Method and device for testing limit parameters of alarm sensor, and electronic equipment

Abstract

The present application relates to the technical field of alarm sensor testing, and discloses a method for testing the limit parameters of an alarm sensor, including: obtaining the gear distribution of the alarm sensor; calculating the first test parameter of the alarm sensor according to the gear distribution; wherein the first test parameter is a test parameter in the abnormal working parameter range that is not easy to trigger the alarm sensor; based on the first test parameter, performing a traversal test on the limit parameters of the alarm sensor. Since the first test parameter used is a test parameter determined according to the gear distribution of the alarm sensor, and is not easy to trigger the abnormal working parameter range of the alarm sensor, the occurrence of alarm sensor test failure due to the applied test parameter exceeding the normal working range of the alarm sensor can be reduced, and the test yield of the alarm sensor is effectively improved. The present application also discloses a device and an electronic device for testing the limit parameters of an alarm sensor.

Description

Technical Field

[0001] The present application relates to the technical field of alarm sensor testing, for example, to a method and device, and electronic equipment for testing limit parameters of an alarm sensor. Background Art

[0002] The chip alarm sensor is to protect the chip from working under normal external conditions. When the normal working conditions are exceeded, the corresponding chip alarm sensor will be triggered, and the chip will start self-protection and stop working. For example, when the voltage applied to the chip is too low, some modules inside the chip may function abnormally, which will cause the chip to work abnormally. If the voltage applied to the chip is lower than the gear value configured by the low voltage alarm sensor, the low voltage alarm sensor will be triggered, causing the chip to start self-protection and stop working.

[0003] In the process of testing the limit parameters of the chip alarm sensor (for example, the low-voltage alarm parameters of each gear of the low-voltage alarm sensor), the expected non-alarm limit parameters and alarm limit parameters are applied to the alarm sensor, and the test is performed from large to small or from small to large. By judging the alarm and non-alarm performance of the alarm sensor, it is verified whether the various distribution gears of the alarm sensor meet the alarm requirements.

[0004] In the process of implementing the embodiments of the present disclosure, it is found that there are at least the following problems in the related art:

[0005] In the process of testing the limit parameters of the chip alarm sensor, the expected non-alarm limit parameters and alarm limit parameters are directly applied for testing. When the applied expected non-alarm parameters / alarm parameters exceed the normal working range of the chip alarm sensor, it is easy to cause the chip alarm sensor test to fail.

[0006] It should be noted that the information disclosed in the above background technology section is only used to enhance the understanding of the background of the present application, and therefore may include information that does not constitute the prior art known to ordinary technicians in the field. Summary of the invention

[0007] In order to provide a basic understanding of some aspects of the disclosed embodiments, a brief summary is given below. The summary is not an extensive review, nor is it intended to identify key / critical components or delineate the scope of protection of these embodiments, but rather serves as a prelude to the detailed description that follows.

[0008] The embodiments of the present disclosure provide a method and device, and an electronic device for testing limit parameters of an alarm sensor, so as to improve the test yield of a chip alarm sensor.

[0009] In some embodiments, a method for testing the limit parameters of an alarm sensor includes: obtaining the gear distribution of the alarm sensor; calculating a first test parameter of the alarm sensor based on the gear distribution; wherein the first test parameter is a test parameter within a range of abnormal working parameters that is not likely to trigger the alarm sensor; and based on the first test parameter, performing a traversal test on the limit parameters of the alarm sensor.

[0010] In some embodiments, the apparatus for testing the limit parameters of an alarm sensor includes: a processor and a memory storing program instructions, and the processor is configured to execute the aforementioned method for testing the limit parameters of an alarm sensor when executing the program instructions.

[0011] In some embodiments, an electronic device includes: an electronic device body; and the aforementioned device for testing the limit parameters of an alarm sensor, which is installed in the electronic device body.

