Projection screen size analysis method, device, and measuring device

Abstract

The application provides a projection picture size analysis method, device and measuring device. The method comprises the following steps: acquiring photosensitive information in a measuring area by a measuring device, wherein the measuring device moves in the measuring area according to a preset track; analyzing a contour line of a projection area in the measuring area according to the photosensitive information; acquiring motion parameters of the measuring device; determining coordinate information of the contour line according to the motion parameters; and analyzing the size of the projection picture according to the coordinate information. By using the method, the measuring device moves in the measuring area according to the preset track, so that the photosensitive information of a large-area measuring area is collected by a small number of photosensitive elements, and the cost is reduced.

Description

Technical Field

[0001] This application relates to the field of projection technology, specifically to a method, apparatus, and measuring device for analyzing the size of a projected image. Background Technology

[0002] With the increasing maturity of projection technology, its application in work and life is becoming more and more widespread. For projection products, determining the size of the projected image is an essential testing step. Existing methods for testing the size of the projected image mainly include three types: (1) manual measurement, which is time-consuming and labor-intensive; (2) covering the projection plane with photosensitive elements, projecting the image onto the photosensitive elements, and measuring the size of the projected image by measuring the light sensitivity of the photosensitive elements, which is costly; (3) using a camera to capture the projected image and then performing image analysis on the captured image, which requires a high-precision camera and is costly. In addition, it requires the use of image recognition algorithms, and achieving high-precision recognition is difficult. Summary of the Invention

[0003] Therefore, it is necessary to provide a method, apparatus, and measuring device for analyzing the size of a projected image to address the aforementioned technical problems. The measuring device moves along a preset trajectory within the measurement area, thereby enabling the acquisition of photosensitive information from a large measurement area using a smaller number of photosensitive elements, thus reducing costs.

[0004] In a first aspect, this application provides a method for analyzing the size of a projected image, including:

[0005] The measuring device acquires photosensitive information within the measurement area, and the measuring device moves within the measurement area according to a preset trajectory.

[0006] Analyze the contour line of the projected area within the measurement area based on the photosensitive information;

[0007] Obtain the motion parameters of the measuring device;

[0008] The coordinate information of the contour line is determined based on the motion parameters;

[0009] The size of the projected image is analyzed based on the coordinate information.

[0010] In some embodiments of this application, analyzing the contour line of the projected area within the measurement area based on the photosensitive information includes:

[0011] Analyze the boundary between the projected area and the non-projected area within the measurement region based on the photosensitive information;

[0012] If the dividing line is a closed curve, then the dividing line is the outline of the projected area;

[0013] If the boundary line is not a closed curve, then the measuring device acquires photosensitive information within a new measuring area until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projection area.

[0014] In some embodiments of this application, if the boundary line is not a closed curve, then the measuring device acquires photosensitive information within a new measuring area until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projection area. The method further includes:

[0015] If the boundary line is not a closed curve, then control the measuring device to move along the extension direction of the boundary line;

[0016] The measuring device acquires photosensitive information within a new measuring area until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projection area.

[0017] In some embodiments of this application, obtaining the motion parameters of the measuring device includes:

[0018] If the measuring device moves by rotation, then the photosensitive range, rotation frequency, and rotation time of the measuring device are obtained.

[0019] If the measuring device moves in a motion mode, then the photosensitive range, moving speed, and moving time of the measuring device are obtained.

[0020] In some embodiments of this application, after determining the coordinate information of the boundary line based on the motion parameters, the process includes:

[0021] The projection parameters of the target points within the projection area are obtained using a measuring device;

[0022] The coordinate information of the target point is determined based on the motion parameters, and the target point, the projection parameters, and the coordinate information are associated.

[0023] Secondly, this application provides a projection screen size analysis device, comprising:

[0024] The information acquisition module is used to acquire photosensitive information within a measurement area through a measuring device, wherein the measuring device moves within the measurement area according to a preset trajectory;

[0025] The contour analysis module is communicatively connected to the information acquisition module and is used to analyze the contour line of the projected area within the measurement area based on the photosensitive information.

