Inert gas protection transfer cavity and use method
By designing an inert gas protection transfer chamber and precision adjustment system, the cumbersome steps and oxidation problems during the transfer of micro samples are solved, and the rapid and accurate transfer and protection of samples are achieved.
Patent Information
- Application Number
- CN202411264358.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-10
- Publication Date
- 2024-12-27
AI Technical Summary
The existing micro sample transfer devices have cumbersome and lengthy steps in the transfer process between different devices, and have failed to effectively avoid sample oxidation problems.
An inert gas protective transfer chamber is designed, using an array probe storage chamber, a self-locking rotary sampling head and a multi-layer nested position adjustment mechanism. By pre-filled inert gas and a precision adjustment system, the sample is ensured during the transfer process. protection and accurate sampling.
It realizes the fast and accurate sample transfer process, and effectively avoids sample oxidation, simplifies sample transfer steps, and improves experimental efficiency.
Smart Images
Figure CN119186673A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of vacuum sample transfer technology, and in particular to an inert gas protection transfer chamber and a use method thereof. Background Art
[0002] Transferring trace samples is a routine operation in biological, chemical, medical and other experiments. The specimen processing device with publication number JP2002021305A provides a universal sample processing device. It provides an atmosphere-controlled glove box, two or more vacuum chambers and a sample transfer device capable of controlling the atmosphere. The application of this patent is mostly sample processing. A trace sample transfer tool with publication number CN106967583A provides a rubber wheel, a gear set, an air storage pipe, a rack, and a piston inside the shell body; an air storage pipe outlet arranged outside the shell body; and a hose and a needle holder. A trace sample transfer device with publication number CN202131081U provides a method of driving a sliding shaft to slide in a sliding cylinder through a motor to create air compression and extraction to extract trace samples and transfer them. The device describes a method of sample transfer, a transfer method of driving a sliding cylinder by a motor.
[0003] Existing technologies are mostly designed for the stability of micro-sample transfer and precise control of pipetting volume, but no design is made for the mechanism of transfer between different devices. The experimental process is cumbersome and the steps are lengthy. Summary of the invention
[0004] In response to the above technical problems, an inert gas protection transfer chamber and a use method are provided.
[0005] The technical means adopted by the present invention are as follows:
[0006] An inert gas protection transfer chamber comprises an array probe storage chamber, a transfer sealing gate valve, an array probe assembly, a self-locking rotary sampling head and a self-locking rotary sampling head position adjustment mechanism. The array probe storage chamber is filled with a preset protective gas, the transfer sealing gate valve is installed at the end of the array probe storage chamber, and the self-locking rotary sampling head position adjustment mechanism is installed at the other end of the array probe storage chamber. The self-locking rotary sampling head is arranged inside the array probe storage chamber, and the distance of its output end relative to the transfer sealing gate valve can be adjusted by the self-locking rotary sampling head position adjustment mechanism. The output end of the self-locking rotary sampling head can be detachably connected to the array probe assembly.
[0007] Furthermore, the protective gas includes an inert gas.
[0008] Furthermore, the array probe assembly includes an array probe lower end support base, an array probe upper end fixed cover plate and an array probe fixing screw. The upper surface of the array probe lower end support base is uniformly provided with a plurality of grooves parallel to its width direction along its length direction, and each groove forms a linear array arranged at equal intervals. The groove of the array probe lower end support base is a complete groove capable of accommodating sampling and ionization detection probes, or a groove matching the array probe lower end support base is provided on the bottom surface of the array probe upper end fixed cover plate. The bottom surface groove of the array probe upper end fixed cover plate and the groove of the array probe lower end support base form a complete groove capable of accommodating sampling and ionization detection probes. Screw holes are provided on the array probe lower end support base at a preset distance from the grooves, and screw holes matching the screw holes of the array probe lower end support base are also provided on the array probe upper end fixed cover plate. The array probe upper end fixed cover plate and the array probe lower end support base are detachably connected by the array probe fixing screws.
[0009] Furthermore, a protrusion is provided on one side of the support base at the lower end of the array probe of the array probe assembly, and the array probe assembly and the self-locking rotary sampling head can be separated and installed based on the cooperation between the output end of the self-locking rotary sampling head and the protrusion.
[0010] Furthermore, a protruding step structure is provided at the bottom of the support base at the lower end of the array probe of the array probe assembly, and the array probe assembly separated from the self-locking rotating sampling head is introduced into the experimental device based on the step structure.