[0012] The method, device, and electronic device for testing the limit parameters of an alarm sensor provided by the embodiments of the present disclosure can achieve the following technical effects:

[0013] In the disclosed technical solution, when testing the limit parameters of the alarm sensor, the first test parameter is first calculated according to the gear distribution of the alarm sensor, and then the limit parameters of the alarm sensor are traversed and tested based on the first test parameter. Since the first test parameter used is a test parameter determined according to the gear distribution of the alarm sensor, it is not easy to trigger the abnormal working parameter range of the alarm sensor. Therefore, the traversal test of the limit parameters of the alarm sensor based on the first test parameter can reduce the occurrence of alarm sensor test failure due to the applied test parameter exceeding the normal working range of the alarm sensor, and effectively improve the test yield of the alarm sensor.

[0014] The above general description and the following description are exemplary and explanatory only and are not intended to limit the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] One or more embodiments are exemplarily described by corresponding drawings, which do not limit the embodiments. Elements with the same reference numerals in the drawings are shown as similar elements, and the drawings do not constitute a scale limitation, and wherein:

[0016] Figure 1 is a flow chart of a method for testing limit parameters of an alarm sensor provided by an embodiment of the present disclosure;

[0017] Figure 2 is a flow chart of another method for testing limit parameters of an alarm sensor provided by an embodiment of the present disclosure;

[0018] Figure 3is a flow chart of another method for testing limit parameters of an alarm sensor provided by an embodiment of the present disclosure;

[0019] Figure 4 is a schematic diagram of a traversal method of an alarm sensor provided by an embodiment of the present disclosure;

[0020] Figure 5 is a structural schematic diagram of a device for testing limit parameters of an alarm sensor provided by an embodiment of the present disclosure;

[0021] Figure 6 It is a structural schematic diagram of an electronic device provided by an embodiment of the present disclosure. DETAILED DESCRIPTION

[0022] In order to be able to understand the features and technical contents of the embodiments of the present disclosure in more detail, the implementation of the embodiments of the present disclosure is described in detail below in conjunction with the accompanying drawings. The attached drawings are for reference only and are not used to limit the embodiments of the present disclosure. In the following technical description, for the convenience of explanation, a full understanding of the disclosed embodiments is provided through multiple details. However, one or more embodiments can still be implemented without these details. In other cases, to simplify the drawings, well-known structures and devices can be simplified for display.

[0023] The terms "first", "second", etc. in the specification and claims of the embodiments of the present disclosure and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the terms used in this way can be interchanged where appropriate, so that the embodiments of the embodiments of the present disclosure described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions.

[0024] Unless otherwise specified, the term "plurality" means two or more than two. In the disclosed embodiment, the character " / " indicates that the objects before and after are in an "or" relationship. For example, A / B means: A or B. The term "and / or" is a description of the association relationship between objects, indicating that three relationships may exist. For example, A and / or B means: A or B, or, the three relationships of A and B. The term "corresponding" may refer to an association relationship or a binding relationship, and the correspondence between A and B means that there is an association relationship or a binding relationship between A and B.

[0025] After wafer manufacturing is completed, wafer testing is a very important test. This test is the report card of the wafer production process. During the test, the electrical capabilities and circuit functions of each chip are detected. Wafer testing is also called chip testing (die sort) or wafer electrical testing (wafer sort). The test is for the following three goals. First, to identify qualified chips before the wafer is sent to the packaging factory. Second, the electrical parameters of the device / circuit are characterized. Engineers need to monitor the distribution of parameters to maintain the quality level of the process. Third, the accounting of qualified and defective chips will provide comprehensive performance feedback to wafer production personnel.

[0026] Combination Figure 1 As shown, the embodiment of the present disclosure provides a method for testing the limit parameters of an alarm sensor in wafer testing, comprising the following steps:

[0027] S101, obtaining the gear distribution of the alarm sensor.

[0028] An alarm sensor is a device that performs an alarm operation by sensing applied parameters (such as voltage, current, temperature, etc.), such as a low voltage alarm sensor / high voltage alarm sensor, a high current alarm sensor / low current alarm sensor, a low temperature alarm sensor / high temperature alarm sensor, etc., without limitation here.

