some embodiments of this application;

[0064] Figure 10 This is an exemplary functional block diagram of a data processing system for flash pulse processing according to some embodiments of this application. Detailed Implementation

[0065] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0066] It should be noted that when a component is said to be "fixed to" another component, it can be directly fixed to the other component or there may be an intervening component. When a component is said to be "connected to" another component, it can be directly connected to the other component or there may be an intervening component. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this document are for illustrative purposes only.

[0067] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The terms “and / or” or “and / or” as used herein include any and all combinations of one or more of the associated listed items.

[0068] The following description, with reference to the accompanying drawings, illustrates some preferred embodiments of the present application. It should be noted that the following description is for illustrative purposes only and is not intended to limit the scope of protection of this application.

[0069] Figure 1This is an exemplary flowchart of a flicker pulse processing method according to some embodiments of this application. In some embodiments, the flicker pulse processing method 100 can be executed by a first data processing system 800. For example, the flicker pulse processing method 100 can be stored in a storage device (such as the built-in storage unit of the first data processing system 800 or an external storage device) in the form of a program or instructions, which, when executed, can implement the flicker pulse processing method 100. Figure 1 As shown, the flashing pulse processing method 100 may include the following steps.

[0070] Step 110: Preset two trigger thresholds, and perform multi-threshold sampling on at least two flashing pulses based on the two trigger thresholds to obtain the first sampling data.

[0071] In some embodiments, the at least two scintillation pulses may be acquired by a radiation detection device, such as a scintillation detector. The scintillation detector may include a scintillation crystal and a photoelectric conversion device coupled together. The scintillation crystal (e.g., BGO, PWO, LYSO:Ce, GAGG:Ce, NaI:TI, CsI:TI, LaBr3:Ce, BaF2, etc.) is used to convert detected high-energy radiation (such as gamma rays, neutron rays, etc.) into visible light signals, and the photoelectric conversion device (e.g., photomultiplier tube PMT, silicon photomultiplier tube SiPM, etc.) is used to convert the visible light signals into electrical signals, which are output as scintillation pulses through electronic devices connected to the photoelectric conversion device.

[0072] Figure 2 An exemplary schematic diagram of the crystal pathway of a radiation detection device according to some embodiments of this application is shown. The crystal of a radiation detection device (e.g., a scintillation detector) can have multiple independent crystal pathways. For example, the crystal can be regularly cut or divided, with each portion independently coupled to a photoelectric conversion device (e.g., a silicon photomultiplier tube, SiPM) to form a crystal pathway. Figure 2 As shown, the scintillation detector has 6×6=36 independent crystal pathways. High-energy particles (e.g., gamma photons) enter a particular crystal pathway (e.g., ... Figure 5The 10th crystal path in the detector will generate energy deposition on the crystal path. The photoelectric conversion device coupled to this crystal path will generate a scintillation pulse signal. This can be called a single event. However, the above process does not take into account the occurrence of photon scattering. In reality, after a gamma photon enters a crystal path (that is, after it is incident on the crystal), Compton scattering may occur. The energy of the gamma photon will change, and its direction will be deflected, resulting in energy deposition on multiple crystal paths, and thus outputting multiple scintillation pulses. That is to say, after a gamma photon is captured by the scintillation detector, a single event may occur in multiple channels. Figure 5 As shown, after a gamma photon enters the 10th crystal channel, Compton scattering occurs. Following directional shift, energy deposition occurs in the 15th, 24th, and 28th crystal channels. Therefore, a single gamma photon will result in four single events. These single events include target single events and scattering single events. A target single event can refer to the initial energy deposition in a particular crystal channel, generating a scintillation pulse. A scattering single event can refer to the scintillation pulse generated in other crystal channels due to photon scattering. During scintillation pulse sampling, the desired event is a true single event—that is, an event where a target high-energy particle (e.g., a gamma photon) enters a crystal channel, generates energy deposition, and produces a scintillation pulse. Noise signals generated due to other reasons (e.g., changes in device status) need to be discarded. Multiple scintillation pulses caused by scattering need to be recovered. For example, the scintillation pulses corresponding to the target single event and the scattering single event can be superimposed and recovered to make subsequent calculations more accurate.

[0073] In some embodiments, the two trigger thresholds can be used to compare with the amplitude of the flicker pulse to determine the time point at which the amplitude of the flicker pulse exceeds the trigger threshold. By setting two trigger thresholds for comparison with the flicker pulse, false detection of noise signals can be effectively avoided. In some embodiments, the types of the two trigger thresholds can be determined according to the manifestation of the flicker pulse. As an example, the flicker pulse can be an electrical flicker pulse, an acoustic flicker pulse, a thermal flicker pulse, or a pressure wave signal, etc. The energy indicators used to represent the flicker pulse are voltage, current, sound intensity, heat, pressure, etc. Then the threshold can be a voltage threshold, a current threshold, a sound intensity threshold, a heat threshold, a pressure threshold, etc.

[0074] In some embodiments, the two thresholds can be determined based on empirical data and / or prior information about the scintillation pulse. For example, taking electrical pulses as an example, by analyzing the summarized data of numerous electrical pulses caused by high-energy particles generated by a radioactive source, scintillation pulses sometimes exhibit low amplitudes. Direct sampling would result in very low thresholds, which is detrimental to the sampling process. Therefore, the scintillation pulse is "cushioned" to a certain extent to increase its amplitude. For example, the "cushioning" height can be set to 625mV. Furthermore, based on previous data, the maximum amplitude of the noise signal is generally determined to be around 50mV. Therefore, the two trigger thresholds can be set to 635mV and 675mV. That is, a larger trigger threshold can be increased by 50mV above 625mV. Such a setting can effectively filter out noise signals during sampling.

[0075] Figure 3 An exemplary schematic diagram of sampling a flash pulse according to some embodiments of this application is shown. Figure 3 As shown, one of the at least two flashing pulses, 300, is an electrical pulse, and the two set trigger thresholds are V1 and V2, wherein... As time progresses, the rising edge of the scintillation pulse 300 crosses the trigger threshold V1 from bottom to top at time t0, and crosses the trigger threshold V2 from bottom to top at time t1. Subsequently, the falling edge of the scintillation pulse 300 crosses the trigger threshold V2 from top to bottom at time t2, and crosses the trigger threshold V1 from top to bottom at time t3. The obtained data from the four sampling points include... , , as well as Of course, among the at least two flashing pulses, there may be one that only exceeds one trigger threshold, or one that does not exceed the trigger threshold at all. All the sampled data points together constitute the first sampled data.

[0076] It should be understood that in actual sampling, the pulse waveform is not as... Figure 3 Instead of the smoothness shown, there will be more fluctuations, which will actually manifest as... Figure 3 The waveform shown fluctuates upwards or downwards within its upper and lower range. Figure 3 The smoothed waveform shown is for illustrative purposes. Therefore, in actual sampling, the waveform may cross the same threshold multiple times within a very short period of time at the rising or falling edge. In actual sampling, the average time of crossing the threshold multiple times within a certain time window or time period can be used as the time of crossing the threshold. This is something that can be easily implemented by those skilled in the art based on the teachings of this application, and will not be elaborated here.

