Roasting method, device, electronic device, roasting oven, and storage medium

Abstract

The application provides a roasting method, a roasting device, an electronic device, a roasting oven and a storage medium. In a roasting process according to a roasting parameter, whether a required roasting temperature of a roasting target is same as an actual roasting temperature of the roasting target is detected. In a case where the required roasting temperature is same as the actual roasting temperature, if a water loss rate and a temperature change rate of the roasting target do not conform to a set rate matching relationship, the roasting humidity of the roasting target is adjusted. In a case where the required roasting temperature is not same as the actual roasting temperature, if the water loss rate and the temperature change rate of the roasting target do not conform to the set rate matching relationship, the roasting temperature of the roasting target is adjusted. In this way, the purpose of automatically adjusting the roasting parameter is achieved, the influence of roasting personnel experience and level on the roasting quality is avoided, and the quality of the roasting target is ensured.

Description

Technical Field

[0001] This application relates to the field of baking technology, and more particularly to a baking method, apparatus, electronic device, baking oven, and storage medium. Background Technology

[0002] For some products, roasting and dehydrating raw materials is a necessary step in their production. For example, tobacco roasting is an essential step in cigarette processing. By roasting the tobacco leaves, the moisture content is reduced to meet the requirements of subsequent production steps such as cigarette packaging.

[0003] Currently, in the baking and dehydration process of baking targets, to ensure the baking quality, baking personnel need to check the baking targets regularly and adjust parameters such as drying temperature and humidity based on experience. However, this method makes the baking quality highly dependent on the experience and skill of the baking personnel, resulting in inconsistent baking quality and affecting product quality. Summary of the Invention

[0004] In view of this, this application proposes a baking method, apparatus, electronic device, baking oven, and storage medium to solve the problem that the baking quality of the target is greatly affected by the experience and skill of the baking personnel in the prior art, resulting in inconsistent baking quality and affecting product quality.

[0005] The technical solution proposed in this application is as follows:

[0006] In a first aspect, embodiments of this application provide a baking method, comprising:

[0007] During the baking process according to the baking parameters, it is detected whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target; the baking parameters include the set baking temperature and the set baking humidity, and the required baking temperature includes the baking temperature required by the baking target;

[0008] If the required baking temperature is the same as the actual baking temperature, and the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship, then the baking humidity of the baking target will be adjusted.

[0009] If the required baking temperature is different from the actual baking temperature, and if the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship, then the baking temperature of the baking target will be adjusted.

[0010] Secondly, embodiments of this application provide a baking apparatus, comprising:

[0011] The detection unit is used to detect whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target during the baking process according to the baking parameters; the baking parameters include a set baking temperature and a set baking humidity, and the required baking temperature includes the baking temperature required by the baking target.

[0012] The adjustment unit is configured to adjust the baking humidity of the baking target if the rate of water loss and the rate of temperature change of the baking target do not conform to a set rate matching relationship when the required baking temperature is the same as the actual baking temperature; and to adjust the baking temperature of the baking target if the rate of water loss and the rate of temperature change of the baking target do not conform to a set rate matching relationship when the required baking temperature is different from the actual baking temperature.

[0013] Thirdly, embodiments of this application provide an electronic device, including:

[0014] Memory and processor;

[0015] The memory is used to store programs;

[0016] The processor is configured to implement any of the above methods by running a program in the memory.

[0017] Fourthly, embodiments of this application provide a baking oven, including: a status acquisition device and a controller;

[0018] The status acquisition device is used to acquire the status information of the baking target;

[0019] The controller is configured to, during the baking process according to the baking parameters, determine the required baking temperature and water loss rate of the baking target based on the state information of the baking target; detect whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target; the baking parameters include a set baking temperature and a set baking humidity, and the required baking temperature includes the baking temperature required by the baking target; if the required baking temperature is the same as the actual baking temperature, and if the water loss rate and temperature change rate of the baking target do not meet the set rate matching relationship, then the baking humidity of the baking target is adjusted; if the required baking temperature is different from the actual baking temperature, and if the water loss rate and temperature change rate of the baking target do not meet the set rate matching relationship, then the baking temperature of the baking target is adjusted.

[0020] Fifthly, embodiments of this application provide a storage medium storing a computer program, which, when executed by a processor, implements the method described in any of the above-mentioned embodiments.

[0021] Sixthly, embodiments of this application provide a computer program product or computer program, the computer program product or computer program including computer instructions stored in a computer-readable storage medium; a processor of a computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, causing the computer device to perform the above-described method.

[0022] The baking method proposed in this application, during the baking process according to the baking parameters, detects whether the required baking temperature and the actual baking temperature of the target baking object are the same. If the required baking temperature and the actual baking temperature are the same, but the rate of water loss and the rate of temperature change of the target baking object do not meet the set rate matching relationship, the baking humidity of the target baking object is adjusted. If the required baking temperature and the actual baking temperature are different, and the rate of water loss and the rate of temperature change of the target baking object do not meet the set rate matching relationship, the baking temperature of the target baking object is adjusted. This setting achieves the purpose of automatically adjusting the baking parameters, avoiding the influence of the baking personnel's experience and skill on the baking quality, and ensuring the quality of the baked object. Attached Figure Description

[0023] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0024] Figure 1 This is a schematic flowchart of a baking method provided in an embodiment of this application.

[0025] Figure 2 This is the dynamic temperature rise curve provided in the embodiments of this application.

[0026] Figure 3 This is a schematic diagram of the network architecture of the convolutional neural network provided in the embodiments of this application.

[0027] Figure 4 This is a curve showing the change in the target moisture loss rate over time during baking, as provided in the embodiments of this application.

[0028] Figure 5 This is a schematic flowchart of another baking method provided in the embodiments of this application.

[0029] Figure 6 This is a schematic diagram of the structure of a baking apparatus provided in an embodiment of this application.

[0030] Figure 7 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application.

[0031] Figure 8 This is a schematic diagram of the camera portion of an oven provided in an embodiment of this application.

[0032] Figure 9 This is a schematic diagram of the structure of the weight sensor part of an oven provided in an embodiment of this application. Detailed Implementation

[0033] The technical solution of this application embodiment is applicable to the application scenario of baking targets. By adopting the technical solution of this application embodiment, the baking parameters can be automatically adjusted during the baking process, avoiding the influence of the baking personnel's experience and skill on the baking quality.

[0034] For some products, roasting and dehydration of the target material used in its production is a necessary step in the manufacturing process. For example, tobacco curing is an important step in tobacco production, aiming to promote yellowing and drying of the tobacco leaves, reduce their moisture content, and meet the requirements of subsequent production steps such as tobacco packaging.

[0035] Currently, semi-automatic baking technology is generally used to bake objects to improve their quality. This semi-automatic technology allows operators to input baking curves before baking, enabling the baking equipment within the oven to bake the object according to these curves. However, these baking curves cannot fully meet baking requirements; operators still need to periodically check the state of the object and adjust parameters such as baking temperature and humidity accordingly.

[0036] The current baking method not only places an excessive workload on baking personnel, but also relies too heavily on their experience. If baking personnel misjudge the baking stage of the target based on their experience, the target may not be dried enough or may not be dried at all, resulting in significant economic losses and waste of resources.

[0037] Based on this, this application proposes a baking method, apparatus, electronic device, baking oven, and storage medium. This technical solution automatically adjusts the baking parameters by comparing the required baking temperature of the baking target with the actual baking temperature, the water loss rate of the baking target, and the temperature change rate of the baking target, without relying on the work experience of the baking personnel, thus ensuring the quality of the baking target.

[0038] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0039] This application provides a baking method that can be executed by an electronic device. This electronic device can be any device with data and instruction processing capabilities, such as a computer, smart terminal, or server. See also... Figure 1 As shown, the method includes:

[0040] S101. During the baking process according to the baking parameters, check whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target; if the required baking temperature is the same as the actual baking temperature, proceed to step S102; if the required baking temperature is different from the actual baking temperature, proceed to step S104.

[0041] The aforementioned baking target refers to the object being baked. The baking target can be placed inside a baking oven, and baking can be achieved by controlling parameters such as temperature and humidity within the oven. For example, in the production of tobacco leaves, the tobacco leaves can be used as the baking target; in the production of dried fruit, the corresponding fruit can be used as the baking target.

[0042] The baking parameters mentioned above refer to the parameters entered before baking. Each baking device in the baking oven can bake the target according to the baking parameters to obtain baked products that meet the requirements of subsequent production.

[0043] Baking equipment includes a controller, temperature control devices, humidity control devices, etc. Baking parameters can be pre-input into the controller. During the baking process, the controller can control the temperature control devices, humidity control devices, etc., to ensure that the baking oven meets the required baking parameters. In some embodiments, the temperature control device includes a dry-bulb device, and the humidity control device includes a wet-bulb device.