[0011] Furthermore, the self-locking rotary sampling head position adjustment mechanism is a multi-layer nested structure, including a self-locking rotary sampling head storage cavity and a coarse position adjustment device, a linear telescopic precision adjustment component, the end of the array probe storage cavity is connected to one end of the self-locking rotary sampling head storage cavity, and the linear telescopic precision adjustment component is installed at one end of the self-locking rotary sampling head storage cavity close to the array probe storage cavity.
[0012] Furthermore, the self-locking rotary sampling head is connected to the output end of the magnetic internal connecting rod, the self-locking rotary sampling head storage chamber is specifically a magnetic support outer bracket, and the position coarse adjustment device includes a magnetic external driving component, which is sleeved on the outer wall of the magnetic support outer bracket. The magnetic external driving component can slide linearly on the magnetic support outer bracket to synchronously drive the linear sliding of the internal magnetic rod.
[0013] Furthermore, the magnetic external driving component is provided with a magnetic external locking screw, which is used to limit the magnetic external driving component to the magnetic support outer bracket after the magnetic external driving component reaches a preset position.
[0014] Furthermore, the linear telescopic precision adjustment component includes a linear telescopic bottom fixed support, a linear telescopic sliding thin rod support, a linear telescopic sliding thick rod support, a linear telescopic screw rotation drive, a linear telescopic linear drive translation, a linear telescopic top fixed support, a linear telescopic nut matching screw drive and a linear telescopic top rotation drive. The linear telescopic bottom fixed support and the linear telescopic linear drive translation are both provided with holes for the linear telescopic sliding thin rod support, the linear telescopic sliding thick rod support, the linear telescopic screw rotation drive and the magnetic support outer bracket to pass through, so that the linear telescopic sliding thin rod support, the linear telescopic sliding thick rod support, the linear telescopic screw rotation drive and the magnetic support outer bracket are arranged in parallel. The linear telescopic top fixed support is provided with a hole for the linear telescopic sliding thin rod support, the linear telescopic sliding thick rod support, the linear telescopic screw rotation drive and the magnetic support outer bracket to pass through. There are holes for the linear telescopic sliding thin rod support, the linear telescopic sliding thick rod support, and the linear telescopic screw rotation drive member to pass through. The bottom end of the linear telescopic top rotation drive member is connected to the linear telescopic screw rotation drive member. The top surface of the linear telescopic top rotation drive member is provided with a handle. The linear telescopic nut and the screw drive member are provided with a hole for the linear telescopic sliding thick rod support member to pass through. The linear telescopic nut and the screw drive member are arranged between the linear telescopic top fixed support member and the linear telescopic linear drive translation member. The magnetic support outer bracket is connected to the self-locking rotary sampling head storage cavity through a flange. The cross-sectional area of the flange is larger than the cross-sectional area of the opening of the linear telescopic bottom fixed support member. The cross-sectional area of the magnetic external drive member is larger than the cross-sectional area of the opening of the linear telescopic linear drive translation member.
[0015] The present invention also discloses a method for using the inert gas protection transfer chamber, comprising the following steps:
[0016] Based on experimental requirements, complete the separation or installation of the self-locking rotary sampling head and array probe assembly;
[0017] The array probe assembly disposed at the end of the self-locking rotary sampling head is retracted or pushed out of the array probe storage cavity through the coarse adjustment and / or fine adjustment function of the self-locking rotary sampling head position adjustment mechanism. Specifically, the magnetic internal connecting rod has three key positions:
[0018] One is the initial position of the magnetic rod, at which the array sampling probe is installed. The array sampling probe is stored in the cavity, and the gate valve can be closed or opened, and the gate valve and the array sampling probe do not interfere with each other;
[0019] The second is to manually adjust the magnetic external driving part to transfer the magnetic internal connecting rod to the initial position of the precision adjustment part, at which time the sample is separated from the array probe storage cavity and is located outside the plug valve;
[0020] The third is the start of fine adjustment. Through the rotation of the linear telescopic top rotary drive, the entire precision adjustment part is driven to move downward or upward, and the downward movement to the bottom end of the fine adjustment component is the longest position that the array sampling needle can extend.
