Structure of annular conductive element resistance test equipment

Abstract

The invention discloses a structure of annular conductive element resistance test equipment, which comprises a positioning jig, a simulation carrier, a PCB (Printed Circuit Board) and an embedded part, the simulation carrier is in a frame shape, a plurality of outer conductive blocks are embedded on the simulation carrier, each outer conductive block is matched with an outer conductive pin, the PCB is connected to the bottom of the simulation carrier, the upper end of the outer conductive pin is in contact with the outer conductive block, and the lower end of the outer conductive pin is in contact with the embedded part. The outer conductive needle is in contact with the PCB, the simulation carrier is positioned on the positioning jig, a plurality of inner conductive blocks are inlaid on the inner insert, the annular conductive element is positioned on the inner side wall of the simulation carrier, the inner insert is positioned in the simulation carrier, an outer convex point of the annular conductive element is in contact with the outer conductive blocks, and an inner convex point of the annular conductive element is in contact with the inner conductive blocks. And a plurality of probes are arranged above the positioning jig and can descend to be in contact with the inner conductive block. The invention provides a structure of resistance testing equipment for an annular conducting element, and provides a hardware basis for resistance testing of the annular conducting element.

Description

Technical Field

[0001] The invention relates to product testing equipment, in particular to testing equipment for conductive elements in watches. Background Art

[0002] The electronic watch comprises a frame-shaped body, in which a plurality of electronic components are installed, and a cover plate matched with the frame-shaped body seals the electronic components in the frame-shaped body. The electronic watch is provided with twelve numerical values, which are distributed along the frame-shaped body and represent one to twelve o'clock. The inner side wall of the frame-shaped body is matched with an annular conductive element, which is provided with a notch, and the outer side wall of the conductive element is provided with twelve outer convex points, and the inner side wall is provided with eight inner convex points, and the outer convex points and the inner convex points are in contact with the corresponding electronic components to achieve conduction.

[0003] Before being assembled into an electronic watch, the resistance of the annular conductive element needs to be tested to determine whether the resistance value is within a predetermined range. During the test, the test element needs to be in electrical contact with the twelve outer convex points and eight inner convex points of the annular conductive element, and the resistance tester connected to the test element obtains the resistance value of the annular conductive element. Summary of the invention

[0004] The technical problem solved by the present invention is: how to achieve electrical contact between the detection element and the twelve outer protrusions and eight inner protrusions of the annular conductive element to detect the resistance of the annular conductive element.

[0005] In order to solve the above technical problems, the present invention provides the following technical solutions: a structure of a ring-shaped conductive element resistance testing device, including a positioning fixture, a simulation carrier, a PCB board, and an embedded component, the simulation carrier is in a frame shape, a plurality of external conductive blocks are embedded in the simulation carrier, the plurality of external conductive blocks are distributed along the circumference of the simulation carrier, each external conductive block is equipped with an external conductive needle, the PCB board is connected to the bottom of the simulation carrier, the upper end of the external conductive needle contacts the external conductive block, and the lower end of the external conductive needle contacts the conductive contact on the PCB board, the simulation carrier is positioned on the positioning fixture, the embedded component is embedded with a plurality of internal conductive blocks, the plurality of internal conductive blocks are distributed along the circumference of the embedded component, the ring-shaped conductive element is positioned on the inner side wall of the simulation carrier, the embedded component is positioned in the simulation carrier and is located in the ring-shaped conductive element, the outer protrusion of the ring-shaped conductive element contacts the outer conductive block, the inner protrusion of the ring-shaped conductive element contacts the inner conductive block, and a plurality of probes are provided above the positioning fixture, the probes can be lowered to contact the inner conductive block.

[0006] According to the above technical solution, the number of outer conductive blocks is twelve, and the number of inner conductive blocks is eight. The twelve outer conductive blocks are in contact with the twelve outer protrusions of the annular conductive element, and the eight inner conductive blocks are in contact with the eight inner protrusions of the annular conductive element. Eight probes are in contact with the eight inner conductive blocks respectively, and the probe-inner conductive block-annular conductive element-outer conductive block-outer conductive needle-PCB board-resistance detection instrument-probe constitutes a loop, and the resistance detection instrument can obtain the resistance value of the annular conductive element. Among them, the probe can be connected to the frame of the resistance testing equipment to achieve grounding. The negative pole of the resistance detection instrument is connected to the frame and grounded.

