Reconstruction structure for generating circularly polarized beams based on transmissive phase discontinuous surfaces

Abstract

This reconstruction structure, based on a transmissive phase discontinuity surface, generates a circularly polarized beam, belonging to the field of beam reconstruction. Traditional optical rotation response and beam direction control techniques typically rely on bulky and complex devices to achieve these functions, which not only limits system integration but also reduces signal processing efficiency. The proposed structure comprises an array of n×n integrated layers, of which n types exist. The first, second, and third metal structural layers have elliptical annular cross-sectional shapes. The rotation angles of the first, second, and third metal structural layers on each type of integrated layer are not identical; these angles are the angles between the major axis of the elliptical annulus and the negative direction. The left-hand or right-hand circularly polarized wave phases of the n integrated layers differ by m° sequentially, and the arrangement range of the left-hand or right-hand circularly polarized wave phases of the n integrated layers is from 0 to 2π. This structure is used to generate a circularly polarized beam.

Description

Technical Field

[0001] This invention relates to circularly polarized beam reconstruction, and belongs to the field of reconstruction. Background Technology

[0002] In microwave communication and radar systems, optical rotation response and beam directional control are key technologies that directly impact signal transmission quality and system detection capabilities. Traditional optical rotation response and beam directional control techniques typically rely on bulky and complex devices to achieve these functions, which not only limits system integration but also reduces signal processing efficiency.

[0003] With the rapid development of micro- and nano-electromagnetics and metamaterials technology, it has become possible to achieve precise beam control in the microwave frequency band by designing artificial structural surfaces with special electromagnetic responses (i.e., phase discontinuities). This method provides a new technical path for achieving miniaturized, high-efficiency optical rotation response and beam direction control. Summary of the Invention

[0004] The purpose of this invention is to address the problem that traditional optical rotation response and beam direction control technologies typically rely on bulky and complex devices to achieve these functions, which not only limits the system integration but also reduces the efficiency of signal processing. The invention proposes a reconstruction structure based on a transmissive phase discontinuity surface to generate a circularly polarized beam.

[0005] A reconstruction structure based on a transmissive phase discontinuity surface for generating circularly polarized beams is described, wherein the reconstruction structure is a planar structure composed of an array of in×in units, and the units include n types, where n is a positive integer.

[0006] In a flat structure, n types of units are arranged sequentially along the horizontal or vertical direction of the array. When the n types of units are arranged sequentially along the horizontal direction, each column contains the same type of unit. When the n types of units are arranged sequentially along the vertical direction, each row contains the same type of unit.

[0007] Each type of assemblies is formed by bonding a first metal structure layer, a first dielectric layer, a second metal structure layer, a second dielectric layer, and a third metal structure layer sequentially from top to bottom. The cross-sectional shape of the first metal structure layer, the second metal structure layer, and the third metal structure layer is an elliptical ring. The first dielectric layer and the second dielectric layer are both rectangular flat plates with a preset thickness.

[0008] The rotation angles of the first, second, and third metal structural layers on each type of assemblies are not exactly the same. In the plane where the flat structure is located, the horizontal leftward direction is the negative direction, and the rotation angle is the angle between the major axis of the ellipse and the negative direction.

[0009] The phases of the left-hand circularly polarized waves or the right-hand circularly polarized waves of the n types of integrated circuits differ by m°, and the phase arrangement range of the left-hand circularly polarized waves or the right-hand circularly polarized waves of the n types of integrated circuits is from 0 to 2π.

[0010] Preferably, when n is 8 and m° is 45°, the phases of the left-hand circularly polarized waves or the right-hand circularly polarized waves of the eight types of components are arranged as follows: 45°, 90°, 135°, 180°, 225°, 270°, 315° and 360°.

