A system for automatic sample exchange

Abstract

The present application relates to the field of optical technology, and provide a kind of automatic replacement sample system.The automatic replacement sample system includes sample positioning device and automatic sample taking and placing device;Wherein, sample positioning device is connected to goniometer head, for fixing the sample to be measured;Automatic sample taking and placing device is electrically connected with sample detection experiment station, for replacing sample signal sent by sample detection experiment station, automatically replacing the sample to be measured on sample positioning device.Through installing sample positioning device on the original sample detection experiment station, and installing automatic sample taking and placing device electrically connected with the detector of sample detection experiment station, automatic sample taking and placing device can automatically replace the sample to be measured on sample positioning device according to the replacement sample signal sent by the detector, so that it avoids experimental personnel to participate in detection all the time in the process of experiment, reduces the number of experimental personnel, and then reduces detection cost, improves experimental efficiency.

Description

Technical Field

[0001] This invention relates to the field of optical technology, and more particularly to a system for automatically changing samples. Background Technology

[0002] Synchrotron radiation X-ray sources, due to their high brightness and high collimation, can conduct experiments that are impossible with conventional laboratory X-ray sources. The position and size of the synchrotron radiation X-ray beam used in the experiment remain fixed during the experiment. Before the experiment, the rotation center of the diffractometer must be precisely positioned at the center of the X-ray beam. The diffractometer used in synchrotron radiation experimental stations is typically a five-circle diffractometer, where the rotational axes of the five circles intersect at the same point, i.e., the position pointed to by the tip of the goniometer. The positioning accuracy of this rotational center is generally within tens of micrometers.

[0003] Each time a new experimental sample is replaced, the upper surface of the sample needs to be precisely positioned with the center of the X-ray beam. Positioning requires high precision in the vertical direction, needing an accuracy of several micrometers; while horizontal positioning doesn't require micrometer-level precision, it still needs to ensure the beam spot falls on the sample's upper surface. Therefore, attitude calibration of the sample's upper surface is necessary. The standard sample attitude calibration procedure is as follows: First, the sample is attached to a small aluminum sample stage on top of the goniometer using double-sided tape. The sample surface is manually leveled until it is parallel to the surface of the φ-shaped frustum below. This requires the use of a laser, a plane mirror, etc., and takes one to several minutes for adjustment. Then, the pitch angle between the sample surface and the incident beam is adjusted using the X-ray beam. This pitch angle refers to the rotation angle between the goniometer, the φ-shaped frustum, and the sample as a whole relative to the incident beam, and is different from the pitch angle of the goniometer itself. Finally, lower the sample height so that the X-ray beam passes completely over the sample and is incident on the detector. Record the detector count at this time. Gradually scan the sample height so that the sample blocks about half of the beam intensity. Then scan the sample's pitch angle. When the sample surface is horizontal with the beam, the detector count is at its maximum. Repeat the last two steps of the above operation until the sample's upper surface is parallel to the beam while blocking half of the beam.

[0004] In summary, precise adjustments to the sample surface height, pitch angle, and roll angle are required for each sample test. This is because using double-sided tape to attach different samples always causes variations in these three parameters. Even with experienced operators, manually adjusting the orientation of a single sample before the experiment takes five to ten minutes. However, the two-dimensional signal acquisition time for a typical sample is only about 1 to 10 minutes, making the time spent switching and adjusting samples unbearable and significantly reducing light efficiency. Internationally, similar experimental stations use methods to fix samples, including double-sided tape, wax, and back-suction, which uses a small vacuum pump to adhere the back of the sample to the sample stage. However, variations in sample thickness and back surface roughness cause displacement, necessitating fine-tuning of the sample's orientation. Furthermore, currently, operators must be present at the sample testing station throughout the experiment to change samples, resulting in high labor costs. Summary of the Invention

[0005] The technical problem to be solved by this invention is that the labor cost of experiments is high.

[0006] To address the aforementioned technical problems, this invention provides a system for automatically changing samples.

[0007] The automatic sample changing system of the present invention includes:

[0008] The sample positioning device, connected to the sample testing station, is used to fix the sample to be tested.

[0009] An automatic sample pick-and-place device is electrically connected to the sample testing station and is used to automatically replace the sample to be tested on the sample positioning device according to the sample replacement signal sent by the sample testing station.

[0010] According to the present invention, an automatic sample replacement system is provided, wherein the sample positioning device comprises:

[0011] The positioning component body has a reserved space inside for accommodating the sample adhesive and is connected to the angle measuring head of the sample testing experimental station.

[0012] The connecting assembly includes a detachably connected first connector and a second connector; one of the first connector and the second connector is connected to the positioning body, and the other is connected to the sample adhesive.

[0013] The automatic sample handling device is used to automatically replace the sample adhesive that is detachably connected to the positioning component body.

[0014] According to the present invention, an automatic sample replacement system is provided, wherein the connecting component is a magnetic suction component.

[0015] According to the present invention, an automatic sample replacement system is provided, wherein the positioning component body includes a cover having a light-transmitting hole formed thereon; the light-transmitting hole communicates with the reserved space and is used to allow light reflected by the sample to pass through the positioning component body.

[0016] According to the present invention, an automatic sample changing system is provided, wherein the positioning component body further includes a base plate and two side plates arranged parallel to each other and spaced apart.