[0044] The baking parameters include setting the baking temperature and setting the baking humidity. The setting baking temperature and setting baking humidity can be obtained in advance through multiple baking experiments, and this embodiment does not limit this. In the embodiments of this application, the baking process of the target according to the baking parameters is a dynamic and slow heating process. By gradually increasing the baking temperature, the temperature and humidity changes are more uniform.

[0045] For example, when the target of baking is tobacco leaves, the dynamic temperature rise curve of the tobacco leaves is as follows: Figure 2 As shown.

[0046] Specifically, current tobacco curing operations are mostly based on a ten-stage curing mode. Before curing begins, the curing parameters for each stage are input into the controller via an interactive panel. Each stage includes five parameters: dry-bulb temperature, wet-bulb temperature, heating time, holding time, and airflow. Dry-bulb temperature represents the target temperature for the stage, used to control the curing chamber temperature; wet-bulb temperature represents the target humidity for the stage, used to control the curing chamber humidity; heating time represents the time required for the dry-bulb temperature to rise from the previous stage to the current stage's dry-bulb temperature, used to control the heating rate; holding time represents the duration of the target dry-bulb and wet-bulb temperatures for the stage; and airflow represents the air speed used to control the airflow speed at each stage of the curing chamber, achieved by setting "high airflow" or "low airflow."

[0047] In the embodiments of this application, when curing tobacco leaves, the ten-stage curing operation mode is no longer used, and the two processes of heating and constant temperature are eliminated. Instead, a more continuous curing method with slow heating is adopted, which makes the temperature and humidity changes more uniform.

[0048] In order to monitor the baking status of the target and ensure the baking quality during the baking process, it is possible to check whether the required baking temperature of the target is the same as the actual baking temperature of the target during the baking process according to the baking parameters.

[0049] An interval time period can be preset, starting from the start of baking, and each time interval corresponding to this interval can be used as an image acquisition time. For example, if the interval time period is 20 minutes, then the times corresponding to 20 minutes, 40 minutes, 60 minutes, etc., during the baking process can be used as image acquisition times. At each image acquisition time, the required baking temperature and the actual baking temperature of the target are obtained, and it is checked whether the required baking temperature and the actual baking temperature are the same.

[0050] In one specific embodiment, if the target to be cured is tobacco leaves, the curing process can be divided into multiple micro-stages of 30 minutes each. For example, based on the original ten-stage curing method, each stage can be further divided into multiple micro-stages of 30 minutes each. Every 30 minutes, the required curing temperature and the actual curing temperature are obtained, and it is checked whether the required curing temperature and the actual curing temperature are the same.

[0051] The actual baking temperature refers to the actual temperature inside the oven at the moment the required baking temperature and the actual baking temperature are collected. Specifically, the baking equipment may include a temperature detection device or a temperature control device with temperature detection function. The temperature detection device or the temperature control device with temperature detection function can acquire the temperature inside the oven in real time and send the temperature inside the oven to the controller mentioned above. Therefore, the actual baking temperature can be read from the oven controller in real time.

[0052] The required baking temperature refers to the baking temperature needed for the target object, specifically the temperature required at the moment the required baking temperature and the actual baking temperature are collected. If the target object is baked at the required baking temperature at that moment, the baking quality will not be affected, and the baking quality requirements will be met.

[0053] In some embodiments, the required baking temperature for the target tobacco leaf can be determined using baking images of the target. Specifically, baking experiments can be conducted beforehand, and as many high-quality baking images as possible can be captured, if conditions permit. Baking experts then screen the target, removing images with poor baking quality or abnormalities in the baking process. Next, the baking experts continuously observe the images from the beginning of baking in chronological order, identifying the tobacco leaf state that should be present at each image acquisition moment, and marking the required baking temperature corresponding to that moment. This creates a baking image library corresponding to different image acquisition moments. Image features are extracted from the baking image library corresponding to each image acquisition moment, and the extracted image features are defined as the first image feature.

[0054] In the embodiments of this application, after obtaining the baking image of the baking target, feature extraction can be performed on the baking target to obtain second image features. By calculating the similarity between the second image features and each first image feature, the target first image feature with the highest similarity to the second image feature is determined from the first image features, and the required baking temperature corresponding to the target first image feature is taken as the required baking temperature of the baking target.

[0055] After obtaining the desired baking temperature and the actual baking temperature, it is checked whether the desired baking temperature and the actual baking temperature are the same. In the embodiments of this application, the desired baking temperature and the actual baking temperature being the same does not mean that the desired baking temperature and the actual baking temperature are exactly the same temperature value, but rather that the deviation between the desired baking temperature and the actual baking temperature is within the set temperature range, which is considered as the desired baking temperature and the actual baking temperature being the same.

[0056] The above-mentioned temperature range can be set according to actual conditions, and this embodiment does not limit it. For example, if the temperature difference between the required baking temperature and the actual baking temperature is within 1°C, it means that the required baking temperature and the actual baking temperature are the same; or, for example, if "actual baking temperature × 98% < required baking temperature < actual baking temperature × 102%", it means that the required baking temperature and the actual baking temperature are the same.

[0057] If the required baking temperature is the same as the actual baking temperature, proceed to step S102; if the required baking temperature is different from the actual baking temperature, proceed to step S104.

[0058] S102. Detect whether the rate of water loss and the rate of temperature change of the baking target meet the set rate matching relationship; if the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship, then execute step S103; if the rate of water loss and the rate of temperature change of the baking target meet the set rate matching relationship, then execute step S101.

[0059] If the required baking temperature is the same as the actual baking temperature, it means that the current baking temperature meets the baking requirements, and further testing is needed to check whether the baking humidity meets the baking requirements.

[0060] The aforementioned rate matching relationship includes the correspondence between the rate of water loss and the rate of temperature change at the same baking moment during the baking process. Each of the above image acquisition moments can be taken as a baking moment, and the baking process can be further segmented over time to obtain the aforementioned baking moments; this embodiment does not impose any limitations on this.

[0061] The water loss rate characterizes the rate at which the target loses water during a set time period in the baking process, i.e., the drying rate of the target. The temperature change rate characterizes the actual temperature change rate during a set time period in the baking process. The aforementioned set time period can be set according to actual conditions, for example, it can be one interval time period or two interval time periods; this embodiment does not impose any limitations.

[0062] In the embodiments of this application, a large number of baking experiments targeting the baking target are conducted in advance to collect the water loss rate and temperature change rate during the same baking time period, so as to obtain the corresponding relationship between the water loss rate and temperature change rate during the same baking time period.

[0063] The water loss rate of the baking target can be obtained by measuring the weight change over a set time period. For example, the ratio of the weight change over the set time period to the corresponding duration of the set time period can be calculated to obtain the water loss rate. Alternatively, the actual temperature change inside the oven over the set time period can be read, and the ratio of the actual temperature change to the corresponding duration of the set time period can be calculated to obtain the temperature change rate of the baking target.

[0064] If the required baking temperature is the same as the actual baking temperature, it means that the current baking temperature meets the baking requirements, that is, the rate of temperature change of the baking target meets the baking requirements. Therefore, it is possible to further detect whether the rate of water loss and the rate of temperature change of the baking target meet the set rate matching relationship, so as to detect whether the baking humidity meets the baking requirements.

[0065] It should be noted that detecting whether the rate of water loss and the rate of temperature change of the baking target conform to the set rate matching relationship means determining whether the rate of water loss and the rate of temperature change of the baking target correspond to the same baking time based on the set rate matching relationship. If, according to the set rate matching relationship, the rate of water loss and the rate of temperature change of the baking target correspond to the same baking time, then it means that the rate of water loss and the rate of temperature change of the baking target conform to the set rate matching relationship.

[0066] For example, if, based on the aforementioned rate matching relationship, the water loss rate at a certain moment is determined to be X1 and the temperature change rate to be X2, and the water loss rate of the baking target is X1 and the temperature change rate is X2, then it means that the water loss rate and temperature change rate of the baking target correspond to the same baking moment, which conforms to the established rate matching relationship. If, based on the aforementioned rate matching relationship, the water loss rate at a certain moment is determined to be X3 and the temperature change rate to be X2, and the water loss rate at another moment is X1 and the temperature change rate to be X4, and the water loss rate of the baking target is X1 and the temperature change rate to be X2, then it means that the water loss rate and temperature change rate of the baking target do not correspond to the same baking moment, which does not conform to the established rate matching relationship.

[0067] Specifically, if the rate of water loss and the rate of temperature change of the target being baked do not meet the set rate matching relationship, it means that the baking humidity does not meet the baking requirements, and step S103 is executed to adjust the baking humidity of the target being baked; if the rate of water loss and the rate of temperature change of the target being baked meet the set rate matching relationship, it means that the baking humidity meets the baking requirements, and step S101 and subsequent steps are executed to bake the target being baked according to the baking parameters. At the next image acquisition moment, the required baking temperature and the actual baking temperature of the target being baked are detected. By comparing the required baking temperature and the actual baking temperature of the target being baked, as well as the rate of water loss and the rate of temperature change of the target being baked, the baking parameters are automatically adjusted.