[0026] A parameter acquisition module is used to acquire the motion parameters of the measuring device;

[0027] The size analysis module is communicatively connected to the contour analysis module and the parameter acquisition module, and is used to determine the coordinate information of the contour line based on the motion parameters; and to analyze the size of the projected image based on the coordinate information.

[0028] In some embodiments of this application, the contour analysis module is further configured to analyze the boundary line between the projected area and the non-projected area within the measurement area based on the photosensitive information; if the boundary line is a closed curve, then the boundary line is the contour line of the projected area; if the boundary line is not a closed curve, then new photosensitive information within the measurement area is obtained through the measuring device until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the contour line of the projected area.

[0029] In some embodiments of this application, the contour analysis module is further configured to control the measuring device to move along the extension direction of the boundary line if the boundary line is not a closed curve; to obtain photosensitive information in a new measuring area through the measuring device until the boundary line determined by all the photosensitive information is a closed curve, thereby obtaining the contour line of the projection area.

[0030] In some embodiments of this application, the parameter acquisition module is further configured to acquire the photosensitive range, rotation frequency, and rotation time of the measuring device if the movement mode of the measuring device is rotation; and to acquire the photosensitive range, movement speed, and movement time of the measuring device if the movement mode of the measuring device is movement.

[0031] In some embodiments of this application, the size analysis module is further configured to obtain the projection parameters of the target point within the projection area through a measuring device; determine the coordinate information of the target point based on the motion parameters; and associate the target point, the projection parameters, and the coordinate information.

[0032] Thirdly, this application provides a measuring device applied to the projection screen size analysis method as described in any one of the above claims, comprising:

[0033] Installation components;

[0034] The test piece is movably connected to the mounting component, and the test piece is provided with multiple photosensitive elements;

[0035] A driving component is provided to drive the test piece to move on the mounting component, so that the plurality of photosensitive elements can collect photosensitive information of the area traversed by the test piece.

[0036] In some embodiments of this application, the test piece is rotatably connected to the mounting piece, or the test piece is movably connected to the mounting piece.

[0037] In some embodiments of this application, the plurality of photosensitive elements are uniformly spaced on the test piece, or the plurality of photosensitive elements are randomly spaced on the test piece.

[0038] In some embodiments of this application, the measuring device further includes an adjusting member, the mounting member is disposed on the adjusting member, and the adjusting member is used to change the relative position of the mounting member and the test piece with the projection device.

[0039] The above-mentioned projection image size analysis method, device, and measuring device allow the measuring device to move along a preset trajectory within the measurement area, enabling the photosensitive elements on the measuring device to collect photosensitive information of the entire measurement area. This allows for the collection of photosensitive information of a large measurement area using a smaller number of photosensitive elements, thereby reducing costs. Attached Figure Description

[0040] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0041] Figure 1 This is a flowchart illustrating a projection screen size analysis method in one embodiment of this application;

[0042] Figure 2 This is a schematic diagram of a projection screen size analysis method in another embodiment of this application;

[0043] Figure 3 This is a flowchart illustrating a projection screen size analysis method in another embodiment of this application;

[0044] Figure 4 This is a schematic diagram of the projected area and the non-projected area within a measurement area in one embodiment of this application;

[0045] Figure 5 This is a flowchart illustrating a projection screen size analysis method in another embodiment of this application;

[0046] Figure 6 This is a flowchart illustrating a projection screen size analysis method in another embodiment of this application;

[0047] Figure 7 This is a flowchart illustrating a projection screen size analysis method in another embodiment of this application;

[0048] Figure 8 This is a schematic diagram of the structure of the projection screen size analysis device in the embodiments of this application;

[0049] Figure 9 This is a schematic diagram of the rotatable connection between the test piece and the mounting piece in another embodiment of this application;

[0050] Figure 10 This is a schematic diagram of the movable connection between the test piece and the mounting piece in another embodiment of this application;

[0051] Figure 11 This is a schematic diagram of a structure in another embodiment of this application in which photosensitive elements are uniformly spaced on a test piece;

[0052] Figure 12 This is a schematic diagram of the structure in another embodiment of the present application, showing that the photosensitive elements are arranged at equal intervals on the test piece. Detailed Implementation