[0017] The bottom surface of the base plate is connected to the angle measuring head; the two side plates are connected between the base plate and the cover; the base plate, the two side plates and the cover enclose the reserved space.

[0018] According to the present invention, an automatic sample replacement system is provided, wherein the sample positioning device further includes a shielding member connected to the cover; the shielding member has a reserved gap, which communicates with the light-transmitting hole.

[0019] An automatic sample replacement system according to the present invention further includes an attenuation absorber, comprising:

[0020] A substrate is disposed between the synchrotron radiation X-ray source of the sample detection experimental station and the sample positioning device; the substrate is defined with a plurality of attenuation absorption parts, which are spaced apart, and each attenuation absorption part has a different thickness to achieve different degrees of attenuation and absorption of X-rays.

[0021] An automatic sample changing system according to the present invention further includes:

[0022] The flight channel assembly has a flight channel formed inside; the flight channel is used to allow the X-ray beam passing through the attenuation absorber to be directed toward the sample to be tested.

[0023] An automatic sample changing system according to the present invention further includes:

[0024] A shielding plate is disposed between the flight tube assembly and the sample positioning device, and is located above the X-ray beam.

[0025] An automatic sample changing system according to the present invention further includes:

[0026] A central beam blocker is located between the detector of the sample detection experimental station and the sample positioning device, and is used to block the direct light directed toward the detector.

[0027] This invention provides an automatic sample replacement system. By installing a sample positioning device and an automatic sample pick-and-place device electrically connected to the sample testing station on the existing sample testing experimental station, the automatic sample pick-and-place device can automatically replace the sample to be tested on the sample positioning device according to the sample replacement signal sent by the sample testing experimental station. This avoids the need for experimental personnel to participate in sample testing throughout the entire experiment, reducing the number of experimental personnel and thus reducing testing costs. Attached Figure Description

[0028] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0029] Figure 1 This is a schematic diagram of the structure of a sample positioning device provided by the present invention;

[0030] Figure 2 yes Figure 1 A three-dimensional structural diagram of the positioning component body from one perspective;

[0031] Figure 3 yes Figure 2 A three-dimensional structural diagram of the structure shown from another perspective;

[0032] Figure 4 yes Figure 1 A schematic diagram of the structure of the sample adhesive after the sample is removed;

[0033] Figure 5 This is a schematic diagram of the structure of an automatic sample changing system provided by the present invention;

[0034] Figure 6 yes Figure 5 Enlarged structural diagram at point A;

[0035] Figure 7 This is a schematic diagram of the attenuation absorber of an automatic sample replacement system provided in an embodiment of the present invention, viewed from the main perspective.

[0036] Figure 8 yes Figure 7 A schematic diagram of the attenuation absorber as seen from the left view.

[0037] Figure 9 yes Figure 7 A schematic diagram of the substrate of the attenuation absorber shown in the main view.

[0038] Figure 10 yes Figure 5 The diagram shows the connection structure and the assembly structure of the shielding plate of an automatic sample changing system.

[0039] Figure 11 yes Figure 5 The diagram shows the connection structure of an automatic sample changing system and the assembly structure of the central beam blocker.

[0040] Figure label:

[0041] 1. Sample positioning device; 3. Automatic sample loading and unloading device; 4. Attenuation absorber; 6. Flight tube assembly; 7. Shielding plate; 8. Center beam shield;

[0042] 11. Positioning component body; 12. Sample mounting component; 13. Connecting assembly; 14. Shielding component; 21. Angle measuring head; 22. Synchrotron X-ray source; 23. Detector; 24. Five-circle diffractometer; 41. Substrate; 42. Attenuation and absorption section; 43. Driving assembly; 44. Support assembly; 51. Connecting structure;

[0043] 111. Reserved space; 112. Cover; 113. Base plate; 114. Side plate; 115. Positioning connector; 131. First connector; 132. Second connector; 141. First shielding plate; 142. Second shielding plate; 143. Reserved gap; 411. Through hole; 421. Mounting hole; 422. Attenuation absorption sheet; 431. Stepper motor; 432. Mounting flange; 441. Support component; 442. Base; 511. Connecting plate; 512. Connecting rod; 513. Support rod;

[0044] 1121. First cover plate; 1122. Second cover plate; 1123. Light-transmitting hole. Detailed Implementation

[0045] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0046] The following is combined with Figures 1-4 This invention describes a sample positioning device. For example... Figure 1As shown, the sample positioning device includes a positioning body 11, a sample adhesive 12, and a connecting assembly 13. The positioning body 11 has a reserved space 111 for accommodating the sample adhesive 12. The connecting assembly 13 includes a detachably connected first connector 131 and a second connector 132. One of the first connector 131 and the second connector 132 is connected to the positioning body 11, and the other is connected to the sample adhesive 12. When the sample adhesive 12 is detachably connected to the positioning body 11 via the connecting assembly 13, the sample adhesive 12 is located within the reserved space 111. In this embodiment, the number and form of the connecting assembly 13 are not limited; for example, there can be one or more connecting assemblies. The connecting assembly 13 can be a magnetic component, a beaded component, or other components with detachable connection functions. The function of the connecting assembly 13 is twofold: firstly, to achieve a detachable connection between the positioning body 11 and the sample adhesive 12; and secondly, to ensure that the sample adhesive 12 is stably connected to the positioning body 11.