[0029] The gear distribution of the alarm sensor is used to indicate the corresponding relationship between each gear of the alarm sensor and its corresponding limit parameter.

[0030] Table 1 below shows an optional gear distribution of a low voltage alarm sensor. In the gear distribution of the low voltage alarm sensor, the design voltages of the various gears are arranged in an arithmetic progression, and the difference between every two adjacent gears is 0.05V.

[0031] Table 1: Low pressure alarm sensor gear distribution

[0032]

[0033] The gear distribution of the low pressure alarm sensor shows the corresponding relationship between each gear of the low pressure alarm sensor and its corresponding limit parameter.

[0034] Table 2 below shows an optional gear distribution of a high-voltage alarm sensor. In the gear distribution of the high-voltage alarm sensor, the design voltages of the various gears are arranged in a non-equidistant manner, and the difference between every two adjacent gears is not necessarily the same.

[0035] Table 2: Gear distribution of high pressure alarm sensors

[0036]

[0037] The gear distribution of the high-pressure alarm sensor shows the corresponding relationship between each gear of the high-pressure alarm sensor and its corresponding limit parameter.

[0038] S102, calculating a first test parameter of the alarm sensor according to the gear distribution; wherein the first test parameter is a test parameter within an abnormal working parameter range that is not likely to trigger the alarm sensor.

[0039] Here, the abnormal working range parameter of the alarm sensor is the working parameter range in which the chip of the alarm sensor is prone to malfunction, resulting in test failure. For example, for a low-voltage alarm sensor, if the test parameters expected to be applied are a non-alarm voltage of 1.13V and an alarm voltage of 1.08V, and 1.08V is too low and within the abnormal working voltage range of the alarm sensor, exceeding the normal working voltage, it may cause the internal module of the alarm sensor chip to work abnormally, resulting in test failure. Therefore, a test parameter within the abnormal working parameter range that is not easy to trigger the alarm sensor is selected as the first test parameter to perform a traversal test of the limit parameters of the alarm sensor.

[0040] S103: Based on the first test parameter, perform a traversal test on the limit parameter of the alarm sensor.

[0041] Here, the limit parameter is the boundary alarm threshold of the alarm sensor. The limit parameters of the alarm sensor include an upper limit parameter and a lower limit parameter. The upper limit parameter is the upper boundary alarm threshold of the alarm sensor, and the lower limit parameter is the lower boundary alarm threshold of the alarm sensor. For example, for a high-pressure alarm sensor, its limit parameter is an upper limit parameter, which is the high-pressure alarm threshold of the high-pressure alarm sensor; for a low-pressure alarm sensor, its limit parameter is a lower limit parameter, which is the low-pressure alarm threshold of the low-pressure alarm sensor.

[0042] Optionally, based on the first test parameter, a traversal test is performed on the limit parameter of the alarm sensor, including: when the limit parameter of the alarm sensor is an upper limit parameter, based on the first test parameter, a traversal test is performed on the upper limit parameter in order from an upper limit gear position to a lower limit gear position.

[0043] Optionally, based on the first test parameter, the limit parameter of the alarm sensor is traversed tested, including: when the limit parameter of the alarm sensor is a lower limit parameter, based on the first test parameter, the lower limit parameter is traversed tested in order from a lower limit gear position to an upper limit gear position.

[0044] For example, combined with Figure 4As shown, for a high-pressure alarm sensor of a four-byte gear, based on the first test parameter, a traversal test is performed in the order from the upper limit gear (high-pressure gear 0001) to the lower limit gear (low-pressure gear 1111). For a low-pressure alarm sensor of a four-byte gear, based on the first test parameter, a traversal test is performed in the order from the lower limit gear (low-pressure gear 0001) to the upper limit gear (high-pressure gear 1111).

[0045] According to different types of limit parameters of the alarm sensor, the traversal test is performed in different orders, so that the traversal test can be completed with fewer times and the target test position that meets the expected results among multiple test positions can be determined.