[0077] Figure 4An exemplary schematic diagram of a scintillation pulse sampling circuit according to some embodiments of this application is shown. For example, Figure 4 The sampling circuit shown can sample the at least two flash pulses using two trigger thresholds to obtain the first sampled data. For example... Figure 4 As shown, CH1 can represent the label of the crystal path, here exemplified as the first crystal path. Simp1 can represent the photoelectric conversion device (e.g., a silicon photomultiplier tube) coupled to the first crystal path. The scintillation pulse output by Simp1 is input to two comparators configured in parallel. For example, in some implementations, the comparators can be implemented using the LVDS (Low-Voltage Differential Signaling) pins of an FPGA chip on a circuit board (in this case, the circuit board can be referred to as an MVT sampling board). Each LVDS comparator receives the scintillation pulse and a trigger threshold as input. For example, two preset trigger thresholds (e.g., V1 and V2) are input to two LVDS comparators via two DACs (Digital-to-Analog Converters). Each comparator is connected to two Time-to-Digital Converters (TDCs) to determine the sampling time points of the rising and falling edges of the scintillation pulse, respectively. For example, when the scintillation pulse crosses the trigger threshold, the comparator can output a state transition signal. The TDC can perform time-digital sampling of this state transition signal to determine the time. For example, the two TDCs connected to the first comparator are used to determine the time t0 when the rising edge of the flash pulse crosses the trigger threshold V1 from bottom to top, and the time t3 when the falling edge crosses the trigger threshold V1 from top to bottom. The two TDCs connected to the second comparator are used to determine the time t1 when the rising edge of the flash pulse crosses the trigger threshold V2 from bottom to top, and the time t2 when the falling edge crosses the trigger threshold V2 from top to bottom. Of course, when the flash pulse does not cross a certain trigger threshold, the comparator will not output a signal to the TDC.

[0078] Step 120: Based on the first sampled data, determine one or more valid flash pulses from the at least two flash pulses.

[0079] In some embodiments, for any flicker pulse, whether the flicker pulse is a valid flicker pulse can be determined by determining whether the first sampled data contains a higher trigger threshold. Setting two trigger thresholds in step 110 can be to limit the energy amplitude required for a single event, effectively filtering noise signals and ensuring high reliability. Continuing with the foregoing example, among the two trigger thresholds V1 and V2 set, Then, it can be determined whether the first sampled data includes relevant sampling point data where the flash pulse crosses V2. If not, it means that the flash pulse has not crossed the higher trigger threshold and is a noise signal. If so, it means that the flash pulse is a valid flash pulse, corresponding to the aforementioned target single event or scattering single event.

[0080] Step 130: Superimpose one or more effective flashing pulses to obtain a target flashing pulse.

[0081] Based on the foregoing explanation, when high-energy particles (e.g., gamma photons) enter the crystal pathway, their energy is dispersed if scattering occurs. Therefore, to ensure accurate energy calculation, these effective scintillation pulses can be superimposed. The energy amplitude of the target scintillation pulse can then be the sum of the energies of these effective scintillation pulses. Processing the target scintillation pulse will yield a more precise result.

[0082] In some embodiments, one or more first amplifier circuits connected in parallel can amplify the one or more valid scintillation pulses to obtain one or more amplified first scintillation pulses. A second amplifier circuit connected in series with the one or more first amplifier circuits connected in parallel can amplify the input intermediate scintillation pulse, which is the sum of one or more amplified first scintillation pulses, to obtain a second amplified scintillation pulse. The target scintillation pulse can then be determined based on the second amplified scintillation pulse. (Reference) Figure 5 An illustrative example is provided. Figure 5 This is an exemplary schematic diagram of a superposition circuit for superimposing flash pulses according to some embodiments of this application. Figure 5 As shown, CH1 to CH36 can represent the crystal path numbers, for a total of 36 crystal paths. Simp1 to Simp36 can represent the photoelectric conversion devices (e.g., silicon photomultiplier tubes) coupled to the crystal paths. The flicker pulse output from each photoelectric conversion device (if any, and confirmed as a valid flicker pulse) will be input to its corresponding first amplifier circuit, such as... Figure 5 As shown in the dashed box A in the diagram. Through the resistors R1 and R2 set in the circuit... f The amplification value of the first amplifier circuit can be determined. Here, the amplification of the effective scintillation pulse can be an amplification of energy, that is, an increase in the maximum amplitude. Each effective scintillation pulse processed by the first amplification circuit is summed to obtain an intermediate scintillation pulse. Let the maximum amplitude replace the energy, and let E be the value of the pulse. n ( Let represent the maximum amplitude of the first amplified scintillation pulse output by the first amplification circuit. Then, the maximum amplitude of the intermediate scintillation pulse obtained by summing these values ​​is... A second amplifier circuit connected in series with multiple first amplifier circuits connected in parallel (such as...) Figure 5 (As shown in the dashed box B) will receive the intermediate flashing pulse and amplify it a second time. This is achieved through resistors R1 and R2 set in the circuit. f The amplification value of the second amplifier circuit can be determined. Therefore, the maximum amplitude of the flicker pulse output by the second amplifier circuit (that is, the target flicker pulse) can be... Amplifying and summing the pulses can reduce the proportion of noise signals that may not have been eliminated in the previous steps in the target flashing pulses, thereby improving the signal-to-noise ratio of the pulse signal and enhancing its anti-interference capability.

[0083] Step 140: Preset multiple sampling thresholds, and perform multi-threshold sampling on the target flashing pulse based on the multiple sampling thresholds to obtain second sampling data.

[0084] In some embodiments, the plurality of sampling thresholds can be determined based on empirical data and / or prior information about the scintillation pulse. For example, taking electrical pulses as an example, by analyzing the summarized data of a large number of electrical pulses caused by high-energy particles generated by the radioactive source, it is determined that the baseline voltage amplification of the radioactive source is the same multiple (i.e., amplification) used when acquiring the target scintillation pulse. The base voltage is approximately 69mV (the DC voltage is reduced during amplification due to isolation). Therefore, the minimum sampling threshold in the sampling threshold can also be set to be approximately 50mV-60mV higher than 69mV. For example, the minimum sampling threshold could be 120mV. The setting of the multiple sampling thresholds can also be based on the maximum amplitude of the scintillation pulse corresponding to the real single event. For example, in PET detection, the energy of a pair of gamma photons generated by annihilation is 511keV, and the maximum amplitude of the corresponding scintillation pulse is close to 400mV after amplification. When the gamma photons enter the crystal path and energy deposition occurs, if no scattering occurs, the maximum amplitude of the scintillation pulse generated by the coupled photoelectric conversion device is also close to 400mV after amplification. Therefore, the maximum sampling threshold in the multiple sampling thresholds can be set to be close to or equal to 400mV so that the obtained sampling data can better restore the waveform and energy of the scintillation pulse corresponding to the real single event. The amplification process when acquiring the target scintillation pulse is taken into account when setting the multiple sampling thresholds.

[0085] In some embodiments, the intervals between the plurality of sampling thresholds can be equal. That is, the plurality of sampling thresholds can form an arithmetic sequence. Taking voltage thresholds as an example, assuming the minimum sampling threshold is 120mV and the maximum sampling threshold is 400mV, then eight sampling thresholds can be set with a threshold interval of 40mV: 120mV, 160mV, 200mV, 240mV, 280mV, 320mV, 360mV, and 400mV. This threshold interval can also be other, such as 10mV, 20mV, 30mV, etc. This application does not impose specific limitations. In some embodiments, the intervals between the plurality of sampling thresholds can also be unequal. For example, the threshold interval increases with the number of sampling thresholds. For instance, the interval between the minimum sampling threshold and the second smallest sampling threshold is 10mV, the interval between the second smallest sampling threshold and the third smallest sampling threshold is 20mV, and so on.