[0047] When using this positioning device for the first time to test a sample, the sample adhesive piece 12 with the sample coating is first connected to the positioning piece body 11. Then, the experimenter adjusts the height and orientation of the positioning piece body 11 to ensure that the height and orientation of the sample meet the experimental requirements before testing the sample. After testing, the sample adhesive piece 12 is replaced, and the next sample is tested. When testing the next sample, it is not necessary to adjust the height and orientation of the positioning piece body 11 again, because once the height and orientation of the positioning piece body 11 are adjusted, it ensures that the height and orientation of the sample on the replaced sample adhesive piece 12 are consistent with the previous sample. That is, it is not necessary to adjust the height and orientation of the sample every time, which solves the problem in existing experiments where the height and orientation of the sample needs to be precisely positioned for each test. Furthermore, because the sample adhesive piece 12 and the positioning piece body 11 are detachably connected via the connecting component 13, it is possible to quickly change the sample to be tested, thereby improving experimental efficiency.

[0048] In a specific embodiment, the first connector 131 includes three first magnet groups, and the second connector 132 also includes three second magnet groups, and the three first magnet groups are magnetically connected to the three second magnet groups respectively.

[0049] Considering connection stability, in this embodiment, the three first magnet groups are not on the same straight line; similarly, the three second magnet groups are also not on the same straight line. In use, the three first magnet groups and the three second magnet groups correspond one-to-one and are magnetically connected to each other. The fact that the three first magnet groups and the three second magnet groups are not on the same straight line is based on the principle that three points determine a plane. This ensures that once the height and orientation of the positioning body 11 are fixed, the height and orientation of the sample on the sample adhesive 12, which is detachably connected to the positioning body 11, are also fixed and will not change due to changes in sample thickness, etc. Preferably, the lines connecting the three first magnet groups form an isosceles right triangle, and the lines connecting the corresponding three second magnet groups also form an isosceles right triangle. This facilitates installation and allows the sample adhesive 12 to be more stably and detachably mounted on the positioning body 11.

[0050] In a specific embodiment, the first magnet group or the second magnet group connected to the positioning component body 11 includes a large magnet or a small magnet that is magnetically connected to each other; the large magnet is also connected to the positioning component body 11, and the small magnet is in contact with the sample on the sample adhesive 12.

[0051] Specifically, when the first magnet group is connected to the positioning component body 11, each first magnet group includes a large magnet and a small magnet that are magnetically connected to each other; the large magnet is also connected to the positioning component body 11, and the small magnet is in contact with the sample on the sample adhesive component 12 while being magnetically connected to the second magnet group. Because it is the small magnet that is in contact with the sample, the contact area between the male connector and the sample can be reduced, thereby exposing more of the sample to the test environment.

[0052] In this embodiment, considering the magnitude of the magnetic force, the large magnet is preferably a magnet with a cross-sectional diameter of 2 mm, while the small magnet is preferably a magnet with a cross-sectional diameter of 1 mm. Both the large and small magnets are preferably N52 type magnets. Correspondingly, the second magnet group is preferably composed of magnets with a cross-sectional diameter of 2 mm, and its purpose is to achieve a stable magnetic connection with the first magnet group; the second magnet group is preferably composed of N52 type magnets.

[0053] Alternatively, when the second magnet group is connected to the positioning body 11, each second magnet group includes a large magnet and a small magnet that are magnetically connected to each other; the large magnet is also connected to the positioning body 11, and the small magnet is in contact with the sample on the sample adhesive 12 while being magnetically connected to the first magnet group.

[0054] In a specific implementation, the positioning component body 11 includes a cover 112, on which a light-transmitting hole 1123 is formed. The light-transmitting hole 1123 communicates with the reserved space 111, allowing light reflected from the sample to pass through the positioning component body 11. When the sample adhesive 12 is detachably mounted on the positioning component body 11, the sample on the sample adhesive 12 is located below the light-transmitting hole 1123, and the light reflected from the sample can pass through the light-transmitting hole 1123 and exit the positioning component body 11. The shape of the light-transmitting hole 1123 can be circular, square, polygonal, or elongated, etc. There are no restrictions on the formation of the light-transmitting hole 1123.

[0055] like Figure 2 and Figure 3 As shown, the positioning component body 11 also includes a base plate 113 and two side plates 114 arranged parallel to each other and spaced apart.

[0056] The bottom ends of the two side plates 114 are connected to the bottom plate 113, and the top ends are connected to the cover 112. The bottom plate 113, the two side plates 114, and the cover 112 enclose a reserved space 111. The reserved space 111 is preferably a rectangular space, and the front and back of the reserved space 111 are directly connected to the outside.

[0057] The positioning component body 11 also includes a positioning connector 115, which is located outside the reserved space 111 and connected to the base plate 113. When using the sample positioning device of this embodiment, the positioning connector 115 is fixedly connected to the sample stage.