[0011] Preferably, the eight types of integrated structures are designated as the first type of integrated structure, the second type of integrated structure, the third type of integrated structure, the fourth type of integrated structure, the fifth type of integrated structure, the sixth type of integrated structure, the seventh type of integrated structure, and the eighth type of integrated structure, respectively; the first type of integrated structure has a rotation angle of 0° for the first metal structure layer, a rotation angle of 140° for the second metal structure layer, and a rotation angle of 125° for the third metal structure layer.

[0012] The first metal structure layer of the second type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 64°, and the third metal structure layer has a rotation angle of 160°.

[0013] The first metal structure layer of the third type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 80°, and the third metal structure layer has a rotation angle of 0°.

[0014] The first metal structure layer of the fourth type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 110°, and the third metal structure layer has a rotation angle of 20°.

[0015] The first metal structure layer of the fifth type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 115°, and the third metal structure layer has a rotation angle of 30°.

[0016] The first metal structure layer of the sixth type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 115°, and the third metal structure layer has a rotation angle of 55°.

[0017] The first metal structure layer of the seventh type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 150°, and the third metal structure layer has a rotation angle of 75°.

[0018] The first metal structure layer of the eighth type of integral has a rotation angle of 0°, the second metal structure layer has a rotation angle of 170°, and the third metal structure layer has a rotation angle of 110°.

[0019] Preferably, each type of assembly further includes an adhesive layer;

[0020] The adhesive layer is bonded between the second metal structural layer and the first dielectric layer.

[0021] The beneficial effects of this invention are:

[0022] In practice, a large number of integrated structures are simulated, and the corners of all metal structure layers are simulated. The required corners are selected to form each type of integrated structure. Therefore, this invention designs an in×in matrix composed of n types of integrated structures. The corners of the first, second, and third metal structure layers on each type of integrated structure are not exactly the same. The phases of the n types of integrated structures are sequentially covered with a gradient of m degrees from 0 to 2π. The uniform phase arrangement and coverage of 0 to 2π are the key to causing beam deflection; otherwise, deflection will not occur.

[0023] These integrated units can be designed in different sizes and shapes, and each unit can independently control the phase and polarization state of the electromagnetic waves passing through it;

[0024] In practical use, when electromagnetic waves are incident on the spliced ​​composite, the beam will be deflected. The deflection angle will be different depending on the phase gradient used. Therefore, the phase gradient can be designed according to the preset deflection angle.

[0025] This invention enables precise control of the beam direction. This precise direction control not only improves the target accuracy of the signal but also optimizes the system's coverage and efficiency. Furthermore, this technology can flexibly adapt to various operating environments, especially in complex electromagnetic environments or under changing communication conditions. Therefore, this invention utilizes phase-discontinuous surface transmission to generate an independently circularly polarized beam with optical rotation properties and achieves precise beam direction reconstruction.

[0026] This invention proposes a novel three-layer elliptical ring-shaped unit structure, where each corner unit can rotate independently to adjust the phase delay, thereby achieving precise control over the polarization and propagation direction of the incident circularly polarized wave. This structural design is significantly superior to traditional single-layer or fixed structures, allowing for more flexible beam and polarization state adjustment, and improving the functionality and application range of the device.

[0027] This invention, through the precise design of micro-nano structures, not only achieves active control of beam polarization state, but also improves the accuracy and efficiency of beam direction reconstruction, thereby opening up new avenues for performance enhancement of microwave communication and radar systems. Attached Figure Description

[0028] Figure 1 Side view of each type of volume;

[0029] Figure 2 A diagram showing the corner positions of the first, second, or third metal structural layer;

[0030] Figure 3This is a schematic diagram of the corners of the first, second, and third metal structural layers. Figure 3 (a) is a schematic diagram of the corner of the first metal structure layer. Figure 3 (b) is a schematic diagram of the corner of the second metal structure layer. Figure 3 (c) is a schematic diagram of the corner of the third metal structure layer;

[0031] Figure 4 The diagram shows two rotation angles for the first, second, or third metal structural layer; in the diagram, Figure 4 (a) is an angle diagram with a rotation angle of 0 degrees; Figure 4 (b) is an angle diagram with a rotation angle of 45 degrees;

[0032] Figure 5 For the Poincaré sphere model;

[0033] Figure 6 A diagram showing the optical rotation angle distribution for each type of integrated volume and its relative array;

[0034] Figure 7 The transmission coefficient curves of left-handed and right-handed circularly polarized waves in each type of integrated simulation are shown.

