X-ray based non-line-of-sight azimuth precision measurement device and method

By using an X-ray-based non-line-of-sight azimuth precision measurement device, which utilizes an X-ray detector converter and a visible light imaging detector, the problem of surface damage caused by optical measurement methods is solved, achieving high-precision azimuth angle measurement and adapting to applications with high surface integrity requirements.

CN116772758BActive Publication Date: 2026-06-16XIAN INST OF OPTICS & PRECISION MECHANICS CHINESE ACAD OF SCI

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
XIAN INST OF OPTICS & PRECISION MECHANICS CHINESE ACAD OF SCI
Filing Date
2023-02-22
Publication Date
2026-06-16

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Abstract

The present application relates to a spatial angle precision measuring device, in particular to a non-visibility azimuth angle precision measuring device and method based on X-ray. The present application solves the technical problem that the existing optical azimuth angle precision measuring device and method need to open a light passage on the surface of the measured object, which destroys the aerodynamic shape and surface air tightness of the measured object, and causes the measured object to fail to meet the requirements. The measuring device comprises two X-ray source assemblies, two imaging module assemblies, a cooperative target and a computer. The X-ray source assembly comprises an X-ray tube and a collimating element; the imaging module assembly comprises an X-ray detection converter and a visible light imaging detector; the X-ray tube emits X-rays which form a collimated X-ray beam through the collimating element, and the collimated X-ray beam is incident on the measured object and irradiates the cooperative target; the light passing through the cooperative target is projected and imaged through the imaging module assembly; the pixel coordinates of the cooperative target image are extracted by the computer, and the azimuth angle value of the measured object is calculated.
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