[0058] In this embodiment, the cover 112 includes a first cover plate 1121 and a second cover plate 1122. The first cover plate 1121 is connected to the top end of one side plate 114, and the second cover plate 1122 is connected to the top end of another side plate 114. A gap is left between the opposite end faces of the first cover plate 1121 and the second cover plate 1122 to form a light-transmitting hole 1123. Preferably, to facilitate the placement and removal of the sample adhesive 12, the first cover plate 1121 is a rectangular structure, while the second cover plate 1122 is a trapezoidal structure. Alternatively, both the first cover plate 1121 and the second cover plate 1122 are trapezoidal structures. In this embodiment, two first magnet groups are fixedly installed on the first cover plate 1121, and another first magnet group is fixedly installed on the second cover plate 1122. All three first magnet groups are located within the reserved space 111, and the line connecting the three first magnet groups forms an isosceles right triangle. Correspondingly, three second magnet groups are fixedly installed on the sample adhesive 12, and the line connecting the three second magnet groups forms an isosceles right triangle.

[0059] In a specific embodiment, such as Figure 4 As shown, the sample adhesive 12 includes an acrylic sheet, which is fixedly connected to the first connector 131 or the second connector 132.

[0060] In a specific embodiment, the sample positioning device further includes a shielding member 14 connected to the cover 112; the shielding member 14 has a reserved gap 143 formed thereon, the reserved gap 143 is vertically arranged and communicates with the light-transmitting hole 1123 and the reserved space 111. The shielding member 14 is used to shield air-scattered light, which can effectively filter out unnecessary air scattering, reduce the background noise signal on the detector of the sample detection experimental station body, and improve the quality of data signal.

[0061] The shielding component 14 includes a first shielding plate 141 and a second shielding plate 142 that are evenly spaced apart; a reserved gap 143 is formed between the two opposite sides of the first shielding plate 141 and the second shielding plate 142. In this embodiment, the first shielding plate 141 is preferably fixedly connected to the first cover plate 1121, and the second shielding plate 142 is preferably fixedly connected to the second cover plate 1122.

[0062] In a specific embodiment, the sample positioning device further includes a sealing component; the sealing component is detachably connected to the shielding component 14 and is used to close or open the reserved gap. In some experimental modes, because the incident angle of X-rays is very small, it is necessary to use the sealing component to close the reserved gap to reduce the scattering effect of air. In other experimental modes, because the incident angle of X-rays is relatively large, it is not necessary to use the sealing component to block the X-rays. This increases the application scenarios of the sample positioning device 1 in this embodiment and expands its application range.

[0063] In this embodiment, the shielding member 14 is preferably an iron plate, and the corresponding sealing member is preferably a magnet. This allows the reserved gap to be opened or closed by magnetic attraction, and also prevents the sealing member from being lost.

[0064] The following is combined with Figure 5 and Figure 6 The present invention describes an automatic sample replacement system, which includes a sample positioning device 1, a sample testing station, and an automatic sample pick-and-place device 3, as described in any of the above embodiments.

[0065] The positioning body 11 of the sample positioning device 1 is fixedly connected to the angle measuring head 21 of the sample testing station; the automatic sample picking and placing device 3 is electrically connected to the sample testing station and is used to automatically replace the sample adhesive piece 12 set on the positioning body 11 according to the sample replacement signal sent by the detector 23 of the sample testing station.

[0066] In this embodiment, the sample testing station includes a goniometer 21, a synchrotron X-ray source 22, a detector 23, and a five-circle diffractometer 24. The sample testing station in this embodiment has already been set up in the laboratory, and can be used directly when samples need to be tested.

[0067] First, the rotational axes of the five circles of the five-circle diffractometer 24 intersect at the same point, which is the position pointed to by the needle tip on the angle measuring head 21. Simultaneously, the X-ray beam emitted by the synchrotron X-ray source 22 of the synchrotron X-ray source emitter also coincides with the center of the five-circle diffractometer. Then, the sample to be tested is placed on the sample stage of the angle measuring head 21 (i.e., at the position of the needle tip). The orientation and height of the sample are adjusted by adjusting the angle measuring head 21 to ensure that the sample's height and orientation meet the experimental requirements. Finally, the sample reflects the X-ray beam to the detector. The detector receives and processes the signal to obtain the sample's detection data.

[0068] In this embodiment, the positioning component body 11 of the sample positioning device 1 is fixedly connected to the angle measuring head 21 of the sample detection experimental station. Specifically, the positioning connector 115 of the positioning component body 11 is fixedly connected to the sample stage of the angle measuring head 21. Therefore, the height and orientation of the positioning component body 11 can be changed by adjusting the angle measuring head 21. Furthermore, because the sample adhesive 12 is detachably mounted on the positioning component body 11, the height and orientation of the sample can be fixed by the positioning component body 11. That is, once the height and orientation of the positioning component body 11 are fixed, even if different sample adhesives 12 are replaced, it is not necessary to readjust the height and orientation of the positioning component body 11. Therefore, this solves the problems of requiring precise positioning of the sample's height and orientation for each sample detection in the prior art, and the resulting low experimental efficiency.

[0069] In this embodiment, the automatic sample handling device 3 preferably uses a robotic arm, which is electrically connected to the detector 23. When the robotic arm receives a sample replacement signal from the detector, it first removes the sample adhesive 12 from the positioning body 11; then, it picks up the new sample adhesive 12 placed on the sample holder; finally, it detachably installs the new sample adhesive 12 onto the positioning body 11, and the sample testing station re-tests the new sample adhesive 12. This completes the automatic sample replacement process, improving experimental efficiency.