[0068] S103. Adjust the baking humidity of the target baking object.

[0069] If the rate of water loss and the rate of temperature change of the target being baked do not match the set rate matching relationship, it indicates that the target is losing water too quickly or too slowly. Water loss is generally controlled by humidity; the higher the humidity inside the oven, the slower the water loss; conversely, the lower the humidity, the faster the water loss. Therefore, if the current baking humidity does not meet the baking requirements, the baking humidity of the target needs to be adjusted.

[0070] Specifically, if the required baking temperature is the same as the actual baking temperature, it means that the current baking temperature meets the baking requirements, that is, the temperature change rate of the baking target meets the baking requirements. The target water loss rate that matches the temperature change rate can be determined based on the set rate matching relationship. The target water loss rate is the water loss rate that meets the baking requirements.

[0071] In some embodiments, if the detected water loss rate is less than the target water loss rate, it indicates that the current water loss rate is too slow, which is caused by high humidity inside the oven. Therefore, the baking humidity can be appropriately reduced. If the detected water loss rate is greater than the target water loss rate, it indicates that the current water loss rate is too fast, which is caused by low humidity inside the oven. Therefore, the baking humidity can be appropriately increased.

[0072] S104. Detect whether the rate of water loss and the rate of temperature change of the baking target meet the set rate matching relationship; if the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship, then execute step S105; if the rate of water loss and the rate of temperature change of the baking target meet the set rate matching relationship, then execute step S101.

[0073] If the required baking temperature differs from the actual baking temperature, it cannot be determined whether the current baking temperature meets the baking requirements. Therefore, further testing is needed to verify that the baking temperature meets the requirements. A difference between the required and actual baking temperatures means that the temperature deviation between the two temperatures is outside the set temperature range.

[0074] Specifically, it can be further detected whether the rate of water loss and the rate of temperature change of the baking target conform to the set rate matching relationship. The rate matching relationship in this step is the same as the rate matching relationship in the above steps, and its specific meaning and acquisition method can be referred to the description in the above embodiments, which will not be repeated here.

[0075] If the rate of water loss and the rate of temperature change of the target being baked meet the set rate matching relationship, it means that the baking temperature and baking humidity meet the baking requirements. Continue to execute step S101 and subsequent steps, bake the target being baked according to the baking parameters, and detect the required baking temperature and the actual baking temperature of the target being baked at the next image acquisition moment. By comparing the required baking temperature and the actual baking temperature of the target being baked, as well as the rate of water loss and the rate of temperature change of the target being baked, the baking parameters are automatically adjusted.

[0076] It should be noted that if the rate of water loss and the rate of temperature change of the target being baked meet the set rate matching relationship, it means that, according to the set rate matching relationship, the rate of water loss and the rate of temperature change of the target being baked correspond to the same baking time. Given that this solution monitors and adjusts the baking parameters in real time, it is unlikely that the rate of water loss and the rate of temperature change of the target being baked will not coincide with the current image acquisition time. Furthermore, it is normal for the baking temperature to fluctuate within a certain range during the baking process, and this will not have a significant impact on the target being baked. Generally, baking ovens are equipped with temperature alarm devices; if the baking temperature exceeds the set temperature fluctuation range, the controller will activate the temperature alarm device. Therefore, even if the required baking temperature is different from the actual baking temperature, if the temperature alarm device does not sound and the rate of water loss and the rate of temperature change of the target being baked meet the set rate matching relationship, it is determined that the baking temperature and baking humidity meet the baking requirements, and step S101 and subsequent steps can be continued.

[0077] If the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship, it means that the baking temperature does not meet the baking requirements. Step S105 is executed to adjust the baking temperature of the baking target first.

[0078] S105. Adjust the baking temperature of the target baking temperature.

[0079] If the required baking temperature is different from the actual baking temperature, and if it is further detected that the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship, it means that the baking temperature of the baking target does not meet the baking requirements. Since the baking temperature has a greater impact on the baking quality during the baking process, the baking temperature is adjusted first in the embodiments of this application.

[0080] Specifically, if the required baking temperature is higher than the actual baking temperature, it means the current temperature is too low and the baking temperature can be increased; if the required baking temperature is lower than the actual baking temperature, it means the current temperature is too high and the baking temperature can be decreased.

[0081] It should be noted that "demanded baking temperature greater than actual baking temperature" means that the required baking temperature is greater than the actual baking temperature, and the temperature deviation between the two temperatures is outside the set temperature range; "demanded baking temperature less than actual baking temperature" means that the required baking temperature is less than the actual baking temperature, and the temperature deviation between the two temperatures is outside the set temperature range.

[0082] In the above embodiments, during the baking process according to the baking parameters, it is detected whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target. If the required baking temperature is the same as the actual baking temperature, but the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship, the baking humidity of the baking target is adjusted. If the required baking temperature is different from the actual baking temperature, and the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship, the baking temperature of the baking target is adjusted. This setting achieves the purpose of automatically adjusting the baking parameters, avoiding the influence of the baking personnel's experience and skill on the baking quality, and ensuring the quality of the baked target.

[0083] As an optional implementation, another embodiment of this application discloses that the steps in the above embodiments adjust the baking humidity of the baking target, which may specifically include the following steps:

[0084] Based on the rate matching relationship, a target water loss rate matching the rate of temperature change is determined; if the detected water loss rate is less than the target water loss rate, the rate of increase of baking humidity is reduced; if the detected water loss rate is greater than the target water loss rate, the rate of increase of baking humidity is increased.

[0085] As described in the above embodiments, if the required baking temperature is the same as the actual baking temperature, it means that the current baking temperature meets the baking requirements, that is, the temperature change rate of the baking target meets the baking requirements, and the target water loss rate that matches the temperature change rate can be determined based on the set rate matching relationship.

[0086] In the embodiments of this application, the baking process of the target to be baked is also a process of dynamically and slowly increasing humidity, that is, by slowly increasing the humidity and temperature inside the baking oven, the target to be baked is dehydrated and dried.

[0087] If the detected water loss rate is less than the target water loss rate, it indicates that the current water loss rate is too slow. This is due to a rapid increase in baking humidity, resulting in high humidity. The rate of increase in baking humidity should be reduced to increase the water loss rate. If the detected water loss rate is greater than the target water loss rate, it indicates that the current water loss rate is too fast. This is due to a slow increase in baking humidity, resulting in low humidity. The rate of increase in baking humidity should be increased to slow down the water loss rate.

[0088] In the above embodiments, by adjusting the rate of increase of baking humidity, the purpose of adjusting the rate of water loss of the baking target is achieved.

[0089] As an optional implementation, another embodiment of this application discloses that the steps of the above embodiments to reduce the rate of increase of baking humidity may specifically include the following steps: reducing the wet-bulb heating rate; the steps of the above embodiments to increase the rate of increase of baking humidity may specifically include the following steps: increasing the wet-bulb heating rate.

[0090] In the embodiments of this application, the humidity inside the baking oven is controlled by a wet-bulb device. The lower the wet-bulb temperature, the lower the air humidity, and the faster the baked target loses moisture; the higher the wet-bulb temperature, the higher the air humidity, and the slower the baked target loses moisture. In other words, the faster the wet-bulb temperature rises, the faster the humidity inside the baking oven rises; the slower the wet-bulb temperature rises, the slower the humidity inside the baking oven rises.

[0091] Therefore, the rate of increase in baking humidity can be reduced by decreasing the wet-bulb heating rate; conversely, the rate of increase in baking humidity can be increased by increasing the wet-bulb heating rate.

[0092] In the above embodiments, the rate of increase in baking humidity can be adjusted by adjusting the wet-bulb temperature, thereby achieving the purpose of adjusting the rate of water loss of the baking target.

[0093] As an optional implementation, another embodiment of this application discloses that the steps in the above embodiments adjust the baking temperature of the baking target, which may specifically include the following steps:

[0094] If the required baking temperature is lower than the actual baking temperature, the rate of increase of the baking temperature is reduced; if the required baking temperature is higher than the actual baking temperature, the rate of increase of the baking temperature is increased.

[0095] In the embodiments of this application, the baking process of the target is a process of dynamically and slowly increasing the baking temperature, that is, by slowly increasing the temperature inside the baking oven, the target is dehydrated and dried.

[0096] If the rate of moisture loss and the rate of temperature change of the baking target do not match the set rate matching relationship, and the required baking temperature is lower than the actual baking temperature, it indicates that the actual temperature inside the oven is higher due to a faster rate of temperature increase, and the rate of temperature increase should be reduced. If the required baking temperature is higher than the actual baking temperature, it indicates that the actual temperature inside the oven is lower due to a slower rate of temperature increase, and the rate of temperature increase should be increased.

[0097] In the above embodiments, the baking temperature of the target baking object is adjusted by adjusting the rate of increase of the baking temperature.