[0007] The invention provides a structure of a ring-shaped conductive element resistance testing device, which provides a hardware basis for the ring-shaped conductive element resistance testing.

[0008] The simulation carrier is provided with an inner convex structure, the inner convex structure is provided with an embedded component positioning column, and the embedded component is provided with an embedded component positioning hole matched with the embedded component positioning column.

[0009] The embedded part is provided with a probe clearance hole, and the probe can extend downward into the probe clearance hole to contact the inner conductive block.

[0010] As an improvement, the simulation carrier is used in conjunction with a claw device, and the simulation carrier is equipped with a pressure head device. The claw device includes a claw device body positioned on the simulation carrier, and a plurality of claws elastically fitted on the claw device body. The claw device body is in a frame shape, and the plurality of claws are distributed circumferentially along the claw device body. The claws can press the annular conductive element against the inner wall of the simulation carrier; the two pressure heads of the pressure head device can press the two ends of the notch of the annular conductive element against the inner wall of the simulation carrier.

[0011] The clamp claws press the annular conductive element laterally, so that the annular conductive element is close to the inner side wall of the simulation carrier. In actual operation, the opposite side of the notch of the annular conductive element is first pressed by the corresponding clamp claws, which is set as the first pressing point. Afterwards, along the annular direction of the annular conductive element, the corresponding clamp claws press the two sides of the first pressing point, and the left side of the first pressing point is set as the second pressing point, and the right side of the first pressing point is set as the third pressing point. The second pressing point first presses the annular conductive element, and then the third pressing point presses the annular conductive element. The left side of the second pressing point is set as the fourth pressing point, the right side of the third pressing point is set as the fifth pressing point, the left side of the fourth pressing point is set as the sixth pressing point, and the right side of the fifth pressing point is set as the seventh pressing point... In this way, the corresponding clamp claws press the annular conductive element in sequence on the corresponding pressing points. The last pressed points are the two ends of the notch of the annular conductive element. In this way, under the pressure of several clamp claws, the annular conductive element can fully approach the inner side wall of the simulation carrier, and each outer protrusion of the annular conductive element can fully contact with the corresponding outer conductive block. Afterwards, the two pressing heads of the pressing head device press the two ends of the notch of the annular conductive element against the inner wall of the simulation carrier. After the clamp claw device is removed, the annular conductive element can still remain close to the inner wall of the simulation carrier, and then, each external protrusion of the annular conductive element maintains full contact with the corresponding external conductive block.

[0012] The positioning fixture is provided with a positioning hole, the simulation carrier is provided with a positioning recess, and the main body of the clamp claw device is provided with a clamp claw device positioning column matched with the positioning hole, and a clamp claw device positioning protrusion matched with the positioning recess.

[0013] The jaw is provided with a jaw guide block, the jaw device body is provided with a jaw guide groove, the jaw guide block is matched in the jaw guide groove, a jaw spring is provided between the jaw guide block and the side wall of the jaw guide groove, and the jaw guide block is connected with a toggle rod. The operator pulls the toggle rod laterally, and the toggle rod drives the jaw guide block to move laterally, and the jaw spring is compressed. The operator releases the laterally pulled toggle rod, and under the action of the jaw spring, the jaw presses laterally on the annular conductive element, so that the annular conductive element is close to the inner wall of the simulation carrier.

[0014] A pressure head cylinder is installed on the side wall of the positioning fixture, the pressure head cylinder is connected to the pressure head guide block, the pressure head guide block extends into the simulation carrier, the pressure head is installed on the pressure head guide block, and the embedded part is provided with a pressure head clearance groove.