[0070] In this embodiment, the preferred method for changing the sample signal is to use data from the X-ray beam reflected by the sample under test received by the detector. The aforementioned control process is pre-integrated by the robot manufacturer into the existing software specifications (SPEC software) based on actual conditions.

[0071] In an embodiment, such as Figure 7 , Figure 8 and Figure 9As shown, the automatic sample replacement system also includes an attenuation absorber 4; the attenuation absorber 4 includes a substrate 41; the substrate 41 is disposed between the synchrotron radiation X-ray source 22 and the sample positioning device 1, and a plurality of attenuation absorption sections 42 are defined on the substrate 41, the plurality of attenuation absorption sections 42 are spaced apart, and each attenuation absorption section 42 has a different thickness to achieve different degrees of attenuation absorption of X-rays.

[0072] When using this attenuator to attenuate and absorb X-rays, firstly, the amount of attenuation of X-rays is determined based on the required X-ray intensity of the sample to be tested and the intensity of X-rays emitted by the synchrotron radiation X-ray source. Then, the required thickness of the attenuation absorption section 42 is calculated based on the attenuation amount. Next, the corresponding attenuation absorption section 42 is adjusted to a position where X-rays can pass through, thereby achieving attenuation and absorption of X-rays. Finally, the attenuated X-rays are directed toward the sample to be tested.

[0073] Because the substrate 41 has multiple attenuation and absorption sections 42 of different thicknesses, it is possible to generate X-rays of different intensities to meet different experimental requirements. In other words, the present invention can adjust the thickness of the attenuation and absorption sections 42 to ensure that the attenuated X-rays meet different experimental requirements.

[0074] By defining multiple attenuation and absorption portions 42 of different thicknesses on the substrate 41, different degrees of attenuation and absorption of X-rays are achieved to obtain X-rays of different intensities. This not only ensures that the attenuated X-rays meet experimental requirements, but also that the attenuation absorber of the present invention is low in cost and small in size, thus effectively solving the shortcomings of high price and large size of existing commercial attenuation absorbers.

[0075] In a specific embodiment of the present invention, each attenuation absorption part 42 includes a mounting hole 421 and an attenuation absorption sheet 422; the mounting hole 421 is formed on the substrate 41, and the attenuation absorption sheet 422 is covered on the corresponding mounting hole 421 and connected to the substrate 41; the thickness of the attenuation absorption sheet 422 of different attenuation absorption parts 42 is different.

[0076] It is understandable that in order to achieve different degrees of attenuation and absorption of X-rays by passing through attenuation absorption sheets 422 of different thicknesses, that is, the attenuation absorption sheet 422 has the effect of attenuation and absorption of X-rays, the material of the attenuation absorption sheet 422 is preferably metal, including, but not limited to, aluminum plate or lead plate.

[0077] Understandably, depending on the attenuation requirements, the materials of the attenuation absorbers 422 connected to the substrate 41 can be exactly the same or not. For example, some attenuation absorbers 422 are aluminum plates, while others are lead plates. The material and thickness of the attenuation absorbers 422 are selected according to the attenuation requirements for X-rays.

[0078] It should be noted that "the attenuation absorption sheet 422 is connected to the substrate 41" can be interpreted in at least two ways, but is not limited to these two interpretations:

[0079] The first type is where the attenuation absorption sheet 422 is integrally formed and connected to the substrate 41.

[0080] The second method involves bonding the attenuation absorption sheet 422 to the substrate 41.

[0081] The attenuation absorption sheet 422 and the substrate 41 are integrally formed and connected. The attenuation absorption sheet 422 and the substrate 41 can be welded together, or it can be obtained by the following processing method: blind holes are directly processed on the substrate 41, and the bottom of the blind hole is the attenuation absorption sheet 422. During processing, the depth of the blind hole is controlled so that different attenuation absorption sheets 422 have different thicknesses.

[0082] The attenuation absorption sheet 422 is bonded to the substrate 41 by the following processing method: First, mounting holes 421 penetrating the substrate 41 are directly machined on the substrate 41; then, the attenuation absorption sheets 422 are directly glued to the substrate 41 one by one to cover the corresponding mounting holes 421. This design not only serves a positioning function, ensuring that operators can quickly find the location of the required attenuation absorption sheet 422, but also facilitates processing without considering the depth of the opening.

[0083] In specific embodiments of the present invention, the substrate 41 may be, but is not limited to, an aluminum plate or a lead plate. However, considering the weight, in some embodiments, the substrate 41 is preferably an aluminum plate. The thickness of the substrate 41 is preferably 1 mm. This is to reduce the weight of the entire attenuation absorber, which on the one hand makes it easier for the experimenter to accurately push the substrate 41 so that the X-ray beam corresponds to the corresponding attenuation absorber 422; on the other hand, it can reduce the problem of excessive inertia caused by the large weight, ensuring that the substrate 41 can stop in time as required.

[0084] In a specific embodiment of the present invention, a through hole 411 is also formed on the substrate 41. The through hole 411 is disposed at intervals from the attenuation and absorption portion 42. The through hole 411 is for allowing X-rays to pass directly through the substrate 41, which is suitable for experiments that do not require attenuation of X-rays.