[0098] As an optional implementation, another embodiment of this application discloses that the steps of the above embodiments to reduce the rate of increase of baking temperature may specifically include the following steps: reducing the rate of increase of dry bulb temperature; the steps of the above embodiments to increase the rate of increase of baking temperature may specifically include the following steps: increasing the rate of increase of dry bulb temperature.

[0099] Specifically, in the embodiments of this application, the temperature inside the baking oven is controlled by a dry-bulb device. The higher the dry-bulb temperature, the higher the air temperature, and the faster the target material loses moisture; the lower the dry-bulb temperature, the lower the air temperature, and the slower the target material loses moisture. In other words, the faster the dry-bulb temperature rises, the faster the temperature inside the baking oven rises; the slower the dry-bulb temperature rises, the slower the temperature inside the baking oven rises.

[0100] Therefore, by reducing the rate of increase in baking temperature, the rate of increase in baking temperature can be reduced; conversely, by increasing the rate of increase in baking temperature, the rate of increase in baking temperature can be increased.

[0101] In the above embodiments, the rate of increase of baking temperature can be adjusted by adjusting the dry bulb temperature, thereby achieving the purpose of controlling the temperature of the baking target.

[0102] As an optional implementation, another embodiment of this application discloses that the method described above may specifically include the following steps:

[0103] The baking image of the target to be baked is input into a pre-trained baking state detection model so that the baking state detection model can obtain the baking state of the target to be baked based on the baking image. The baking state detection model is trained by using the baking image of the sample target to be baked as a sample and the baking state of the output sample target to be baked as a target. The baking temperature required when the target to be baked is in the baking state is taken as the required baking temperature.

[0104] In the embodiments of this application, the required baking temperature of the baking target is determined by a pre-trained baking state detection model.

[0105] Specifically, a baking experiment can be conducted beforehand targeting the tobacco leaf, and, where conditions permit, as many high-quality baking images as possible should be captured. Baking experts then screen the target tobacco leaf, removing images with poor baking quality or abnormalities in the baking process. Next, the experts continuously observe the images from the beginning of baking in chronological order, identifying the tobacco leaf state that should exist at each image acquisition moment as training samples, and labeling the baking state corresponding to different training samples as training labels. In some embodiments, the target tobacco leaf is the tobacco leaf itself, and the baking state labeled by the experts can include soft leaves, 50-60% yellow, 90% yellow, semi-dry leaves, dry leaves, and dry veins, etc.

[0106] It should be noted that the images of the actual heating moments in the baking experiment were not directly used as node images here. This is to avoid inconsistencies between the state stage of the baking target and the actual baking stage, and also to avoid the adverse effects of inconsistent baking techniques and methods of the baking personnel on the training model.

[0107] Training samples can be input into the baking state detection model to obtain the predicted results output by the model. By comparing the predicted results with the training labels, the loss value of the baking state detection model is determined. The parameters of the baking state detection model are adjusted to reduce this loss value. This training process is then repeated until the loss value of the baking state detection model is less than a set value. This set value can be adjusted according to actual conditions; this embodiment does not impose any limitations.

[0108] The baking status detection model mentioned above can be trained based on any neural network model, or it can be trained based on a pre-trained model, such as a large pre-trained model similar to chatgpt.

[0109] In some embodiments, the baking state detection model is trained based on a convolutional neural network with a VGG (Visual Geometry Group) architecture. Figure 3 The diagram shows the network architecture of a convolutional neural network based on the VGG architecture. In the embodiments of this application, a very small convolutional kernel (e.g., 3×3) is used to construct the convolutional neural network structure, which enables the convolutional neural network structure to have good recognition accuracy and effectively extract features from the image.

[0110] It should be noted that convolutional neural networks based on the VGG architecture are very mature neural network technologies, and their specific parameter details can be obtained by those skilled in the art. Figure 3 The acquisition of relevant existing technologies will not be elaborated here.

[0111] The baking image of the target object can be input into a pre-trained baking state detection model, which can analyze the baking image and output the baking state of the target object.

[0112] After determining the baking state of the target object, the required baking temperature for that state can be used as the demand baking temperature. In some embodiments, baking experts or relevant technicians can pre-mark the required baking temperatures for different baking states of the target object, thereby obtaining the correspondence between the baking states of the target object and their required baking temperatures. After determining the baking state of the target object based on the above-described baking state detection model, the required baking temperature for that baking state can be determined based on the marked correspondence, and used as the demand baking temperature for the target object.

[0113] In the above embodiments, the required baking temperature of the baking target can be quickly determined through a pre-trained baking state detection model, without relying on the baking experience of the baking personnel, thus avoiding the influence of the baking personnel's experience and skill level on the baking quality and ensuring the quality of the baking target.

[0114] As an optional implementation, another embodiment of this application discloses that, during the baking process according to the baking parameters, detecting whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target may specifically include the following steps:

[0115] During the baking process according to the baking parameters, if the moisture loss rate of the baking target is not detected to reach the target moisture loss rate when baking is completed, then it is checked whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target.

[0116] During the baking process according to the baking parameters, if the image acquisition time is reached, it is necessary to determine whether the baking target has been baked before detecting the required baking temperature and the actual baking temperature of the baking target.

[0117] Specifically, the baking process can be completed by detecting whether the moisture loss rate of the target object reaches the target moisture loss rate at the end of baking. For example, if the moisture loss rate of the target object reaches the target moisture loss rate at the end of baking, it means that baking is complete; if the moisture loss rate of the target object does not reach the target moisture loss rate at the end of baking, it means that baking is not complete.

[0118] If baking is confirmed to be complete, the baking equipment in the oven can be turned off, and the relevant personnel can be notified that baking is complete. If baking is still not complete, it is necessary to check whether the required baking temperature and the actual baking temperature are the same. By comparing the required baking temperature with the actual baking temperature, the rate of water loss and the rate of temperature change, the baking parameters can be automatically adjusted.

[0119] The target moisture loss rate at the end of baking can be set according to the actual situation, such as setting the target moisture loss rate to a range of 98%-100%, but this embodiment does not limit it.

[0120] The water loss rate of the baking target can be obtained by weighing the target. For example, the initial weight of the target can be collected before baking begins, and the current weight can be collected at the time of image acquisition mentioned above. The weight difference between the initial weight and the current weight can be calculated, and then the ratio of the weight difference to the initial weight of the target can be determined as the water loss rate of the target.

[0121] In the above embodiments, it is possible to detect whether baking is complete at the time of image acquisition. If baking is not complete, the baking parameters are automatically adjusted by comparing the required baking temperature of the baking target with the actual baking temperature, the water loss rate of the baking target, and the temperature change rate.

[0122] As an optional implementation, another embodiment of this application discloses that the method of the above embodiments may further include the following steps:

[0123] The moisture loss rate of the baking target is calculated based on the baking time of the baking target and the set moisture loss rate curve. The moisture loss rate curve is obtained by fitting the curve of the moisture loss rate of the baking target with the baking time during the baking process with the goal of achieving the target moisture loss rate. The moisture loss rate curve includes the logistic curve.

[0124] In the embodiments of this application, the water loss rate of the baking target can be determined based on the baking time of the baking target and the set water loss rate curve.

[0125] Specifically, there is a certain relationship between the moisture loss rate of the target tobacco leaf and the baking time. For example, Table 1 is a comparison table of the moisture loss rate of each layer of tobacco leaves in the baking oven and the baking time when the target tobacco leaf is tobacco leaf.

[0126]

[0127] Table 1

[0128] As shown in Table 1, the moisture loss rate of the top, middle, and bottom layers of tobacco leaves in the baking oven all exhibit an "S"-shaped curve with varying baking time during the baking process. Figure 4As shown. Therefore, it can be seen that there is a certain relationship between the water loss rate of the baking target and the baking time. In the embodiments of this application, multiple baking experiments are conducted to achieve the target water loss rate, so as to fit a water loss rate curve based on the relationship between the water loss rate of the baking target and the baking time. Based on the water loss rate curve, a water loss rate equation can be obtained. The baking time of the baking target is input into the water loss rate equation to calculate the water loss rate of the baking target.

[0129] Taking tobacco leaves as the target of curing as an example, based on Figure 4 It can be determined that the water loss rate curve of tobacco leaves conforms to a logistic curve. To achieve the target water loss rate, multiple curing experiments were conducted on the tobacco leaves to fit the logistic curve corresponding to the water loss rate of the tobacco leaves based on the relationship between the target water loss rate and the curing time. The equation of this logistic curve is:

[0130]

[0131] In the formula: K represents the target water loss rate; x represents the baking time of the target baking; y represents the water loss rate of the target baking; a and b are the parameters of the Logistic curve, which can be obtained through the above fitting process; e is the base of the natural logarithm, with a value of 2.71828.

[0132] It should be noted that, Figure 4 The illustrated embodiment uses three layers of tobacco leaves. In the Logistic curve equation for the top layer, 'a' is 40.89 and 'b' is -0.0621; in the middle layer, 'a' is 89.07 and 'b' is -0.0728; and in the bottom layer, 'a' is 139.72 and 'b' is -0.0703. Combining the values ​​of the top, middle, and bottom layers, the Logistic curve equation for the entire batch of tobacco leaves has 'a' of 77.46 and 'b' of -0.0644.