[0021] Compared with the prior art, the present invention has the following advantages: the present invention provides a sample transfer chamber used in the sample transfer process, wherein in order to avoid the problem of oxidation of the sample during the transfer process, an inert gas protection is specially designed to provide adequate protection for the sample, and by designing a coarse adjustment and fine adjustment system, it can be ensured that after the transfer chamber is connected to other practical devices, it can quickly and accurately sample / experiment with the line of sight of the sample probe to be tested. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.
[0023] Figure 1 This is a usage diagram of the array probe assembly of the device of the present invention placed in a storage cavity.
[0024] Figure 2 This is a pattern diagram of the device array probe assembly of the present invention before being placed in the storage cavity.
[0025] Figure 3 It is a schematic diagram of the position change of the magnetic rod of the present invention.
[0026] Among them, (a) is a schematic diagram of the initial position of the magnetic rod.
[0027] (b) is a schematic diagram of the magnetic rod being lowered to the initial position for high precision adjustment.
[0028] (c) is a schematic diagram of the magnetic rod being lowered to the bottom end for high precision adjustment.
[0029] Figure 4 It is a schematic diagram of the position relationship between the magnetic rod and the internal slider of the present invention.
[0030] Among them, (a) is a schematic diagram of the position of the internal slider when the magnetic rod is in the initial position.
[0031] (b) is a schematic diagram of the position of the internal slider when the magnetic rod is lowered to the initial position for high precision adjustment.
[0032] (c) is a schematic diagram of the position of the internal slider when the magnetic rod is lowered to the bottom end of the height precision adjustment.
[0033] Figure 5 It is a schematic diagram of the explosion of the overall parts of the device of the present invention.
[0034] Figure 6 Schematic diagram of the split style of the linear telescopic precision adjustment component and the magnetic coupling rod of the present invention.
[0035] Figure 7 This is an exploded view of the linear telescopic precision adjustment component of the present invention.
[0036] Figure 8 This is an exploded view of the array probe assembly of the present invention.
[0037] Fig. 9 It is a schematic diagram of the array probe assembly and the self-locking rotary sampling head of the present invention in a decoupled state.
[0038] Fig.10 It is a schematic diagram of the locking state of the array probe assembly and the self-locking rotary sampling head of the present invention.
[0039] In the figure: 001, array probe assembly; 002, magnetic internal connecting rod; 003, linear telescopic precision adjustment assembly; 004, magnetic support outer bracket; 005, magnetic external drive; 006, magnetic drive external locking screw; 007, array probe storage chamber; 008, transfer sealing plug valve; 009, self-locking rotary sampling head; 101, array probe fixing screw; 102, array probe upper end fixing cover; 103, array probe lower end support base; 104, sampling and ionization detection probe; 301, linear telescopic top rotation drive; 302, linear telescopic linear drive translation; 303, linear telescopic sliding thin rod support; 304, linear telescopic screw rotation drive; 305, linear telescopic top fixed support; 306, linear telescopic nut matching screw drive; 307, linear telescopic sliding thick rod support; 308, linear telescopic bottom fixed support. DETAILED DESCRIPTION
[0040] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.
[0041] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means intended to limit the present invention and its application or use. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0042] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit exemplary embodiments according to the present invention. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprising" and / or "including" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.
[0043] Unless otherwise specifically stated, the relative arrangement of the parts and steps described in these embodiments, the numerical expressions and numerical values do not limit the scope of the present invention. At the same time, it should be clear that, for ease of description, the sizes of the various parts shown in the drawings are not drawn according to the actual proportional relationship. The technology, methods and equipment known to ordinary technicians in the relevant field may not be discussed in detail, but in appropriate cases, the technology, methods and equipment should be regarded as part of the authorization specification. In all examples shown and discussed here, any specific value should be interpreted as merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar numbers and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.
[0044] In the description of the present invention, it is necessary to understand that the directions or positional relationships indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom" are usually based on the directions or positional relationships shown in the drawings. They are only for the convenience of describing the present invention and simplifying the description. Unless otherwise specified, these directional words do not indicate or imply that the device or element referred to must have a specific direction or be constructed and operated in a specific direction. Therefore, they cannot be understood as limiting the scope of protection of the present invention: the directional words "inside and outside" refer to the inside and outside relative to the contours of each component itself.
[0045] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below their position devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.
[0046] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. If not otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of the present invention.