[0035] Figure 8 Phase distribution diagrams of 8 types of solid-state left-handed circularly polarized transmitted waves;

[0036] Figure 9 Phase distribution diagrams of right-hand circularly polarized transmitted waves for eight types of integrated circuits;

[0037] Figure 10 This is a diagram showing the arrangement of the product volumes in the matrix;

[0038] Figure 11 A modeling diagram for CST electromagnetic simulation software, in which... Figure 11 (a) Front view of CST array modeling Figure 11 (b) A reverse view of the CST array model;

[0039] Figure 12 The far-field radiation patterns of right-hand circularly polarized and left-hand circularly polarized transmitted waves are shown. Figure 12 (a) is the far-field pattern of a left-handed circularly polarized transmitted wave. Figure 12 (b) is the far-field pattern of right-hand circularly polarized transmitted waves;

[0040] Figure 13 The measured far-field radiation pattern of a left-handed circularly polarized wave;

[0041] Figure 14 This is the measured far-field pattern of a right-handed circularly polarized wave. Detailed Implementation

[0042] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0043] It should be noted that, unless otherwise specified, the embodiments and features described in the present invention can be combined with each other.

[0044] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, but this is not intended to limit the scope of the invention.

[0045] Example:

[0046] Combination Figures 1 to 3 , Figure 8 This embodiment describes a reconstruction structure for generating circularly polarized beams based on a transmissive phase discontinuity surface. The reconstruction structure is a planar structure composed of an array of in×in integrated units, and the types of integrated units include n, where n is a positive integer.

[0047] In a flat structure, n types of units are arranged sequentially along the horizontal or vertical direction of the array. When the n types of units are arranged sequentially along the horizontal direction, each column contains the same type of unit. When the n types of units are arranged sequentially along the vertical direction, each row contains the same type of unit.

[0048] Each type of assemblies is formed by bonding the first metal structure layer 1, the first dielectric layer 4, the second metal structure layer 2, the second dielectric layer 5, and the third metal structure layer 3 sequentially from top to bottom. The cross-sectional shape of the first metal structure layer 1, the second metal structure layer 2, and the third metal structure layer 3 is an elliptical ring. The first dielectric layer 4 and the second dielectric layer 5 are both rectangular flat plates with a preset thickness.

[0049] The rotation angles of the first metal structure layer 1, the second metal structure layer 2, and the third metal structure layer 3 on each type of assemblies are not exactly the same. In the plane where the flat structure is located, the direction to the left is the negative direction, and the rotation angle is the angle between the major axis of the ellipse and the negative direction.

[0050] The phases of the left-hand circularly polarized waves or the right-hand circularly polarized waves of the n types of integrated circuits differ by m°, and the phase arrangement range of the left-hand circularly polarized waves or the right-hand circularly polarized waves of the n types of integrated circuits is from 0 to 2π.

[0051] Specifically, the Poincaré sphere is a theoretical method mainly used to explain the way and principle of polarization state changes. The polarization state adjustment of the three-layer elliptical structure (first metal structure layer, second metal structure layer and third metal structure layer) designed in this embodiment can be explained using the Poincaré sphere.

[0052] Polarization state control method based on Poincaré sphere:

[0053] The polarization state control method based on the Poincaré sphere is a key innovation of this embodiment, enabling precise control of the polarization state and direction of independently circularly polarized beams. This method utilizes the geometric properties of the Poincaré sphere, combined with the design of a phase-discontinuous surface, to achieve a high degree of control over the beam polarization state.