[0133] Based on the above Logistic curve equation, the time when 50% of the water is lost can be determined as follows:

[0134]

[0135] That is, the time for the top layer of tobacco leaves to lose 50% of their water is 58 hours, the time for the middle layer of tobacco leaves to lose 50% of their water is 66 hours, the time for the bottom layer of tobacco leaves to lose 50% of their water is 80 hours, and the time for all the tobacco leaves in the entire pit to lose 50% of their water is 67 hours.

[0136] In the above embodiments, the water loss rate of the baking target can be quickly determined based on the pre-fitted water loss rate curve and the baking time of the baking target, without the need for weighing, and the calculation speed is fast; moreover, the pre-fitted water loss rate curve can be used to correct the actual baking process.

[0137] As an optional implementation, another embodiment of this application discloses the method of the above embodiments, which may specifically include the following steps: if the actual baking parameters of the baking target are detected to exceed the set baking parameter range, a baking abnormality reminder is output.

[0138] In the embodiments of this application, a baking parameter range is provided, which can be obtained through multiple baking experiments targeting the baking objective. In some embodiments, the baking parameter range includes a baking temperature range consisting of the highest and lowest allowable baking temperatures during the baking process, and a baking humidity range consisting of the highest and lowest allowable baking humidity, as determined through baking experiments.

[0139] If the actual baking parameters of the target being baked exceed the set baking parameter range, a baking anomaly alert will be issued. For example, if the actual baking temperature of the target being baked is higher than the maximum baking temperature mentioned above, a baking anomaly alert can be issued. Similarly, if the actual baking humidity of the target being baked is lower than the minimum baking humidity mentioned above, a baking anomaly alert can be issued. Baking anomaly alerts can be communicated to relevant personnel via sound, light, electricity, SMS, or email, etc., and this embodiment does not impose any limitations on this method.

[0140] The purpose of the above-mentioned baking abnormality alert is to inform relevant staff of any abnormalities that may occur during the baking process, so that they can take timely action and avoid affecting the baking quality.

[0141] As an optional implementation, another embodiment of this application discloses that if the actual baking parameters of the target being baked exceed the set baking parameter range, a baking abnormality alert is output in the steps of the above embodiments. Specifically, this may include the following steps:

[0142] If the average value of the actual baking parameters exceeds the set average range, and / or the range of the actual baking parameters exceeds the set range, a baking anomaly alert will be output.

[0143] In some embodiments, a mean range and / or a range is set as the baking parameter range. If the mean value of the actual baking parameter is detected to exceed the set mean range, and / or the range of the actual baking parameter is detected to exceed the set range, a baking anomaly alert is output.

[0144] Specifically, baking parameters such as baking temperature and baking humidity can be obtained in advance through multiple baking experiments targeting the baking target.

[0145] Taking baking temperature as an example, calculate the average baking temperature in each baking experiment. Range (R):

[0146]

[0147] Where: x1, x2, ..., x n The value of n represents the baking temperature in this baking experiment; n represents the number of times the baking temperature was collected in this baking experiment. In this embodiment, n is 100.

[0148] R = x max -x min

[0149] In the formula: x max x represents the highest baking temperature achieved in this baking experiment. min The lowest baking temperature used in this baking experiment.

[0150] Then the overall average value CL is calculated. X Total average range CL R .

[0151]

[0152]

[0153] In the formula: K represents the number of baking experiments; R1 represents the sample mean and range corresponding to the first baking experiment; and R K represents the sample mean and range corresponding to the Kth baking experiment.

[0154] Final calculation Upper control limit UCL X , lower control limit LCL X ;Upper control limit UCL of R R , lower control limit LCL R .

[0155]

[0156]

[0157]

[0158]

[0159] In the formula: A2, D3, and D4 are constants, which can be obtained by referring to the control chart coefficient table.

[0160] It should be noted that the upper and lower control limits corresponding to the sample mean of baking humidity, and the upper and lower control limits corresponding to the range, are the same as the UCL of baking temperature in the above embodiments. X LCL X UCL R With LCL R The calculation method is the same. Those skilled in the art can refer to the above embodiments to determine the upper and lower control limits corresponding to the sample mean of baking humidity, as well as the upper and lower control limits corresponding to the range, which will not be elaborated here.

[0161] In this embodiment, the temperature and humidity values ​​inside the baking oven are read in real time, and the average temperature, temperature range, average humidity, and humidity range inside the baking oven are calculated. When an anomaly is detected in the data, such as at least one of the following situations: the actual average temperature exceeds the set average temperature range, the actual temperature range exceeds the set temperature range, the actual average humidity exceeds the set average humidity range, or the actual humidity range exceeds the set humidity range, a baking anomaly alert is output to remind relevant personnel to investigate and make adjustments.

[0162] In the above embodiments, relevant staff can be informed of any abnormalities during the baking process, so that they can handle them in a timely manner and avoid affecting the baking quality.

[0163] As an optional implementation, another embodiment of this application discloses that the baking target of the above embodiments includes an upper baking target, a middle baking target, and a lower baking target. The step of detecting the required baking temperature of the baking target in the above embodiments may specifically include the following steps:

[0164] Calculate the weighted sum of the required baking temperatures for the upper, middle, and lower baking targets, and determine the required baking temperature for the baking target as the weighted sum. The weight corresponding to the required baking temperature of the middle baking target is greater than the weight corresponding to the required baking temperature of the upper and lower baking targets.

[0165] Specifically, to improve roasting efficiency, roasting ovens typically have multiple roasting targets, roasting them simultaneously, such as three layers: top, middle, and bottom. The top layer has the highest temperature, while the bottom layer has the lowest. For example, when roasting tobacco leaves, there is a 1-2 degree Celsius temperature difference between the top, middle, and bottom layers in the roasting oven.

[0166] In the actual baking process, to ensure the baking of the upper, middle, and lower layers, baking images of the upper, middle, and lower layers can be acquired separately. Based on the baking state detection model in the above embodiment, the baking states of the upper, middle, and lower layers are detected respectively. The required baking temperature for the upper layer is determined based on the baking state of the upper layer, the required baking temperature for the middle layer is determined based on the baking state of the middle layer, and the required baking temperature for the lower layer is determined based on the baking state of the lower layer. Based on the required baking temperatures of the upper, middle, and lower layers, the required baking temperatures for all baking targets in the oven are determined.

[0167] In the actual baking process, the baking temperature of the middle layer baking target is moderate, and the overall baking progress of the oven matches the baking progress of the middle layer baking target. Therefore, the required baking temperature of the middle layer baking target can be set to have the highest weight. Then, the weighted sum of the required baking temperatures of the upper layer baking target, the middle layer baking target, and the lower layer baking target can be calculated, and the weighted sum can be determined as the required baking temperature of all baking targets in the oven.

[0168] In some embodiments, the weight of the middle layer baking target is 70%, and the weights of the upper and lower layer baking targets are 30%. Therefore, the formula for calculating the required baking temperature for all baking targets within the oven is:

[0169] T = T1 × 70% + (T2 + T3) × 30%

[0170] In the formula: T represents the required baking temperature for all baking targets in the oven; T1 represents the required baking temperature for the middle baking target; T2 represents the required baking temperature for the upper baking target; and T3 represents the required baking temperature for the lower baking target.

[0171] It should be noted that in this embodiment, only one baking state detection model can be trained, or baking state detection models can be trained separately for the upper, middle and lower baking targets, so that the baking state detection model corresponding to the upper baking target detects the baking state corresponding to the baking image of the upper baking target, the baking state detection model corresponding to the middle baking target detects the baking state corresponding to the baking image of the middle baking target, and the baking state detection model corresponding to the lower baking target detects the baking state corresponding to the baking image of the lower baking target.

[0172] In the above embodiments, the required baking temperature of all baking targets in the baking oven can be determined by taking into account the baking targets of the upper, middle and lower layers, so as to improve the baking quality of the baking targets.

[0173] As an optional implementation, another embodiment of this application discloses that, when the baking target includes three layers of baking targets (upper, middle, and lower), the weighted sum of the baking parameters of the three layers at each time point can be calculated when setting the baking parameters, and this sum is used as the baking parameters for all baking targets in the oven. The weight corresponding to the baking parameters of the middle layer baking target is greater than the weight corresponding to the baking parameters of the upper layer baking target and the weight corresponding to the baking parameters of the lower layer baking target. In some embodiments, the weight corresponding to the baking parameters of the middle layer baking target is 70%, and the weight corresponding to the baking parameters of the upper and lower layer baking targets is 30%.