[0047] like Figures 1 to 10 As shown, an embodiment of the present invention discloses an inert gas protection transfer chamber, including an array probe storage chamber 007, a transfer sealing gate valve 008, an array probe assembly 001, a self-locking rotary sampling head 009 and a self-locking rotary sampling head position adjustment mechanism, wherein the array probe storage chamber 007 is filled with a preset protective gas, the transfer sealing gate valve 008 is installed at the end of the array probe storage chamber 007, the other end of the array probe storage chamber 007 is installed with the self-locking rotary sampling head position adjustment mechanism, the self-locking rotary sampling head 009 is arranged inside the array probe storage chamber 007, and the distance of its output end relative to the transfer sealing gate valve 008 can be adjusted by the self-locking rotary sampling head position adjustment mechanism, and the output end of the self-locking rotary sampling head 009 can be detachably connected to the array probe assembly 001. The purpose of the present invention is to connect a certain type of chamber to a glove box or a mass spectrometer, respectively, so that the internal sample holder can be well loaded with samples or tested. The key lies in the sample piece that is placed inside an array sampler.
[0048] When the gate valve is opened, it can be used to replace the gas in the chamber, and at the same time, the internal array sample piece can be removed from the outside of the cavity. The needle tip array piece can move forward and backward. In this embodiment, it is realized based on the magnetic sample transfer rod. The array needle tip can be transferred to the outside of the cavity to load the needle tip. At the same time, through the sampling of the probe sampling rod, the sample is taken from the outside to the probe storage cavity. In this process, the transfer sealing gate valve can be closed, and the transfer cavity of the present invention can be moved or placed to other positions.
[0049] Furthermore, the protective gas includes an inert gas.
[0050] Furthermore, the built-in array sample assembly 001 is composed of a series of drawn probe pieces, and the array probe assembly 001 includes an array probe lower end support base 103, an array probe upper end fixed cover plate 102 and an array probe fixing screw 101. The upper surface of the array probe lower end support base 103 is uniformly provided with a plurality of grooves parallel to its width direction along its length direction, and each groove forms a linear array arranged at equal intervals. The groove of the array probe lower end support base 103 is a complete groove capable of accommodating the sampling and ionization detection probe 104 or a groove on the array probe upper end fixed cover plate 102. The bottom surface is provided with a groove matching the array probe lower support base 103, and the bottom surface groove of the array probe upper fixed cover plate 102 and the groove of the array probe lower support base 103 form a complete groove capable of accommodating the sampling and ionization detection probe 104; screw holes are provided on the array probe lower support base 103 separated by a preset groove and a preset distance from the groove, and screw holes matching the screw holes of the array probe lower support base 103 are also provided on the array probe upper fixed cover plate 102, and the array probe upper fixed cover plate 102 and the array probe lower support base 103 are detachably connected by the array probe fixing screw 101. In this embodiment, the array probe upper fixed cover plate 102 can be a non-metallic component, which is used to fix the probe well and has a certain insulation effect.
[0051] Furthermore, a protrusion is provided on one side of the array probe lower end support base 103 of the array probe assembly, and based on the cooperation between the output end of the self-locking rotary sampling head 009 and the protrusion, the array probe assembly 001 and the self-locking rotary sampling head 009 can be separated and installed. The protrusion also facilitates the pulling of the array probe assembly for sampling. In this embodiment, the cooperation between the output end of the self-locking rotary sampling head 009 and the protrusion can be specifically to open a small hole on the protrusion, and the locking method adopted is that the self-locking rotary sampling head grabs the array probe sampling, wherein the grabbing method is to lock the array sampling assembly by rotating in one direction, and at the same time, the array sampling device is unhooked by rotating in the opposite direction. In other optional embodiments, a pin structure can also be provided to facilitate the installation and separation of the output end of the self-locking rotary sampling head 009 and the protrusion.
[0052] Furthermore, the bottom of the array probe lower end support base 103 of the array probe assembly is provided with a protruding step structure, based on which the array probe assembly 001 separated from the self-locking rotating sampling head 009 is introduced into the experimental device. Accordingly, the experimental device has a mounting seat or a sliding seat that matches the step structure.
[0053] Furthermore, the self-locking rotary sampling head position adjustment mechanism is a multi-layer nested structure, the core of which is to place the arrayed sampling probes therein to play a protective role. And it enables the arrayed probes to move linearly in one dimension back and forth in the storage cavity. Specifically, it includes a self-locking rotary sampling head storage cavity and a position coarse adjustment device, a linear telescopic precision adjustment component 003, the end of the array probe storage cavity 007 is connected to one end of the self-locking rotary sampling head storage cavity, and the linear telescopic precision adjustment component 003 is installed in the self-locking rotary sampling head storage cavity near the end of the array probe storage cavity 007.
