Method for testing low temperature resistance of perfluoropolyether preparation equipment

Abstract

The invention relates to the technical field of mechanical testing, and particularly discloses a method for testing the low temperature resistance of perfluoropolyether preparation equipment, which comprises the following steps of: counting a plurality of key components of the perfluoropolyether preparation equipment, and matching corresponding to-be-tested components based on characteristic values to obtain the layout number of adaptive surface monitoring points; performing low-temperature testing on each to-be-tested component, performing comprehensive analysis to obtain a structural safety evaluation index of each to-be-tested component, and performing comprehensive analysis to obtain a surface quality evaluation index of each to-be-tested component; and performing comprehensive analysis to obtain a low-temperature resistance evaluation value of the equipment, and obtaining and feeding back an evaluation result. The method for testing the low-temperature resistance of the perfluoropolyether preparation equipment provided by the invention can help to identify potential problems possibly occurring in the perfluoropolyether preparation equipment under the influence of a low-temperature environment in the production process, improves the production efficiency and the resource utilization rate, ensures that the produced perfluoropolyether product is qualified in quality, and reduces the production cost. And market requirements and customer requirements are met.

Description

Technical Field

[0001] The invention relates to the technical field of mechanical testing, in particular to a method for testing the low temperature resistance of perfluoropolyether preparation equipment. Background Art

[0002] At present, the production process of perfluoropolyether is the key part to ensure the high performance of perfluoropolyether. With the continuous development of automation technology, the production process of perfluoropolyether is gradually developing towards high precision, high speed and high stability. The low temperature resistance of perfluoropolyether preparation equipment directly affects the production efficiency and product quality. In order to ensure the stability and performance of perfluoropolyether under low temperature conditions, the production process of perfluoropolyether needs to be monitored.

[0003] For example, the invention patent with the announcement number CN112175116B is a method and device for preparing and heating the dispersant for suspension polymerization of polyvinyl chloride, including: the former is to fill the jacket and pipeline of the preparation tank with water, circulate the circulating water in the jacket of the preparation tank and then heat it, put the dispersant and pure water into the dispersant preparation tank together for stirring, heat the preparation tank to 70℃ to 75℃ and then stop heating, and reduce the temperature of the preparation tank to 10℃ to 30℃, and the latter includes a first dispersant preparation tank, a second dispersant preparation tank, a steam mixing heater, an ejector and a circulating pipeline booster pump. By adding a pipeline circulation booster pump and a steam mixing heater to the heating system to circulate and heat the jacket water, and designing remote instrument facilities to achieve automatic temperature control, the traditional method of directly heating the preparation tank with steam is changed, and the temperature of the preparation tank during the heating process is reduced, which can extend the service life of the preparation tank and reduce the amount of steam used.

[0004] For example, the invention patent with the announcement number CN114085302B is a method for preparing chlorinated polyvinylidene fluoride materials, which includes the following steps: (1) placing polyvinylidene fluoride powder in a tubular chlorination device, and introducing argon gas with a flow rate of 0.5 to 5 mL / min for 0.5 to 2 hours to exclude air; (2) introducing chlorine-containing gas into the tubular chlorination device, controlling the flow rate to 0.3 to 700 mL / min, controlling the reaction temperature to 40 to 60°C, and reacting for 8 to 16 hours to obtain chlorinated polyvinylidene fluoride materials. The preparation method of the chlorinated polyvinylidene fluoride material of the present invention uses chlorine-modified PVDF, which can well alleviate the stress-strain caused by the positive electrode during the charge and discharge process, improve the mechanical properties of the electrode, and thus improve the rate characteristics and long cycle characteristics of the electrode; the preparation conditions of the invention are mild, and low-temperature chlorination is used, which is suitable for large-scale production.

[0005] However, in the process of implementing the technical solution of the invention in the embodiments of the present application, it was found that the above technology has at least the following technical problems: the current perfluoropolyether production process pays more attention to product quality monitoring and process control of the preparation method, but in actual production, the production equipment may be affected by low temperature, resulting in limited accuracy of the process control system, and ultimately reducing product quality. Summary of the invention

[0006] In view of the deficiencies in the prior art, the present invention provides a method for testing the low-temperature resistance of a perfluoropolyether preparation equipment, which can effectively solve the problems involved in the above-mentioned background technology.

[0007] To achieve the above objectives, the present invention is implemented through the following technical solutions: The present invention provides a method for testing the low-temperature resistance of perfluoropolyether preparation equipment, including: counting several key components of the perfluoropolyether preparation equipment, marking them as components to be tested, monitoring the characteristic parameters of each component to be tested, comprehensively analyzing to obtain the characteristic value of each component to be tested, and matching each component to be tested based on the characteristic value to obtain the number of adapted surface monitoring points.

[0008] A low-temperature test is performed on each component to be tested, and the feedback data of several surface monitoring points of each component to be tested is recorded in real time. A comprehensive analysis is performed to obtain the structural safety assessment index of each component to be tested. The initial image and post-test scan image of each component to be tested are collected to obtain image difference parameters, and a comprehensive analysis is performed to obtain the surface quality assessment index of each component to be tested.

[0009] According to the structural safety evaluation index and surface quality evaluation index of each component to be tested, a comprehensive analysis is conducted to obtain the low-temperature resistance performance evaluation value of the equipment.

[0010] The low temperature resistance of the perfluoropolyether preparation equipment is evaluated according to the low temperature resistance evaluation value of the perfluoropolyether preparation equipment, and the product purity of the perfluoropolyether preparation equipment is obtained, and feedback is given based on the product quality of the perfluoropolyether preparation equipment.

[0011] As a further method, characteristic parameter analysis is performed on each component to be tested to obtain characteristic values ​​of different components to be tested. The specific analysis process is as follows: the characteristic parameters include thermal expansion coefficient, function requirement number and geometric shape complexity.

[0012] The critical thermal expansion coefficient, critical functional requirement number and critical geometric complexity were extracted from the perfluoropolyether preparation equipment database.

[0013] According to the thermal expansion coefficient, functional requirement number and geometric shape complexity of each component to be tested, the characteristic value of each component to be tested is obtained through comprehensive analysis.

[0014] As a further method, the matching obtains the number of adapted surface monitoring points. The specific matching process is: matching the characteristic value of each component to be tested with the number of surface monitoring points corresponding to each characteristic value interval stored in the perfluoropolyether preparation equipment database to obtain the number of surface monitoring points of each component to be tested.

[0015] As a further method, the comprehensive analysis obtains the structural safety assessment index of each component to be tested, and the specific analysis process is: the feedback data includes pressure, vibration frequency and stress.

[0016] The allowable deviation pressure, allowable deviation vibration frequency and allowable deviation stress were extracted from the perfluoropolyether preparation equipment database.

[0017] According to the pressure, vibration frequency and stress of several surface monitoring points of each component to be tested, a comprehensive analysis is performed to obtain the structural safety assessment index of each component to be tested.

[0018] As a further method, the comprehensive analysis obtains the surface quality evaluation index of each component to be tested, and the specific analysis process is: the image difference parameters include the deviation distance and the number of variation areas of each surface monitoring point.

[0019] The deviation distances and the number of critical variation areas of each critical surface monitoring point were extracted from the perfluoropolyether preparation equipment database.

[0020] According to the deviation distance and the number of variation areas of each surface monitoring point of each component to be tested, a comprehensive analysis is performed to obtain the surface quality evaluation index of each component to be tested.