[0054] A Poincaré sphere is a three-dimensional model used to describe the polarization state of electromagnetic waves, where each point on the sphere represents a unique polarization state. The polarization of a beam can be viewed as a point on the Poincaré sphere, and changes in beam polarization correspond to the movement of that point on the sphere.

[0055] This embodiment introduces a Poincaré sphere model to accurately calculate and control the beam polarization state. By analyzing the changing path of the incident wave on the Poincaré sphere, a phase discontinuity surface can be designed to precisely control the changes in the beam polarization state. This method not only improves the accuracy of beam control but also provides a novel physical mechanism for complex beam operations. The specific process is as follows:

[0056] First, the initial polarization state of the incident wave is analyzed to determine its starting position on the Poincaré sphere. This step is performed using an advanced polarization analyzer to ensure the accuracy and reliability of the analysis. Next, a phase discontinuity surface (i.e., a three-layer elliptical ring-shaped unit structure) is designed to alter the polarization state of the incident wave in a specific manner. The structure and relative position of each unit are precisely calculated to guide the beam along a predetermined path during transmission. These paths are preset by calculating the ideal trajectory of the beam on the Poincaré sphere. By adjusting the angle and arrangement of each unit structure, the polarization state of the beam can be dynamically adjusted along a specific path on the Poincaré sphere. This control precision is further optimized using the electromagnetic simulation software CST. By simulating the beam behavior under different design parameters, the final polarization state and beam path can be verified, ensuring accuracy and efficiency in practical applications.

[0057] This embodiment proposes a novel three-layer elliptical ring structure, where each metal layer can be independently rotated to different angles to adjust the phase delay, thereby achieving precise control over the polarization and propagation direction of the incident circularly polarized wave. Its specific structure is as follows: Figure 4 As shown, Figure 4The structure is a metal structure rotated at a certain angle, where a = 4.5 mm, b = 2 mm, a1 = 2.5 mm, b1 = 1.2 mm, and p = 10 mm. This structural design is significantly superior to traditional single-layer or fixed structures, allowing for more flexible beam and polarization state adjustment, thus improving the functionality and application range of the device.

[0058] When designing the unit, both the amplitude requirements for optical rotation and the phase requirements for beam deflection were considered. A total of eight integrated units were designed, with corresponding amplitudes as follows: Figure 7 As shown (taking a set of integrated circuits as an example), it can be seen that at 10 GHz, the transmission efficiencies of left-hand circular polarization and right-hand circular polarization are basically equal, which is one of the conditions for achieving optical rotation. The phase distribution of the transmitted waves of the eight sets of units with left-hand circular polarization is as follows: Figure 8 and Figure 9 As shown, the phase of the left-hand circularly polarized wave at 10 GHz remains basically around 90°, while the phase of the right-hand circularly polarized wave uniformly covers 0-2π with a gradient of 45°. This is an important condition for achieving beam deflection.

[0059] The following are the rotation angles and phase gradients of eight types of integrals:

[0060] When n is 8 and m° is 45°, the phases of the left-hand circularly polarized waves or the right-hand circularly polarized waves of the eight types of integrals are arranged as follows: 45°, 90°, 135°, 180°, 225°, 270°, 315° and 360°.

[0061] Specifically, for example, to achieve a left-hand circularly polarized wave without deflection and a right-hand circularly polarized wave with a deflection angle of 22.8° at 10 GHz, the phases of eight components can be set to 45°, 90°, 135°, 180°, 225°, 270°, 315°, and 360° respectively. This setting ultimately achieves the effect of no deflection of the left-hand circularly polarized wave and a deflection angle of 22.8° for the right-hand circularly polarized wave. To achieve other deflection angles, the phase gradient can be set to other angles, covering the range from 0 to 2π, to achieve the effect of deflection at other angles.