[0054] Furthermore, the self-locking rotary sampling head 009 is connected to the output end of the magnetic internal connecting rod 002, the self-locking rotary sampling head storage chamber is specifically a magnetic support outer bracket 004, and the position coarse adjustment device includes a magnetic external driving member 005, which is sleeved on the outer wall of the magnetic support outer bracket 004, and the magnetic external driving member 005 can slide linearly on the magnetic support outer bracket 004, synchronously driving the linear sliding of the internal magnetic rod. Then, through external dragging, the array sampling probe assembly slides significantly within a certain range.
[0055] Furthermore, the magnetic external driving member 005 is provided with a magnetic external locking screw 006, which is used to limit the magnetic external driving member 005 to the magnetic support outer bracket 004 after the magnetic external driving member 005 reaches the preset position. By holding the magnetic external driving member 005, it can be moved within a relatively wide range of distances. When it is adjusted to a distance and wants to be locked, the position of the magnetic external driving member 005 is tightened by the external locking screw 006 of the magnetic external driving member 005, and a position limit of the array sample support is realized at the same time. When it is necessary to move the magnetic external driving member 005, the screw is loosened to achieve sliding again. When its position reaches the initial position of fine adjustment, the position of the magnetic link rod is finely adjusted by adjusting the telescopic precision adjustment component, and the adjustment accuracy can be achieved below 0.1mm.
[0056] Furthermore, the linear telescopic precision adjustment component 003 includes a linear telescopic bottom fixed support 308, a linear telescopic sliding thin rod support 303, a linear telescopic sliding thick rod support 307, a linear telescopic screw rotation drive 304, a linear telescopic linear drive translation 302, a linear telescopic top fixed support 305, a linear telescopic nut matching screw drive 306 and a linear telescopic top rotation drive 301, and the linear telescopic bottom fixed support 308 and the linear telescopic linear drive translation 302 are both provided with holes for the linear telescopic sliding thin rod support 303, the linear telescopic sliding thick rod support 307, the linear telescopic screw rotation drive 304 and the magnetic support outer bracket 004 to pass through, and the linear telescopic sliding thin rod support 303, the linear telescopic sliding thick rod support 307, the linear telescopic screw rotation drive 304 and the magnetic support outer bracket 004 are arranged in parallel, and the linear telescopic top fixed support 305 is provided with a linear telescopic nut matching screw drive 306 and a linear telescopic top rotation drive 301. A hole is provided on 305 for the linear telescopic sliding thin rod support 303, the linear telescopic sliding thick rod support 307, and the linear telescopic screw rotation driver 304 to pass through. The bottom end of the linear telescopic top rotation driver 301 is connected to the linear telescopic screw rotation driver 304. The top surface of the linear telescopic top rotation driver 301 is provided with a handle. A hole is provided on the linear telescopic nut and screw driver 306 for the linear telescopic sliding thick rod support 307 to pass through. The linear telescopic nut and screw driver 306 are arranged between the linear telescopic top fixed support 305 and the linear telescopic linear drive translation member 302. The magnetic support outer bracket 004 is connected to the storage cavity of the self-locking rotary sampling head 009 through a flange. The cross-sectional area of the flange is larger than the cross-sectional area of the opening of the linear telescopic bottom fixed support 308. The cross-sectional area of the magnetic external driver 005 is larger than the cross-sectional area of the opening of the linear telescopic linear drive translation member 302. The magnetic external driving member 005 can be directly seated on the linear telescopic linear driving translation member 302 by gravity, that is, the limit position of the magnetic external driving member. The magnetic external driving member 005 can also be adjusted manually to reach a preset position.
[0057] By rotating the handle driving part at the top, the screw is driven to rotate, thereby driving the telescopic nut to drive the mating part, and driving the bottom driving translation part to move up and down. In order to achieve better adjustment accuracy, one manual rotation of 1 circle adjusts the height by 1mm. As an extended implementation method, it can not only be rotated manually, but also can be matched with a servo motor to achieve automatic rotation.