[0021] As a further method, the comprehensive analysis obtains the low temperature performance evaluation value of the equipment. The specific analysis process is: according to the structural safety evaluation index and surface quality evaluation index of each component to be tested, the low temperature performance evaluation value of the equipment is obtained by comprehensive analysis.

[0022] As a further method, the low temperature resistance of the perfluoropolyether preparation equipment is evaluated according to the low temperature resistance performance evaluation value of the perfluoropolyether preparation equipment. The specific evaluation process is: extracting the low temperature resistance performance evaluation threshold in the perfluoropolyether preparation equipment database, comparing the equipment low temperature resistance performance evaluation value with the low temperature resistance performance evaluation threshold, if the equipment low temperature resistance performance evaluation value is greater than or equal to the low temperature resistance performance evaluation threshold, then the equipment low temperature resistance performance is evaluated as qualified, if the equipment low temperature resistance performance evaluation value is less than the low temperature resistance performance evaluation threshold, then the equipment low temperature resistance performance is evaluated as unqualified, and the unqualified evaluation result is fed back to relevant personnel.

[0023] As a further method, the low temperature resistance performance evaluation value of the equipment is a quantitative index obtained by analyzing the structural safety evaluation index and surface quality evaluation index of each component to be tested, and is used to quantify the low temperature resistance performance of the equipment.

[0024] As a further method, the characteristic value of each component to be tested is specifically expressed as:

[0025]

[0026] Among them, A i represents the characteristic value of the i-th component to be tested, S i represents the thermal expansion coefficient of the i-th component to be tested, S0 represents the set critical thermal expansion coefficient, H i represents the number of functional requirements of the i-th component to be tested, H0 represents the set critical functional requirements, F i represents the geometric shape complexity of the i-th component to be tested, F0 represents the set critical geometric shape complexity, ω1 represents the eigenvalue influence factor corresponding to the set thermal expansion coefficient, ω2 represents the eigenvalue influence factor corresponding to the set number of functional requirements, ω3 represents the eigenvalue influence factor corresponding to the set geometric shape complexity, i represents the number of the component to be tested, i=1,2,3,...,m, and m represents the total number of components to be tested.

[0027] As a further method, the structural safety evaluation index of each component to be tested has a specific numerical expression as follows:

[0028]

[0029] Among them, B i represents the structural safety assessment index of the i-th component to be tested, e represents the natural constant, and f ijc represents the pressure of the jth surface monitoring point of the i-th component under test at the c-th time node, f i0 represents the reference standard pressure of the i-th component to be tested, Δf represents the set allowable deviation pressure, P ijc represents the vibration frequency of the jth surface monitoring point of the i-th component under test at the c-th time node, P i0 represents the reference standard vibration frequency of the i-th component to be tested, ΔP represents the set allowable deviation vibration frequency, Q ijc represents the stress at the cth time node of the jth surface monitoring point of the i-th component to be tested, Q i0represents the reference standard stress of the i-th component to be tested, ΔQ represents the set allowable deviation stress, ρ1 represents the structural safety assessment influence factor corresponding to the set pressure deviation, ρ2 represents the structural safety assessment influence factor corresponding to the set vibration frequency deviation, ρ3 represents the structural safety assessment influence factor corresponding to the set stress deviation, i represents the number of the component to be tested, i=1,2,3,...,m, m represents the total number of components to be tested, j represents the number of surface monitoring points, j=1,2,3,...,n, n represents the total number of surface monitoring points, c represents the time node number, c=1,2,3,...,s, s represents the total number of time nodes.

[0030] The perfluoropolyether preparation equipment database is used to store indicators such as critical thermal expansion coefficient, critical functional requirement number, critical geometric shape complexity, structural safety assessment influencing factor corresponding to pressure, structural safety assessment influencing factor corresponding to vibration frequency, structural safety assessment influencing factor corresponding to stress, deviation distance of critical surface monitoring points, number of critical variation areas, low temperature resistance performance assessment influencing factor corresponding to structural safety assessment index, low temperature resistance performance assessment influencing factor corresponding to surface quality assessment index and low temperature resistance performance assessment threshold. The data in the perfluoropolyether preparation equipment database are obtained by collecting multiple perfluoropolyether preparation equipment experimental data.

[0031] Compared with the prior art, the embodiments of the present invention have at least the following advantages or beneficial effects:

[0032] (1) The present invention provides a method for testing the low-temperature resistance of perfluoropolyether preparation equipment, which can help identify potential problems that may occur in the perfluoropolyether preparation equipment under the influence of a low-temperature environment during the production process, and then adjust the process parameters in time, reduce the scrap rate, improve production efficiency and resource utilization, and ensure that the perfluoropolyether products produced are of qualified quality and meet market demand and customer requirements.

[0033] (2) The present invention can identify abnormal conditions in equipment operation at an early stage, such as sudden pressure change, abnormal vibration or abnormal stress distribution, by evaluating the structural safety assessment index of each component to be tested, which helps to take preventive maintenance measures, reduce unexpected downtime, and improve equipment availability. At the same time, it ensures that the equipment always operates within a safe operating range under low temperature conditions, avoiding safety accidents caused by overpressure, excessive vibration or stress.

[0034] (3) The present invention can help discover the wear condition of mechanical parts by evaluating the surface quality evaluation index of each component to be tested, take timely measures to reduce wear and extend the service life of the equipment, and predict the fatigue condition of materials, replace wearing parts in advance, avoid sudden failures, and help improve the overall production quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] The present invention is further described using the accompanying drawings, but the embodiments in the accompanying drawings do not constitute any limitation to the present invention. A person skilled in the art can obtain other drawings based on the following drawings without creative work.

[0036] Figure 1 It is a schematic diagram of the method flow of the present invention.

[0037] Figure 2 It is a schematic diagram of the functional relationship between the low temperature resistance performance evaluation value of the equipment of the present invention and the structural safety evaluation index of each component to be tested. DETAILED DESCRIPTION

[0038] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0039] Reference Figure 1 As shown, the present invention provides a method for testing the low-temperature resistance of perfluoropolyether preparation equipment, including: counting several key components of the perfluoropolyether preparation equipment, marking them as components to be tested, monitoring the characteristic parameters of each component to be tested, comprehensively analyzing to obtain the characteristic value of each component to be tested, and matching each component to be tested based on the characteristic value of each component to be tested to obtain the number of surface monitoring points to be matched.

[0040] A low-temperature test is performed on each component to be tested, and the feedback data of several surface monitoring points of each component to be tested is recorded in real time. A comprehensive analysis is performed to obtain the structural safety assessment index of each component to be tested. The initial image and post-test scan image of each component to be tested are collected to obtain image difference parameters, and a comprehensive analysis is performed to obtain the surface quality assessment index of each component to be tested.

[0041] According to the structural safety evaluation index and surface quality evaluation index of each component to be tested, a comprehensive analysis is conducted to obtain the low-temperature resistance performance evaluation value of the equipment.

[0042] The low temperature resistance of the perfluoropolyether preparation equipment is evaluated according to the low temperature resistance evaluation value of the perfluoropolyether preparation equipment, and the product purity of the perfluoropolyether preparation equipment is obtained, and feedback is given based on the product quality of the perfluoropolyether preparation equipment.