[0053] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0054] In the description of this application, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the stated features. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0055] In the description of this application, the word "for example" is used to mean "used as an example, illustration, or description." Any embodiment described as "for example" in this application is not necessarily to be construed as being more preferred or advantageous than other embodiments. The following description is provided to enable any person skilled in the art to make and use the invention. Details are set forth in the following description for purposes of explanation. It should be understood that those skilled in the art will recognize that the invention can be made without using these specific details. In other instances, well-known structures and processes will not be described in detail to avoid obscuring the description of the invention with unnecessary detail. Therefore, the invention is not intended to be limited to the embodiments shown, but is consistent with the broadest scope of the principles and features disclosed in this application.

[0056] In the embodiments of this application, it should be noted that since the projection screen size analysis method provided in this application is executed in a computer device, the processing objects of each computer device exist in the form of data or information, such as time, which is essentially time information. It can be understood that if size, quantity, position, etc. are mentioned in subsequent embodiments, they are all corresponding data that exist so that the computer device can process them. The specifics will not be elaborated here.

[0057] See Figure 1 This application provides a method for analyzing the size of a projected image, which includes steps S101 to S105, as follows:

[0058] S101, the photosensitive information within the measurement area is acquired by the measuring device, and the measuring device moves within the measurement area according to a preset trajectory.

[0059] Specifically, the measuring device is equipped with multiple photosensitive elements. The photosensitive elements can convert the image (light signal) projected onto their photosensitive surface into an electrical signal. Within a region, the projected image exists in the projection area, but not in the non-projection area. In other words, the photosensitive elements can identify the projection area by collecting photosensitive information.

[0060] The measurement area is the range that the measuring device can measure in advance. In order to reduce the size of the measuring device and avoid arranging photosensitive elements in the entire measurement area, the measuring device can move along a preset trajectory within the measurement area, so that the photosensitive elements on the measuring device can collect photosensitive information of the entire measurement area. Thus, a large area of ​​photosensitive information can be collected with a small number of photosensitive elements, reducing costs.

[0061] The projection screen size analysis method provided in this application embodiment can be applied to, for example... Figure 2 In the scenario shown, such as Figure 2 As shown, the entire circular dashed area 1 is the measurement area, and the rectangular area 2 is the projection area. It should be noted that the shapes of the measurement area and the projection area are not specifically limited in this embodiment.

[0062] S102, Analyze the contour line of the projected area within the measurement area based on the photosensitive information.

[0063] Specifically, the projected area and the non-projected area within the measurement area are distinguished based on the photosensitive information. Since the projected image may be rectangular, trapezoidal due to distortion, or any other arbitrary shape, the outline of the projected area is determined based on the photosensitive information. The area within the outline is the projected image. Then, the size of the projected image is determined based on the outline, and the calculation result is more accurate and closer to the actual situation.

[0064] In one embodiment, such as Figure 3As shown, this step includes: S201, analyzing the boundary line between the projected area and the non-projected area within the measurement area based on the photosensitive information; S202, if the boundary line is a closed curve, then the boundary line is the outline of the projected area; S203, if the boundary line is not a closed curve, then acquiring new photosensitive information within the measurement area through the measuring device, until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projected area.

[0065] Specifically, the projected and non-projected areas within the measurement region are distinguished based on the photosensitive information. One possibility is that the projected area contains projected light, while the non-projected area has no other light; in this case, the presence of light in the photosensitive information can be used for differentiation. Another possibility is that the projected area contains projected light, while the non-projected area also has ambient light (such as light scattered from other devices or natural ambient light). However, based on the requirements of projection effect, the intensity of the projected light in the projected area should be much greater than that in the non-projected area. That is, the brightness of the light in the photosensitive information shows a sudden change at the boundary between the two, thus determining the boundary between the projected and non-projected areas. Since the information acquisition range of the photosensitive element on the measuring device is limited, the projected area measured by the measuring device in one or several measurements may only be a part of the complete projected area. Therefore, further judgment is made based on the boundary line.

