Method for processing air interface test data and electronic device

Abstract

The embodiment of the application provides a kind of air interface test data processing method and electronic equipment, it is related to data processing field, can improve the precision of air interface test data under the premise of not increasing the time length of OTA test.The method comprises: obtaining first data.According to lobe width, air interface test data and the position data of each interpolation point, the associated sampling point of each interpolation point is determined.According to the associated sampling point of interpolation point and the spherical center angle corresponding to interpolation point, and the radio frequency parameter of the associated sampling point of interpolation point, the radio frequency parameter of interpolation point is determined.The radio frequency parameter of interpolation point is positively correlated with the radio frequency parameter of associated point of interpolation point, and negatively correlated with the spherical center angle corresponding to the associated sampling point of interpolation point and interpolation point.

Description

TECHNICAL FIELD

[0001] Embodiments of the present application relate to the field of data processing, and in particular to a method for processing air interface test data and an electronic device. BACKGROUND

[0002] In the field of communication testing, OTA (over the air) testing is a commonly used method for testing the communication performance of an antenna. In OTA testing, a test instrument is connected to a DUT (device under test) through an air interface. The test instrument tests the DUT to obtain air interface test data that reflects the overall radiation performance and reception performance of the DUT. Exemplarily, the OTA testing can set sampling points on a three-dimensional sphere with the DUT as the center of the sphere. The test instrument detects the radio frequency parameters of the sampling points to determine the air interface test data. It should be understood that the more the number of sampling points, the smaller the sampling interval, and the higher the precision of the air interface test data.

[0003] However, the time length of the OTA testing is directly proportional to the number of sampling points, and the number of sampling points is directly proportional to the square of the sampling interval. Therefore, when the sampling precision is improved, i.e., the sampling interval is reduced, the time length of the OTA testing will be greatly increased. For example, if the sampling interval is reduced from 5° to 1°, the time length of the OTA testing will be about 25 times the original time. In this way, the battery of the DUT can not be able to support a complete high-precision OTA test.

[0004] Therefore, how to improve the precision of the air interface test data without increasing the time length of the OTA testing has become a problem to be solved. SUMMARY

[0005] To solve the above problems, embodiments of the present application provide a method for processing air interface test data and an electronic device, which can improve the precision of the air interface test data without increasing the time length of the OTA testing.

[0006] To achieve the above object, embodiments of the present application adopt the following technical solutions:

[0007] In a first aspect, a method for processing air interface test data is provided. The method comprises: obtaining first data. The first data comprises at least air interface test data of an antenna under test, position data of each interpolation point, and lobe width of the antenna under test. The air interface test data comprises position data of each sampling point on a sampling sphere and radio frequency parameters of the antenna under test at each sampling point. The center of the sampling sphere is the antenna under test. Each interpolation point is located on the sampling sphere. Each interpolation point is associated with one or more sampling points according to the lobe width, the air interface test data, and the position data of each interpolation point. The corresponding central angle of each interpolation point is less than or equal to one-half of the central angle corresponding to the lobe width and the central angle corresponding to adjacent sampling points in the air interface test data. The radio frequency parameters of each interpolation point are determined according to the corresponding central angle of each interpolation point and the radio frequency parameters of the associated sampling points of each interpolation point. The radio frequency parameters of each interpolation point are positively correlated with the radio frequency parameters of the associated sampling points of each interpolation point and negatively correlated with the corresponding central angle of each interpolation point.

[0008] According to the scheme, the density of sampling points on the sampling sphere is increased by interpolating the regions between the sampling points on the sampling sphere and accurately estimating the radio frequency parameters of the interpolation points according to the radio frequency parameters of the sampling points near the interpolation points, so that the interpolation points can serve as new sampling points, thereby improving the accuracy of the air interface test data without increasing the time length of the OTA test.