[0043] It needs to be explained that the synthesis of perfluoropolyether usually involves the reaction of fluoride with specific precursor substances. Low temperature can help inhibit unnecessary side reactions and ensure the purity and quality of the product. In addition, certain reactions can better control the reaction rate at low temperature, thereby increasing the yield of the target product. At the same time, some reactants or intermediates may be very sensitive to temperature. Low temperature can prevent them from decomposing or deteriorating. Therefore, low temperature testing of perfluoropolyether preparation equipment is required.

[0044] Furthermore, the preparation equipment of perfluoropolyether is a complex system, including a reactor, a gas mixing system, a stirring device and subsequent processing equipment, etc., wherein the reactor is usually a vertical reactor made of stainless steel, and its volume is determined according to the production scale. The vertical reactor is suitable for large-scale and continuous production, and can better control the reaction temperature, pressure and other parameters. The reactor is the core equipment for the preparation of perfluoropolyether, and is used for key reaction steps such as prepolymerization, addition and post-polymerization; wherein the gas mixing system is responsible for fully mixing the fluorinating agent gas with the reaction materials in the fluorination reaction to ensure the uniform progress of the fluorination reaction. The system may include components such as gas storage tanks, gas delivery pipelines, and mixing chambers; wherein the stirring device is an indispensable equipment in the preparation process of perfluoropolyether, and is used to ensure the uniform mixing of the reaction materials in the reactor. Advanced stirring devices may include hollow stirring rods and hollow The core porous stirring paddle can improve the utilization rate of the fluorination agent and the reaction efficiency. The stirring device can fully mix the reaction materials by rotating and stirring to promote the chemical reaction. The subsequent processing equipment includes the release agent removal and distillation equipment, which is used to separate the reaction product from the release agent and perform distillation treatment to remove impurities and unreacted products to obtain pure perfluoropolyether. It also includes crushing and packaging equipment, which is used to crush the perfluoropolyether after distillation and package it according to the needs of different customers. Other auxiliary equipment includes heating and cooling systems, which are used to control the temperature of the reactor to ensure that the reaction is carried out within a suitable temperature range, and pressure control systems, which are used to control the pressure of the reactor to ensure that the reaction is carried out under safe pressure conditions, and safety systems, including emergency shutdown systems, leak detection systems, etc., are used to ensure safety during the production process.

[0045] The parts that need to be tested at low temperature in this embodiment include the reactor, which is the container where the chemical reaction occurs. It is necessary to ensure that the reaction can be carried out stably at low temperature and maintain good heat transfer performance; the stirring device, in order to make the reactants evenly mixed, the stirring device needs to be able to operate effectively at low temperature and will not be damaged by too low temperature; the cooling system is used to maintain the reaction system within the required low temperature range to ensure the smooth progress of the reaction; the feeding and discharging system, including the valves of the feeding port and the discharging port, ensure that it can still operate smoothly at low temperature without freezing or damage. Through low temperature testing, it can be ensured that the prepared perfluoropolyether has the expected physical and chemical properties, such as viscosity, molecular weight distribution, etc., and the test can help determine the optimal operating conditions, thereby improving production efficiency and output. At the same time, by optimizing the reaction conditions to reduce the generation of by-products, the cost of raw materials and subsequent processing costs can be reduced.

[0046] It should be understood that the production of perfluoropolyether is a complex chemical process, which first requires the acquisition of high-purity fluorinated monomer raw materials, such as hexafluoropropylene oxide, hexafluoropropylene and tetrafluoroethylene. Under the preset reaction conditions, these raw materials are fed into the reactor, and multi-stage chemical reactions are carried out by controlling the temperature, pressure and catalyst dosage. In this process, pre-polymerization and post-polymerization techniques may be used, or depending on the type of product, photo-oxidation or anionic polymerization may be used for polymerization. After the reaction is completed, the product needs to undergo post-processing steps, including the use of a release agent to remove impurities, distillation purification, and pulverization to meet specific physical and chemical performance standards. Finally, through strict quality control and inspection processes, it is ensured that the produced perfluoropolyether products have high purity, excellent low temperature resistance, chemical corrosion resistance and other key properties to meet a wide range of application needs.

[0047] It should be understood that the preparation process of perfluoropolyether usually needs to be carried out in a low temperature environment, and the polymerization reaction of tetraethylene or hexafluoropropylene under ultraviolet light needs to be carried out at a low temperature of -60°C to -70°C. This is because at these extremely low temperatures, the reaction rate can be slowed down, the occurrence of side reactions can be reduced, and it is conducive to the formation of perfluoropolyether products with specific structures and properties.

[0048] It should be understood that the components to be tested refer to the components in the perfluoropolyether preparation equipment that need to be tested for low-temperature resistance, including the agitator, the coolant circulation pipeline and the reactor coil. When the agitator mixes the raw materials, since the preparation of perfluoropolyether may need to be carried out at low temperature, the low-temperature operation stability of the agitator and its related pipelines during the mixing process is crucial. The low-temperature test in this step can ensure that the agitator can still maintain good stirring effect and sealing at low temperatures; the coolant circulation pipeline is responsible for transporting the coolant to the part that needs cooling to maintain the low-temperature state of the reaction system. The low-temperature test in this step can verify the efficiency and stability of the coolant circulation system to prevent production accidents caused by pipeline rupture or leakage; the reactor coil is a key part in the reactor for transferring cooling medium to control the reaction temperature. In the low-temperature test, it is necessary to verify the cooling efficiency, pressure bearing capacity and sealing performance of the coil at low temperatures to prevent production accidents caused by temperature fluctuations or leakage.

[0049] Specifically, characteristic parameter analysis is performed on each component to be tested to obtain characteristic values ​​of different components to be tested. The specific analysis process is as follows: the characteristic parameters include thermal expansion coefficient, function requirement number and geometric shape complexity.

[0050] The critical thermal expansion coefficient, critical functional requirement number and critical geometric complexity were extracted from the perfluoropolyether preparation equipment database.

[0051] According to the thermal expansion coefficient, functional requirement number and geometric shape complexity of each component to be tested, the characteristic value of each component to be tested is obtained through comprehensive analysis.

[0052] In a specific embodiment, the coefficient of thermal expansion refers to the degree to which the size of a material changes when the temperature changes, which can be measured by a linear expansion meter. The number of functional requirements refers to the number of functional requirements that a component needs to meet. These requirements include performance indicators, operating restrictions, safety requirements, etc., which can be extracted from the perfluoropolyether preparation equipment database. Geometric shape complexity is an important concept in topology, which can be obtained by calculating the relationship between the number of vertices, the number of edges and the number of faces. The specific value is the number of vertices minus the number of edges plus the number of faces, which can be obtained through computer-aided design.

[0053] It can be understood that by considering the thermal expansion coefficient of the component, it can help designers choose the right material combination to ensure that the component maintains good fit and performance at different temperatures, help manufacturers control dimensional accuracy during processing, especially for components working in high or low temperature environments, and further help to formulate reasonable maintenance plans to prevent component damage caused by temperature changes. By considering the number of functional requirements of the component, it helps to evaluate the overall performance and reliability of the component, and ensure that the component can meet the predetermined operating conditions. By considering the complexity of the geometric shape of the component, it helps to arrange monitoring points, so as to achieve key monitoring of parts with complex shapes or sudden geometric changes.