[0066] If all the determined boundary lines can be connected to form a closed curve, such as a complete rectangle or trapezoid, or if all the determined boundary lines are piecewise curves but can be fitted to a closed curve, then it is also considered that all the determined boundary lines can be connected to form a closed curve, with the area inside the closed curve being the projection region and the area outside the closed curve being the non-projection region. In this case, the determined boundary lines are the outlines of the projection region.

[0067] If all the determined boundary lines, when connected in series, do not form a closed curve, although the projected and non-projected regions can be distinguished within the measurement area, the projected region extends to the boundary of the measurement area, meaning the determined projected region is incomplete. Figure 4 As shown, the entire circular dashed area 1 is the measurement area, and the shaded area 2 is the projection area. The boundary between the projection area and the non-projection area is not a closed curve, and the projection area is incomplete. Therefore, the measuring device is controlled to move to a new measurement area to acquire photosensitive information within the new measurement area. Then, the new boundary between the projection area and the non-projection area is analyzed using all the photosensitive information. If the new boundary is a closed curve, it is determined as the outline of the projection area. If the new boundary is still not a closed curve, the above process is repeated to control the measuring device to move to a new measurement area, acquire photosensitive information, and analyze the boundary until the boundary determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projection area.

[0068] In this embodiment, when the measurement area of ​​the measuring device is small and cannot measure the entire projection area, the measuring device is controlled to move to obtain photosensitive information of the new area, and photosensitive information of a large area is collected through a small number of photosensitive elements.

[0069] In one embodiment, such as Figure 5 As shown, step S203, if the boundary line is not a closed curve, then the measuring device acquires photosensitive information within a new measurement area until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projection area, includes: S301, if the boundary line is not a closed curve, then the measuring device is controlled to move along the extension direction of the boundary line; S302, the measuring device acquires photosensitive information within a new measurement area until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projection area.

[0070] Specifically, if all the determined boundary lines, when connected in series, do not form a closed curve, in order to ensure that the new measurement area acquired by the measuring device is an effective area and to avoid excessive deviation from the projected area, the moving direction of the measuring device is determined by using the already obtained boundary lines as a reference object. The measuring device is controlled to move along the extension direction of the boundary lines, which is the direction of a preset length line segment at any end of the already determined boundary lines. For example, starting from any end point of the already determined boundary lines, the measuring device is controlled to move in a direction away from the boundary lines, while ensuring that the distance between the measuring device and the endpoint of the boundary lines at the starting point does not exceed a preset distance.

[0071] Furthermore, the measuring device can be controlled to stop after moving to a new measuring range, and then move along a preset trajectory within the new measuring range to acquire photosensitive information within that new area. Alternatively, the measuring device can be controlled to move to a new measuring range while simultaneously moving along a preset trajectory to acquire photosensitive information within that new area. By adjusting the motion parameters of the measuring device, missed detection areas can be avoided.

[0072] The above process is repeated to move the measuring device to a new measuring area, acquire photosensitive information, and analyze the boundary line until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projected area.

[0073] S103, Obtain the motion parameters of the measuring device.

[0074] Specifically, the measuring device moves within the measuring area according to a preset trajectory. The motion parameters include the preset motion trajectory and the motion speed of the measuring device. In addition, if the measuring device moves to a new measuring area to acquire new photosensitive information, the motion parameters also include the direction and speed of the measuring device's movement between measuring areas.

[0075] In one embodiment, such as Figure 6 As shown, this step includes: S401, if the movement mode of the measuring device is rotation, then the photosensitive range, rotation frequency and rotation time of the measuring device are obtained; S402, if the movement mode of the measuring device is movement, then the photosensitive range, movement speed and movement time of the measuring device are obtained.

[0076] Specifically, the measuring device moves along a preset trajectory within the measuring area. The purpose is to collect photosensitive information across the entire measuring area using a smaller number of photosensitive elements, avoiding the high cost of arranging photosensitive elements throughout the entire measuring area. The preset trajectory of the measuring device within the measuring area can be a straight line, an arc, or an arbitrary curve; this embodiment does not impose specific limitations. It is only necessary to obtain the motion parameters of the measuring device to analyze the coordinates of each point within the measuring area.