[0058] The embodiment of the present invention also discloses a method for using the inert gas protection transfer chamber, comprising the following steps:
[0059] Based on the experimental requirements, the self-locking rotary sampling head 009 and the array probe assembly 001 are separated or installed;
[0060] The array probe assembly 001 disposed at the end of the self-locking rotary sampling head 009 is retracted or pushed out of the array probe storage cavity 007 through the coarse adjustment and / or fine adjustment function of the position adjustment mechanism of the self-locking rotary sampling head 009. Specifically, the magnetic internal connecting rod 002 has three key positions:
[0061] One is the initial position of the magnetic rod, at which the array sampling probe is installed. The array sampling probe is stored in the cavity, and the gate valve can be closed or opened, and the gate valve and the array sampling probe do not interfere with each other;
[0062] The second is to manually adjust the magnetic external driving part 005 to transfer the magnetic internal connecting rod 002 to the initial position of the precision adjustment part, at which time the sample is separated from the array probe storage cavity 007 and is located outside the gate valve;
[0063] The third is the start of fine adjustment, through the rotation of the linear telescopic top rotary drive 301, the entire precision adjustment component is driven to move downward or upward, wherein the downward movement to the bottom end of the fine adjustment component is the longest position that the array sampling needle can extend.
[0064] If you want to restore the telescopic rod and install the probe assembly back into the cavity, you can manually pull up the magnetic external drive. Let the entire device be used in a horizontal state, and add a force to the magnetic external drive. At this time, the entire device can be used vertically under the action of gravity. But remember not to use the device upside down.
[0065] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.
Claims
1. An inert gas protection transfer chamber, characterized in that: The invention comprises an array probe storage cavity (007), a transfer sealing gate valve (008), an array probe assembly (001), a self-locking rotary sampling head (009) and a self-locking rotary sampling head position adjustment mechanism. The array probe storage cavity (007) is filled with a preset protective gas. The transfer sealing gate valve (008) is installed at the end of the array probe storage cavity (007). The other end of the array probe storage cavity (007) is installed with the self-locking rotary sampling head position adjustment mechanism. The self-locking rotary sampling head (009) is arranged inside the array probe storage cavity (007) and the distance of its output end relative to the transfer sealing gate valve (008) can be adjusted by the self-locking rotary sampling head position adjustment mechanism. The output end of the self-locking rotary sampling head (009) can be detachably connected to the array probe assembly (001).
2. The inert gas protection transfer chamber according to claim 1, characterized in that: The protective gas includes an inert gas.
3. The inert gas protection transfer chamber according to claim 1, characterized in that: The array probe assembly (001) comprises an array probe lower end support base (103), an array probe upper end fixed cover plate (102) and an array probe fixing screw (101); the upper surface of the array probe lower end support base (103) is uniformly provided with a plurality of grooves parallel to its width direction along its length direction, and each groove forms a linear array arranged at equal intervals; the groove of the array probe lower end support base (103) is a complete groove capable of accommodating a sampling and ionization detection probe (104), or a groove is provided on the bottom surface of the array probe upper end fixed cover plate (102) to cooperate with the array probe lower end support base (104). 3), the bottom surface groove of the array probe upper end fixing cover plate (102) and the groove of the array probe lower end supporting base (103) form a complete groove capable of accommodating the sampling and ionization detection probe (104); screw holes are provided on the array probe lower end supporting base (103) separated by a preset groove and a preset distance from the groove, and screw holes matching the screw holes of the array probe lower end supporting base (103) are also provided on the array probe upper end fixing cover plate (102), and the array probe upper end fixing cover plate (102) and the array probe lower end supporting base (103) are detachably connected by the array probe fixing screw (101).
4. The inert gas protection transfer chamber according to claim 1, characterized in that: A protrusion is provided on one side of the support base (103) at the lower end of the array probe of the array probe assembly, and the array probe assembly (001) and the self-locking rotary sampling head (009) can be separated and installed based on the cooperation between the output end of the self-locking rotary sampling head (009) and the protrusion.
5. The inert gas protection transfer chamber according to claim 1, characterized in that: The bottom of the array probe lower end support base (103) of the array probe assembly is provided with a protruding step structure, and the array probe assembly (001) separated from the self-locking rotating sampling head (009) is introduced into the experimental device based on the step structure.