[0062] Covering the phase from 0 to 2π allows the deflected beam to cover 360 degrees. For example, eight types of phases—45°, 90°, 135°, 180°, 225°, 270°, 315°, and 360°—can be combined to form at least an 8×8 matrix, achieving the preset deflection angle. If the dielectric layer size is small, resulting in a less noticeable effect, a 16×16 matrix can also be formed. Figure 3 As shown.

[0063] The following are the preferred rotation angles and phase gradients for eight types of integrated volumes:

[0064] The eight types of solids are respectively called the first type of solid, the second type of solid, the third type of solid, the fourth type of solid, the fifth type of solid, the sixth type of solid, the seventh type of solid, and the eighth type of solid;

[0065] The first type of integral material has a rotation angle of 0° for the first metal structure layer, a rotation angle of 140° for the second metal structure layer, and a rotation angle of 125° for the third metal structure layer;

[0066] The first metal structure layer of the second type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 64°, and the third metal structure layer has a rotation angle of 160°.

[0067] The first metal structure layer of the third type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 80°, and the third metal structure layer has a rotation angle of 0°.

[0068] The first metal structure layer of the fourth type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 110°, and the third metal structure layer has a rotation angle of 20°.

[0069] The first metal structure layer of the fifth type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 115°, and the third metal structure layer has a rotation angle of 30°.

[0070] The first metal structure layer of the sixth type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 115°, and the third metal structure layer has a rotation angle of 55°.

[0071] The first metal structure layer of the seventh type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 150°, and the third metal structure layer has a rotation angle of 75°.

[0072] The first metal structure layer of the eighth type of integral has a rotation angle of 0°, the second metal structure layer has a rotation angle of 170°, and the third metal structure layer has a rotation angle of 110°.

[0073] The composition of the product is further defined below:

[0074] Each type of building block also includes an adhesive layer 6;

[0075] The adhesive layer 6 is bonded between the second metal structural layer 2 and the first dielectric layer 4.

[0076] Specifically, a 10x10 array of the same type of building blocks can be used to verify the optical rotation of each type of building block, such as... Figure 6 As shown, the optical rotation angle of each unit can be obtained in three ways; the amplitude of each unit is as follows: Figure 7As shown, the ability to adjust the beam rotation angle allows the beam to be better applied in different application scenarios. For example, it can play a significant role in communication systems that require changing the signal polarization to adapt to different receiving conditions.

[0077] This embodiment can predict and verify the beam polarization and direction control effects in the early stages of design based on the generalized Snell's theorem. The formula for the generalized Snell's theorem is: In the formula, n t Let n be the refractive index of the refracting medium. i Let θ be the refractive index of the incident medium. t θ represents the deflection angle of a right-handed or left-handed circularly polarized wave. i Let λ be the angle of the incident light, and λ0 be the wavelength of the light wave. dx represents the phase gradient of a right-hand circularly polarized wave or a left-hand circularly polarized wave, and dx represents the period of each type of rotation unit.

[0078] As we know, since the refractive index of both the incident and exit surfaces is air, the values ​​of ni and nt are both 1. Since the circularly polarized beam is incident perpendicularly, the incident angle θ is... i Taking 0°, based on the incident wave λ = 30 mm and the unit period dx = 10 mm, the phase distribution of the eight integrated circuits at 10 GHz is shown in Table 1. It can be seen that for left-handed circularly polarized waves, For right-hand circularly polarized waves Calculations show that the deflection angle of a left-handed circularly polarized transmitted wave is 0°, while the deflection angle of a right-handed circularly polarized transmitted wave is 22.8°.

[0079] Experimental simulation and effect verification:

[0080] Modeling: Based on the phase distribution of the eight types of integrated elements in Table 1, a 16*16 square array was further constructed to achieve the required beam control. It is worth noting that using only CST software for array modeling is cumbersome and inefficient. A better approach is to build an eight-element CST model element library and use Matlab and CST for co-simulation, which allows for rapid construction of the target array. This design underwent detailed simulation using CST electromagnetic simulation software, simulating the basic element arrangement and electromagnetic wave propagation behavior of the array. The simulation results verified the accuracy of the theoretical calculations. The specific element arrangement is as follows: Figure 10 As shown, the CST electromagnetic simulation software model is as follows: Figure 11 As shown.