[0015] As an improvement, a cover plate is positioned on the simulation carrier, and the cover plate includes a positioning portion and an annular portion. A downward pressing protrusion is provided on the inner side wall of the annular portion, and the downward pressing protrusion can press on the annular conductive element. In actual operation, the annular conductive element is positioned in the simulation carrier, and then the cover plate is closed on the simulation carrier, and a number of downward pressing protrusions press on the annular conductive element, so that the annular conductive element sinks on the step of the inner side wall of the simulation carrier. Afterwards, the claws of the claw device press the annular conductive element laterally. In this way, the annular conductive element is accurately and stably positioned on the inner side wall of the simulation carrier, and the outer protrusions of the annular conductive element can fully contact with the corresponding outer conductive block.

[0016] After the two pressing heads of the pressing head device press the two ends of the notch of the annular conductive element against the inner side wall of the simulation carrier, remove the claw device and the cover plate, then fit the embedded component into the simulation carrier so that the eight inner conductive blocks of the embedded component contact the eight inner protrusions of the annular conductive element.

[0017] The positioning fixture is installed on the horizontal manipulator, and the gantry spans the horizontal manipulator. The gantry is provided with a lifting frame and a lifting cylinder, and the lifting cylinder is connected to the lifting frame. The probe is installed on the probe module, and the probe module is installed on the lifting frame. After the embedded component is matched in the simulation carrier, the horizontal manipulator drives the positioning fixture and the product on it to move below the probe, and the lifting cylinder drives the probe to descend. The eight probes contact the eight internal conductive blocks of the embedded component respectively, forming a circuit for detecting the resistor. In this way, the resistance detection instrument can measure the resistance value of the annular conductive element. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The present invention will be further described below in conjunction with the accompanying drawings:

[0019] Figure 1 It is a schematic diagram of the appearance of a ring-shaped conductive element resistance testing device;

[0020] Figure 2 for Figure 1 Schematic diagram of the device after the housing is hidden;

[0021] Figure 3 for Figure 2 Schematic diagram of the middle probe 50 and the mechanism for driving the probe to rise and fall;

[0022] Figure 4 is a schematic diagram of an annular conductive element 90;

[0023] Figure 5 is a schematic diagram of a simulation carrier 20 in a positioning fixture 10;

[0024] Figure 6 for Figure 5 Enlarged view of point A in the middle;

[0025] Figure 7for Figure 5 A schematic diagram of the simulation carrier 20 after the main body is hidden;

[0026] Figure 8 for Figure 7 A schematic diagram showing a partial cover plate 12 hidden in the middle;

[0027] Fig. 9 A schematic diagram of a simulation carrier 20 in the positioning fixture 10 for observation from below;

[0028] Fig.10 It is a schematic diagram of simulating a carrier 20 covered with a cover plate 80;

[0029] Fig.11 is a schematic diagram of a cover plate 80;

[0030] Fig.12 exist Fig.10 A schematic diagram of a positioning jaw device 60 based on the present invention;

[0031] Fig.13 for Fig.12 Enlarged view of point B in the middle;

[0032] Fig.14 is a schematic diagram of a clamp claw device 60;

[0033] Fig.15 It is a schematic diagram of the claw device 60 after a partial cover plate is hidden;

[0034] Fig.16 A schematic diagram of the jaw device 60 observed from below;

[0035] Fig.17 It is a schematic diagram of placing the embedded component 40 in the simulation carrier 20 after the pressing head 71 presses the annular conductive element 90;

[0036] Fig.18 is a schematic diagram of an embedded component;

[0037] Fig.19 This is a schematic diagram of the embedded component viewed from below.

[0038] Explanation of symbols in the figure:

[0039] 10. Positioning fixture; 11. Horizontal manipulator; 12. Local cover on the positioning fixture; 13. Industrial camera for photographing the product;

[0040] 20. Simulation carrier; 21. External conductive block; 22. External conductive needle; 23. Inner convex structure; 24. Inlay positioning column; 25. Positioning hole for clamping claw device; 26. Positioning recess; 27. Step on the inner side wall of the simulation carrier for positioning the annular conductive element;

[0041] 30. PCB board;

[0042] 40. Inlay; 41. Internal conductive block; 42. Inlay positioning hole; 43. Probe clearance hole; 44. Press head clearance groove;

[0043] 50. Probe; 51. Gantry; 52. Lifting frame; 53. Lifting cylinder; 54. Lifting module;