[0086] In some embodiments, other characteristics of the sampling threshold may be the same as or similar to the trigger threshold. For example, the type of sampling threshold may also be based on the manifestation of the flicker pulse, and may be a voltage threshold, current threshold, sound intensity threshold, heat threshold, pressure threshold, etc.

[0087] In some embodiments, the sampling circuit for sampling the target flash pulse based on the plurality of sampling thresholds can be combined with... Figure 4 The sampling circuit shown is similar. The difference is that it includes multiple comparators connected in parallel, the same number as the multiple sampling thresholds. Assuming eight sampling thresholds, the sampling circuit can include eight comparators, each receiving the target flash pulse and one sampling threshold as input. Similarly, a DAC can be used to set the sampling thresholds. Each comparator is connected to two TDCs. When the target flash pulse crosses a sampling threshold, the comparator can output a state transition signal. The TDC can perform time digitization sampling on this state transition signal to determine the time. After the target flash pulse crosses all eight sampling thresholds, the TDC can determine 16 times. Ultimately, a maximum of 16 threshold-time pairs can be obtained after sampling. These threshold-time pairs constitute the second sampled data.

[0088] Step 150: Determine whether the target flashing pulse corresponds to a real single event based on the second sampled data.

[0089] In some embodiments, whether the target scintillation pulse corresponds to a real single event is determined by whether the second sampled data contains a maximum sampling threshold. Combined with the aforementioned setting of the sampling threshold, by setting the maximum sampling threshold to be close to the maximum amplitude of the scintillation pulse corresponding to a real single event, real single events can be effectively filtered out. When the second sampled data includes a threshold-time pair corresponding to the maximum sampling threshold, the target scintillation pulse can be considered to correspond to a real single event. That is, one or more valid scintillation pulses superimposed to form the target scintillation pulse (e.g., two or more) contain both the target single event and a scattering single event (e.g., in the case of scattering), or the valid scintillation pulse itself corresponds to a real single event (e.g., in the case of no scattering). Otherwise, one or more valid scintillation pulses superimposed to form the target scintillation pulse may correspond to a scattering single event, and without energy calculation, they can all be discarded.

[0090] In some embodiments, the second sampled data can be used to fit the target scintillation pulse. For example, a function model describing the waveform shape of the target scintillation pulse can be determined first, denoted as [model name missing]. The parameters to be fitted can be a and b. The threshold from the threshold-time pair included in the second sampling data is used as y, and the time is used as x to form the fitting data. The least squares method is used to fit the function to determine the parameters a and b to be fitted. The expression of the function model after the parameters are determined can be used to describe the fitted pulse waveform of the target flashing pulse. For example, the curve shape presented in a coordinate system.

[0091] In some embodiments, the energy value corresponding to the target scintillation pulse can be determined based on the fitted pulse waveform. For example, the energy value can be obtained by integrating the fitted pulse waveform. Whether the target pulse corresponds to a real single event can be determined by determining whether the energy value meets a preset condition. It is known that the high-energy particles that cause scintillation pulses have a fixed energy value. For example, the energy of a gamma photon is 511 keV. An exemplary preset condition can be that the energy value, after being reduced (e.g., the reduction factor is the amplification factor used when acquiring the target scintillation pulse), is greater than or equal to 511 keV. If the energy value of the target pulse, after being reduced, is greater than or equal to 511 keV, then the energy value can be considered a valid energy value, and the target scintillation pulse corresponds to a real single event. One or more valid scintillation pulses (e.g., two or more) superimposed to form the target scintillation pulse contain a target single event and a scattering single event (e.g., in the case of scattering), or the valid scintillation pulse itself corresponds to a real single event (e.g., in the case of no scattering). Otherwise, one or more effective scintillation pulses that superimpose to form the target scintillation pulse can correspond to a single scattering event, and no energy calculation is required; they can all be discarded.

[0092] Step 160: Determine the event information of the real single event based on the first sampled data and the second sampled data.

[0093] In some embodiments, the event information may include energy information. The energy information is used to indicate the energy value of the scintillation pulse corresponding to the actual single event. When a target scintillation pulse obtained by superimposing one or more valid scintillation pulses corresponds to an actual single event, it indicates that the one or more valid scintillation pulses were caused by energy deposition (whether scattering or not) occurring when a target high-energy particle (e.g., a gamma photon in a PET system) enters the crystal channel, and is therefore a pulse signal that needs to be sampled. In this case, the energy value corresponding to the target scintillation pulse, after being reduced in size, can be designated as the energy information.

[0094] In some embodiments, the event information may further include time information. The time information can be used to indicate the moment the actual single event occurred. It is understood that for one or more valid scintillation pulses, it must include the scintillation pulse corresponding to the target single event (without scattering) and may also include the scintillation pulse corresponding to the scattering single event (with scattering). Based on the characteristics of these scintillation pulses, it can be known that the scintillation pulse corresponding to the target single event has the highest energy and occurs earliest. Therefore, the time information can be determined based on the sampling data of the scintillation pulse corresponding to the target single event.

[0095] In some embodiments, for any valid flash pulse, the first sampling data may include the first rise time and the first fall time when the valid flash pulse first crosses the lower of two trigger thresholds, and the second rise time and the second fall time when it first crosses the higher of the two trigger thresholds. Figure 3 The first rise time can be t0, and the first fall time can be t3. The second rise time can be t1, and the second fall time can be t2. The time when the effective scintillation pulse first crosses the threshold can be considered as the time when a high-energy particle arrives at the crystal pathway, triggering the corresponding single event. This is denoted as... =t0. The time information can be determined by comparing the minimum rise time among the first rise times corresponding to the one or more valid flash pulses. For example, by determining the minimum rise time among all valid flash pulses... The smallest size The time information can be determined as the actual occurrence time of a single event.

[0096] In some embodiments, the energy of an effective flash pulse can also be represented by its pulse width. For example, a flash pulse with higher energy will have a larger amplitude and a longer duration. Therefore, the duration exceeding a threshold will also be longer. This pulse width can also be referred to as the relative energy of the effective flash pulse. In this application, the first sampled data can be used to determine the relative energy and to determine which effective flash pulse corresponds to the target true event. In some embodiments, the difference between the second fall time and the first rise time can be used as the relative energy. That is, relative energy... Conventional methods typically use a single threshold to determine the pulse width. While simple to implement, this approach is susceptible to interference and suffers from poor reliability. This application utilizes a dual-threshold method to determine the pulse width, effectively limiting the energy amplitude required for the event and offering high reliability. After determining the relative energies of all valid flash pulses, the first rise time corresponding to the maximum relative energy can be designated as the time information. In other words, the first rise time of the valid flash pulse with the maximum relative energy can be used as the time information for a real single event.