[0077] If the measuring device moves by moving, then the photosensitive range, moving speed, and moving time of the measuring device are obtained. The photosensitive range includes the number, position, and spacing of the photosensitive elements arranged on the measuring device, as well as the position of the moving reference point, such as the starting position. Combining the moving speed and moving time of the measuring device, the coordinates of each point within the measuring area can be determined.

[0078] If the measuring device moves by rotation, then the photosensitive range, rotation frequency, and rotation time of the measuring device are obtained. The photosensitive range includes the number, position, and spacing of the photosensitive elements arranged on the measuring device, as well as the position of the rotation reference point, such as the center of rotation. By combining the rotation frequency and rotation time of the measuring device, the coordinates of each point within the measurement area can be determined. The smaller the spacing between the photosensitive elements on the polishing device, the higher the measurement accuracy.

[0079] S104, determine the coordinate information of the contour line based on the motion parameters.

[0080] Specifically, the coordinate information of each point on the contour line is determined based on the motion parameters, thereby determining the coordinate information of the entire contour line. For example, the measuring device is set as a long strip and rotates around one end of the measuring device as the center. The length of the photosensitive element on the measuring device is w, and the spacing between them is m. If the number of photosensitive elements is n, and if the photosensitive elements on the measuring device are reasonably arranged with no large blank areas (no photosensitive elements) around them, then the photosensitive range of the measuring device, that is, the measuring radius R, is: R = w*n + m*(n-1). The rotation frequency of the measuring device is f, and the rotation time of the measuring device is t. Then, the rotation plane of the measuring device forms a polar coordinate system plane that varies with time and the detection radius. The coordinates of any point detected at any time point are P = ((w*n + m*(n-1)), (360°*f·t)). Then, the coordinate information of the contour line is determined based on the determined coordinates of each point. If the projection screen is rectangular and the measurement area includes the entire projection screen, then the coordinates of the four endpoints of the projection screen are calculated in the following order: The distance between endpoints is used to calculate the size of the projected image. It should be noted that the sum of the photosensitive element length and the spacing w+m should be as small as possible, and the smaller the photosensitive element response time and the time difference Δt, the higher the accuracy.

[0081] One approach is to first analyze the pattern of the contour line or perform polygon fitting on the contour line. Then, the coordinate information of the contour line can be determined based on a few points on the contour line. For example, when the contour line is analyzed as a rectangle, only the coordinates of the four endpoints of the contour line need to be determined to determine the coordinate information of the entire contour line, reducing the number of points whose coordinates need to be calculated.

[0082] S105, Analyze the size of the projected image based on the coordinate information.

[0083] Specifically, after determining the outline of the projection area, which is a closed curve, the area within the outline is the projection image. After obtaining the coordinate information of the outline, the size of the projection image is analyzed based on the coordinate information.

[0084] In one embodiment, such as Figure 7 As shown, this step includes: S501, obtaining the projection parameters of the target point within the projection area through a measuring device; S502, determining the coordinate information of the target point based on the motion parameters, and associating the target point, the projection parameters, and the coordinate information.

[0085] Specifically, once the outline is determined, the projection area is determined. The projection parameters of the target points within the projection area are obtained through a measuring device. The measuring device is equipped with a projection parameter acquisition module. While acquiring photosensitive information through the photosensitive element, the projection parameters of each point are acquired through the projection parameter acquisition module, so that the data acquisition is synchronized.

[0086] The projection parameters include color temperature, brightness, and other parameters. Corresponding acquisition modules can be set on the measuring device according to the parameters that need to be collected; this embodiment does not impose specific limitations. Generally, only the projection parameters of a single point within the projection area need to be acquired. Therefore, after determining the contour line, i.e., after determining the projection area, the projection parameters of the target point are selected from all the previously acquired points without distinction. The target point is any point within the projection area, a pre-set point for which projection parameters need to be collected. Therefore, the coordinate information of the target point can be determined based on the motion parameters. Furthermore, if the target point is a special point within the projection area, such as the center point of the projection area, the coordinate information of the target point can be determined by combining the characteristics of the target point. Finally, the target point, projection parameters, and coordinate information are associated for easy storage and retrieval of relevant information.