[0009] In some possible implementation manners, the first data further comprises a darkroom radius, an antenna aperture of the antenna under test, and a wavelength of electromagnetic waves transmitted and received by the antenna under test. The associated sampling points of each interpolation point are determined according to the lobe width, the air interface test data, and the position data of each interpolation point, comprising: determining the associated sampling points of each interpolation point according to the lobe width, the air interface test data, and the position data of each interpolation point in a case where a prior condition is satisfied. The prior condition comprises at least that the central angles corresponding to adjacent sampling points in the air interface test data are equal. The central angles corresponding to adjacent sampling points in the air interface test data are less than one-half of the central angle corresponding to the lobe width and 7.5 degrees. The product of one-half of the darkroom radius and the wavelength of the electromagnetic waves is greater than twice the square of the antenna aperture.

[0010] In some possible implementation manners, the first data is obtained by: performing air interface test on the antenna under test according to a preset sampling rule to obtain the air interface test data; performing simulation test on the antenna under test to obtain the lobe width; and uniformly interpolating the regions between the sampling points according to a preset interpolation rule to obtain the position data of each interpolation point.

[0011] In some possible implementation manners, the determining the associated sampling point of each interpolation point according to the lobe width, the air interface test data, and the position data of each interpolation point comprises: determining a first central angle. The first central angle is a smaller one of a central angle corresponding to the adjacent sampling point pair and a central angle corresponding to one-half of the lobe width. The associated region of each interpolation point is determined according to the first central angle and the position data of each interpolation point. Any sampling point in the associated region of the interpolation point corresponds to a central angle smaller than or equal to the first central angle. The associated sampling point of each interpolation point is determined according to the associated region of the interpolation point. The sampling point in the associated region of the interpolation point is the associated sampling point of the interpolation point.

[0012] In some possible implementation manners, the position data of the sampling point refers to the coordinates of the sampling point in a rectangular coordinate system. The horizontal axis of the rectangular coordinate system is the azimuth angle of the sampling point in a spherical coordinate system with the measured antenna as the center, and the vertical axis of the rectangular coordinate system is the elevation angle of the sampling point in the spherical coordinate system. The position data of the interpolation point refers to the coordinates of the interpolation point in the rectangular coordinate system.

[0013] In some possible implementation manners, the determining the associated sampling point of each interpolation point according to the associated region of the interpolation point comprises: determining an analytical function of the boundary of the associated region of the interpolation point in the rectangular coordinate system. The associated sampling point of each interpolation point is determined according to the position data of the interpolation point and the analytical function. The associated sampling point of the interpolation point satisfies: the position data of the interpolation point, the first central angle, and the function value of the analytical function after substituting the position data of the associated sampling point of the interpolation point into the analytical function is greater than 0.

[0014] In some possible implementation manners, the determining the radio frequency parameter of the interpolation point according to the associated sampling point of the interpolation point, the central angle corresponding to the interpolation point, and the radio frequency parameter of the associated sampling point of the interpolation point comprises: determining the weight of each associated sampling point of the interpolation point according to the central angle corresponding to the interpolation point. The weight of the associated sampling point of the interpolation point is negatively correlated with the central angle corresponding to the interpolation point. The weighted average value of the radio frequency parameters of the associated sampling points of the interpolation point is calculated based on the weight of each associated sampling point of the interpolation point, to obtain the radio frequency parameter of the interpolation point.

[0015] In a second aspect, an electronic device is provided, including: one or more processors, and one or more memories. The one or more memories are coupled to the one or more processors, and the one or more memories store a computer program. When the one or more processors execute the computer program, the electronic device performs the method for processing air interface test data according to any one of the first aspect.

[0016] In a third aspect, a computer readable storage medium is provided, and the computer readable storage medium stores a computer program. When the computer program is executed by a processor, the method for processing air interface test data according to any one of the first aspect is implemented.

[0017] In a fourth aspect, a computer program product is provided, comprising a computer program which, when executed by a processor, implements the method for processing air interface test data according to any one of the first aspect.