[0174] Similarly, when the baking target includes baking targets for the top, middle, and bottom layers, such as Figure 4 In the illustrated embodiment, the water loss rate curve of the whole-layer tobacco leaves is close to that of the middle-layer tobacco leaves. Therefore, when calculating the water loss rate of the curing target, water loss rate curves can be fitted separately for the upper-layer curing target, the middle-layer curing target, and the lower-layer curing target. Based on the curing time of the curing target and the water loss rate curves of each layer of the curing target, the water loss rate of each layer of the curing target is calculated separately. Then, the weighted sum of the water loss rates of the upper-layer curing target, the middle-layer curing target, and the lower-layer curing target is calculated, and the weighted sum is determined as the water loss rate of the curing target.

[0175] Since the moisture loss rate of all baking targets in the oven is closest to that of the middle layer baking target, the weight corresponding to the moisture loss rate of the middle layer baking target is set to be greater than the weight corresponding to the moisture loss rate of the upper layer baking target and the lower layer baking target. In some embodiments, the weight corresponding to the moisture loss rate of the middle layer baking target is 70%, and the weight corresponding to the moisture loss rate of the upper and lower layer baking targets is 30%.

[0176] As an optional implementation, another embodiment of this application discloses that the maturity and growth part of the baking target will affect the baking quality. Therefore, in the embodiments of this application, corresponding baking parameters can be set for different maturity and non-growing parts of the baking target.

[0177] Before baking, baking parameters that meet the requirements can be determined according to the maturity and growth part of the target to be baked. Then, the baking parameters can be automatically adjusted during the baking process according to the steps of the above embodiment.

[0178] It should be noted that the maturity of the baking target can be determined by pre-training a maturity detection model. Specifically, a large number of images of the baking target before baking can be obtained as training samples, and relevant baking experts can label the maturity of each training sample as a training label. The training process of the maturity detection model is the same as the training method of the baking state detection model in the above embodiments. Those skilled in the art can refer to the training method of the baking state detection model in the above embodiments to train the maturity detection model, and this embodiment will not be described in detail.

[0179] The maturity detection model mentioned above can be trained based on any neural network model, or it can be trained based on a pre-trained model, such as a large pre-trained model similar to chatgpt.

[0180] The growth location of the target to be baked can be manually selected by the baking staff.

[0181] In a specific roasting scenario, the target tobacco leaf is being roasted. Before roasting begins, the maturity detection model trained in the above embodiments is used to detect the maturity of the tobacco leaf, and then the tobacco roasting personnel determine the growth location of the tobacco leaf. Based on the maturity and growth location of the tobacco leaf, appropriate roasting parameters are then determined so that the target tobacco leaf can be roasted according to these parameters. In some embodiments, roasting curves corresponding to nine sets of roasting parameters are established by combining the maturity of different parts of the fresh tobacco leaf. A target roasting curve can be selected from these nine sets of roasting curves based on the maturity and growth location of the tobacco leaf, and the target tobacco leaf can be roasted according to the target roasting curve.

[0182] Before baking, the initial weight of each layer of tobacco leaves needs to be collected.

[0183] like Figure 5 As shown, the specific adjustment process is as follows:

[0184] In this embodiment, a detection is performed every 30 minutes to obtain the baking images of the top, middle and bottom layers of tobacco leaves, the actual baking temperature of the tobacco leaves, the current baking time, and the current weight of the top, middle and bottom layers of tobacco leaves.

[0185] Based on the current baking time and the preset Logistic curve equation, the current water loss rate of the tobacco leaves is calculated.

[0186] Determine whether the current water loss rate of the tobacco leaves has reached the target water loss rate.

[0187] If the current moisture loss rate of the tobacco leaves reaches the target moisture loss rate, then the curing process is complete.

[0188] If the current moisture loss rate of the tobacco leaves has not reached the target moisture loss rate, it means that the curing is not complete. Based on the curing images of the upper, middle and lower layers of tobacco leaves, the required curing temperature for all tobacco leaves is determined according to the description in the above embodiment.

[0189] Check whether the actual baking temperature is the same as the required baking temperature.

[0190] If the actual baking temperature is the same as the required baking temperature, the water loss rate of each layer of tobacco leaves is calculated based on the initial and current weights of each layer. Then, the weighted sum of the water loss rates of each layer of tobacco leaves is calculated to obtain the overall water loss rate of the tobacco leaves. Among them, the water loss rate of the middle layer of tobacco leaves corresponds to the highest weight.

[0191] Determine whether the rate of water loss and the rate of temperature change match the set rate matching relationship.

[0192] If the rate of water loss and the rate of temperature change meet the set rate matching relationship, continue to execute according to the target baking curve, and perform a test every 30 minutes.

[0193] If the rate of water loss and the rate of temperature change do not match the set rate matching relationship, then the target rate of water loss is determined based on the rate of temperature change, and it is detected whether the rate of water loss is less than the target rate of water loss.

[0194] If the water loss rate is less than the target water loss rate, reduce the wet bulb heating rate by 20% and continue to follow the target baking curve, performing a check every 30 minutes.

[0195] If the rate of water loss exceeds the target rate of water loss, increase the heating rate of the wet bulb by 20% and continue to follow the target baking curve, performing a check every 30 minutes.

[0196] If the actual baking temperature differs from the required baking temperature, the water loss rate of each layer of tobacco leaves is calculated based on the initial and current weights of each layer. Then, a weighted sum of the water loss rates of each layer is calculated to obtain the overall water loss rate of the tobacco leaves. The water loss rate of the middle layer of tobacco leaves has the highest weight.

[0197] Determine whether the rate of water loss and the rate of temperature change match the set rate matching relationship.

[0198] If the rate of water loss and the rate of temperature change meet the set rate matching relationship, continue to execute according to the target baking curve, and perform a test every 30 minutes.

[0199] If the rate of water loss and the rate of temperature change do not match the set rate, then determine whether the actual baking temperature is greater than the required baking temperature.

[0200] If the actual baking temperature is higher than the required baking temperature, reduce the heating rate of the dry balls by 20% and continue to follow the target baking curve, checking every 30 minutes.

[0201] If the actual baking temperature is lower than the required baking temperature, increase the heating rate of the dry balls by 20% and continue to follow the target baking curve, checking every 30 minutes.

[0202] Corresponding to the baking method described above, this application also discloses a baking apparatus, see [link to relevant documentation]. Figure 6 As shown, the device includes:

[0203] The detection unit 100 is used to detect whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target during the baking process according to the baking parameters; the baking parameters include the set baking temperature and the set baking humidity, and the required baking temperature includes the baking temperature required by the baking target.

[0204] The adjustment unit 110 is used to adjust the baking humidity of the baking target if the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship when the required baking temperature is the same as the actual baking temperature; and to adjust the baking temperature of the baking target if the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship when the required baking temperature is different from the actual baking temperature.

[0205] As an optional implementation, another embodiment of this application discloses that the adjustment unit 110 of the above embodiments is specifically used for:

[0206] Based on the rate matching relationship, a target water loss rate matching the rate of temperature change is determined; if the detected water loss rate is less than the target water loss rate, the rate of increase of baking humidity is reduced; if the detected water loss rate is greater than the target water loss rate, the rate of increase of baking humidity is increased.

[0207] As an optional implementation, another embodiment of this application discloses that when the adjustment unit 110 of the above embodiments reduces the rate of increase of baking humidity, it is specifically used to: reduce the wet-bulb heating rate; when the adjustment unit 110 of the above embodiments increases the rate of increase of baking humidity, it is specifically used to: increase the wet-bulb heating rate.

[0208] As an optional implementation, another embodiment of this application discloses that the adjustment unit 110 of the above embodiments is specifically used for:

[0209] If the required baking temperature is lower than the actual baking temperature, the rate of increase of the baking temperature is reduced; if the required baking temperature is higher than the actual baking temperature, the rate of increase of the baking temperature is increased.

[0210] As an optional implementation, another embodiment of this application discloses that when the adjustment unit 110 of the above embodiments reduces the rate of increase of baking temperature, it is specifically used to: reduce the rate of increase of dry bulb temperature; when the adjustment unit 110 of the above embodiments increases the rate of increase of baking temperature, it is specifically used to: increase the rate of increase of dry bulb temperature.

[0211] As an optional implementation, another embodiment of this application discloses that the apparatus of the above embodiments further includes:

[0212] The input unit is used to input the baking image of the baking target into the pre-trained baking state detection model, so that the baking state detection model can obtain the baking state of the baking target based on the baking image; the baking state detection model is trained by using the baking image of the sample baking target as the sample and the baking state of the output sample baking target as the target.

[0213] The determining unit is used to determine the required baking temperature when the target to be baked is in the baking state, as the demand baking temperature.

[0214] As an optional implementation, another embodiment of this application discloses that the detection unit 100 of the above embodiments is specifically used for:

[0215] During the baking process according to the baking parameters, if the moisture loss rate of the baking target is not detected to reach the target moisture loss rate when baking is completed, then it is checked whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target.

[0216] As an optional implementation, another embodiment of this application discloses that the apparatus of the above embodiments further includes:

[0217] The calculation unit is used to calculate the moisture loss rate of the baking target based on the baking time of the baking target and the set moisture loss rate curve. The moisture loss rate curve is obtained by fitting the curve of the moisture loss rate of the baking target with the baking time during the baking process with the goal of achieving the target moisture loss rate. The moisture loss rate curve includes the logistic curve.