[0046] According to the method for testing the limit parameters of the alarm sensor provided by the embodiment of the present disclosure, when testing the limit parameters of the alarm sensor, the first test parameter is first calculated according to the gear distribution of the alarm sensor, and then the limit parameters of the alarm sensor are traversed and tested based on the first test parameter. Since the first test parameter used is a test parameter determined according to the gear distribution of the alarm sensor, it is not easy to trigger the abnormal working parameter range of the alarm sensor. Therefore, the traversal test of the limit parameters of the alarm sensor based on the first test parameter can reduce the occurrence of alarm sensor test failure due to the applied test parameter exceeding the normal working range of the alarm sensor, and effectively improve the test yield of the alarm sensor.

[0047] Combination Figure 2 As shown, the embodiment of the present disclosure provides a method for testing the limit parameters of an alarm sensor, wherein the method calculates the first test parameter of the alarm sensor according to the gear distribution, and comprises the following steps:

[0048] S201, obtaining the limit alarm parameter of the alarm sensor.

[0049] The limit alarm parameter of the alarm sensor is the limit alarm design parameter value of the chip in the alarm sensor. For example, for a low voltage alarm sensor, the limit alarm design parameter of the chip in the low voltage alarm sensor is 1.1V. When the externally applied voltage is lower than 1.1V, the low voltage alarm sensor will alarm.

[0050] S202, obtaining a gear distribution difference of the gear distribution.

[0051] Optionally, obtaining the gear distribution difference of the gear distribution includes calculating the gear distribution difference according to the following formula:

[0052]

[0053] Among them, ΔP is the gear distribution difference, ΔP1 is the first gear distribution difference, ΔP nis the nth gear distribution difference, n is the number of gear distribution differences, n≥2.

[0054] For example, when n=2:

[0055]

[0056] Wherein, ΔP is the gear distribution difference, ΔP1 is the first gear distribution difference, and ΔP2 is the second gear distribution difference.

[0057] When n=4:

[0058]

[0059] Wherein, ΔP is the gear distribution difference, ΔP1 is the first gear distribution difference, ΔP2 is the second gear distribution difference, ΔP3 is the third gear distribution difference, and ΔP4 is the fourth gear distribution difference.

[0060] In practical applications, ΔP1 may also be the first gear distribution difference among the multiple gear distribution differences whose difference from the average gear distribution difference is less than the preset difference, ΔP n is the nth gear distribution difference among the multiple gear distribution differences whose difference with the average gear distribution difference is less than the preset difference, and n is the number of gear distribution differences among the multiple gear distribution differences whose difference with the average gear distribution difference is less than the preset difference.

[0061] By obtaining the average value of multiple gear distribution differences, or the average value of the gear distribution differences among multiple gear distribution differences whose difference with the average gear distribution difference is less than the preset difference, the first test parameter can be further determined. This can better avoid the alarm sensor from running away due to abnormal working parameter testing, and more effectively improve the production test yield.

[0062] S203, based on the limit alarm parameter, calculate the first test parameter according to the gear distribution difference.

[0063] Here, the first test parameter includes a first test parameter upper limit value and a first test parameter lower limit value.

[0064] In practical applications, the upper limit value of the first test parameter may be an alarm test parameter, and the lower limit value of the first test parameter may be a non-alarm test parameter; or, the upper limit value of the first test parameter may be a non-alarm test parameter, and the lower limit value of the first test parameter may be an alarm test parameter. For example, for a low-voltage alarm sensor, the upper limit value of the voltage may be a non-alarm test parameter, and the lower limit value of the voltage may be an alarm test parameter; for a high-voltage alarm sensor, the upper limit value of the voltage may be an alarm test parameter, and the lower limit value of the voltage may be a non-alarm test parameter.

[0065] Optionally, based on the limit alarm parameter, the first test parameter is calculated according to the gear distribution difference, including calculating the first test parameter upper limit value and the first test parameter lower limit value according to the following formula:

[0066]

[0067] Among them, P up1 is the upper limit value of the first test parameter, P down1 is the lower limit of the first test parameter, P goal is the limit alarm parameter, ΔP is the gear distribution difference, and N is the division coefficient.