[0097] In some embodiments, the event information may further include location information. The location information can be used to indicate the location where the actual single event occurred. Referring to the foregoing description, the one or more valid pulse signals can be generated by the crystal path of a radiation detection device. For example, high-energy particles enter the crystal path, undergo energy deposition, and generate scintillation pulses by coupled photoelectric conversion components. After each scintillation pulse is generated, the crystal path that generated the scintillation pulse can be recorded and stored. To determine the location information, the location identifier of the crystal path corresponding to the valid scintillation pulse corresponding to the time information can be determined. This valid scintillation pulse is actually the earliest generated scintillation pulse, and the actual single event occurs within its corresponding crystal path. Therefore, the location identifier of the crystal path (e.g., Figure 2 The 10th crystal path shown can serve as the location information for the real single event.

[0098] It should be noted that the above-mentioned Figure 1 The descriptions of the various steps in this specification are for illustrative purposes only and do not limit the scope of this specification. Those skilled in the art can, under the guidance of this specification, [perform certain tasks / activities]. Figure 1 Various modifications and changes have been made to the steps described herein. However, these modifications and changes remain within the scope of this specification.

[0099] The first data processing system 800 disclosed in this application for implementing the exemplary process 100 can be either a device with a large amount of computing resources (e.g., a computer, server, cloud computing, etc.) or a device with limited computing resources (e.g., hardware circuits such as FPGA chip boards, ASIC chip boards, etc.).

[0100] The scintillation pulse processing method disclosed in this application can limit the energy amplitude of a real single event through dual-threshold duration, which is highly reliable and avoids false sampling. At the same time, combined with multi-threshold sampling, it can accurately reconstruct the incident time information, position information, and energy information of high-energy particles.

[0101] Figure 6 This is an exemplary flowchart of a flicker pulse processing method according to some embodiments of this application. In some embodiments, the flicker pulse processing method 600 can be executed by a second data processing system 900. For example, the flicker pulse processing method 600 can be stored in a storage device (such as the built-in storage unit of the second data processing system 900 or an external storage device) in the form of a program or instructions, which, when executed, can implement the flicker pulse processing method 600. Figure 6 As shown, the flashing pulse processing method 600 may include the following steps.

[0102] Step 610: Preset two trigger thresholds, and perform multi-threshold sampling on at least two flashing pulses based on the two trigger thresholds to obtain the first sampling data.

[0103] Step 620: Superimpose the at least two flashing pulses to obtain the target flashing pulse.

[0104] Step 630: Preset multiple sampling thresholds, and perform multi-threshold sampling on the target flashing pulse based on the multiple sampling thresholds to obtain second sampling data.

[0105] Step 640: Determine whether the target flashing pulse corresponds to a real single event based on the second sampled data.

[0106] Step 650: Determine the target event information of the real single event based on the first sampled data and the second sampled data.

[0107] The difference between process 600 and process 100 is that, for acquiring the target flash pulse, the at least two flash pulses can be directly superimposed without noise signal filtering. During the acquisition of the target flash pulse, amplification and summation can reduce the proportion of noise signal in the target flash pulse, thus reducing the interference effect of noise signal. This improves the signal-to-noise ratio of the target flash pulse and enhances its anti-interference capability.

[0108] Figure 7 This is an exemplary schematic diagram of a flicker pulse processing circuit according to some embodiments of this application. Reference Figure 7 and combined Figure 4 and Figure 5 Taking the scintillation pulse output from one crystal path (e.g., Simp1) as an example, the signal flow path of process 600 is explained. The scintillation pulse output by Simp1 can be output to two parallel comparators for comparison with two trigger thresholds to obtain first sampled data. Simultaneously, the scintillation pulse output by Simp1 can be input to a first amplifier circuit for amplification to obtain an amplified scintillation pulse. This amplified scintillation pulse is then added to the amplified scintillation pulses output from other crystal paths, which have been amplified by their respective first amplifier circuits. Finally, it is input to a second amplifier circuit for amplification to obtain the target scintillation pulse.

[0109] In process 600, valid blink pulse identification is not required, but this does not affect the final result. This can further save computational resources, reduce computation time, and improve efficiency.

[0110] The second data processing system 900 disclosed in this application for implementing the exemplary process 600 can be either a device with abundant computing resources (e.g., a computer, server, cloud computing, etc.) or a device with limited computing resources (e.g., hardware circuits such as FPGA chip boards, ASIC chip boards, etc.). The second data processing system 900 can be the same system as the first data processing system 800. When implementing process 600, the module in the first data processing system 800 used to determine valid flashing pulses may not be operational.

[0111] It should be noted that the above-mentioned Figure 6 The descriptions of the various steps in this specification are for illustrative purposes only and do not limit the scope of this specification. Those skilled in the art can, under the guidance of this specification, [perform certain tasks / activities]. Figure 6 Various modifications and changes have been made to the steps described herein. However, these modifications and changes remain within the scope of this specification.

[0112] Figure 8 This is an exemplary block diagram of a data processing system according to some embodiments of this specification. This data processing system can achieve precise sampling of flicker pulses. For example... Figure 8 As shown, the first data processing system 800 may include a first sampling module 810, a first determining module 820, a first summing module 830, a second sampling module 840, a second determining module 850, and a first information acquisition module 860.

[0113] The first sampling module 810 can implement two preset trigger thresholds as shown in step 110 above, and perform multi-threshold sampling on at least two scintillation pulses based on the two trigger thresholds to obtain first sampling data. The at least two scintillation pulses can be generated by at least two crystal paths in the radiation detection device. The two trigger thresholds can be used to compare with the amplitude of the scintillation pulses to determine the time point when the amplitude of the scintillation pulse exceeds the trigger threshold. By setting two trigger thresholds for comparison with the scintillation pulse, false detection of noise signals can be effectively avoided. The first sampling module 810 can use two parallel comparators to compare the scintillation pulse with the two trigger thresholds. When the scintillation pulse exceeds the trigger threshold, the comparator can output a state transition signal. The first sampling module 810 can use two time-to-digital converters to perform time-data sampling on the state transition signal to determine the transition time. Thus, the threshold-time pair consisting of the trigger threshold and the corresponding transition time can be the first sampling data.

[0114] The first determining module 820 can determine one or more valid flash pulses from the at least two flash pulses based on the first sampled data, as shown in step 120 above. For any flash pulse, the first determining module 820 can determine whether the flash pulse is a valid flash pulse by determining whether the first sampled data contains a higher trigger threshold. When the first determining module 820 determines that the first sampled data includes relevant sampling point data (e.g., threshold-time pairs) where the flash pulse crosses a higher trigger threshold, it can confirm that the flash pulse is a valid flash pulse.

[0115] The first summing module 830 can superimpose one or more effective flash pulses as shown in step 130 above to obtain a target flash pulse. The first summing module 830 can amplify one or more effective flash pulses respectively through one or more first amplified circuits connected in parallel to obtain one or more first amplified flash pulses. A second amplified circuit connected in series with the one or more first amplified circuits in parallel can amplify the intermediate flash pulse obtained by summing one or more first amplified flash pulses to obtain a second amplified flash pulse. Amplifying and summing the pulses reduces the proportion of noise signals that may not have been eliminated in the aforementioned steps in the target flash pulse, thereby improving the signal-to-noise ratio of the pulse signal and enhancing anti-interference capabilities.