[0044] 60. Claw device; 61. Claw device body; 62. Claw; 63. Claw device positioning column; 64. Claw device positioning convex portion; 65. Claw guide block; 66. Claw spring; 67. Toggle lever;

[0045] 70. Press head device; 71. Press head; 72. Press head cylinder; 73. Press head guide block; 74. Movable block connecting the press head cylinder and the press head guide block;

[0046] 80. cover plate; 81. positioning portion; 82. annular portion; 83. pressing convex head;

[0047] 90. annular conductive element; 91. outer convex point; 92. inner convex point; 93. notch. DETAILED DESCRIPTION

[0048] Combination Figures 4 to 9 ,as well as, Figures 17 to 19 , a structure of a ring-shaped conductive element resistance test device, including a positioning fixture 10, a simulation carrier 20, a PCB board 30, and an embedded component 40, the simulation carrier is in a frame shape, a plurality of external conductive blocks 21 are embedded in the simulation carrier, the plurality of external conductive blocks are distributed along the circumference of the simulation carrier, each external conductive block is equipped with an external conductive needle 22, the PCB board is connected to the bottom of the simulation carrier, the upper end of the external conductive needle contacts the external conductive block, and the lower end of the external conductive needle contacts the conductive contact on the PCB board, the simulation carrier is positioned on the positioning fixture, the embedded component 40 is embedded with a plurality of internal conductive blocks 41, the plurality of internal conductive blocks are distributed along the circumference of the embedded component, a ring-shaped conductive element 90 is positioned on the inner side wall of the simulation carrier, the embedded component is positioned in the simulation carrier and is located in the ring-shaped conductive element, the outer protrusion 91 of the ring-shaped conductive element contacts the outer conductive block 21, the inner protrusion 92 of the ring-shaped conductive element contacts the inner conductive block 41, and a plurality of probes 50 are arranged above the positioning fixture 10, the probes can be lowered to contact the inner conductive blocks.

[0049] The number of outer conductive blocks 21 is twelve, and the number of inner conductive blocks 41 is eight. The twelve outer conductive blocks 21 are in contact with the twelve outer protrusions 91 of the annular conductive element, and the eight inner conductive blocks 41 are in contact with the eight inner protrusions 92 of the annular conductive element. Eight probes 50 are in contact with the eight inner conductive blocks 41, respectively, and the probe 50-inner conductive block 41-annular conductive element 90-outer conductive block 21-outer conductive needle 22-PCB board 30-resistance detection instrument-probe 50, forming a loop, wherein the probe can be connected to the rack of the resistance testing equipment to achieve grounding. The negative pole of the resistance detection instrument is connected to the rack and grounded. The resistance detection instrument can obtain the resistance value of the annular conductive element 90.

[0050] The simulation carrier 20 is provided with an inner convex structure 23 , on which an embedded component positioning column 24 is provided, and the embedded component 40 is provided with an embedded component positioning hole 42 matched with the embedded component positioning column.

[0051] The embedded component 40 is provided with a probe clearance hole 43 , and the probe 50 can extend downward into the probe clearance hole to contact the inner conductive block 41 .

[0052] Combination Fig.10 , Fig.11 , a cover plate 80 is positioned on the simulation carrier 20, and the cover plate includes a positioning portion 81 and an annular portion 82. A downward pressing protrusion 83 is provided on the inner side wall of the annular portion, and the downward pressing protrusion can press on the annular conductive element 90. In actual operation, the annular conductive element 90 is positioned in the simulation carrier 20, and then the cover plate 80 is covered on the simulation carrier 20, and a number of downward pressing protrusions 83 press on the annular conductive element 90, so that the annular conductive element sinks on the step of the inner side wall of the simulation carrier 20. Afterwards, the jaws 62 of the jaw device 60 described below press the annular conductive element 90 laterally. In this way, the annular conductive element is accurately and stably positioned on the inner side wall of the simulation carrier 20, and the outer protrusions 91 of the annular conductive element can fully contact with the corresponding outer conductive block 21.