[0068] The division coefficient N is negatively correlated with the gear distribution difference ΔP. The larger the gear distribution difference ΔP, the smaller the division coefficient N; the smaller the gear distribution difference ΔP, the larger the division coefficient N.

[0069] For example, for a low pressure alarm sensor, determine the limit alarm parameter P goal is 1.1V, the gear distribution difference ΔP is 0.05V, and the division coefficient N is 2, then:

[0070] The first test parameter upper limit

[0071] The first test parameter lower limit

[0072] In the disclosed embodiment, based on the extreme alarm parameter, the first test parameter is calculated according to the gear distribution difference, and the extreme parameter of the alarm sensor is traversed tested based on the first test parameter. This can reduce the occurrence of alarm sensor test failure due to the applied test parameter exceeding the normal working range of the alarm sensor, avoid the risk of abnormal chip operation test failure of the alarm sensor, and effectively improve the test yield and mass production capacity of the alarm sensor.

[0073] Combination Figure 3 As shown, the embodiment of the present disclosure provides a method for testing the limit parameters of an alarm sensor, comprising the following steps:

[0074] S301, obtaining the gear distribution of the alarm sensor.

[0075] S302, calculating a first test parameter of the alarm sensor according to the gear distribution; wherein the first test parameter is a test parameter within an abnormal working parameter range that is not likely to trigger the alarm sensor.

[0076] S303: Based on the first test parameter, perform a traversal test on the limit parameter of the alarm sensor.

[0077] S304, after traversing the limit parameters of the alarm sensor, determine a target test gear that meets the expected results among multiple test gears.

[0078] Optionally, determining a target test gear that meets expected results among multiple test gears includes: determining a test gear that issues an alarm according to a first test parameter among the multiple test gears; and using the test gear that issues an alarm according to the first test parameter as the target test gear.

[0079] For the low-voltage alarm sensor, apply the expected non-alarm voltage to the alarm sensor (test chip) to test whether the alarm sensor alarms. If not, it proves that the test position of the alarm sensor meets the no-alarm requirement. Apply the expected alarm voltage to the alarm sensor to test whether the alarm sensor alarms. If so, it proves that the test position of the alarm sensor meets the alarm requirement.

[0080] The test results at different test positions are:

[0081] Test gear 1: no alarm voltage 1.8V alarm, alarm voltage 1.7V alarm;

[0082] Test gear 2: No alarm voltage 1.8V alarm, alarm voltage 1.7V alarm;

[0083] Test gear 3: No alarm voltage 1.8V alarm, alarm voltage 1.7V alarm;

[0084] Test gear 4: No alarm voltage 1.8V no alarm, alarm voltage 1.7V alarm;

[0085] Test gear 5: No alarm voltage 1.8V no alarm, alarm voltage 1.7V no alarm;

[0086] Test gear 6: No alarm at 1.8V, no alarm at 1.7V.

[0087] Then: test gear 4 is the test gear that meets expectations, and test gears 1-3 and 5-6 are the test gears that do not meet expectations.

[0088] S305, determining second test parameters of other test gears among the multiple test gears except the target test gear.

[0089] Optionally, the multiple test gears are arranged in an arithmetic progression; determining the second test parameter of the other test gears in the multiple test gears except the target test gear comprises calculating the second test parameter according to the following formula:

[0090]

[0091] Among them, P1 is the first test parameter, P 21is the second test parameter of the test gear position which is lower than the target test gear position and m1 intervals away from the target test gear position, P 22 is the second test parameter of the test gear that is higher than the target test gear and m2 intervals away from the target test gear, and ΔP is the gear distribution difference.

[0092] For example, for a low voltage alarm sensor, after determining that test gear position 4 is the expected test gear position, when the gear distribution difference ΔP is 0.05V:

[0093] Test the non-alarm voltage V at gear 6 21 =V1-m1×ΔV=1.8-2×0.05=1.7, alarm voltage V 21 =V1-m1×ΔV=1.7-2×0.05=1.6.