[0116] The second sampling module 840 can implement multiple preset sampling thresholds as shown in step 140 above, and perform multi-threshold sampling on the target flashing pulse based on the multiple sampling thresholds to obtain second sampling data. The multiple sampling thresholds can be determined based on empirical data and / or prior information of the flashing pulse. The maximum sampling threshold among the multiple sampling thresholds approaches the maximum amplitude of the flashing pulse corresponding to a real single event. The intervals between the multiple sampling thresholds can be equal. That is, the multiple sampling thresholds can form an arithmetic sequence. The intervals between the multiple sampling thresholds can also be unequal. For example, the threshold interval increases with the increase of the number of sampling thresholds. The second sampling module 840 can sample the one or more valid flashing pulses in the same or similar manner as the first sampling module 810.

[0117] The second determining module 850 can determine whether the target flashing pulse corresponds to a real single event based on the second sampled data, as shown in step 150 above. The second determining module 850 can determine whether the target flashing pulse corresponds to a real single event by determining whether the second sampled data indicates that the target flashing pulse crosses the maximum sampling threshold. The second sampled data includes the threshold-time pair corresponding to the target flashing pulse crossing the maximum sampling threshold, and the second determining module 850 can determine that the target flashing pulse corresponds to a real single event. The second determining module 850 can also perform curve fitting on the target flashing pulse based on the second sampled data to obtain a fitted pulse waveform of the target flashing pulse. The second determining module 850 can obtain the energy value corresponding to the target flashing pulse by integrating the fitted pulse waveform. By determining whether the energy value meets a preset condition, the second determining module 850 can determine whether the target pulse corresponds to a real single event.

[0118] The first information acquisition module 860 can determine the event information of the real single event based on the first sampling data and the second sampling data as shown in step 160 above. The event information may include energy information. The energy information is used to indicate the energy value of the flash pulse corresponding to the real single event. The first information acquisition module 860 can specify the energy value corresponding to the target flash pulse, after reduction, as the energy information. The event information may also include time information. The time information can be used to indicate the time when the real single event occurs. The first information acquisition module 860 can determine the time information by comparing the minimum rise time among the first rise times corresponding to one or more valid flash pulses. The first information acquisition module 860 can also specify the first rise time corresponding to the maximum relative energy among the relative energies as the time information. The event information may also include location information. The location information can be used to indicate the location where the real single event occurs. The first information acquisition module 860 can specify the location identifier of the crystal path corresponding to the valid flash pulse corresponding to the time information as the location information.

[0119] Figure 9 This is an exemplary block diagram of another data processing system according to some embodiments of this specification. This data processing system can achieve precise sampling of flicker pulses. Figure 9 As shown, the second data processing system 900 may include a third sampling module 910, a second summing module 920, a fourth sampling module 930, a third determining module 940, and a second information acquisition module 950.

[0120] The third sampling module 910 can implement two preset trigger thresholds as shown in step 610 above, and perform multi-threshold sampling on at least two flashing pulses based on the two trigger thresholds to obtain the first sampling data.

[0121] The second summing module 920 can superimpose the at least two flashing pulses as shown in step 620 above to obtain the target flashing pulse.

[0122] The fourth sampling module 930 can implement multiple preset sampling thresholds as shown in step 630 above, and perform multi-threshold sampling on the target flashing pulse based on the multiple sampling thresholds to obtain the second sampling data.

[0123] The third determining module 940 can determine whether the target flashing pulse corresponds to a real single event based on the second sampled data, as shown in step 640 above.

[0124] The second information acquisition module 950 can determine the target event information of the real single event based on the first sampled data and the second sampled data, as shown in step 650 above.

[0125] The second data processing system 900 can be the same system as the first data processing system 800. When implementing process 600, the first determining module 620 in the first data processing system 800 may not work, and the remaining modules implement the second data processing system 900.

[0126] For further descriptions of the above modules, please refer to the flowchart and related sections of this application, for example... Figures 1-7 .

[0127] It should be understood that Figure 8 and Figure 9The systems and modules shown can be implemented in various ways. For example, in some embodiments, the systems and modules can be implemented in hardware, software, or a combination of both. The hardware portion can be implemented using dedicated logic; the software portion can be stored in memory and executed by an appropriate instruction execution system, such as a microprocessor or dedicated hardware. Those skilled in the art will understand that the methods and systems described above can be implemented using computer-executable instructions and / or included in processor control code, for example, on a carrier medium such as a disk, CD, or DVD-ROM, a programmable memory such as read-only memory (firmware), or a data carrier such as an optical or electronic signal carrier. The systems and modules of this specification can be implemented not only with hardware circuits such as very large-scale integrated circuits or gate arrays, semiconductors such as logic chips, transistors, or programmable hardware devices such as field-programmable gate arrays, programmable logic devices, etc., but also with software, for example, executed by various types of processors, or with a combination of the aforementioned hardware circuits and software (e.g., firmware).

[0128] It should be noted that the above description of the modules is for convenience only and should not be construed as limiting this specification to the embodiments described. It is understood that those skilled in the art, after understanding the principles of the system, may arbitrarily combine the modules or construct subsystems connected to other modules without departing from these principles. For example, modules may share a single storage module, or each module may have its own separate storage module. Such modifications are all within the scope of this specification.

[0129] Figure 10 This is an exemplary block diagram of a processing device according to some embodiments of this application. The processing device 1000 may include any components used to implement the systems described in the embodiments of this application. For example, the processing device 1000 may be implemented using hardware, software programs, firmware, or a combination thereof. For example, the processing device 1000 may implement a first data processing system 800 and a second data processing system 900. For convenience, only one processing device is shown in the figure; however, the computing functions described in the embodiments of this application can be implemented in a distributed manner by a set of similar platforms to distribute the system's processing load.

[0130] In some embodiments, the processing device 1000 may include a processor 1010, a memory 1020, an input / output component 1030, and a communication port 1040. In some embodiments, the processor (e.g., CPU) 1010 may execute program instructions as one or more processors. In some embodiments, the memory 1020 includes different forms of program memory and data memory, such as a hard disk, read-only memory (ROM), random access memory (RAM), etc., for storing various data files processed and / or transmitted by a computer. In some embodiments, the input / output component 1030 may be used to support input / output between the processing device 1000 and other components. In some embodiments, the communication port 1040 may be connected to a network for data communication. Exemplary processing devices may include program instructions executed by the processor 1010 stored in read-only memory (ROM), random access memory (RAM), and / or other types of non-transitory storage media. The methods and / or processes of the embodiments of this specification may be implemented as program instructions. The processing device 1000 may also receive programs and data disclosed in this application via network communication.

[0131] For ease of understanding, Figure 10 Only one processor is illustrated in this specification. However, it should be noted that the processing device 1000 in the embodiments of this specification may include multiple processors, and therefore the operations and / or methods described in the embodiments of this specification that are implemented by one processor may also be implemented jointly or independently by multiple processors. For example, if in this specification, the processor of the processing device 1000 executes steps 1 and 2, it should be understood that steps 1 and 2 may also be executed jointly or independently by two different processors of the processing device 1000 (e.g., the first processor executes step 1, the second processor executes step 2, or the first and second processors jointly execute steps 1 and 2).