[0053] Combination Figures 12 to 16 The simulation carrier 20 is used in conjunction with the claw device 60. The simulation carrier 20 is equipped with a pressure head device 70. The claw device includes a claw device body 61 positioned on the simulation carrier, and a plurality of claws 62 elastically fitted on the claw device body. The claw device body is in a frame shape, and a plurality of claws are distributed along the circumference of the claw device body. The claws can press the annular conductive element 90 against the inner wall of the simulation carrier 20; the two pressure heads 71 ​​of the pressure head device 70 can press the two ends of the notch 93 of the annular conductive element against the inner wall of the simulation carrier.

[0054] The clamp claws 62 press the annular conductive element 90 laterally, so that the annular conductive element is close to the inner wall of the simulation carrier 20. In actual operation, the opposite side of the notch 93 of the annular conductive element is first pressed by the corresponding clamp claws 62. Afterwards, along the annular direction of the annular conductive element, the corresponding clamp claws press the annular conductive element 90 on both sides of the first pressing point. The last pressed point is the two ends of the notch 93 of the annular conductive element. In this way, under the pressure of a number of annularly distributed clamp claws 62, the annular conductive element 90 can fully approach the inner wall of the simulation carrier 20, and each outer convex point 91 of the annular conductive element can fully contact with the corresponding outer conductive block 21. Afterwards, the two pressing heads 71 ​​of the pressing head device press the two ends of the notch 93 of the annular conductive element against the inner wall of the simulation carrier 20. After the clamp claw device 60 is removed, the annular conductive element 90 can still remain close to the inner wall of the simulation carrier 20, and then, each outer convex point 91 of the annular conductive element remains in full contact with the corresponding outer conductive block 21.

[0055] The positioning fixture 10 is provided with a jaw device positioning hole 25, the simulation carrier 20 is provided with a positioning recess 26, and the jaw device body 61 is provided with a jaw device positioning column 63 that cooperates with the jaw device positioning hole, and a jaw device positioning protrusion 64 that cooperates with the positioning recess.

[0056] The jaw 62 is provided with a jaw guide block 65, the jaw device body 61 is provided with a jaw guide groove, the jaw guide block is matched in the jaw guide groove, a jaw spring 66 is provided between the jaw guide block and the side wall of the jaw guide groove, and the jaw guide block is connected with a toggle rod 67. The operator pulls the toggle rod 67 laterally, and the toggle rod drives the jaw guide block 65 to move laterally, and the jaw spring 66 is compressed. The operator releases the toggle rod 67, and under the action of the jaw spring 66, the jaw 62 is laterally pressed on the annular conductive element 90, so that the annular conductive element is close to the inner wall of the simulation carrier 20.

[0057] The placement of the cover plate 80, the clamping claw device 60, and the embedded component 40 is completed manually by workers.

[0058] like Figure 8 A pressure head cylinder 72 is installed on the side wall of the positioning fixture 10, and the pressure head cylinder is connected to the pressure head guide block 73. The pressure head guide block extends into the simulation carrier 20, and the pressure head 71 is installed on the pressure head guide block. The embedded part 40 is provided with a pressure head clearance groove 44.

[0059] like Figure 2 , Figure 3The positioning fixture 10 is installed on the horizontal manipulator 11, and the gantry 51 spans the horizontal manipulator. The gantry is provided with a lifting frame 52 and a lifting cylinder 53, and the lifting cylinder is connected to the lifting frame. The probe 50 is installed on the probe module 54, and the probe module is installed on the lifting frame. After the embedded component 40 is matched in the simulation carrier 20, the horizontal manipulator 11 drives the positioning fixture 10 and the product thereon to move to the bottom of the probe 50, and the lifting cylinder drives the probe to descend. The eight probes are respectively in contact with the eight inner conductive blocks 41 of the embedded component 40 to form a circuit for detecting the resistor. In this way, the resistance detection instrument can measure the resistance value of the annular conductive element 90.

[0060] The above contents are only preferred embodiments of the present invention. For ordinary technicians in this field, according to the concept of the present invention, there will be changes in the specific implementation methods and application scopes. The contents of this specification should not be understood as limiting the present invention.