[0087] In this embodiment, the measuring device can move along a preset trajectory within the measuring area, enabling the photosensitive elements on the measuring device to collect photosensitive information of the entire measuring area. This allows for the collection of photosensitive information of a large measuring area with a smaller number of photosensitive elements, thereby reducing costs.

[0088] To better implement the projection screen size analysis method in the embodiments of this application, based on the projection screen size analysis method, the embodiments of this application also provide a projection screen size analysis device, such as... Figure 8 As shown, the projection screen size analysis 600 includes:

[0089] The information acquisition module 610 is used to acquire photosensitive information within a measurement area through a measuring device, wherein the measuring device moves within the measurement area according to a preset trajectory;

[0090] The contour analysis module 620 is communicatively connected to the information acquisition module 610 and is used to analyze the contour line of the projected area within the measurement area based on the photosensitive information.

[0091] The parameter acquisition module 630 is used to acquire the motion parameters of the measuring device;

[0092] The size analysis module 640 is communicatively connected to the contour analysis module 620 and the parameter acquisition module 630, and is used to determine the coordinate information of the contour line according to the motion parameters; and to analyze the size of the projected image according to the coordinate information.

[0093] In one embodiment, the contour analysis module 620 is further configured to analyze the boundary line between the projected area and the non-projected area within the measurement area based on the photosensitive information; if the boundary line is a closed curve, then the boundary line is the contour line of the projected area; if the boundary line is not a closed curve, then new photosensitive information within the measurement area is obtained through the measuring device until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the contour line of the projected area.

[0094] In one embodiment, the contour analysis module 620 is further configured to control the measuring device to move along the extension direction of the boundary line if the boundary line is not a closed curve; to acquire photosensitive information in a new measurement area through the measuring device until the boundary line determined by all the photosensitive information is a closed curve, thereby obtaining the contour line of the projection area.

[0095] In one embodiment, the parameter acquisition module 630 is further configured to acquire the photosensitive range, rotation frequency, and rotation time of the measuring device if the movement mode of the measuring device is rotation; and to acquire the photosensitive range, movement speed, and movement time of the measuring device if the movement mode of the measuring device is movement.

[0096] In one embodiment, the size analysis module 640 is further configured to acquire the projection parameters of the target point within the projection area through a measuring device; determine the coordinate information of the target point based on the motion parameters; and associate the target point, the projection parameters, and the coordinate information.

[0097] This application provides a measuring device applied to the projection screen size analysis method described in the above embodiments. The measuring device includes a mounting component, a test component, and a driving component. The mounting component is used to install the entire measuring device within the measurement area and also supports other components of the measuring device. The test component is movably connected to the mounting component and can move along a preset trajectory on the mounting component. The test component is provided with multiple photosensitive elements. The test component can be elongated or arc-shaped; the shape of the test component is not specifically limited in this embodiment. The driving component can be located on the mounting component or between the test components. The driving component drives the test components to move along the preset trajectory on the mounting component, thereby causing the multiple photosensitive elements on the test component to collect photosensitive information of the area traversed by the test component, which is the measurement area. By using a smaller number of photosensitive elements, photosensitive information of a large measurement area can be collected, reducing costs.

[0098] In one embodiment, the test piece is rotatably connected to the mounting piece, such as... Figure 9 As shown, test piece 4 rotates clockwise around its endpoint. The area within the dashed line is the measurement area of ​​test piece 4. It should be noted that... Figure 9This is an illustrative example for ease of understanding and should not be construed as a limitation of this embodiment. The preset trajectory of the test piece 4 moving on the mounting piece 3 can be a partial arc (the test piece 4 rotates back and forth within a preset arc angle range, the arc angle range is not specifically limited, for example, first rotating 60° clockwise, then 60° counterclockwise), or it can be a complete circle (the test piece 4 rotates a full revolution). Furthermore, the test piece 4 can rotate around an endpoint or around any point; this embodiment does not impose specific limitations.