[0132] The scintillation pulse processing method provided in this application can be specifically used in photon detection and is applicable to various fields, such as medical imaging technology, high-energy physics, lidar, autonomous driving, precision analysis, and optical communication. In a specific example, the scintillation pulse processing method, apparatus, device, and storage medium provided in this application can be applied to positron emission tomography (PET). In a PET system, photon data can be acquired using the scheme described in the embodiments of this application, followed by image reconstruction. In other specific examples of this application, the scintillation pulse processing method, apparatus, device, and storage medium provided in this application can be applied to various digital devices, such as CT equipment, MRI equipment, radiation detection equipment, oil exploration equipment, low-light detection equipment, SPECT equipment, security inspection equipment, gamma cameras, X-ray equipment, DR equipment, and other devices utilizing the principle of high-energy ray conversion, as well as other photoelectric conversion application devices, or a combination of the above devices.

[0133] The basic concepts have been described herein. It is obvious that the detailed disclosure above is merely illustrative and does not constitute a limitation of this specification. Although not explicitly stated herein, various modifications, improvements, and corrections may be made to this specification by those skilled in the art. Such modifications, improvements, and corrections are suggested in this specification and therefore remain within the spirit and scope of the exemplary embodiments described herein.

[0134] Furthermore, this specification uses specific terms to describe embodiments thereof. For example, "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic associated with at least one embodiment of this specification. Therefore, it should be emphasized and noted that references to "an embodiment," "one embodiment," or "an alternative embodiment" in different locations throughout this specification do not necessarily refer to the same embodiment. Moreover, certain features, structures, or characteristics in one or more embodiments of this specification can be appropriately combined.

[0135] Furthermore, those skilled in the art will understand that various aspects of this specification can be described and illustrated in several patentable ways or situations, including any new and useful combination of processes, machines, products, or substances, or any new and useful improvements thereof. Accordingly, various aspects of this specification can be implemented entirely by hardware, entirely by software (including firmware, resident software, microcode, etc.), or by a combination of hardware and software. All of the above hardware or software may be referred to as a “data block,” “module,” “engine,” “unit,” “component,” or “system.” Furthermore, various aspects of this specification may be represented as a computer product located on one or more computer-readable media, including computer-readable program code.

[0136] Computer storage media may contain a propagated data signal containing computer program code, for example, on baseband or as part of a carrier wave. This propagated signal may take various forms, including electromagnetic, optical, and suitable combinations thereof. Computer storage media can be any computer-readable medium other than a computer-readable storage medium, which can be connected to an instruction execution system, apparatus, or device to enable communication, propagation, or transmission of a program for use. The program code located on the computer storage medium can be propagated through any suitable medium, including radio, cable, fiber optic cable, RF, or similar media, or any combination of the above media.

[0137] The computer program code required for the operation of each part of this manual can be written in any one or more programming languages, including object-oriented programming languages ​​such as Java, Scala, Smalltalk, Eiffel, JADE, Emerald, C++, C#, VB.NET, Python, etc.; conventional procedural programming languages ​​such as C, Visual Basic, Fortran 3003, Perl, COBOL 3002, PHP, ABAP; dynamic programming languages ​​such as Python, Ruby, and Groovy; or other programming languages. This program code can run entirely on the user's computer, or as a standalone software package on the user's computer, or partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the latter case, the remote computer can be connected to the user's computer through any network, such as a local area network (LAN) or wide area network (WAN), or connected to an external computer (e.g., via the Internet), or in a cloud computing environment, or used as a service such as Software as a Service (SaaS).

[0138] Furthermore, unless expressly stated in the claims, the order of processing elements and sequences, the use of numbers and letters, or other names described in this specification are not intended to limit the order of the processes and methods described herein. Although various examples have been discussed in the foregoing disclosure of some embodiments of the invention that are currently considered useful, it should be understood that such details are for illustrative purposes only, and the appended claims are not limited to the disclosed embodiments; rather, the claims are intended to cover all modifications and equivalent combinations that conform to the spirit and scope of the embodiments described herein. For example, while the system components described above can be implemented using hardware devices, they can also be implemented solely using software solutions, such as installing the described system on existing servers or mobile devices.

[0139] Similarly, it should be noted that, in order to simplify the description disclosed herein and thus aid in the understanding of one or more embodiments of the invention, the foregoing description of embodiments in this specification may sometimes combine multiple features into a single embodiment, drawing, or description thereof. However, this method of disclosure does not imply that the subject matter of this specification requires more features than those mentioned in the claims. In fact, the embodiments contain fewer features than all the features of a single embodiment disclosed above.

[0140] In some embodiments, numbers describing the quantity of components and attributes are used. It should be understood that such numbers used in the description of embodiments are modified in some examples with the terms "approximately," "approximately," or "generally." Unless otherwise stated, "approximately," "approximately," or "generally" indicates that the numbers are allowed to vary by ±20%. Accordingly, in some embodiments, the numerical parameters used in the specification and claims are approximate values, which may be changed depending on the characteristics required by individual embodiments. In some embodiments, numerical parameters should take into account specified significant digits and employ a general method of digit reservation. Although the numerical ranges and parameters used to confirm their breadth of range in some embodiments of this specification are approximate values, in specific embodiments, such values ​​are set as precisely as feasible.

[0141] For each patent, patent application, patent application publication, and other material such as articles, books, specifications, publications, and documents referenced in this specification, the entire contents of which are incorporated herein by reference. This excludes historical application documents that are inconsistent with or conflict with the content of this specification, as well as documents that limit the broadest scope of the claims in this specification (currently or subsequently appended to this specification). It should be noted that in the event of any inconsistency or conflict between the descriptions, definitions, and / or terminology used in the supplementary materials to this specification and the content of this specification, the descriptions, definitions, and / or terminology used in this specification shall prevail.

[0142] Finally, it should be understood that the embodiments described in this specification are merely illustrative of the principles of the embodiments described herein. Other variations may also fall within the scope of this specification. Therefore, alternative configurations of the embodiments described herein are intended to be illustrative rather than limiting, and should be considered consistent with the teachings of this specification. Accordingly, the embodiments described herein are not limited to those explicitly introduced and described herein.

Claims

1. A method for processing flicker pulses, characterized in that, The processing method includes: Two trigger thresholds are preset, and multi-threshold sampling is performed on at least two flashing pulses based on the two trigger thresholds to obtain the first sampling data; Based on the first sampled data, one or more valid flash pulses are determined from the at least two flash pulses; Superimpose one or more effective flashing pulses to obtain a target flashing pulse; Multiple sampling thresholds are preset, and the target flashing pulse is sampled using multiple thresholds to obtain second sampling data; Based on the second sampled data, determine whether the target flashing pulse corresponds to a real single event; If so, the event information of the real single event is determined based on the first sampled data and the second sampled data.

2. The method for processing flicker pulses according to claim 1, characterized in that, The step of determining one or more valid flash pulses from the at least two flash pulses based on the first sampled data includes: For any flash pulse, Determine whether the first sampled data contains the higher of the two trigger thresholds; If so, designate the flashing pulse as the valid flashing pulse.

3. The method for processing flicker pulses according to claim 1, characterized in that, The superposition of one or more valid flash pulses to obtain a target flash pulse includes: The effective scintillation pulse is amplified by one or more first amplification circuits connected in parallel to obtain one or more amplified scintillation pulses; The target flash pulse is obtained by amplifying the intermediate flash pulse, which is the sum of one or more amplified flash pulses, through a second amplification circuit connected in series with one or more first amplification circuits in parallel.