[0018] It should be understood that the technical features of the technical solutions provided in the above-mentioned second aspect, third aspect and fourth aspect can correspond to the method for processing air interface test data provided in the first aspect and possible designs thereof, and thus similar beneficial effects can be achieved, which will not be described here again. BRIEF DESCRIPTION OF DRAWINGS

[0019] Figure 1 A schematic diagram of an air interface test device provided by an embodiment of the present application;

[0020] Figure 2 A schematic diagram of an electronic device provided by an embodiment of the present application;

[0021] Figure 3 A flowchart of a method for processing air interface test data provided by an embodiment of the present application;

[0022] Figure 4 A distribution diagram of a part of sampling points and interpolation points on a sampling spherical surface provided by an embodiment of the present application;

[0023] Figure 5 A distribution diagram of a part of sampling points and interpolation points in a rectangular coordinate system provided by an embodiment of the present application;

[0024] Figure 6 A lobe width diagram of a measured antenna provided by an embodiment of the present application;

[0025] Figure 7 A flowchart of a method for determining associated sampling points of an interpolation point provided by an embodiment of the present application;

[0026] Figure 8 A diagram of an associated region provided by an embodiment of the present application;

[0027] Figure 9 Another diagram of an associated region provided by an embodiment of the present application;

[0028] Figure 10 A diagram of a distance between an interpolation point and an associated sampling point provided by an embodiment of the present application. DETAILED DESCRIPTION

[0029] The terms "first", "second", and "third" and the like in the embodiments of the present application are used to distinguish different objects, rather than to limit a particular order. In addition, the words "exemplary" or "for example" are used to mean serving as an example, instance, or illustration. Any embodiment or design solution described as "exemplary" or "for example" in the embodiments of the present application should not be construed as being more preferred or advantageous than other embodiments or design solutions. Rather, the use of the words "exemplary" or "for example" is intended to present related concepts in a specific way.

[0030] To facilitate understanding of the air interface test data processing method provided by the embodiments of the present application, the process of obtaining air interface test data, i.e., the process of OTA test, will be introduced first.

[0031] Reference is made to Figure 1 A schematic diagram of an air interface test device provided by the embodiments of the present application is shown. As shown in Figure 1 The device includes a test instrument 101, a darkroom 102, a plurality of sampling probes 103, and the sampling probes 103 are in communication connection with the test instrument 101. In the air interface test, a device under test 104 (i.e., DUT) is arranged in the darkroom 102. The plurality of sampling probes 103 are uniformly distributed on a spherical surface with the device under test 104 as the spherical center, and the sampling probes 103 are arranged at each sampling point in the OTA test.

[0032] In the process of air interface test, the darkroom 102 is used to shield the electromagnetic interference from the outside world, and to provide a test environment for the OTA test to be electromagnetically isolated from the outside world. The sampling probes 103 are used to collect the radio frequency parameters of the device under test 104 at the sampling points. The radio frequency parameters refer to parameters that can reflect the radiation performance and / or reception performance of the device under test 104, such as the transmission power, the effective isotropic radiated power (EIRP), the total radiated power (TRP), the reception sensitivity, etc. The test instrument 101 is used to record the radio frequency parameters of the device under test 104 at each sampling point, i.e., the radio frequency parameters collected by each sampling probe 103. The data recorded by the test instrument 101 is the air interface test data.

[0033] In the embodiments of the present application, the air interface test data can include coordinates of each sampling point, radio frequency parameters of each sampling point, etc. The coordinates of each sampling point can be coordinates of each sampling point in a spherical coordinate system with the device under test as the center of the sphere, or coordinates of each sampling point in a rectangular coordinate system with an azimuth angle of each sampling point in a spherical coordinate system with the device under test as the center of the sphere as the horizontal coordinate and an elevation angle as the vertical coordinate. In the embodiments of the present application, the coordinates of each sampling point can also be referred to as position data of each sampling point. The included angle between the line connecting one of the adjacent sampling points and the device under test and the line connecting the other sampling point and the device under test can be referred to as a sampling interval, which is used to identify the sampling density in the air interface test process. It should be understood that the smaller the sampling interval, the greater the number of sampling points on the spherical surface with the device under test as the center, the smaller the sampling interval, the greater the sampling density, and the higher the accuracy of the obtained air interface test data.