[0054] Specifically, the characteristic value of each component to be tested is expressed as follows:

[0055]

[0056] Among them, A i represents the characteristic value of the i-th component to be tested, S i represents the thermal expansion coefficient of the i-th component to be tested, S0 represents the set critical thermal expansion coefficient, H i represents the number of functional requirements of the i-th component to be tested, H0 represents the set critical functional requirements, F i represents the geometric shape complexity of the i-th component to be tested, F0 represents the set critical geometric shape complexity, ω1 represents the eigenvalue influence factor corresponding to the set thermal expansion coefficient, ω2 represents the eigenvalue influence factor corresponding to the set number of functional requirements, ω3 represents the eigenvalue influence factor corresponding to the set geometric shape complexity, i represents the number of the component to be tested, i=1,2,3,...,m, and m represents the total number of components to be tested.

[0057] It should be understood that the critical functional requirement number and the critical geometric complexity are used to eliminate the units in the formula and perform normalization processing so that data of different dimensions or magnitudes can be compared and weighted, which helps to reduce the scale differences between different features and improve the accuracy of the model. The critical functional requirement number can be obtained by obtaining the functional requirement number of each component to be tested and marking the maximum functional requirement number as the critical functional requirement number, and the critical geometric complexity can be obtained by obtaining the geometric complexity of each component to be tested and marking the maximum geometric complexity as the critical geometric complexity.

[0058] The algorithm of this embodiment combines the thermal expansion coefficient, functional requirement number and geometric shape complexity of each component to be tested, and comprehensively analyzes to obtain the characteristic value of each component to be tested. If the thermal expansion coefficient of the component is large, it will cause a large dimensional change when the temperature changes, which may affect the functional performance of the component, especially when the functional requirement number of the component is high. At the same time, components with high functional requirement numbers often require more complex geometric shapes to achieve the required functions, which increases the complexity of the geometric shape. Components with high geometric shape complexity may require more complex manufacturing processes, which may increase the uncertainty of the thermal expansion coefficient of the component. Comprehensive analysis can obtain more comprehensive, accurate and reliable characteristic values ​​of each component to be tested.

[0059] Table 1 Example of characteristic value data of each component to be tested

[0060]

[0061] As shown in Table 1, the characteristic value of each component to be tested is jointly determined by the thermal expansion coefficient, the number of functional requirements and the complexity of geometric shape. In a specific embodiment, the critical thermal expansion coefficient is 15×10^(-6) / ℃, the critical number of functional requirements is 9, the critical geometric shape complexity is 12, the characteristic value influence factor corresponding to the set thermal expansion coefficient is 0.4, the characteristic value influence factor corresponding to the set number of functional requirements is 0.3, and the characteristic value influence factor corresponding to the set geometric shape complexity is 0.3. This formula takes into account the thermal expansion coefficient, the number of functional requirements and the geometric shape complexity of each component to be tested, that is, it comprehensively considers the physical properties, chemical properties and stress concentration of each component, so as to effectively identify the parts where the monitoring points need to be arranged. By standardizing the thermal expansion coefficient, the number of functional requirements and the geometric shape complexity, it is ensured that they are compared at the same order of magnitude, which improves the fairness and comparability of the evaluation. By weighting the influence of the thermal expansion coefficient, the number of functional requirements and the geometric shape complexity, it reflects their relative importance in the evaluation index. The weights of different factors can be adjusted according to different needs, making the model very adaptable. It can be seen that when the thermal expansion coefficient or the number of functional requirements or the complexity of the geometric shape is larger, the characteristic value of each component to be tested is larger. By evaluating the characteristic value of each component to be tested, the performance of each component can be comprehensively evaluated to ensure the balance of the overall performance of the equipment, thereby obtaining the number of adapted surface monitoring points more accurately.

[0062] It should be understood that, in this embodiment, ω1 is the characteristic value influencing factor corresponding to the thermal expansion coefficient preset in the perfluoropolyether preparation equipment database, which indicates the numerical value of the influence degree of the thermal expansion coefficient on the characteristic value of each component to be tested. When used, the characteristic value influencing factor corresponding to the thermal expansion coefficient can be directly obtained from the perfluoropolyether preparation equipment database, and the corresponding relationship can be a preset mapping relationship. For example, the thermal expansion coefficient and the characteristic value influencing factor corresponding to the thermal expansion coefficient preset in the perfluoropolyether preparation equipment database form a mapping set, and the real-time thermal expansion coefficient is input into the mapping set to obtain the characteristic value influencing factor corresponding to the thermal expansion coefficient, wherein the mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1; ω2 is the characteristic value influencing factor corresponding to the number of functional requirements preset in the perfluoropolyether preparation equipment database, which indicates the numerical value of the influence degree of the number of functional requirements on the characteristic value of each component to be tested. When used, the characteristic value influencing factor corresponding to the number of functional requirements can be directly obtained from the perfluoropolyether preparation equipment database, and the corresponding relationship can be a preset mapping relationship, for example For example, the function requirement number and the eigenvalue influencing factors corresponding to the function requirement number preset in the perfluoropolyether preparation equipment database form a mapping set, and the real-time function requirement number is input into the mapping set to obtain the eigenvalue influencing factors corresponding to the function requirement number, wherein the mapping relationship can be one-to-one or many-to-one, and its value range is between 0 and 1 in this example; ω3 is the eigenvalue influencing factor corresponding to the geometric shape complexity preset in the perfluoropolyether preparation equipment database, which represents the numerical value of the influence degree of the geometric shape complexity on the eigenvalue of each component to be tested. When used, the eigenvalue influencing factors corresponding to the geometric shape complexity can be directly obtained from the perfluoropolyether preparation equipment database, and the corresponding relationship can be a preset mapping relationship. For example, the geometric shape complexity and the eigenvalue influencing factors corresponding to the geometric shape complexity preset in the perfluoropolyether preparation equipment database form a mapping set, and the real-time geometric shape complexity is input into the mapping set to obtain the eigenvalue influencing factors corresponding to the geometric shape complexity, wherein the mapping relationship can be one-to-one or many-to-one, and its value range is between 0 and 1 in this example.

[0063] In a specific embodiment, the characteristic value of each component to be tested is a quantitative index obtained by analyzing the thermal expansion coefficient, the number of functional requirements and the complexity of the geometric shape of each component to be tested, and is used to quantify the characteristics of each component to be tested.

[0064] Furthermore, the number of adapted surface monitoring points is matched, and the specific matching process is: matching the characteristic value of each component to be tested with the number of surface monitoring points corresponding to each characteristic value interval stored in the perfluoropolyether preparation equipment database to obtain the number of surface monitoring points of each component to be tested.

[0065] In a specific embodiment, a low-temperature test is performed on each component to be tested. The specific test process is: a test temperature range is selected according to the actual working environment of the component, for example, from room temperature to -50°C, the operating function of each component to be tested is tested, sensors and other devices are installed at key positions of the component to monitor the characteristic parameters of each component to be tested, and an initial image of each component to be tested is collected. The test duration should be long enough to ensure that the component can withstand long-term low-temperature exposure. For example, the test duration can be set to 48 hours. During the test, the temperature is gradually reduced at a specified rate until the set target low temperature of -50°C is reached. After the test, the component is restored to room temperature, and post-test scan images of each component to be tested and feedback data from several surface monitoring points are collected.

[0066] Specifically, a comprehensive analysis is performed to obtain a structural safety assessment index of each component to be tested, and the specific analysis process is as follows: the feedback data includes pressure, vibration frequency and stress.