Claims

1. A structure of a resistance test device for an annular conductive element, comprising a positioning fixture (10), a simulation carrier (20), a PCB board (30), and an embedded part (40), wherein the simulation carrier is in a frame shape, a plurality of external conductive blocks (21) are embedded on the simulation carrier, the plurality of external conductive blocks are distributed along the circumference of the simulation carrier, each external conductive block is equipped with an external conductive needle (22), the PCB board is connected to the bottom of the simulation carrier, the upper end of the external conductive needle contacts the external conductive block, and the lower end of the external conductive needle contacts the conductive contact on the PCB board, and the simulation carrier is positioned on the positioning fixture, characterized in that: The embedded component (40) is inlaid with a plurality of inner conductive blocks (41), which are distributed along the circumference of the embedded component. The annular conductive element (90) is positioned on the inner side wall of the simulation carrier. The embedded component is positioned in the simulation carrier and is located in the annular conductive element. The outer convex point (91) of the annular conductive element contacts the outer conductive block (21), and the inner convex point (92) of the annular conductive element contacts the inner conductive block (41). A plurality of probes (50) are arranged above the positioning fixture (10), and the probes can be lowered to contact the inner conductive block.

2. The structure of the annular conductive element resistance testing device as claimed in claim 1, characterized in that: The simulation carrier (20) is provided with an inner convex structure (23), an inner embedded component positioning column (24) is provided on the inner convex structure, and the inner embedded component (40) is provided with an inner embedded component positioning hole (42) matched with the inner embedded component positioning column.

3. The structure of the annular conductive element resistance testing device as claimed in claim 1, characterized in that: The embedded component (40) is provided with a probe clearance hole (43), and the probe (50) can extend downward into the probe clearance hole to contact the inner conductive block (41).

4. The structure of the annular conductive element resistance testing device as claimed in claim 1, characterized in that: The simulation carrier (20) is used in conjunction with a clamp claw device (60). The simulation carrier (20) is equipped with a pressure head device (70). The clamp claw device comprises a clamp claw device body (61) positioned on the simulation carrier and a plurality of clamp claws (62) elastically fitted on the clamp claw device body. The clamp claw device body is in a frame shape. The plurality of clamp claws are distributed along the circumference of the clamp claw device body. The clamp claws can press the annular conductive element (90) against the inner side wall of the simulation carrier (20). The two pressure heads (71) of the pressure head device (70) can press the two ends of the notch (93) of the annular conductive element against the inner side wall of the simulation carrier.

5. The structure of the annular conductive element resistance testing device as claimed in claim 4, characterized in that: A clamp claw device positioning hole (25) is provided on the positioning fixture (10), a positioning recess (26) is provided on the simulation carrier (20), and a clamp claw device main body (61) is provided with a clamp claw device positioning column (63) matched with the clamp claw device positioning hole, and a clamp claw device positioning protrusion (64) matched with the positioning recess.

6. The structure of the annular conductive element resistance testing device as claimed in claim 4, characterized in that: The jaw (62) is provided with a jaw guide block (65), the jaw device body (61) is provided with a jaw guide groove, the jaw guide block is matched in the jaw guide groove, a jaw spring (66) is provided between the jaw guide block and the side wall of the jaw guide groove, and the jaw guide block is connected to a toggle rod (67).

7. The structure of the annular conductive element resistance testing device as claimed in claim 4, characterized in that: A pressure head cylinder (72) is installed on the side wall of the positioning fixture (10), and the pressure head cylinder is connected to a pressure head guide block (73). The pressure head guide block extends into the interior of the simulation carrier (20), and the pressure head (71) is installed on the pressure head guide block. The embedded component (40) is provided with a pressure head clearance groove (44).

8. The structure of the annular conductive element resistance testing device as claimed in claim 1, characterized in that: A cover plate (80) is positioned on the simulation carrier (20), the cover plate comprising a positioning portion (81) and an annular portion (82), a pressing protrusion (83) is provided on the inner side wall of the annular portion, and the pressing protrusion can be pressed on the annular conductive element (90).

9. The structure of the annular conductive element resistance testing device according to claim 1, characterized in that: The positioning fixture (10) is installed on a horizontal manipulator (11), a gantry (51) straddles the horizontal manipulator, a lifting frame (52) and a lifting cylinder (53) are provided on the gantry, the lifting cylinder is connected to the lifting frame, the probe (50) is installed on a probe module (54), and the probe module is installed on the lifting frame.

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