[0034] The test duration of the air interface test data is greatly affected by the sampling interval. For example, if the sampling interval is reduced by 5 times, the test duration of the air interface test data will increase by about 25 times. However, in the OTA test, the device under test is usually an antenna in an electronic device such as a mobile phone or a tablet, and the battery power of the electronic device is limited and cannot support a complete high-precision OTA test at one time.

[0035] To solve the above problems, the embodiments of the present application provide a processing method of air interface test data, which can improve the accuracy of the air interface test data without increasing the test duration.

[0036] The processing method of air interface test data provided by the embodiments of the present application is applied to an electronic device. The electronic device can be a test instrument, or a mobile phone, a computer, a notebook, a tablet, etc., without limitation. The air interface test data refers to the air interface test data of a device under test (DUT), and the DUT can be an electronic device such as a mobile phone, a tablet, a watch, a notebook, a computer, etc., which is provided with an antenna.

[0037] As an example, please refer to Figure 2 , which is a schematic diagram of an electronic device provided by the embodiments of the present application. The processing method of air interface test data provided by the embodiments of the present application can be applied to the electronic device 200 as shown in Figure 2 . The composition of the DUT in the embodiments of the present application can also be shown in the electronic device 200 as shown in Figure 2 .

[0038] As shown in Figure 2 , the electronic device 200 can include a processor 201, a communication module 202, and an antenna module 203. The processor 201 can be connected with the communication module 202, and the communication module 202 can also be connected with the antenna module 203.

[0039] The processor 201 can include one or more processing units. Exemplarily, the processing unit can be an application processor (AP), a modem processor, a graphics processing unit (GPU), an image signal processor (ISP), a controller, a memory, a video stream codec, a digital signal processor (DSP), a baseband processor, a neural-network processing unit (NPU), etc. Different processing units can be independent devices or integrated in one or more processors 201.

[0040] In some possible implementation manners, the method for processing air interface test data provided by the embodiments of the present application can be applied to the processor 201 in the electronic device 200.

[0041] The communication module 202 can include at least one filter, switch, power amplifier, low noise amplifier (LNA), modem, etc. (not shown in the figure). The communication module 202 is mainly used for the communication solution of the electronic device, such as the wireless communication solution, etc. Figure 2

[0042] One or more antennas can be included in the antenna module 203. The antenna is used to transmit and receive electromagnetic waves. Each antenna can be used to cover a single or multiple communication frequency bands. Different antennas can also be multiplexed to improve the utilization of the antenna.

[0043] As shown in Figure 2 In some possible implementation manners, the processor 201 can further include an internal memory 211. The internal memory 211 can be used to store computer executable program codes, and the executable program codes include instructions. The processor 201 executes various function applications and data processing of the electronic device 200 by running the instructions stored in the internal memory 211, such as executing the method for processing air interface test data provided by the embodiments of the present application.

[0044] It should be understood that the structure illustrated in the embodiments does not constitute a specific limitation on the electronic device 200. In other embodiments, the electronic device 200 can include more or fewer components than those illustrated, or combine certain components, or split certain components, or different arrangement of components. The illustrated components can be implemented in hardware, software, or a combination of software and hardware.

[0045] ​Based on the above description of the composition of the electronic device, the method for processing air interface test data provided by the embodiments of the present application is introduced. It should be noted that the embodiments of the present application can be applied to test instruments in air interface test devices, and can also be applied to electronic devices such as mobile phones, computers, notebooks, and cloud servers. For example, the electronic device can obtain air interface test data through the test instrument in the air interface test device and execute the method for processing air interface test data provided by the embodiments of the present application.

[0046] Reference is made to Figure 3 , a flowchart of the method for processing air interface test data provided by the embodiments of the present application. As Figure 3 shown, the flowchart can include the following steps.

[0047] S301, obtaining first data.