[0099] Alternatively, the test piece and the mounting piece can be moved together, such as... Figure 10 As shown, test piece 4 moves linearly along the track of mounting piece 3. The area within the dashed line is the measurement area of ​​test piece 4. It should be noted that... Figure 10 This is an illustrative example for ease of understanding and should not be construed as a limitation of this embodiment. The preset trajectory of the test piece 4 moving on the mounting piece 3 can be a straight line or a curve, such as a C-shaped curve; this embodiment does not impose any specific limitations.

[0100] In one embodiment, multiple photosensitive elements are evenly spaced on the test piece, meaning that the spacing between adjacent photosensitive elements is the same, such as... Figure 11 As shown, test piece 4 is designed as a long strip, and the photosensitive elements on test piece 4 are evenly spaced. It should be noted that... Figure 11 This is an illustrative example for ease of understanding and should not be construed as a limitation on the shape of the test piece or the spacing between the photosensitive elements in this embodiment.

[0101] Alternatively, multiple photosensitive elements are randomly spaced on the test piece, meaning the spacing between adjacent photosensitive elements is not uniform. For example, along the direction of the photosensitive element arrangement, the spacing between adjacent photosensitive elements increases or decreases arithmetically or geometrically. Figure 12 As shown, test piece 4 is designed as a long strip, and the spacing between the photosensitive elements on test piece 4 forms an arithmetic sequence. It should be noted that... Figure 12 This is an illustrative example for ease of understanding and should not be construed as a limitation on the shape of the test piece or the spacing between the photosensitive elements in this embodiment. The variation of the spacing between adjacent photosensitive elements is not specifically limited in this embodiment.

[0102] Furthermore, the spacing between adjacent photosensitive elements can be set to be variable, meaning the photosensitive elements can move freely on the test piece, and different spacing settings can be made according to their own needs. Further, the spacing can be adjusted by moving the photosensitive elements before testing, and then fixed after adjustment; alternatively, the photosensitive elements can be moved during measurement while acquiring photosensitive information, for example, they can be moved back and forth on the test piece towards and away from the axis of rotation. During measurement, the spacing between the photosensitive elements can remain constant or be adjusted simultaneously; this embodiment does not impose specific limitations.

[0103] It should be noted that the larger the proportion of the photosensitive element relative to the area of ​​the test piece, that is, the smaller the spacing between adjacent photosensitive elements, the denser the acquired photosensitive information, and the smaller the blank area around the photosensitive element, the higher the accuracy of the analysis results.

[0104] In one embodiment, since the area measured by a single measuring device is limited, multiple measuring devices can be set up to measure different areas respectively, with the areas overlapping each other. Based on the different connection methods between the test piece and the mounting piece, when the test piece and the mounting piece are rotated and connected, the multiple measuring devices are arranged in a centrally symmetrical manner so that their measurement areas overlap. When the test piece and the mounting piece are rotated and connected, the multiple measuring devices are arranged in a horizontal and vertical array so that their measurement areas overlap, thus obtaining a measurement result for a larger area.

[0105] Alternatively, the measuring device may also include an adjustment component, on which the mounting component is mounted. The adjustment component is used to change the relative position of the mounting component and the test piece with the projection device. That is, after collecting the photosensitive information of a certain measurement area, the entire measuring device is moved to a new measurement area for detection and analysis by driving the adjustment component.

[0106] In this embodiment, the measuring device can move along a preset trajectory within the measuring area, allowing the photosensitive elements on the measuring device to collect photosensitive information of the entire measuring area. At the same time, the measuring device can be controlled to move to a new measuring area, thereby achieving the collection of photosensitive information of a large measuring area with a small number of photosensitive elements, reducing costs.

[0107] In the above embodiments, the descriptions of each embodiment have their own emphasis. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments. The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as the combination of these technical features does not contradict each other, it should be considered within the scope of this specification.