[0081] Table 1. Phase distribution of transmitted left-handed and right-handed circularly polarized waves at 10 GHz.

[0082]

[0083]

[0084] Parameter settings: Array simulation differs slightly from element simulation. For array simulation, the simulation algorithm should first be set to the time-domain finite element method, and the electric field monitor and far-field monitor should be uniformly set in the 8-12GHz frequency band with a step size of 0.2GHz. The incident wave type should be changed to circularly polarized plane wave, and the boundary conditions in the X and Y directions should be changed to "OPEN".

[0085] Through simulation, we focused on the far-field radiation pattern of the independent circularly polarized wave, because the far-field radiation pattern allows for a more intuitive observation of the beam decoupling and deflection effects, such as... Figure 12 The images show the far-field radiation patterns of left-handed and right-handed circularly polarized transmitted waves, respectively. Since the main function of the array is to deflect the transmitted independent circularly polarized beams, we only focus on the transmission direction of the far-field radiation pattern. It can be seen that the main lobe direction of the transmitted left-handed circularly polarized wave beam has not been deflected, while the transmitted right-handed circularly polarized wave has been deflected by a certain angle. The specific deflection angle calculated by simulation software is 22.8°, which is consistent with the theoretical calculation result and has high accuracy.

[0086] The array consisting of eight integrated units in this design achieves a beam deflection angle of 22.8°. However, to meet the requirements for other deflection angles, we can change the interlayer rotation angle of the unit structure, thereby changing the phase response of the integrated unit at 10 GHz. By combining the generalized Snell's theorem and selecting a suitable phase gradient, we can construct a new array. The specific steps are the same as in this design.

[0087] Real-world simulation and comparison with simulation results: The main purpose of far-field measurement of the beam decoupling and deflection array is to verify its beam decoupling and deflection performance. Using a microwave anechoic chamber and its supporting instruments in the laboratory, relevant data were recorded by measuring the far-field radiation pattern at different angles. During the measurement process, we first installed the source antenna and the receiving antenna, and fixed the array at a certain distance from the source antenna to ensure that the electromagnetic wave illuminating the array was a plane wave. Then, the high-precision turntable was rotated from 90° to -90° before the measurement began.

[0088] The four sets of data collected were of the same type as those collected earlier, so the processing method was also the same, and will not be described in detail here.

[0089] Based on the above theoretical derivation, the collected linearly polarized electric field data can be converted into circularly polarized electric field data. The following section will use mathematical simulation software to plot the far-field radiation pattern of the collected measured data according to the above formula, as shown below. Figure 13 , Figure 14 As shown.

[0090] As can be seen from the two figures above, for left-hand circularly polarized waves, the direction of the main lobe is basically not deflected, while for right-hand circularly polarized waves, the main lobe is deflected by about 22°, which is basically consistent with the theoretical design effect.

[0091] However, the measured data showed many narrow sidelobes. Analysis of the causes suggests that this may be because, in reality, only spherical waves can be generated, not ideal plane waves, to illuminate the array. Furthermore, in order to make the spherical waves more approximate plane waves, the source antenna was placed at a considerable distance from the metasurface array, causing electromagnetic waves to diffract and be directly received by the receiving antenna. Overall, the main lobe directions of the two polarization states are the parameters we are focusing on. Their deflection angles are within the allowable error range compared to the theoretical predictions. Therefore, the effectiveness of the array in this embodiment can be proven.