[0094] Test the non-alarm voltage V at gear position 1 22 =V1+m1×ΔV=1.8+3×0.05=1.95, alarm voltage V 22 =V1+m1×ΔV=1.7+3×0.05=1.85.

[0095] S306: Based on the second test parameter, the limit parameters of other test gears are tested.

[0096] After the second test parameter is determined, the second test parameter corresponding to each other test gear is used to test and verify the corresponding limit parameter of the test gear.

[0097] In the disclosed embodiment, when testing the limit parameters of the alarm sensor, the first test parameter is first calculated according to the gear distribution of the alarm sensor, and then the limit parameters of the alarm sensor are traversed and tested based on the first test parameter to determine the target test gear that meets the expected results among the multiple test gears. Then, after determining the second test parameters of the other test gears except the target test gear among the multiple test gears, the limit parameters of the other test gears are tested based on the second test parameter. Since the first test parameter and the second test parameter used are test parameters determined according to the gear distribution of the alarm sensor, it is not easy to trigger the abnormal working parameter range of the alarm sensor. Therefore, the limit parameters of the alarm sensor are traversed and tested based on the first test parameter and the second test parameter, which can reduce the occurrence of alarm sensor test failure due to the applied test parameters exceeding the normal working range of the alarm sensor, and effectively improve the test yield of the alarm sensor.

[0098] In the process of testing the limit parameters of the chip alarm sensor, the traditional test method is used to directly apply the expected non-alarm limit parameters and alarm limit parameters for testing. The applied expected non-alarm parameters / alarm parameters exceed the normal working range of the chip alarm sensor, resulting in a failure rate of up to 1.5%-2% in the chip alarm sensor test failure. However, by using the test method provided in the embodiment of the disclosed application, the test parameters are calculated according to the gear distribution of the alarm sensor, and then the test is performed based on the calculated test parameters, which can well avoid the situation of exceeding the normal working range of the alarm sensor (chip) during the test process, and the failure rate of the chip alarm sensor test failure is reduced to 0.2%-0.5%, and the effect is very obvious.

[0099] Combination Figure 5 The embodiment of the present disclosure provides a device for testing the limit parameters of an alarm sensor, including a processor 50 and a memory 51, and may also include a communication interface 52 and a bus 53. The processor 50, the communication interface 52, and the memory 51 can communicate with each other through the bus 53. The communication interface 52 can be used for information transmission. The processor 50 can call the logic instructions in the memory 51 to execute the method for testing the limit parameters of the alarm sensor of the above embodiment.

[0100] In addition, the logic instructions in the above-mentioned memory 51 can be implemented in the form of software functional units and can be stored in a computer-readable storage medium when sold or used as an independent product.

[0101] The memory 51 is a computer-readable storage medium that can be used to store software programs and computer executable programs, such as program instructions / modules corresponding to the method in the embodiment of the present disclosure. The processor 50 executes the function application and data processing by running the program instructions / modules stored in the memory 51, that is, the method for testing the limit parameters of the alarm sensor in the above method embodiment is implemented.

[0102] The memory 51 may include a program storage area and a data storage area, wherein the program storage area may store an operating system and an application required for at least one function; the data storage area may store data created according to the use of the terminal device, etc. In addition, the memory 51 may include a high-speed random access memory and may also include a non-volatile memory.

[0103] When testing the limit parameters of the alarm sensor using the device provided by the embodiment of the present disclosure, the first test parameter is first calculated according to the gear distribution of the alarm sensor, and then the limit parameters of the alarm sensor are traversed and tested based on the first test parameter. Since the first test parameter used is a test parameter determined according to the gear distribution of the alarm sensor, it is not easy to trigger the abnormal working parameter range of the alarm sensor. Therefore, the traversal test of the limit parameters of the alarm sensor based on the first test parameter can reduce the occurrence of alarm sensor test failures due to the applied test parameters exceeding the normal working range of the alarm sensor, and effectively improve the test yield of the alarm sensor.