4. The method for processing flicker pulses according to claim 1, characterized in that, The plurality of sampling thresholds are determined based on empirical data and / or prior information of the flicker pulse, and the maximum sampling threshold among the plurality of sampling thresholds approaches the maximum amplitude of the flicker pulse corresponding to a real single event.

5. The method for processing flicker pulses according to claim 4, characterized in that, The step of determining whether the target flashing pulse corresponds to a real single event based on the second sampled data includes: Determine whether the second sampled data contains the maximum sampling threshold; If so, determine that the target flashing pulse corresponds to a real single event.

6. The method for processing flicker pulses according to claim 1, characterized in that, The step of determining whether the target flashing pulse corresponds to a real single event based on the second sampled data includes: Based on the second sampling data, pulse fitting is performed on the target scintillation pulse to determine the fitted pulse waveform; The energy value corresponding to the target scintillation pulse is determined based on the fitted pulse waveform; Determine whether the energy value meets the preset conditions; If so, determine that the target flashing pulse corresponds to a real single event.

7. The method for processing flicker pulses according to claim 6, characterized in that, The event information includes energy information, and determining the energy information includes: If the target flashing pulse corresponds to a real single event, the energy information is determined based on the energy value.

8. The method for processing flicker pulses according to claim 1, characterized in that, For any valid flash pulse, the first sampling data includes the first rise time when the valid flash pulse first crosses the lower trigger threshold and the first fall time when it crosses the lower trigger threshold for the second time, as well as the second rise time when it first crosses the higher trigger threshold and the second fall time when it crosses the higher trigger threshold for the second time.

9. The method for processing flicker pulses according to claim 8, characterized in that, The event information includes time information, and determining the time information includes: Determine the minimum rise time among the first rise times corresponding to the one or more valid flash pulses; The minimum rise time is specified as the time information.

10. The method for processing flicker pulses according to claim 8, characterized in that, The event information includes time information, and determining the time information includes: Determine the relative energy corresponding to each valid flash pulse, wherein the relative energy is the difference between the second fall time and the first rise time; The first rise time corresponding to the maximum relative energy among the relative energies is designated as the time information.

11. The method for processing flicker pulses according to claim 9 or 10, characterized in that, The at least two scintillation pulses are generated by the crystal path of the radiation detection device. The event information includes location information, and determining the location information includes: Determine the position identifier of the crystal path corresponding to the valid scintillation pulse corresponding to the time information; The location identifier is designated as the location information.

12. A method for processing flicker pulses, characterized in that, The processing method includes: Two trigger thresholds are preset, and multi-threshold sampling is performed on at least two flashing pulses based on the two trigger thresholds to obtain the first sampling data; The at least two flash pulses are superimposed to obtain the target flash pulse; Multiple sampling thresholds are preset, and the target flashing pulse is sampled using multiple thresholds to obtain second sampling data; Based on the second sampled data, determine whether the target flashing pulse corresponds to a real single event; If so, the event information of the real single event is determined based on the first sampled data and the second sampled data.

13. The method for processing flicker pulses according to claim 12, characterized in that, The superposition of the at least two flashing pulses to obtain the target flashing pulse includes: The at least two scintillation pulses are amplified by at least two first amplification circuits connected in parallel to obtain at least two amplified scintillation pulses; The target flash pulse is obtained by amplifying the intermediate flash pulse, which is the sum of the at least two amplified flash pulses, through a second amplification circuit connected in series with the at least two first amplification circuits connected in parallel.

14. The method for processing flicker pulses according to claim 12, characterized in that, The plurality of sampling thresholds are determined based on empirical data and / or prior information of the flicker pulse, and the maximum sampling threshold among the plurality of sampling thresholds approaches the maximum amplitude of the flicker pulse corresponding to a real single event.

15. The method for processing flicker pulses according to claim 14, characterized in that, The step of determining whether the target flashing pulse corresponds to a real single event based on the second sampled data includes: Determine whether the second sampled data contains the maximum sampling threshold; If so, determine that the target flashing pulse corresponds to a real single event.

16. The method for processing flicker pulses according to claim 12, characterized in that, The step of determining whether the target flashing pulse corresponds to a real single event based on the second sampled data includes: Based on the second sampling data, pulse fitting is performed on the target scintillation pulse to determine the fitted pulse waveform; The energy value corresponding to the target scintillation pulse is determined based on the fitted pulse waveform; Determine whether the energy value meets the preset conditions; If so, determine that the target flashing pulse corresponds to a real single event.

17. The method for processing flicker pulses according to claim 16, characterized in that, The event information includes energy information, and determining the energy information includes: If the target flashing pulse corresponds to a real single event, the energy information is determined based on the energy value.

18. The method for processing flicker pulses according to claim 12, characterized in that, The first sampling data includes flash pulses with a higher trigger threshold as valid flash pulses; for any valid flash pulse, the first sampling data includes the first rise time when the valid flash pulse first crosses the lower trigger threshold and the first fall time when it crosses the lower trigger threshold for the second time, as well as the second rise time when it first crosses the higher trigger threshold and the second fall time when it crosses the higher trigger threshold for the second time.

19. The method for processing flicker pulses according to claim 18, characterized in that, The event information includes time information, and determining the time information includes: Determine the minimum rise time among the first rise times corresponding to one or more valid flash pulses; The minimum rise time is specified as the time information.

20. The method for processing flicker pulses according to claim 18, characterized in that, The event information includes time information, and determining the time information includes: Determine the relative energy corresponding to each valid flash pulse, wherein the relative energy is the difference between the second fall time and the first rise time; The first rise time corresponding to the maximum relative energy among the relative energies is designated as the time information.

21. The method for processing flicker pulses according to claim 19 or 20, characterized in that, The at least two scintillation pulses are generated by the crystal path of the radiation detection device. The event information includes location information, and determining the location information includes: Determine the position identifier of the crystal path corresponding to the valid scintillation pulse corresponding to the time information; The location identifier is designated as the location information.

22. A processing device for scintillation pulses, characterized in that, The processing device includes: The first sampling module is used to preset two trigger thresholds and perform multi-threshold sampling on at least two flashing pulses based on the two trigger thresholds to obtain first sampling data; A first determining module is configured to determine one or more valid flash pulses from the at least two flash pulses based on the first sampled data; The first summing module is used to superimpose one or more valid flashing pulses to obtain a target flashing pulse; The second sampling module is used to preset multiple sampling thresholds and perform multi-threshold sampling on the target flashing pulse based on the multiple sampling thresholds to obtain second sampling data; The second determining module is configured to determine, based on the second sampled data, whether the target flashing pulse corresponds to a real single event; and The first information acquisition module is used to determine the event information of the real single event based on the first sampling data and / or the second sampling data when the target flashing pulse corresponds to a real single event.

23. The flash pulse processing apparatus according to claim 22, characterized in that, To determine one or more valid flash pulses from the at least two flash pulses based on the first sampled data, the first determining module is configured to: For any flash pulse, Determine whether the first sampled data contains the higher of the trigger thresholds; If so, designate the flashing pulse as the valid flashing pulse.