[0067] The allowable deviation pressure, allowable deviation vibration frequency and allowable deviation stress were extracted from the perfluoropolyether preparation equipment database.

[0068] According to the pressure, vibration frequency and stress of several surface monitoring points of each component to be tested, a comprehensive analysis is performed to obtain the structural safety assessment index of each component to be tested.

[0069] It should be explained that in this embodiment, the pressure at each surface monitoring point can be monitored by a pressure sensor, so that potential problems such as pipeline blockage or leakage can be discovered early, and timely measures can be taken to avoid equipment damage or failure caused by abnormal pressure. By monitoring the vibration frequency of each surface monitoring point by a vibration sensor, problems such as wear or imbalance of mechanical parts can be discovered early, which is helpful to take preventive maintenance measures and reduce unexpected downtime. By monitoring the stress of each surface monitoring point by a fiber Bragg grating sensor, the structural integrity of the component can be evaluated to avoid failure due to overload or fatigue. At the same time, it is ensured that the component works within the design limit and reduces safety risks. At the same time, several time nodes are deployed to monitor real-time data at different time nodes. For example, the first monitoring is performed immediately after the equipment is started to capture the status during the startup process, and monitoring is performed at regular intervals (such as every hour or every half hour) to track the status changes of the equipment during stable operation. The last monitoring is performed before the equipment is shut down to capture the status during the shutdown process.

[0070] Specifically, the structural safety evaluation index of each component to be tested has a specific numerical expression as follows:

[0071]

[0072] Among them, B i represents the structural safety assessment index of the i-th component to be tested, e represents the natural constant, and fijc represents the pressure of the jth surface monitoring point of the i-th component under test at the c-th time node, f i0 represents the reference standard pressure of the i-th component to be tested, Δf represents the set allowable deviation pressure, P ijc represents the vibration frequency of the jth surface monitoring point of the i-th component under test at the c-th time node, P i0 represents the reference standard vibration frequency of the i-th component to be tested, ΔP represents the set allowable deviation vibration frequency, Q ijc represents the stress at the cth time node of the jth surface monitoring point of the i-th component to be tested, Q i0 represents the reference standard stress of the i-th component to be tested, ΔQ represents the set allowable deviation stress, ρ1 represents the structural safety assessment influence factor corresponding to the set pressure deviation, ρ2 represents the structural safety assessment influence factor corresponding to the set vibration frequency deviation, ρ3 represents the structural safety assessment influence factor corresponding to the set stress deviation, i represents the number of the component to be tested, i=1,2,3,...,m, m represents the total number of components to be tested, j represents the number of surface monitoring points, j=1,2,3,...,n, n represents the total number of surface monitoring points, c represents the time node number, c=1,2,3,...,s, s represents the total number of time nodes.

[0073] The algorithm of this embodiment combines the pressure, vibration frequency and stress of each surface monitoring point, and comprehensively analyzes to obtain the structural safety assessment index of each component to be tested. When the pressure inside the equipment changes, it may cause the load of the mechanical parts to change, thereby causing a change in the vibration frequency. At the same time, when the fluid passes through a pipe or container, the change in pressure will affect the flow characteristics of the fluid, which may lead to fluid dynamic instability phenomena such as eddy currents or resonance, thereby inducing vibration. The change in pressure will cause deformation of the material, thereby generating stress, and vibration will generate dynamic stress, especially in certain parts of the equipment, such as supports, couplings, etc. These dynamic stresses may accelerate material fatigue. Comprehensive analysis can obtain a more comprehensive, accurate and reliable structural safety assessment index for each component to be tested.

[0074] It should be explained that three key factors, namely, pressure, vibration frequency and stress at each surface monitoring point, are considered in this embodiment, which can identify abnormal conditions in equipment operation early, such as sudden pressure changes, abnormal vibrations or abnormal stress distribution, and help to take preventive maintenance measures, reduce unexpected downtime, and improve equipment availability. At the same time, it ensures that the equipment always operates within a safe operating range under low temperature conditions, and avoids safety accidents caused by overpressure, excessive vibration or stress. By standardizing the pressure, vibration frequency and stress at each surface monitoring point, it is ensured that they are compared at the same magnitude, which improves the fairness and comparability of the evaluation. By weighting the influence of pressure, vibration frequency and stress at each surface monitoring point, it reflects their relative importance in the evaluation index. The weights of different factors can be adjusted according to different needs, making the model very adaptable. It can be seen that the smaller the deviation of pressure, vibration frequency or stress, the greater the structural safety evaluation index of each component to be tested. By evaluating the structural safety assessment index of each component to be tested, the working status of the equipment can be adjusted in real time, the production process can be optimized, and production efficiency can be improved. It can also help discover the wear of mechanical parts and take timely measures to reduce wear and tear, extend the service life of the equipment, and help maintain process stability and ensure consistency in product quality.

[0075] It should be understood that, in this embodiment, ρ1 is the structural safety assessment influencing factor corresponding to the pressure deviation preset in the perfluoropolyether preparation equipment database, which represents the numerical value of the influence degree of the pressure deviation on the structural safety assessment index of each component to be tested. When used, the structural safety assessment influencing factor corresponding to the pressure deviation can be directly obtained from the perfluoropolyether preparation equipment database, and the corresponding relationship can be a preset mapping relationship. For example, the pressure deviation of each surface monitoring point and the structural safety assessment influencing factor corresponding to the pressure preset in the perfluoropolyether preparation equipment database form a mapping set, and the real-time pressure deviation is input into the mapping set to obtain the structural safety assessment influencing factor corresponding to the pressure, wherein the mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1; ρ2 is the structural safety assessment influencing factor corresponding to the vibration frequency deviation preset in the perfluoropolyether preparation equipment database, which represents the numerical value of the influence degree of the vibration frequency deviation on the structural safety assessment index of each component to be tested. When used, the structural safety assessment influencing factor corresponding to the vibration frequency deviation can be directly obtained from the perfluoropolyether preparation equipment database, and the corresponding relationship can be a preset A certain mapping relationship is formed, for example, the vibration frequency deviation of each surface monitoring point and the structural safety assessment influencing factor corresponding to the vibration frequency deviation preset in the perfluoropolyether preparation equipment database form a mapping set, and the real-time vibration frequency deviation is input into the mapping set to obtain the structural safety assessment influencing factor corresponding to the pressure, wherein the mapping relationship can be one-to-one or many-to-one, and its value range in this example is between 0 and 1; ρ3 is the structural safety assessment influencing factor corresponding to the stress deviation preset in the perfluoropolyether preparation equipment database, which represents the numerical value of the influence degree of the stress deviation on the structural safety assessment index of each component to be tested. When used, the structural safety assessment influencing factor corresponding to the stress deviation can be directly obtained from the perfluoropolyether preparation equipment database, and its corresponding relationship can be a preset mapping relationship, for example, the stress deviation of each surface monitoring point and the structural safety assessment influencing factor corresponding to the stress preset in the perfluoropolyether preparation equipment database form a mapping set, and the real-time stress deviation is input into the mapping set to obtain the structural safety assessment influencing factor corresponding to the stress, wherein the mapping relationship can be one-to-one or many-to-one, and its value range in this example is between 0 and 1.

[0076] In a specific embodiment, the structural safety assessment index of each component to be tested is a quantitative indicator obtained by analyzing the pressure, vibration frequency and stress of each surface monitoring point of each component to be tested, and is used to quantify the structural safety level of each component to be tested under low temperature conditions.