[0104] Combination Figure 6 As shown, an embodiment of the present disclosure provides an electronic device (eg, a computer, a server, etc.), comprising an electronic device body 60 ; and the above-mentioned device 500 for testing the limit parameters of an alarm sensor, which is installed in the electronic device body 60 .

[0105] An embodiment of the present disclosure provides a computer-readable storage medium storing computer-executable instructions, wherein the computer-executable instructions are configured to execute the above-mentioned method for testing limit parameters of an alarm sensor.

[0106] An embodiment of the present disclosure provides a computer program product, which includes a computer program stored on a computer-readable storage medium, and the computer program includes program instructions. When the program instructions are executed by a computer, the computer executes the above-mentioned method for testing the limit parameters of an alarm sensor.

[0107] The computer-readable storage medium mentioned above may be a transient computer-readable storage medium or a non-transitory computer-readable storage medium.

[0108] The technical solution of the embodiment of the present disclosure can be embodied in the form of a software product, which is stored in a storage medium and includes one or more instructions for enabling a computer device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in the embodiment of the present disclosure. The aforementioned storage medium may be a non-transient storage medium, including: a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, and other media that can store program codes, or a transient storage medium.

[0109] The above description and the accompanying drawings fully illustrate the embodiments of the present disclosure so that those skilled in the art can practice them. Other embodiments may include structural, logical, electrical, process and other changes. The embodiments represent only possible changes. Unless explicitly required, individual components and functions are optional, and the order of operation may vary. The parts and features of some embodiments may be included in or replace the parts and features of other embodiments. The scope of the embodiments of the present disclosure includes the entire scope of the claims, and all available equivalents of the claims. When used in this application, although the terms "first", "second", etc. may be used in this application to describe each element, these elements should not be limited by these terms. These terms are only used to distinguish one element from another element. For example, without changing the meaning of the description, the first element can be called the second element, and similarly, the second element can be called the first element, as long as all occurrences of the "first element" are renamed consistently and all occurrences of the "second element" are renamed consistently. The first element and the second element are both elements, but may not be the same element. Moreover, the words used in this application are only used to describe the embodiments and are not used to limit the claims. As used in the description of the embodiments and claims, unless the context clearly indicates, the singular forms "a", "an" and "the" are intended to include the plural forms as well. Similarly, the term "and / or" as used in this application refers to any and all possible combinations of one or more associated listings. In addition, when used in this application, the term "comprise" and its variants "comprises" and / or comprising refer to the presence of stated features, wholes, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or groups of these. In the absence of further restrictions, the elements defined by the sentence "including one..." do not exclude the presence of other identical elements in the process, method or device including the elements. In this article, each embodiment may focus on the differences from other embodiments, and the same and similar parts between the embodiments may refer to each other. For the methods, products, etc. disclosed in the embodiments, if they correspond to the method part disclosed in the embodiments, then the relevant parts can refer to the description of the method part.

[0110] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software may depend on the specific application and design constraints of the technical solution. The technicians may use different methods for each specific application to implement the described functions, but such implementations should not be considered to exceed the scope of the embodiments of the present disclosure. The technicians may clearly understand that, for the convenience and simplicity of description, the specific working processes of the systems, devices and units described above may refer to the corresponding processes in the aforementioned method embodiments, and will not be repeated here.

[0111] In the embodiments disclosed herein, the disclosed methods and products (including but not limited to devices, equipment, etc.) can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the units can be only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between each other shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms. The units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the units may be selected according to actual needs to implement this embodiment. In addition, each functional unit in the embodiment of the present disclosure may be integrated in a processing unit, or each unit may exist physically alone, or two or more units may be integrated in one unit.