[0092] While the invention has been described herein with reference to specific embodiments, it should be understood that these embodiments are merely examples of the principles and applications of the invention. Therefore, it should be understood that many modifications can be made to the exemplary embodiments, and other arrangements can be designed without departing from the spirit and scope of the invention as defined by the appended claims. It should be understood that different dependent claims and features described herein can be combined in ways different from those described in the original claims. It is also understood that features described in conjunction with individual embodiments can be used in other described embodiments.

Claims

1. A reconstruction structure based on a transmissive phase discontinuity surface generating a circularly polarized beam, characterized in that, The reconstructed structure is a flat plate structure composed of in×in units arranged in an array, and the units include n types; n is a positive integer. In a flat structure, n types of units are arranged sequentially along the horizontal or vertical direction of the array. When the n types of units are arranged sequentially along the horizontal direction, each column contains the same type of unit. When the n types of units are arranged sequentially along the vertical direction, each row contains the same type of unit. Each type of assemblies is formed by bonding the first metal structure layer (1), the first dielectric layer (4), the second metal structure layer (2), the second dielectric layer (5), and the third metal structure layer (3) from top to bottom. The cross-sectional shape of the first metal structure layer (1), the second metal structure layer (2), and the third metal structure layer (3) is an elliptical ring. The first dielectric layer (4) and the second dielectric layer (5) are both rectangular flat plates with a preset thickness. The rotation angles of the first metal structure layer (1), the second metal structure layer (2), and the third metal structure layer (3) on each type of material are not exactly the same. In the plane where the flat structure is located, the direction to the left is the negative direction. The rotation angle is the angle between the major axis of the ellipse and the negative direction. The phases of the left-hand or right-hand circularly polarized waves of the n types of integrated circuits differ by m°, and the phase arrangement of the left-hand or right-hand circularly polarized waves of the n types of integrated circuits ranges from 0 to 2. ; Each layer of the metal structure can be independently rotated to different angles to adjust the phase delay, thereby achieving precise control over the polarization and propagation direction of the incident circularly polarized wave.

2. The reconstruction structure based on a transmissive phase discontinuity surface generating a circularly polarized beam according to claim 1, characterized in that, When n is 8 and m° is 45°, the phases of the left-hand circularly polarized waves or the right-hand circularly polarized waves of the eight types of integrals are arranged as follows: 45°, 90°, 135°, 180°, 225°, 270°, 315° and 360°.

3. The reconstruction structure based on a transmissive phase discontinuity surface generating a circularly polarized beam according to claim 2, characterized in that, The eight types of integrated structures are respectively called the first type of integrated structure, the second type of integrated structure, the third type of integrated structure, the fourth type of integrated structure, the fifth type of integrated structure, the sixth type of integrated structure, the seventh type of integrated structure, and the eighth type of integrated structure; the first type of integrated structure has a rotation angle of 0° for the first metal structure layer, a rotation angle of 140° for the second metal structure layer, and a rotation angle of 125° for the third metal structure layer; The first metal structure layer of the second type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 64°, and the third metal structure layer has a rotation angle of 160°. The first metal structure layer of the third type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 80°, and the third metal structure layer has a rotation angle of 0°. The first metal structure layer of the fourth type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 110°, and the third metal structure layer has a rotation angle of 20°. The first metal structure layer of the fifth type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 115°, and the third metal structure layer has a rotation angle of 30°. The first metal structure layer of the sixth type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 115°, and the third metal structure layer has a rotation angle of 55°. The first metal structure layer of the seventh type of assemblies has a rotation angle of 0°, the second metal structure layer has a rotation angle of 150°, and the third metal structure layer has a rotation angle of 75°. The first metal structure layer of the eighth type of building block has a rotation angle of 0°, the second metal structure layer has a rotation angle of 170°, and the third metal structure layer has a rotation angle of 110°.

4. The reconstruction structure based on a transmissive phase discontinuity surface generating a circularly polarized beam according to claim 1, characterized in that, Each type of building block also includes an adhesive layer (6); The adhesive layer (6) is bonded between the second metal structure layer (2) and the first dielectric layer (4).

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