[0077] Specifically, the surface quality evaluation index of each component to be tested is obtained by comprehensive analysis, and the specific analysis process is as follows: the image difference parameters include the deviation distance and the number of variation areas of each surface monitoring point.

[0078] The deviation distances and the number of critical variation areas of each critical surface monitoring point were extracted from the perfluoropolyether preparation equipment database.

[0079] According to the deviation distance and the number of variation areas of each surface monitoring point of each component to be tested, a comprehensive analysis is performed to obtain the surface quality evaluation index of each component to be tested.

[0080] In a specific embodiment, the number of variation areas includes the number of cracks, corrosion and wear areas, etc. The initial image and the post-test scan image of each component to be tested can be collected through an optical microscope, and the initial image and the post-test image can be aligned using image registration technology to ensure that the positions of the two images are consistent, thereby obtaining the deviation distance of each surface monitoring point of each component to be tested. The number of variation areas can be obtained through image segmentation technology and image texture analysis technology.

[0081] Specifically, the surface quality evaluation index of each component to be tested has a specific numerical expression as follows:

[0082]

[0083] Among them, C i represents the surface quality evaluation index of the i-th component to be tested, e represents the natural constant, W ij represents the deviation distance of each surface monitoring point of the jth surface monitoring point of the i-th component to be tested, W0 represents the set critical deviation distance, X i represents the number of variation regions of the i-th component to be tested, X0 represents the set number of critical variation regions, τ1 represents the surface quality assessment influencing factor corresponding to the set deviation distance of each surface monitoring point, τ2 represents the surface quality assessment influencing factor corresponding to the set number of variation regions, i represents the number of the component to be tested, i=1,2,3,...,m, m represents the total number of components to be tested, j represents the number of surface monitoring points, j=1,2,3,...,n, n represents the total number of surface monitoring points.

[0084] The algorithm of this embodiment combines the deviation distance of each surface monitoring point of each component to be tested and the number of variation areas, and comprehensively analyzes to obtain the surface quality evaluation index of each component to be tested. When the deviation distance of each surface monitoring point of the material occurs, some areas may experience stress concentration, which may cause local stress to exceed the bearing capacity of the material, forming variation areas, and repeated deviation distances of each surface monitoring point will cause fatigue accumulation of the material. Over time, this accumulation may cause the formation and expansion of cracks. As the deviation distance of each surface monitoring point increases, the cracks in the material may increase or expand, which will increase the number of variation areas. Comprehensive analysis can obtain a more comprehensive, accurate and reliable surface quality evaluation index of each component to be tested.

[0085] It should be explained that in this embodiment, two key factors, namely the deviation distance and the number of variation areas of each surface monitoring point of each component to be tested, are considered, which can obtain more comprehensive information, help to find problems early, thereby reducing unexpected downtime, improving the availability and production efficiency of equipment, and predicting possible problems in the future, so as to take preventive measures. By standardizing the deviation distance and the number of variation areas of each surface monitoring point of each component to be tested, it is ensured that they are compared at the same magnitude, which improves the fairness and comparability of the evaluation. At the same time, the setting of W0 and X0 helps to monitor whether the data exceeds the normal range, thereby prompting the need to take action. By weighting the influence of the deviation distance and the number of variation areas of each surface monitoring point of each component to be tested, it reflects their relative importance in the evaluation index, and the weights of different factors can be adjusted according to different needs, so that the model has good adaptability. It can be seen that when the deviation distance or the number of variation areas of each surface monitoring point is smaller, the surface quality evaluation index of each component to be tested is larger. By evaluating the surface quality evaluation index of each component to be tested, it can help to discover the wear of mechanical parts, take timely measures to reduce wear and tear, and extend the service life of equipment. It can also predict material fatigue, replace wearing parts in advance, avoid sudden failures, and help improve overall production quality and economic benefits.

[0086] It should be understood that in this embodiment, τ1 is the surface quality assessment influencing factor corresponding to the deviation distance of each surface monitoring point preset in the perfluoropolyether preparation equipment database, which represents the numerical value of the degree of influence of the deviation distance of each surface monitoring point on the surface quality assessment index of each component to be tested. When used, the surface quality assessment influencing factor corresponding to the deviation distance of each surface monitoring point can be directly obtained from the perfluoropolyether preparation equipment database, and the corresponding relationship can be a pre-set mapping relationship. For example, the deviation distance of each surface monitoring point and the surface quality assessment influencing factor corresponding to the deviation distance of each surface monitoring point preset in the perfluoropolyether preparation equipment database form a mapping set, and the real-time deviation distance of each surface monitoring point is input into the mapping set to obtain the surface quality assessment influencing factor corresponding to the deviation distance of each surface monitoring point, wherein the mapping relationship can be one-to-one or Many-to-one relationship, in this example, its value range is between 0 and 1; τ2 is the surface quality assessment influencing factor corresponding to the number of variable regions preset in the perfluoropolyether preparation equipment database, which represents the numerical value of the influence of the number of variable regions on the surface quality assessment index of each component to be tested. When used, the surface quality assessment influencing factor corresponding to the number of variable regions can be directly obtained from the perfluoropolyether preparation equipment database, and the corresponding relationship can be a pre-set mapping relationship. For example, the number of variable regions and the surface quality assessment influencing factors corresponding to the number of variable regions preset in the perfluoropolyether preparation equipment database form a mapping set, and the real-time number of variable regions is input into the mapping set to obtain the surface quality assessment influencing factor corresponding to the number of variable regions. The mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1.

[0087] In a specific embodiment, the surface quality evaluation index of each component to be tested is a quantitative indicator obtained by analyzing the deviation distance and the number of variation areas of each surface monitoring point of each component to be tested, and is used to quantify the surface quality of each component to be tested under low temperature conditions.

[0088] In a specific embodiment, a comprehensive analysis is performed to obtain an evaluation value of the low temperature resistance performance of the equipment. The specific analysis process is as follows: based on the structural safety evaluation index and the surface quality evaluation index of each component to be tested, a comprehensive analysis is performed to obtain an evaluation value of the low temperature resistance performance of the equipment.

[0089] Specifically, the low temperature resistance performance evaluation value of the equipment is expressed as:

[0090]

[0091] Among them, D represents the low temperature resistance performance evaluation value of the equipment, B i represents the structural safety assessment index of the i-th component to be tested, C irepresents the surface quality evaluation index of the i-th component to be tested, θ1 represents the equipment low temperature performance evaluation impact factor corresponding to the set structural safety evaluation index, θ2 represents the equipment low temperature performance evaluation impact factor corresponding to the set surface quality evaluation index, i represents the number of the component to be tested, i=1,2,3,...,m, m represents the total number of components to be tested.

[0092] In a specific embodiment, the algorithm of this embodiment combines the structural safety evaluation index of each component to be tested and the surface quality evaluation index of each component to be tested, and comprehensively analyzes to obtain the low temperature resistance performance evaluation value of the equipment. The higher the accuracy of the equipment operation, it usually means that its stability over a long period of time is also better, because accurate performance is usually accompanied by smaller fluctuations, and stability can be predicted by evaluating accuracy, that is, the accurate performance of the equipment under low temperature conditions can often reflect its stability in long-term operation. If the accuracy evaluation index of the equipment under low temperature conditions is high, it usually means that its stability at low temperatures is also good. Good accuracy usually means lower maintenance requirements, and stability is a key indicator of long-term maintenance requirements. Under low temperature conditions, a good balance between the accuracy and stability of the equipment helps to reduce maintenance costs, and a more accurate, comprehensive, and reliable low temperature resistance performance evaluation value of the equipment is obtained through comprehensive analysis.