[0085] Understandably, the diameter of the X-ray beam is approximately 2 mm. To ensure that the X-ray beam can completely pass through the through-hole 411 or mounting hole 421, and to avoid the problem of the X-ray beam irradiating anything other than the target attenuation and absorption sheet 422 during the instant the substrate 41 changes from dynamic to static, the apertures of the through-hole 411 and mounting hole 421 must be much larger than the diameter of the X-ray beam. In a specific embodiment, the diameter of the through-hole 411 and mounting hole 421 is preferably 20 mm. Of course, the diameter of the through-hole 411 and mounting hole 421 is not limited in this invention, as long as the aperture of the through-hole 411 and mounting hole 421 is larger than the diameter of the X-ray beam.

[0086] In specific embodiments, the number of attenuation absorption portions 42 is not limited. However, based on actual experimental experience, this embodiment of the invention has 15 mounting holes 421 and 1 through hole 411. The through hole 411 and the 15 mounting holes 421 are numbered as follows: through hole 0, mounting hole 1, mounting hole 2, mounting hole 3, mounting hole 4, mounting hole 5, mounting hole 6, mounting hole 7, mounting hole 8, mounting hole 9, mounting hole 10, mounting hole 11, mounting hole 12, mounting hole 13, mounting hole 14, and mounting hole 15. The thickness of the attenuation absorption sheet 422 disposed on the above 15 mounting holes is different. Of course, the number of mounting holes 421 can be more than 15 or less than 15, depending on the actual needs of the test station.

[0087] In a specific embodiment of the present invention, the thickness of the attenuation absorber 422 is not limited. However, considering the difference between the intensity of the X-ray beam emitted by the synchrotron X-ray source during the experiment and the intensity of the X-ray beam required by the sample, the materials and thicknesses of the 15 attenuation absorber 422 are preferably 0.1mm, 0.2mm, 0.3mm, 0.4mm, 0.5mm, 0.6mm, 0.7mm, 0.8mm, 0.9mm, 1mm, 1.5mm, 2mm, 3mm, 5mm, and 1mm lead plates, respectively. The X-ray beam emitted by the synchrotron X-ray source passes through one through-hole 411 and the 15 attenuation absorber 422, resulting in 16 X-ray beams of varying intensities. These 16 intensities can meet the X-ray beam intensity requirements of most samples during testing. Of course, the thickness and material of each attenuation absorber 422 are not limited and can be determined based on the actual conditions of the experimental station.

[0088] In specific embodiments of the present invention, the specific arrangement of the through hole 411 and the mounting hole 421 is not limited. However, considering that the through hole 411 and different attenuation and absorption plates 422 can correspond to the X-ray beam respectively, the specific arrangement of the through hole 411 and the mounting hole 421 can be at least the following three ways:

[0089] The first type is a straight line connecting the center of the through hole 411 and the center of all the mounting holes 421.

[0090] The second type is where the line connecting the center of the through hole 411 and the centers of all the mounting holes 421 forms an ellipse.

[0091] The third type is where the line connecting the center of the through hole 411 and the centers of all the mounting holes 421 forms a circle.

[0092] Understandably, when the connecting lines form a circle, the substrate 41 is in the shape of a disk for aesthetic purposes, with through holes 411 and multiple mounting openings arranged at intervals around the center of the substrate 41.

[0093] In a specific embodiment of the present invention, although the experimenter can manually move the substrate 41 to allow X-rays to pass through the corresponding attenuation absorption plate 422, the attenuation absorber is relatively heavy because the substrate 41 and the attenuation absorption plate 422 are made of metal, preferably aluminum or lead. Therefore, the attenuation absorber in this embodiment of the present invention also includes a driving component 43, which is connected to the substrate 41 and is used to drive the substrate 41 to move so that X-rays can pass through the through hole 411 or different attenuation absorption sections 42. This method of using the driving component 43 to drive the substrate 41 not only improves efficiency but also reduces the labor intensity of the experimenter.

[0094] It is understandable that the driving component 43 is used to drive the movement of the substrate 41 in two ways:

[0095] The first type is that the driving component 43 is used to drive the substrate 41 to move linearly. This driving method is suitable for cases where the line connecting the center of the through hole 411 and the center of all the mounting holes 421 is a straight line.

[0096] The second type is that the driving component 43 is used to drive the substrate 41 to rotate. This driving method is suitable for cases where the line connecting the center of the through hole 411 and the center of all the mounting holes 421 forms an ellipse or a circle.

[0097] It is understandable that when the center of the through hole 411 is aligned with the center of all the attenuation absorption sections 42, the drive assembly 43 drives the substrate 41 to perform reciprocating linear motion guided by the straight line.

[0098] It is understandable that when the line connecting the center of the through hole 411 and the center of all the attenuation absorption parts 42 forms an ellipse, the drive assembly 43 drives the substrate 41 to rotate guided by the edge of the ellipse.

[0099] It is understandable that when the line connecting the center of the through hole 411 and the center of all the attenuation absorption parts 42 forms a circle, the drive assembly 43 drives the substrate 41 to rotate with the edge of the circle as a guide.