[0048] The first data at least includes air interface test data of a device under test, position data of each interpolation point, lobe width of the device under test, etc. In the embodiments of the present application, the device under test can include but is not limited to an antenna under test, and the device under test can also be referred to as a DUT or other names, which will not be described in subsequent embodiments. Taking the device under test as an antenna under test for example, the first data can at least include air interface test data of the antenna under test, position data of each interpolation point of the antenna under test, lobe width of the antenna under test, etc.

[0049] The position data of each interpolation point of the antenna under test is used to indicate the position of each interpolation point on a sampling sphere, such as coordinates, etc. The sampling sphere refers to a three-dimensional sphere with the antenna under test as the center in OTA testing. The interpolation points are located on the sampling sphere and distributed between the sampling points. The lobe width of the antenna under test can be obtained by pre-testing or simulating the antenna under test before OTA testing, and is used to indicate the angle width of the main lobe peak value of the antenna pattern. That is, in the embodiments of the present application, the lobe width of the antenna under test can be an actual measured lobe width or a simulated lobe width. In addition, when pre-testing or simulating the antenna under test, other information of the antenna under test can also be obtained, such as the style of the antenna under test, etc. The style of the antenna under test is used to determine the polarization characteristics, the approximate lobe direction, etc. of the antenna under test.

[0050] In some possible implementation manners, when the tested antenna is a directional antenna, the first data can further include a general lobe direction of the tested antenna. The general lobe direction is used to indicate a direction in which the directional antenna radiates and receives signals. In this way, the general lobe direction of the tested antenna can be tested in the subsequent OTA test, thereby saving test resources. It should be understood that, when the general lobe direction of the directional antenna is tested in the OTA test, the sampling points in the air interface test data are distributed on the general lobe direction of the directional antenna on a sampling sphere. The sampling sphere refers to a three-dimensional sphere with the tested antenna as the center in the OTA test.

[0051] In some possible implementation manners, the first data can further include a polarization mode of the tested antenna, so that the OTA test measures a component of the radio frequency parameter of the tested antenna at the sampling point in a certain polarization direction. For example, the first data indicates that the tested antenna is horizontally polarized, and then the OTA test can only measure the horizontally polarized component of the radio frequency parameter of the tested antenna at the sampling point. In this way, test resources can be saved.

[0052] In the embodiments of the present application, the lobe width, pattern, polarization characteristics, general lobe direction, and the like of the tested antenna can be collectively referred to as prior information of the tested antenna.

[0053] The air interface test data of the tested antenna can be data obtained by pre-testing the tested antenna in the OTA test. For example, the air interface test data of the tested antenna can be obtained by pre-sampling the radio frequency parameter of the tested antenna at each sampling point on a sampling sphere. The sampling sphere refers to a three-dimensional sphere with the tested antenna as the center in the OTA test, and the sampling points on the sampling sphere are determined according to a preset sampling rule. For example, the preset sampling rule is to uniformly sample at an interval of 6° on the sampling sphere. Then, each sampling point satisfies that the angle between the line connecting the sampling point and the center of the sampling sphere is 6°.

[0054] In the embodiments of the present application, the air interface test data of the tested antenna needs to satisfy prior conditions. The prior conditions at least include the following three conditions: the sampling interval in the air interface test data is less than a center angle corresponding to a half lobe width and 7.5°; each sampling point in the air interface test data is uniformly distributed; and the air interface test data is far field data. Details are described below.

[0055] The half lobe width refers to half of the lobe width of the tested antenna. The center angle corresponding to the half lobe width refers to the angle between the line connecting two points on the sampling sphere with a distance of the half lobe width and the center of the sampling sphere. For example, the center angle corresponding to the lobe width of the tested antenna is 15°, and the center angle corresponding to the half lobe width is 7.5°. In the embodiments of the present application, when the sampling interval in the air interface test data is less than the center angle corresponding to the half lobe width and 7.5°, the air interface test data can also be referred to as high-precision air interface test data.