[0108] The foregoing has provided a detailed description of a projection screen size analysis method, apparatus, and measuring device provided in the embodiments of this application. Specific examples have been used to illustrate the principles and implementation methods of the present invention. The descriptions of the above embodiments are only for the purpose of helping to understand the method and core ideas of the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A method for analyzing the size of a projected image, characterized in that, Used to analyze the projection screen size of projection products, including: The measuring device acquires photosensitive information within a measurement area. The measuring device includes a test piece, on which multiple photosensitive elements are provided. The test piece moves within the measurement area according to a preset trajectory, so that the multiple photosensitive elements collect photosensitive information of the area traversed by the test piece. Analyze the contour line of the projected area within the measurement area based on the photosensitive information; Obtain the motion parameters of the measuring device; The coordinate information of the contour line is determined based on the motion parameters; Analyze the size of the projected image based on the coordinate information; The step of analyzing the contour line of the projected area within the measurement area based on the photosensitive information includes: Analyze the boundary between the projected area and the non-projected area within the measurement area based on the photosensitive information; If the dividing line is a closed curve, then the dividing line is the outline of the projected area.

2. The projection image size analysis method as described in claim 1, characterized in that, The step of analyzing the contour line of the projected area within the measurement area based on the photosensitive information includes: If the boundary line is a non-closed curve, then the measuring device acquires photosensitive information within the new measuring area until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projection area.

3. The projection image size analysis method as described in claim 2, characterized in that, If the boundary line is not a closed curve, then the measuring device acquires photosensitive information within a new measuring area until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projection area. The method further includes: If the dividing line is a non-closed curve, then control the measuring device to move along the extension direction of the dividing line; The measuring device acquires photosensitive information within a new measuring area until the boundary line determined by all the photosensitive information is a closed curve, thus obtaining the outline of the projection area.

4. The projection image size analysis method as described in claim 2, characterized in that, The process of acquiring the motion parameters of the measuring device includes: If the measuring device moves by rotation, then the photosensitive range, rotation frequency, and rotation time of the measuring device are obtained. If the measuring device moves in a motion mode, then the photosensitive range, moving speed, and moving time of the measuring device are obtained.

5. The projection image size analysis method as described in claim 1, characterized in that, After determining the coordinate information of the boundary line based on the motion parameters, the process includes: The projection parameters of the target points within the projection area are obtained using a measuring device; The coordinate information of the target point is determined based on the motion parameters, and the target point, the projection parameters, and the coordinate information are associated.

6. A projection screen size analysis device, characterized in that, Used to analyze the projection screen size of projection products, including: An information acquisition module is used to acquire photosensitive information within a measurement area through a measuring device. The measuring device includes a test piece, on which multiple photosensitive elements are provided. The test piece moves within the measurement area according to a preset trajectory, so that the multiple photosensitive elements collect photosensitive information of the area traversed by the test piece. The contour analysis module is communicatively connected to the information acquisition module and is used to analyze the contour line of the projected area within the measurement area based on the photosensitive information. A parameter acquisition module is used to acquire the motion parameters of the measuring device; The size analysis module is communicatively connected to the contour analysis module and the parameter acquisition module, and is used to determine the coordinate information of the contour line based on the motion parameters; and analyze the size of the projected image based on the coordinate information. The step of analyzing the contour line of the projected area within the measurement area based on the photosensitive information includes: Analyze the boundary between the projected area and the non-projected area within the measurement area based on the photosensitive information; If the dividing line is a closed curve, then the dividing line is the outline of the projected area.

7. A measuring device, characterized in that, The method for analyzing the size of a projected image as described in any one of claims 1 to 5 includes: Installation components; The test piece is movably connected to the mounting piece; A driving component, the driving component being used to drive the test piece to move on the mounting component.

8. The measuring device as described in claim 7, characterized in that, The test piece is rotatably connected to the mounting piece, or the test piece is movably connected to the mounting piece.

9. The measuring device as described in claim 7, characterized in that, The plurality of photosensitive elements are arranged at uniform intervals on the test piece, or the plurality of photosensitive elements are arranged at random intervals on the test piece.

10. The measuring device as claimed in claim 7, characterized in that, The measuring device further includes an adjusting component, and the mounting component is disposed on the adjusting component. The adjusting component is used to change the relative position of the mounting component, the test piece, and the projection device.

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