[0218] As an optional implementation, another embodiment of this application discloses that the apparatus of the above embodiments further includes:

[0219] The reminder unit is used to output a baking abnormality reminder if the actual baking parameters of the baking target are detected to exceed the set baking parameter range.

[0220] As an optional implementation, another embodiment of this application discloses the reminder unit of the above embodiments, which is specifically used for:

[0221] If the average value of the actual baking parameters exceeds the set average range, and / or the range of the actual baking parameters exceeds the set range, a baking anomaly alert will be output.

[0222] As an optional implementation, another embodiment of this application discloses that the baking targets in the above embodiments include upper baking targets, middle baking targets, and lower baking targets, and the detection unit 100 in the above embodiments is specifically used for:

[0223] Calculate the weighted sum of the required baking temperatures for the upper, middle, and lower baking targets, and determine the required baking temperature for the baking target as the weighted sum. The weight corresponding to the required baking temperature of the middle baking target is greater than the weight corresponding to the required baking temperature of the upper and lower baking targets.

[0224] For details on the specific operation of each unit of the baking apparatus described above, please refer to the content of the above method embodiments, which will not be repeated here.

[0225] This application also proposes a control device, which includes a processor and an interface circuit. The processor in the control device is connected to an input / output component through the interface circuit of the control device.

[0226] The input / output component specifically refers to the hardware component that enables the user to input information and output information to the user, such as a microphone, keyboard, handwriting tablet, touch screen, monitor, speaker, printer, etc.

[0227] The aforementioned interface circuit can be any interface circuit capable of implementing data communication functions, such as a USB interface circuit, a Type-C interface circuit, a serial port circuit, a PCIe circuit, etc.

[0228] The processor in the control device is a circuit with signal processing capabilities, which can execute any of the baking methods described in the above embodiments.

[0229] When the control device is applied to a device with human-computer interaction function, the input and output components of the control device can be input components and output components on the device, such as microphone, keyboard, handwriting tablet, touch screen, display, audio player, etc. Meanwhile, the processor of the control device can be the device's built-in CPU or GPU, etc., and the interface circuit of the control device can be the interface circuit between the device's information input components and the CPU or GPU processor.

[0230] Corresponding to the baking method described above, this application also discloses an electronic device, see [link to relevant documentation]. Figure 7 As shown, the electronic device includes:

[0231] Memory 200 and processor 210;

[0232] The memory 200 is connected to the processor 210 and is used to store programs;

[0233] The processor 210 is configured to implement the baking method disclosed in any of the above embodiments by running a program stored in the memory 200.

[0234] Specifically, the aforementioned electronic device may further include: a bus, a communication interface 220, an input device 230, and an output device 240.

[0235] The processor 210, memory 200, communication interface 220, input device 230, and output device 240 are interconnected via a bus. Among them:

[0236] A bus can include a pathway for transmitting information between various components of a computer system.

[0237] The processor 210 can be a general-purpose processor, such as a general-purpose central processing unit (CPU), a microprocessor, etc., or an application-specific integrated circuit (ASIC), or one or more integrated circuits used to control the execution of the program of the present application. It can also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), an off-the-shelf programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0238] Processor 210 may include a main processor, as well as a baseband chip, modem, etc.

[0239] The memory 200 stores a program for executing the technical solution of this application, and may also store an operating system and other critical business functions. Specifically, the program may include program code, which includes computer operation instructions. More specifically, the memory 200 may include read-only memory (ROM), other types of static storage devices capable of storing static information and instructions, random access memory (RAM), other types of dynamic storage devices capable of storing information and instructions, disk storage, flash memory, etc.

[0240] Input device 230 may include a device for receiving user input data and information, such as a keyboard, mouse, camera, scanner, light pen, voice input device, touch screen, pedometer, or gravity sensor.

[0241] Output device 240 may include devices that allow information to be output to a user, such as a display screen, printer, speaker, etc.

[0242] The communication interface 220 may include a device that uses any transceiver to communicate with other devices or communication networks, such as Ethernet, Radio Access Network (RAN), Wireless Local Area Network (WLAN), etc.

[0243] The processor 210 executes the program stored in the memory 200 and calls other devices, which can be used to implement the various steps of the baking method provided in the above embodiments of this application.

[0244] Another embodiment of this application also proposes a baking oven, see [link to relevant documentation] Figure 8 As shown, the baking oven includes a status acquisition device 100 and a controller 110;

[0245] Status acquisition device 100 is used to acquire status information of the baking target;

[0246] The controller 110 is used to determine the required baking temperature and moisture loss rate of the baking target based on the status information of the baking target during the baking process according to the baking parameters; to detect whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target; the baking parameters include the set baking temperature and the set baking humidity, and the required baking temperature includes the baking temperature required by the baking target; if the required baking temperature is the same as the actual baking temperature, and the moisture loss rate and temperature change rate of the baking target do not meet the set rate matching relationship, the baking humidity of the baking target is adjusted; if the required baking temperature is different from the actual baking temperature, and the moisture loss rate and temperature change rate of the baking target do not meet the set rate matching relationship, the baking temperature of the baking target is adjusted.

[0247] As an optional implementation, another embodiment of this application discloses that the baking state of the above embodiments includes the state information including the baking image and weight of the baking target.

[0248] like Figure 8 As shown, the status acquisition device includes a camera installed on the inner wall of the baking oven, and the baking oven also includes a supplementary light box and a wind baffle; the wind baffle is fastened to the inner wall of the baking oven to form a photographing space; the camera and the supplementary light box are both installed in the photographing space; the camera is used to acquire the baking image of the baking target through the wind baffle.

[0249] Specifically, when installing cameras inside an oven, a baffle plate 300 is typically arranged inside the oven. The baffle plate 300 includes a transparent partition 301 and a bracket 302. The partition 301 is mounted on the bracket 302. The baffle plate 300, formed by the combination of the partition 301 and the bracket 302, is fastened to the inner wall of the oven to form a photographing space. Cameras 310 and supplementary lighting boxes 320 are both installed in this photographing space. Cameras 310 are used to capture baking images of each layer of the target being baked, and supplementary lighting boxes 320 are used to provide supplementary lighting when the cameras 310 are taking pictures. The number of cameras 310 is equal to the number of baking layers; that is, one camera 310 corresponds to one baking layer and captures an image of the target being baked in that layer.

[0250] In addition, the bracket 302 is painted white in this application.

[0251] This setting will produce the following effect:

[0252] First, it offers a wide field of view. A single camera can capture an entire layer of the baking target, improving the accuracy of image analysis. Second, it produces clearer images. Compared to using an external camera to capture images of each layer of the baking target through the oven's observation window, this method places the camera inside the oven, resulting in clearer images. Third, it minimizes the impact on the baking target. The enclosed imaging space prevents hot air from entering and causing short circuits, minimizing the impact on the baking target around the imaging space and improving the reliability of image analysis. Fourth, it provides more accurate color reproduction. Cameras shooting single-color objects often suffer from color casts due to a lack of white. This solution uses white paint on the bracket for white balance correction.

[0253] like Figure 9 As shown, the status acquisition device also includes a weight sensor, and the baking oven also includes a support body and a load-bearing rod; the first end of the weight sensor is connected to the support body, and the second end of the weight sensor is connected to the load-bearing rod; the load-bearing rod is used to place the baking target.

[0254] Specifically, the baking chamber can be equipped with a support frame 400, a load-bearing rod 410, and a weight sensor 420. There are multiple support frames 400 and multiple load-bearing rods 410.

[0255] The load-bearing rod 410 is used to place the baking target. The load-bearing rod 410 can be a baking rod capable of hanging the baking target or a baking tray capable of supporting the baking target; those skilled in the art can choose according to the actual shape of the baking target, and this embodiment is not limited thereto. The first end of the weight sensor 420 is connected to the support body 400, and the second end of the weight sensor 420 is connected to the load-bearing rod 410. The support body 400 is installed on the ground or a wall, enabling the weight sensor 420 and the load-bearing rod 410 to be erected at a certain height.

[0256] The load-bearing rod 410 and the support body 400 are independent of each other and can move freely relative to each other. In this way, the baking target can be set on the load-bearing rod 410 and the weight of the baking target can be completely supported by the load-bearing rod 410. The change in the mass of the baking target is reflected in the change in the tensile force measurement value of the weight sensor 420 through the tensile force method, and then converted into the weight of the baking target.

[0257] The baking oven provided in this embodiment belongs to the same concept as the baking method provided in the above embodiments of this application. It can perform the baking method provided in any of the above embodiments of this application and has the corresponding functional modules and beneficial effects for performing the above baking method. For technical details not described in detail in this embodiment, please refer to the specific processing content of the baking method provided in the above embodiments of this application, which will not be repeated here.