[0100] In a specific embodiment of the present invention, the attenuation absorber further includes a support component 44, which is connected to the drive component 43 and is used to support the substrate 41 so that the height of the substrate 41 meets the experimental requirements.

[0101] The support component 44 includes a base 442 and a support member 441; one end of the support member 441 is connected to the base 442 and the other end is connected to the drive component 43.

[0102] The following is combined with Figure 1 and Figure 2 The attenuation absorber of the present invention will be described in detail below.

[0103] In a specific embodiment of the present invention, the attenuation absorber includes a circular substrate 41, a driving assembly 43, and a support assembly 44; the driving assembly 43 includes a stepper motor 431 and a mounting flange 432; the support assembly 44 includes a base 442 and a support member 441. The shaft of the stepper motor 431 is connected to the substrate 41 to drive the substrate 41 to rotate; the base 442 is placed on the ground, one end of the support member 441 is fixed to the base 442, and the other end is connected to the stepper motor 431 through the mounting flange 432.

[0104] The substrate 41 is an aluminum plate with a thickness of 1 mm. The substrate 41 has one through-hole 411 and 15 mounting holes 421 arranged at intervals around the center of the substrate 41. Each mounting hole 421 is covered with an attenuation absorption sheet 422, which is glued to the substrate 41. The thickness of each attenuation absorption sheet 422 is different. To facilitate quick location of the attenuation absorption sheet 422 that meets experimental requirements, the 15 mounting holes 421 are numbered sequentially as follows: mounting hole 1, mounting hole 2, mounting hole 3, mounting hole 4, mounting hole 5, mounting hole 6, mounting hole 7, mounting hole 8, mounting hole 9, mounting hole 10, mounting hole 11, mounting hole 12, mounting hole 13, mounting hole 14, and mounting hole 15. Correspondingly, the attenuation absorption sheets 422 are glued into mounting holes 1 to 15 in the following order: 0.1mm aluminum plate, 0.2mm aluminum plate, 0.3mm aluminum plate, 0.4mm aluminum plate, 0.5mm aluminum plate, 0.6mm aluminum plate, 0.7mm aluminum plate, 0.8mm aluminum plate, 0.9mm aluminum plate, 1mm aluminum plate, 1.5mm aluminum plate, 2mm aluminum plate, 3mm aluminum plate, 5mm aluminum plate and 1mm lead plate, thus obtaining the attenuation absorber of the present invention.

[0105] In use, the experimenter calculates the attenuation of X-rays based on the X-ray intensity requirements of the sample to be tested; then, based on the attenuation, the material and thickness of the required attenuation absorber 422 are determined. For example, the required attenuation absorber 422 is an aluminum plate with a thickness of 0.6 mm, corresponding to mounting hole 6 421; then, the stepper motor 431 is started, and after mounting hole 6 421 is rotated to the position of the X-ray, the stepper motor 431 is stopped; finally, the X-rays pass through the attenuation absorber 422 located in mounting hole 6 421 and are directed toward the sample to be tested, thus realizing the detection of the sample to be tested.

[0106] Furthermore, because X-ray beams inevitably attenuate during transmission through the air, generating strong scattering noise signals that can affect the accuracy of sample detection results, the automatic sample replacement system in this embodiment of the invention also includes a flight tube assembly 6. The flight tube assembly 6 includes a flight tube and a support frame; a flight channel is formed within the flight tube, which is positioned between the attenuator 4 and the sample positioning device 1. X-ray beams passing through the through-hole 411 or the attenuator 422 enter the flight channel and are then directed towards the sample to be tested. The bottom of the support frame is placed on the ground or fixed to the experimental platform, while the upper end is connected to the flight tube to support it and ensure its stable placement between the attenuator 4 and the sample positioning device 1.

[0107] To further improve the accuracy of the experiment, the flight pipeline assembly 6 also includes a vacuum pump and valves. The vacuum pump is connected to the flight channel of the flight pipeline via a suction pipe, which is equipped with valves. Polyacetamide membranes are installed at both the inlet and outlet of the flight channel. These membranes not only seal the flight channel but also allow the X-ray beam to pass through with minimal attenuation. Before testing the sample, the vacuum pump is activated to achieve a vacuum level of one atmosphere within the flight channel. The valves are then closed to maintain the vacuum level at one atmosphere, thus preventing air attenuation and absorption of the X-ray beam.

[0108] The automatic sample changing system of this embodiment further includes a shielding plate 7 and a central beam stop 8. The shielding plate 7 is located between the flight tube and the sample positioning device 1, and above the X-ray beam to block air scattering, thereby further improving the accuracy of the experiment. The central beam stop 8 is located between the detector 23 and the sample positioning device 1. The central beam stop 8 is used to block the direct light incident on the detector 23, improving the accuracy of the experimental structure and preventing direct light from damaging the detector 23. Preferably, the central beam stop 8 is positioned close to the detector 23.

[0109] The drive assembly also includes two two-dimensional displacement platforms; one platform is connected to the shielding plate 7 for adjusting its position, and the other platform is connected to the central beam shielding device 8 for adjusting its position. These two-dimensional displacement platforms can be obtained by purchasing ready-made products.