6. The inert gas protection transfer chamber according to claim 1, characterized in that: The self-locking rotary sampling head position adjustment mechanism is a multi-layer nested structure, comprising a self-locking rotary sampling head storage cavity, a position coarse adjustment device, and a linear telescopic precision adjustment component (003). The end of the array probe storage cavity (007) is connected to one end of the self-locking rotary sampling head storage cavity, and the linear telescopic precision adjustment component (003) is installed at one end of the self-locking rotary sampling head storage cavity close to the array probe storage cavity (007).
7. The inert gas protection transfer chamber according to claim 6, characterized in that: The self-locking rotary sampling head (009) is connected to the output end of the magnetic internal connecting rod (002); the storage chamber of the self-locking rotary sampling head is specifically a magnetic support outer bracket (004); the position coarse adjustment device comprises a magnetic external driving member (005); the magnetic external driving member (005) is sleeved on the outer wall of the magnetic support outer bracket (004); the magnetic external driving member (005) can perform linear sliding on the magnetic support outer bracket (004) to synchronously drive the linear sliding of the internal magnetic rod.
8. The inert gas protection transfer chamber according to claim 7, characterized in that: The magnetic external driving component (005) is provided with a magnetic driving external locking screw (006) for limiting the magnetic external driving component (005) on the magnetic support outer bracket (004) after the magnetic external driving component (005) reaches a preset position.
9. The inert gas protection transfer chamber according to claim 7, characterized in that: The linear telescopic precision adjustment assembly (003) comprises a linear telescopic bottom fixed support (308), a linear telescopic sliding thin rod support (303), a linear telescopic sliding thick rod support (307), a linear telescopic screw rotation drive (304), a linear telescopic linear drive translation member (302), a linear telescopic top fixed support (305), a linear telescopic nut matching screw drive (306) and a linear telescopic top rotation drive (301), wherein the linear telescopic bottom fixed support (308) The linear telescopic linear drive translation member (302) is provided with holes for the linear telescopic thin sliding rod support member (303), the linear telescopic thick sliding rod support member (307), the linear telescopic screw rotation drive member (304) and the magnetic support outer bracket (004) to pass through, and the linear telescopic thin sliding rod support member (303), the linear telescopic thick sliding rod support member (307), the linear telescopic screw rotation drive member (304) and the magnetic support outer bracket (004) are arranged in parallel, and the linear telescopic top fixed support ... The support member (305) is provided with holes for the linear telescopic sliding thin rod support member (303), the linear telescopic sliding thick rod support member (307), and the linear telescopic screw rotation drive member (304) to pass through. The bottom end of the linear telescopic top rotation drive member (301) is connected to the linear telescopic screw rotation drive member (304). The top surface of the linear telescopic top rotation drive member (301) is provided with a handle. The linear telescopic nut matching screw drive member (306) is provided with a hole for the linear telescopic sliding thick rod support member (307). ) through a hole, the linear telescopic nut cooperates with the screw drive member (306) and is arranged between the linear telescopic top fixed support member (305) and the linear telescopic linear drive translation member (302), the magnetic support outer bracket (004) is connected to the self-locking rotary sampling head storage chamber through a flange, the cross-sectional area of the flange is larger than the cross-sectional area of the opening of the linear telescopic bottom fixed support member (308), and the cross-sectional area of the magnetic external drive member (005) is larger than the cross-sectional area of the opening of the linear telescopic linear drive translation member (302).
10. A method for using the inert gas protection transfer chamber according to any one of claims 1 to 9, characterized in that: The steps include: Based on the experimental requirements, the self-locking rotary sampling head (009) and the array probe assembly (001) are separated or installed; The array probe assembly (001) disposed at the end of the self-locking rotary sampling head (009) is retracted or pushed out of the array probe storage cavity (007) through the coarse adjustment and / or fine adjustment function of the position adjustment mechanism of the self-locking rotary sampling head (009). Specifically, the magnetic internal connecting rod (002) has three key positions: One is the initial position of the magnetic rod, at which the array sampling probe is installed. The array sampling probe is stored in the cavity, and the gate valve can be closed or opened, and the gate valve and the array sampling probe do not interfere with each other; The second is to manually adjust the magnetic external driving part (005) to transfer the magnetic internal connecting rod (002) to the initial position of the precision adjustment part, at which time the sample is separated from the array probe storage cavity (007) and is located outside the plug valve; The third is the start of fine adjustment, through the rotation of the linear telescopic top rotary drive member (301), the entire precision adjustment member is driven to move downward or upward, wherein the downward movement to the bottom end of the fine adjustment assembly is the longest position that the array sampling needle can extend.