A method and system for testing short-circuit of pins of an image sensor based on an SOC platform

Abstract

The application provides a kind of SOC platform-based image sensor pin open short test method and system, host computer sets the output parameter of the output channel of excitation module and corresponding image sensor to be measured and is issued to control module;Control module identifies each pin of image sensor to be measured through switch module;Control module controls each output channel of excitation module respectively polls corresponding image sensor pin to be measured and executes open short test: control module configures the excitation source of excitation module, so that excitation module outputs positive excitation and reverse excitation;Control module connects test pin with excitation source or ground through switch module, controls non-test pin to be grounded or suspended or connected with excitation source;Voltage detection module real-time acquisition voltage signal of test pin and feedback to host computer through control module;Host computer judges whether open short circuit or not.The application effectively improves the detection efficiency and precision of image sensor pin open short test.

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