[0093] like Figure 2 As shown, in a specific embodiment, m = 1, θ1 = 0.5, θ2 = 0.3. i =0.1, the functional relationship between the low temperature resistance performance evaluation value of the equipment and the structural safety evaluation index of each component to be tested is shown in curve a; when C i =0.5, the functional relationship between the low temperature resistance performance evaluation value of the equipment and the structural safety evaluation index of each component to be tested is shown in curve b; when C i =1, the functional relationship between the low temperature resistance performance evaluation value of the equipment and the structural safety evaluation index of each component to be tested is shown in curve c.

[0094] It should be explained that in this embodiment, two key factors, the structural safety evaluation index of each component to be tested and the surface quality evaluation index of each component to be tested, are comprehensively considered, which can comprehensively evaluate the overall performance of the component under low temperature conditions, ensuring that it can perform well in a single task and maintain stable performance in long-term use, which helps to identify and avoid components that may cause system failure at critical moments, thereby reducing the risk of the overall project, and ensuring that each component in the system can operate stably and accurately within its design range, thereby improving the reliability of the entire system, and at the same time, potential improvement points can be identified, and corresponding measures can be taken to improve the performance of the component. By weighting the influence of the structural safety evaluation index of each component to be tested and the surface quality evaluation index of each component to be tested, it reflects their relative importance in the evaluation index, and the weights of different factors can be adjusted according to different needs, so that the model has good adaptability. It is not difficult to see that the larger the structural safety evaluation index of each component to be tested or the surface quality evaluation index of each component to be tested, the greater the low temperature resistance evaluation value of the equipment. By evaluating the low-temperature resistance performance of the equipment, it can help identify potential problems that may arise in the perfluoropolyether preparation equipment under the influence of low-temperature environment during the production process, and then adjust the process parameters in time, reduce the scrap rate, improve production efficiency and resource utilization, and ensure that the perfluoropolyether products produced are of qualified quality and meet market demand and customer requirements.

[0095] It should be understood that in this embodiment, θ1 is the equipment low temperature performance evaluation influencing factor corresponding to the structural safety evaluation index preset in the perfluoropolyether preparation equipment database, which represents the numerical value of the degree of influence of the structural safety evaluation index on the equipment low temperature performance evaluation value. When used, the equipment low temperature performance evaluation influencing factor corresponding to the structural safety evaluation index can be directly obtained from the perfluoropolyether preparation equipment database, and the corresponding relationship can be a preset mapping relationship. For example, the structural safety evaluation index and the equipment low temperature performance evaluation influencing factor corresponding to the structural safety evaluation index preset in the perfluoropolyether preparation equipment database form a mapping set, and the real-time structural safety evaluation index is input into the mapping set to obtain the equipment low temperature performance evaluation influencing factor corresponding to the structural safety evaluation index. The mapping relationship can be one-to-one or many-to-one. In this example, its value The range is between 0 and 1; θ2 is the equipment low temperature performance evaluation influencing factor corresponding to the surface quality evaluation index preset in the perfluoropolyether preparation equipment database, which represents the numerical value of the influence degree of the surface quality evaluation index on the equipment low temperature performance evaluation value. When used, the equipment low temperature performance evaluation influencing factor corresponding to the surface quality evaluation index can be directly obtained from the perfluoropolyether preparation equipment database, and the corresponding relationship can be a preset mapping relationship. For example, the surface quality evaluation index and the equipment low temperature performance evaluation influencing factor corresponding to the surface quality evaluation index preset in the perfluoropolyether preparation equipment database form a mapping set, and the real-time surface quality evaluation index is input into the mapping set to obtain the equipment low temperature performance evaluation influencing factor corresponding to the surface quality evaluation index. The mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1.

[0096] In a specific embodiment, the low temperature resistance performance evaluation value of the equipment is a quantitative index obtained by analyzing the structural safety evaluation index and the surface quality evaluation index of each component to be tested, and is used to quantify the low temperature resistance performance of the equipment.

[0097] Furthermore, a low-temperature resistance evaluation is performed based on the low-temperature resistance evaluation value of the perfluoropolyether preparation equipment. The specific evaluation process is: extracting the low-temperature resistance evaluation threshold in the perfluoropolyether preparation equipment database, comparing the equipment low-temperature resistance performance evaluation value with the low-temperature resistance performance evaluation threshold, if the equipment low-temperature resistance performance evaluation value is greater than or equal to the low-temperature resistance performance evaluation threshold, then the equipment low-temperature resistance performance is evaluated as qualified; if the equipment low-temperature resistance performance evaluation value is less than the low-temperature resistance performance evaluation threshold, then the equipment low-temperature resistance is evaluated as unqualified, and the unqualified evaluation result is fed back to relevant personnel.

[0098] Specifically, the product purity of the perfluoropolyether preparation equipment is obtained, and feedback is given based on the product quality of the perfluoropolyether preparation equipment. The specific process is: if the low-temperature performance evaluation of the equipment is unqualified, the unqualified evaluation result is fed back to the relevant personnel; if the low-temperature performance evaluation of the equipment is qualified, a gas chromatograph is used to monitor the product purity of the perfluoropolyether preparation equipment, and the product purity threshold is extracted from the perfluoropolyether preparation equipment database; if the product purity is lower than the product purity threshold, the result is fed back to the relevant personnel and the process parameters are adjusted in time; if the product purity is greater than or equal to the product purity threshold, it indicates that the equipment low-temperature performance test meets the final result.

[0099] It needs to be explained that by testing before production, it is possible to avoid equipment aging, avoid the production of products with insufficient purity, avoid waste of raw materials, improve product quality, avoid greater equipment damage, and ensure that the equipment operates stably under low temperature conditions. Testing can also be carried out during the production process to promptly detect equipment problems and ensure the continuity and stability of production. This helps to promptly detect and eliminate safety hazards and reduce the risk of accidents.

[0100] It should be understood that the product purity of the perfluoropolyether preparation equipment in this embodiment refers to the purity level of the target compound in the prepared perfluoropolyether, that is, the ratio of the target compound to all other impurities. Product purity is an important indicator for measuring the quality of perfluoropolyether and is crucial to ensuring the performance and application effect of the product.

[0101] The perfluoropolyether preparation equipment database is used to store indicators such as critical thermal expansion coefficient, critical functional requirement number, critical geometric shape complexity, structural safety assessment influencing factor corresponding to pressure, structural safety assessment influencing factor corresponding to vibration frequency, structural safety assessment influencing factor corresponding to stress, deviation distance of critical surface monitoring points, number of critical variation areas, low temperature resistance performance assessment influencing factor corresponding to structural safety assessment index, low temperature resistance performance assessment influencing factor corresponding to surface quality assessment index and low temperature resistance performance assessment threshold. The data in the perfluoropolyether preparation equipment database are obtained by collecting multiple perfluoropolyether preparation equipment experimental data.

[0102] The above contents are merely examples and explanations of the structure of the present invention. The technicians in this technical field may make various modifications or additions to the specific embodiments described or replace them in a similar manner. As long as they do not deviate from the structure of the invention or exceed the scope defined by the present invention, they should all fall within the protection scope of the present invention.