[0258] In addition to the methods and apparatus described above, embodiments of this application may also be computer program products, which include computer program instructions that, when executed by processor 210, cause processor 210 to perform the various steps of the baking method provided in the above embodiments.

[0259] Computer program products can be written in any combination of one or more programming languages ​​to perform the operations of the embodiments of this application. The programming languages ​​include object-oriented programming languages ​​such as Java and C++, as well as conventional procedural programming languages ​​such as C or similar languages. The program code can be executed entirely on the user's computing device, partially on the user's computing device, as a standalone software package, partially on the user's computing device and partially on a remote computing device, or entirely on a remote computing device or server.

[0260] Furthermore, embodiments of this application may also be computer-readable storage media storing computer program instructions thereon, which, when executed by a processor, cause the processor to perform the various steps of the baking method provided in the above embodiments.

[0261] The computer-readable storage medium may be any combination of one or more readable media. A readable medium may be a readable signal medium or a readable storage medium. A readable storage medium may, for example, include, but is not limited to, electrical, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatuses, or devices, or any combination thereof. More specific examples of readable storage media (a non-exhaustive list) include: electrical connections having one or more wires, portable disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0262] For the foregoing method embodiments, in order to simplify the description, they are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, because according to this application, some steps can be performed in other orders or simultaneously. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to this application.

[0263] It should be noted that the various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For apparatus embodiments, since they are basically similar to method embodiments, the description is relatively simple; relevant parts can be referred to the descriptions in the method embodiments.

[0264] The steps in the methods of the various embodiments of this application can be adjusted, merged, or deleted in order according to actual needs, and the technical features described in each embodiment can be replaced or combined.

[0265] The modules and sub-modules in the apparatus and terminal in the various embodiments of this application can be merged, divided, and deleted according to actual needs.

[0266] It should be understood, in the several embodiments provided in this application, that the disclosed terminals, devices, and methods can be implemented in other ways. For example, the terminal embodiments described above are merely illustrative; for instance, the division of modules or sub-modules is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple sub-modules or modules may be combined or integrated into another module, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection through some interfaces, devices, or modules, and may be electrical, mechanical, or other forms.

[0267] The modules or submodules described as separate components may or may not be physically separate. The components that constitute a module or submodule may or may not be physical modules or submodules; that is, they may be located in one place or distributed across multiple network modules or submodules. Some or all of the modules or submodules can be selected to achieve the purpose of this embodiment's solution, depending on actual needs.

[0268] Furthermore, the functional modules or sub-modules in the various embodiments of this application can be integrated into one processing module, or each module or sub-module can exist physically separately, or two or more modules or sub-modules can be integrated into one module. The integrated modules or sub-modules described above can be implemented in hardware or in the form of software functional modules or sub-modules.

[0269] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0270] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein can be implemented directly by hardware, a software unit executed by a processor, or a combination of both. The software unit can be located in random access memory (RAM), main memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, removable disk, CD-ROM, or any other form of storage medium known in the art.

[0271] Finally, it should be noted that in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0272] The above description of the disclosed embodiments enables those skilled in the art to make or use this application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A baking method, characterized in that, include: During the baking process according to the baking parameters, it is detected whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target; the baking parameters include the set baking temperature and the set baking humidity, and the required baking temperature includes the baking temperature required by the baking target; If the required baking temperature is the same as the actual baking temperature, and the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship, then the baking humidity of the baking target will be adjusted. If the required baking temperature is different from the actual baking temperature, and if the rate of water loss and the rate of temperature change of the baking target do not meet the set rate matching relationship, then the baking temperature of the baking target will be adjusted.

2. The method according to claim 1, characterized in that, The adjustment of the baking humidity of the baking target includes: Based on the rate matching relationship, a target water loss rate matching the rate of temperature change is determined; If the detected rate of water loss is less than the target rate of water loss, the rate of increase of the baking humidity is reduced; if the detected rate of water loss is greater than the target rate of water loss, the rate of increase of the baking humidity is increased.

3. The method according to claim 2, characterized in that, The reduction of the rate of increase of the baking humidity includes: reducing the wet-bulb heating rate; The rate of increase in the baking humidity includes: increasing the wet-bulb heating rate.

4. The method according to claim 1, characterized in that, The adjustment of the baking temperature of the baking target includes: If the required baking temperature is lower than the actual baking temperature, the rate of increase of the baking temperature is reduced; if the required baking temperature is higher than the actual baking temperature, the rate of increase of the baking temperature is increased.

5. The method according to claim 4, characterized in that, The reduction of the rate of increase of the baking temperature includes: reducing the rate of increase of the dry ball temperature; The rate of increase of the baking temperature includes: increasing the rate of increase of the dry bulb temperature.

6. The method according to claim 1, characterized in that, Also includes: The baking image of the target to be baked is input into a pre-trained baking state detection model, so that the baking state detection model can obtain the baking state of the target to be baked based on the baking image; the baking state detection model is trained by using the baking image of the sample target to be baked as a sample and outputting the baking state of the sample target to be baked. The required baking temperature is defined as the baking temperature required when the target object is in the baking state.

7. The method according to claim 1, characterized in that, The step of detecting whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target during the baking process according to the baking parameters includes: During the baking process according to the baking parameters, if it is detected that the moisture loss rate of the baking target has not reached the target moisture loss rate when baking is completed, then it is detected whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target.

8. The method according to claim 7, characterized in that, Also includes: The moisture loss rate of the baking target is calculated based on the baking time of the baking target and the set moisture loss rate curve. The moisture loss rate curve is obtained by fitting the curve of the moisture loss rate of the baking target with the baking time during the baking process aimed at achieving the target moisture loss rate. The moisture loss rate curve includes the logistic curve.

9. The method according to claim 1, characterized in that, Also includes: If the actual baking parameters of the target being baked exceed the set baking parameter range, a baking error alert will be output.

10. The method according to claim 8, characterized in that, If the actual baking parameters of the target being baked are detected to exceed the set baking parameter range, a baking anomaly alert will be output, including: If the average value of the actual baking parameters exceeds the set average range, and / or the range of the actual baking parameters exceeds the set range, a baking anomaly alert will be output.

11. The method according to claim 1, characterized in that, The baking targets include upper baking targets, middle baking targets, and lower baking targets, and the required baking temperature for detecting the baking targets includes: Calculate the weighted sum of the required baking temperatures for the upper baking target, the middle baking target, and the lower baking target, and determine the weighted sum as the required baking temperature for the baking target; The weight corresponding to the required baking temperature of the middle layer baking target is greater than the weight corresponding to the required baking temperature of the upper layer baking target and the weight corresponding to the required baking temperature of the lower layer baking target.

12. A baking apparatus, characterized in that, include: The detection unit is used to detect whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target during the baking process according to the baking parameters; the baking parameters include a set baking temperature and a set baking humidity, and the required baking temperature includes the baking temperature required by the baking target. The adjustment unit is configured to adjust the baking humidity of the baking target if the rate of water loss and the rate of temperature change of the baking target do not conform to a set rate matching relationship when the required baking temperature is the same as the actual baking temperature; and to adjust the baking temperature of the baking target if the rate of water loss and the rate of temperature change of the baking target do not conform to a set rate matching relationship when the required baking temperature is different from the actual baking temperature.

13. An electronic device, characterized in that, include: Memory and processor; The memory is used to store programs; The processor is configured to implement the method as described in any one of claims 1 to 11 by running a program in the memory.

14. A baking oven, characterized in that, include: Status acquisition devices and controllers; The status acquisition device is used to acquire the status information of the baking target; The controller is configured to, during the baking process according to the baking parameters, determine the required baking temperature and water loss rate of the baking target based on the state information of the baking target; detect whether the required baking temperature of the baking target is the same as the actual baking temperature of the baking target; the baking parameters include a set baking temperature and a set baking humidity, and the required baking temperature includes the baking temperature required by the baking target; if the required baking temperature is the same as the actual baking temperature, and if the water loss rate and temperature change rate of the baking target do not meet the set rate matching relationship, then the baking humidity of the baking target is adjusted; if the required baking temperature is different from the actual baking temperature, and if the water loss rate and temperature change rate of the baking target do not meet the set rate matching relationship, then the baking temperature of the baking target is adjusted.

15. The baking oven according to claim 14, characterized in that, The status information includes the baking image and weight of the target object; The status acquisition device includes a camera installed on the inner wall of the baking oven, which also includes a supplementary light box and a wind baffle. The wind baffle is fastened to the inner wall of the baking oven to form a photographing space. The camera and the supplementary light box are both installed in the photographing space. The camera is used to acquire baking images of the target through the wind baffle. The status acquisition device also includes a weight sensor, and the baking oven also includes a support body and a load-bearing rod; the first end of the weight sensor is connected to the support body, and the second end of the weight sensor is connected to the load-bearing rod; the load-bearing rod is used to place the baking target.

16. A storage medium, characterized in that, The storage medium stores a computer program, which, when executed by a processor, implements the method as described in any one of claims 1 to 11.

Images