[0112] The flowchart and block diagram in the accompanying drawings show the possible architecture, function and operation of the system, method and computer program product according to the embodiment of the present disclosure. In this regard, each box in the flowchart or block diagram can represent a module, a program segment or a part of the code, and the module, the program segment or a part of the code contains one or more executable instructions for realizing the specified logical function. In some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, which can depend on the functions involved. In the description corresponding to the flowchart and the block diagram in the accompanying drawings, the operations or steps corresponding to different boxes can also occur in a different order from the order disclosed in the description, and sometimes there is no specific order between different operations or steps. For example, two consecutive operations or steps can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, which can depend on the functions involved. Each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, may be implemented by a dedicated hardware-based system that performs the specified functions or actions, or may be implemented by a combination of dedicated hardware and computer instructions.

Claims

1. A method for testing limit parameters of an alarm sensor, characterized in that: include: Obtaining the gear distribution of the alarm sensor; Calculating a first test parameter of the alarm sensor according to the gear distribution; wherein the first test parameter is a test parameter within an abnormal working parameter range that is not likely to trigger the alarm sensor; Based on the first test parameter, performing a traversal test on the limit parameter of the alarm sensor; The step of calculating the first test parameter of the alarm sensor according to the gear distribution includes: obtaining a limit alarm parameter of the alarm sensor; obtaining a gear distribution difference of the gear distribution; and calculating the first test parameter according to the gear distribution difference based on the limit alarm parameter; The obtaining of the gear distribution difference of the gear distribution comprises calculating the gear distribution difference according to the following formula: Among them, ΔP is the gear distribution difference, ΔP1 is the first gear distribution difference, ΔP n is the nth gear distribution difference, n is the number of gear distribution differences, n≥2; The first test parameter includes a first test parameter upper limit value and a first test parameter lower limit value; the first test parameter is calculated based on the limit alarm parameter and according to the gear distribution difference, including calculating the first test parameter upper limit value and the first test parameter lower limit value according to the following formula: Among them, P up1 is the upper limit value of the first test parameter, P down1 is the lower limit of the first test parameter, P goal is the limit alarm parameter, ΔP is the gear distribution difference, and N is the division coefficient.

2. The method according to claim 1, characterized in that The limit parameters of the alarm sensor include an upper limit parameter and a lower limit parameter; The step of performing a traversal test on the limit parameters of the alarm sensor based on the first test parameter includes: In the case where the limit parameter of the alarm sensor is an upper limit parameter, based on the first test parameter, performing a traversal test on the upper limit parameter in a sequence from an upper limit gear position to a lower limit gear position; In the case where the limit parameter of the alarm sensor is a lower limit parameter, the lower limit parameter is traversed and tested in order from a lower limit gear position to an upper limit gear position based on the first test parameter.

3. The method according to claim 1 or 2, characterized in that: The alarm sensor includes a plurality of test positions; the method further includes: After traversing the limit parameters of the alarm sensor, determining a target test gear that meets the expected results among the multiple test gears; Determine a second test parameter of other test gears among the plurality of test gears except the target test gear; Based on the second test parameter, the limit parameters of the other test gears are tested.

4. The method according to claim 3, characterized in that The multiple test gears are arranged in an arithmetic progression; The determining of the second test parameters of the other test gears among the multiple test gears except the target test gear includes calculating the second test parameters according to the following formula: Among them, P1 is the first test parameter, P 21 is the second test parameter of the test gear position which is lower than the target test gear position and m1 intervals away from the target test gear position, P 22 is the second test parameter of the test gear that is higher than the target test gear and m2 intervals away from the target test gear, and ΔP is the gear distribution difference.

5. The method according to claim 3, characterized in that: The determining of a target test gear that meets the expected result among the multiple test gears includes: Determine a test gear among the multiple test gears for alarming according to the first test parameter; The test gear position for alarming according to the first test parameter is used as the target test gear position.

6. A device for testing the limit parameters of an alarm sensor, comprising a processor and a memory storing program instructions, characterized in that: The processor is configured to perform the method for testing the limit parameters of an alarm sensor according to any one of claims 1 to 5 when executing the program instructions.

7. An electronic device, characterized in that: include: Electronic equipment body; The device for testing the limit parameters of an alarm sensor as claimed in claim 6 is installed in the electronic equipment body.

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