[0110] Considering space limitations, the drive assembly also includes two connection structures 51, one of which is connected at both ends to a two-dimensional displacement platform and a shielding plate 7, respectively. Figure 10 As shown; the two ends of another connection structure 51 are respectively connected to another two-dimensional displacement platform and the central beam blocker 8, as shown. Figure 11 As shown.

[0111] like Figure 10 As shown, the connection structure 51 includes a connection plate 511 connected to the two-dimensional displacement platform and a connection rod 512; one end of the connection rod 512 is connected to the connection plate 511, and the other end is connected to the shielding plate 7 or the central beam shielding device 8.

[0112] like Figure 11 As shown, the connecting structure 51 also includes a support rod 513, through which the central beam blocker 8 is connected to the connecting rod 512. To fine-tune the distance between the central beam blocker 8 and the detector 23, multiple rows of first mounting holes are provided on the connecting rod 512, with at least one first mounting hole in each row. These multiple rows of first mounting holes are arranged along the extending direction of the connecting rod 512. Second mounting holes are also provided on the support rod 513. Bolts and nuts are installed in both the first and second mounting holes to fix the central beam blocker 8. Fine-tuning of the distance between the central beam blocker 8 and the detector 23 is achieved by cooperating with the second mounting holes in different rows of first mounting holes.

[0113] The detector 23 in existing sample testing stations is generally a Mar345 imaging plate detector. However, the Mar345 imaging plate detector is very slow; after exposure and data acquisition, it takes about two minutes to read and store the data. Furthermore, it is placed at a relatively far distance from the sample (approximately 440 mm), and the greater the distance between the sample and the detector, the more severe the air absorption, resulting in a weaker signal and strong background noise from the air. To solve these problems, the detector 23 in the sample testing station of this embodiment is an EIGER X 1M detector. Using an EIGER X 1M detector significantly increases the speed, requiring only a few milliseconds to read the data. Placing it closer to the sample (approximately 110 mm) effectively reduces air attenuation and noise, improving the signal strength of the sample. In addition, to facilitate easier adjustment of the EIGER X 1M detector's position, it is mounted on the third two-dimensional displacement platform of the drive assembly.

[0114] It should be noted that the automatic sample changing system of the present invention can be used, but is not limited to, for grazing incidence wide-angle X-ray scattering (GIWAXS) experiments.

[0115] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A system for automatically changing samples, characterized in that, include: The sample positioning device (1) is connected to the sample testing experimental station and is used to fix the sample to be tested. An automatic sample pick-and-place device (3) is electrically connected to the sample testing experimental station and is used to automatically replace the sample to be tested on the sample positioning device (1) according to the sample replacement signal sent by the sample testing experimental station. The sample positioning device (1) includes: The positioning component body (11) has a reserved space (111) for accommodating the sample adhesive and is connected to the angle measuring head (21) of the sample detection experimental station. The connecting assembly includes a detachably connected first connector (131) and a second connector (132); one of the first connector (131) and the second connector (132) is connected to the positioning body (11), and the other is connected to the sample adhesive. The automatic sample pick-and-place device (3) is used to automatically replace the sample adhesive that is detachably connected to the positioning body (11).

2. The automatic sample changing system according to claim 1, characterized in that, The connecting component is a magnetic component.

3. The automatic sample changing system according to claim 1, characterized in that, The positioning component body (11) includes a cover (112) on which a light-transmitting hole (1123) is formed; the light-transmitting hole (1123) is connected to the reserved space (111) and is used to allow light reflected by the sample to be tested to pass through the positioning component body (11).

4. The automatic sample changing system according to claim 3, characterized in that, The positioning component body (11) also includes a base plate (113) and two parallel and spaced side plates (114). The bottom surface of the base plate (113) is connected to the angle measuring head (21); the two side plates (114) are connected between the base plate (113) and the cover (112); the base plate (113), the two side plates (114) and the cover (112) enclose the reserved space (111).

5. The automatic sample changing system according to claim 4, characterized in that, The sample positioning device (1) further includes a shield (14) connected to the cover (112); a reserved gap (143) is formed on the shield (14), and the reserved gap (143) is connected to the light-transmitting hole (1123).

6. The automatic sample changing system according to claim 1, characterized in that, It also includes an attenuation absorber (4), which includes: A substrate (41) is disposed between the synchrotron radiation X-ray source (22) of the sample detection experimental station and the sample positioning device (1); a plurality of attenuation absorption parts (42) are defined on the substrate (41), the plurality of attenuation absorption parts (42) are spaced apart, and the thickness of each attenuation absorption part (42) is different so as to achieve different degrees of attenuation absorption of X-rays.

7. The automatic sample changing system according to claim 6, characterized in that, Also includes: The flight channel assembly (6) has a flight channel formed inside; the flight channel is used to allow the X-ray beam passing through the attenuator (4) to be directed toward the sample to be tested.

8. The automatic sample changing system according to claim 7, characterized in that, Also includes: A shielding plate (7) is disposed between the flight tube assembly (6) and the sample positioning device (1), and is located above the X-ray beam.

9. The automatic sample changing system according to any one of claims 1-8, characterized in that, Also includes: The central beam blocker (8) is located between the detector (23) of the sample detection experimental station and the sample positioning device (1) to block the direct light directed toward the detector (23).

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