24. The flash pulse processing apparatus according to claim 22, characterized in that, To superimpose one or more valid flash pulses to obtain a target flash pulse, the first summing module is used to: The effective scintillation pulse is amplified by one or more first amplification circuits connected in parallel to obtain one or more amplified scintillation pulses; The target flash pulse is obtained by amplifying the intermediate flash pulse, which is the sum of one or more amplified flash pulses, through a second amplification circuit connected in series with one or more first amplification circuits in parallel.

25. The flash pulse processing apparatus according to claim 22, characterized in that, The plurality of sampling thresholds are determined based on empirical data and / or prior information of the flicker pulse, and the maximum sampling threshold among the plurality of sampling thresholds approaches the maximum amplitude of the flicker pulse corresponding to a real single event.

26. The flash pulse processing apparatus according to claim 25, characterized in that, To determine whether the target flashing pulse corresponds to a real single event based on the second sampled data, the second determining module is used to: Determine whether the second sampled data contains the maximum sampling threshold; If so, determine that the target flashing pulse corresponds to a real single event.

27. The flash pulse processing apparatus according to claim 22, characterized in that, To determine whether the target flashing pulse corresponds to a real single event based on the second sampled data, the second determining module is used to: Based on the second sampling data, pulse fitting is performed on the target scintillation pulse to determine the fitted pulse waveform; The energy value corresponding to the target scintillation pulse is determined based on the fitted pulse waveform; Determine whether the energy value meets the preset conditions; If so, determine that the target flashing pulse corresponds to a real single event.

28. The flash pulse processing apparatus according to claim 27, characterized in that, The event information includes energy information. To determine the energy information, the first information acquisition module is used to: If the target flashing pulse corresponds to a real single event, the energy information is determined based on the energy value.

29. The flash pulse processing apparatus according to claim 22, characterized in that, For any valid flash pulse, the first sampling data includes the first rise time when the valid flash pulse first crosses the lower trigger threshold and the first fall time when it crosses the lower trigger threshold for the second time, as well as the second rise time when it first crosses the higher trigger threshold and the second fall time when it crosses the higher trigger threshold for the second time.

30. The flash pulse processing apparatus according to claim 29, characterized in that, The event information includes time information. To determine the time information, the first information acquisition module is used to: Determine the minimum rise time among the first rise times corresponding to the one or more valid flash pulses; The minimum rise time is specified as the time information.

31. The flash pulse processing apparatus according to claim 29, characterized in that, The event information includes time information. To determine the time information, the first information acquisition module is used to: Determine the relative energy corresponding to each valid flash pulse, wherein the relative energy is the difference between the second fall time and the first rise time; The first rise time corresponding to the maximum relative energy among the relative energies is designated as the time information.

32. The flash pulse processing apparatus according to claim 30 or 31, characterized in that, The at least two scintillation pulses are generated by the crystal path of the radiation detection device. The event information includes location information. To determine the location information, the first information acquisition module is used for: Determine the position identifier of the crystal path corresponding to the valid scintillation pulse corresponding to the time information; The location identifier is designated as the location information.

33. A processing device for flicker pulses, characterized in that, The processing device includes: The third sampling module is used to preset two trigger thresholds and perform multi-threshold sampling on at least two flashing pulses based on the two trigger thresholds to obtain the first sampling data; The second summing module is used to superimpose the at least two flashing pulses to obtain a target flashing pulse; The fourth sampling module is used to preset multiple sampling thresholds and perform multi-threshold sampling on the target flashing pulse based on the multiple sampling thresholds to obtain second sampling data; The third determining module is used to determine, based on the second sampled data, whether the target flashing pulse corresponds to a real single event; and The second information acquisition module is used to determine the event information of the real single event based on the first sampling data and / or the second sampling data when the target flashing pulse corresponds to a real single event.

34. The flash pulse processing apparatus according to claim 33, characterized in that, To superimpose the at least two flash pulses to obtain the target flash pulse, the second summing module is used for: The at least two scintillation pulses are amplified by at least two first amplification circuits connected in parallel to obtain at least two amplified scintillation pulses; The target flash pulse is obtained by amplifying the intermediate flash pulse, which is the sum of the at least two amplified flash pulses, through a second amplification circuit connected in series with the at least two first amplification circuits connected in parallel.

35. The flash pulse processing apparatus according to claim 33, characterized in that, The plurality of sampling thresholds are determined based on empirical data and / or prior information of the flicker pulse, and the maximum sampling threshold among the plurality of sampling thresholds approaches the maximum amplitude of the flicker pulse corresponding to a real single event.

36. The flash pulse processing apparatus according to claim 35, characterized in that, To determine whether the target flashing pulse corresponds to a real single event based on the second sampled data, the third determining module is used to: Determine whether the second sampled data contains the maximum sampling threshold; If so, determine that the target flashing pulse corresponds to a real single event.

37. The flash pulse processing apparatus according to claim 33, characterized in that, To determine whether the target flashing pulse corresponds to a real single event based on the second sampled data, the third determining module is used to: Based on the second sampling data, pulse fitting is performed on the target scintillation pulse to determine the fitted pulse waveform; The energy value corresponding to the target scintillation pulse is determined based on the fitted pulse waveform; Determine whether the energy value meets the preset conditions; If so, determine that the target flashing pulse corresponds to a real single event.

38. The flash pulse processing apparatus according to claim 37, characterized in that, The event information includes energy information. To determine the energy information, the second information acquisition module is used for: If the target flashing pulse corresponds to a real single event, the energy information is determined based on the energy value.

39. The flash pulse processing apparatus according to claim 33, characterized in that, The first sampling data indicates that a flash pulse that crosses a higher trigger threshold is a valid flash pulse; for any valid flash pulse, the first sampling data includes the first rise time when the valid flash pulse first crosses the lower trigger threshold and the first fall time when it crosses the lower trigger threshold for the second time, as well as the second rise time when it first crosses the higher trigger threshold and the second fall time when it crosses the higher trigger threshold for the second time.

40. The flash pulse processing apparatus according to claim 39, characterized in that, The event information includes time information. To determine the time information, the second information acquisition module is used for: Determine the minimum rise time among the first rise times corresponding to one or more valid flash pulses; The minimum rise time is specified as the time information.

41. The flash pulse processing apparatus according to claim 39, characterized in that, The event information includes time information. To determine the time information, the second information acquisition module is used for: Determine the relative energy corresponding to each valid flash pulse, wherein the relative energy is the difference between the second fall time and the first rise time; The first rise time corresponding to the maximum relative energy among the relative energies is designated as the time information.

42. The flash pulse processing apparatus according to claim 40 or 41, characterized in that, The at least two scintillation pulses are generated by the crystal path of the radiation detection device. The event information includes location information. To determine the location information, the second information acquisition module is used for: Determine the position identifier of the crystal path corresponding to the valid scintillation pulse corresponding to the time information; The location identifier is designated as the location information.

43. A processing device for flicker pulses, characterized in that, The device includes a flicker pulse processing circuit board, which is used to perform a multi-threshold sampling operation on the flicker pulse and implement the flicker pulse processing method as described in any one of claims 1-21.

44. A processing apparatus, characterized in that, include: The processing apparatus for scintillation pulses as described in any one of claims 22-43.

45. A processing apparatus, characterized in that, include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the processing method as described in any one of claims 1-22.

46. ​​A computer-readable storage medium, characterized in that, The storage medium stores a computer program, which, when executed by a processor, implements the steps of the processing method as described in any one of claims 1-22.

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