Claims

1. A method for testing the low temperature resistance of a perfluoropolyether preparation device, characterized in that: include: Counting several key components of the perfluoropolyether preparation equipment, marking them as components to be tested, monitoring the characteristic parameters of each component to be tested, comprehensively analyzing to obtain the characteristic value of each component to be tested, and matching each component to be tested based on the characteristic value to obtain the number of surface monitoring points to be arranged; Perform low-temperature tests on each component to be tested, record the feedback data of several surface monitoring points of each component to be tested in real time, and comprehensively analyze to obtain the structural safety assessment index of each component to be tested. Collect the initial image and the post-test scan image of each component to be tested to obtain the image difference parameters, and comprehensively analyze to obtain the surface quality assessment index of each component to be tested. According to the structural safety evaluation index and surface quality evaluation index of each component to be tested, the low temperature resistance performance evaluation value of the equipment is obtained through comprehensive analysis; The low temperature resistance of the perfluoropolyether preparation equipment is evaluated according to the low temperature resistance evaluation value of the perfluoropolyether preparation equipment, and the product purity of the perfluoropolyether preparation equipment is obtained, and feedback is given based on the product quality of the perfluoropolyether preparation equipment.

2. The method for testing the low temperature resistance of the perfluoropolyether preparation equipment according to claim 1, characterized in that: The characteristic parameters of each component to be tested are monitored and the characteristic values ​​of each component to be tested are obtained through comprehensive analysis. The specific analysis process is as follows: The characteristic parameters include thermal expansion coefficient, functional requirement number and geometric shape complexity; Extract critical thermal expansion coefficient, critical functional requirement number and critical geometric complexity from the perfluoropolyether preparation equipment database; According to the thermal expansion coefficient, functional requirement number and geometric shape complexity of each component to be tested, the characteristic value of each component to be tested is obtained through comprehensive analysis.

3. The method for testing the low temperature resistance of the perfluoropolyether preparation equipment according to claim 1, characterized in that: The matching process is as follows: The characteristic value of each component to be tested is matched with the number of surface monitoring points corresponding to each characteristic value interval stored in the perfluoropolyether preparation equipment database to obtain the number of surface monitoring points of each component to be tested.

4. The method for testing the low temperature resistance of the perfluoropolyether preparation equipment according to claim 1, characterized in that: The comprehensive analysis obtains the structural safety evaluation index of each component to be tested. The specific analysis process is as follows: The feedback data includes pressure, vibration frequency and stress; Extract the allowable deviation pressure, allowable deviation vibration frequency and allowable deviation stress from the perfluoropolyether preparation equipment database; According to the pressure, vibration frequency and stress of several surface monitoring points of each component to be tested, a comprehensive analysis is performed to obtain the structural safety assessment index of each component to be tested.

5. The method for testing the low temperature resistance of the perfluoropolyether preparation equipment according to claim 3, characterized in that: The comprehensive analysis obtains the surface quality evaluation index of each component to be tested. The specific analysis process is as follows: The image difference parameters include the deviation distance and the number of variation areas of each surface monitoring point; The deviation distance and number of critical variation areas of each critical surface monitoring point were extracted from the perfluoropolyether preparation equipment database; According to the deviation distance and the number of variation areas of each surface monitoring point of each component to be tested, a comprehensive analysis is performed to obtain the surface quality evaluation index of each component to be tested.

6. The method for testing the low temperature resistance of the perfluoropolyether preparation equipment according to claim 1, characterized in that: The comprehensive analysis obtains the low temperature resistance performance evaluation value of the equipment, and the specific analysis process is as follows: According to the structural safety evaluation index and surface quality evaluation index of each component to be tested, a comprehensive analysis is conducted to obtain the low-temperature resistance performance evaluation value of the equipment.

7. The method for testing the low temperature resistance of the perfluoropolyether preparation equipment according to claim 1, characterized in that: The low temperature resistance performance of the perfluoropolyether preparation equipment is evaluated according to the low temperature resistance performance evaluation value of the perfluoropolyether preparation equipment. The specific evaluation process is: The low temperature resistance performance evaluation threshold is extracted from the perfluoropolyether preparation equipment database, and the equipment low temperature resistance performance evaluation value is compared with the low temperature resistance performance evaluation threshold. If the equipment low temperature resistance performance evaluation value is greater than or equal to the low temperature resistance performance evaluation threshold, the equipment low temperature resistance performance is evaluated as qualified; if the equipment low temperature resistance performance evaluation value is less than the low temperature resistance performance evaluation threshold, the equipment low temperature resistance performance is evaluated as unqualified, and the unqualified evaluation result is fed back to relevant personnel.

8. The method for testing the low temperature resistance of the perfluoropolyether preparation equipment according to claim 6, characterized in that: The low temperature resistance performance evaluation value of the equipment is a quantitative index obtained by analyzing the structural safety evaluation index and the surface quality evaluation index of each component to be tested, and is used to quantify the low temperature resistance performance of the equipment.

9. The method for testing the low temperature resistance of the perfluoropolyether preparation equipment according to claim 2, characterized in that: The specific numerical expression of the characteristic value of each component to be tested is: Among them, A i represents the characteristic value of the i-th component to be tested, S i represents the thermal expansion coefficient of the i-th component to be tested, S0 represents the set critical thermal expansion coefficient, H i represents the number of functional requirements of the i-th component to be tested, H0 represents the set critical functional requirements, F i represents the geometric shape complexity of the i-th component to be tested, F0 represents the set critical geometric shape complexity, ω1 represents the eigenvalue influence factor corresponding to the set thermal expansion coefficient, ω2 represents the eigenvalue influence factor corresponding to the set number of functional requirements, ω3 represents the eigenvalue influence factor corresponding to the set geometric shape complexity, i represents the number of the component to be tested, i=1,2,3,...,m, and m represents the total number of components to be tested.

10. The method for testing the low temperature resistance of the perfluoropolyether preparation equipment according to claim 1, characterized in that: The structural safety evaluation index of each component to be tested is specifically expressed as: Among them, B i represents the structural safety assessment index of the i-th component to be tested, e represents the natural constant, and f ijc represents the pressure of the jth surface monitoring point of the i-th component under test at the c-th time node, f i0 represents the reference standard pressure of the i-th component to be tested, Δf represents the set allowable deviation pressure, P ijc represents the vibration frequency of the jth surface monitoring point of the i-th component under test at the c-th time node, P i0 represents the reference standard vibration frequency of the i-th component to be tested, ΔP represents the set allowable deviation vibration frequency, Q ijc represents the stress at the cth time node of the jth surface monitoring point of the i-th component to be tested, Q i0 represents the reference standard stress of the i-th component to be tested, ΔQ represents the set allowable deviation stress, ρ1 represents the structural safety assessment influence factor corresponding to the set pressure deviation, ρ2 represents the structural safety assessment influence factor corresponding to the set vibration frequency deviation, ρ3 represents the structural safety assessment influence factor corresponding to the set stress deviation, i represents the number of the component to be tested, i=1,2,3,...,m, m represents the total number of components to be tested, j represents the number of surface monitoring points, j=1,2,3,...,n, n represents the total number of surface monitoring points, c represents the time node number, c=1,2,3,...,s, s represents the total number of time nodes.

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