[0056] The uniform distribution of each sampling point in the air interface test data means that the angles between each adjacent sampling point and the center of the sampling sphere in the air interface test data are equal, that is, the sampling interval is a fixed interval; or, the distances between adjacent sampling points are equal. In other words, the sampling interval in the above-mentioned preset sampling rule is fixed. In some possible implementation manners, when multiple sampling rules are adopted in one OTA test, the data in which the sampling points in the air interface test data obtained by the OTA test are uniformly distributed can be selected, and the processing method of the air interface test data provided in the embodiments of the present application is applied.

[0057] The air interface test data is far field data means that in the OTA test, the radius R of the darkroom, the antenna aperture D of the measured antenna, and the electromagnetic wavelength λ satisfy the following formula (1).

[0058]

[0059] The antenna aperture is a parameter used to indicate the effective area of the antenna to absorb electromagnetic waves, and can also be referred to as the effective area of the antenna. In some possible implementation manners, the antenna aperture can be included in the prior information of the measured antenna. The radius R of the darkroom and the electromagnetic wavelength λ are known parameters in the OTA test, and will not be described here.

[0060] In the embodiments of the present application, after the first data is obtained, it can be first judged whether the air interface test data in the first data satisfies the prior condition. If yes, the subsequent steps are executed. If not, it means that the air interface test data is not applicable to the processing method of the air interface test data provided in the embodiments of the present application, so the subsequent steps can be stopped, and it is prompted that the air interface test data is not applicable or cannot be used.

[0061] The position data of each interpolation point can be determined according to a preset interpolation rule, and is used to indicate the position of each interpolation point on the sampling sphere. The interpolation point is located on the sampling sphere. Unlike the sampling point, the above-mentioned air interface test data does not include the radio frequency parameter of the measured antenna at the interpolation point. That is, only the sampling points are tested in the OTA test to obtain the air interface test data, and the radio frequency parameter of the measured antenna at each interpolation point is determined by actually measuring the radio frequency parameter of the measured antenna at each sampling point, so that the sampling interval in the air interface test data is reduced without increasing the test time, and the precision of the air interface test data is improved.

[0062] Exemplarily, the preset sampling rule is that the sampling points are uniformly sampled in the sampling sphere with a first sampling interval. The first sampling interval is the sampling interval of the sampling points. The preset interpolation rule is that the positions without sampling points are uniformly interpolated in the sampling sphere with a first interpolation interval as the interpolation interval. The first interpolation interval is the interpolation interval of the interpolation points. In some possible implementation, the first sampling interval is 6°, the first interpolation interval is 3°, and the distribution of the sampling points and the interpolation points on the sampling sphere in the spherical coordinate system with the measured antenna as the center can be as shown in FIG. 8. Figure 4 As can be seen from FIG. 8, the sampling points are uniformly distributed on the sampling sphere, and the interpolation points are uniformly distributed between the sampling points. The angle between the line connecting the nearest two sampling points and the center is 6°, the angle between the line connecting the adjacent two interpolation points and the center is 3°, and the angle between the line connecting the adjacent sampling point and interpolation point and the center is 3°. Figure 4

[0063] For another example, the preset sampling rule is that the sampling points are uniformly sampled in the developed plane of the sampling sphere with a first sampling interval. The preset interpolation rule is that the positions without sampling points are uniformly interpolated in the developed plane of the sampling sphere with a first interpolation interval. The developed plane of the sampling sphere refers to a rectangular coordinate system in which the azimuth angle is the horizontal coordinate and the elevation angle is the vertical coordinate in the spherical coordinate system with the measured antenna as the center. When the first sampling interval is 6° and the first interpolation interval is 3°, the distribution of the sampling points and the interpolation points in the developed plane of the sampling sphere can be as shown in FIG. 9. Figure 5 As can be seen from FIG. 9, the sampling points are uniformly distributed on the developed plane of the sampling sphere, and the interpolation points are uniformly distributed between the sampling points. The elevation angle difference between the nearest two sampling points is 6°, and the azimuth angle difference is 6°. The elevation angle difference between the adjacent two interpolation points is 3°, and the azimuth angle difference is 3°. The elevation angle difference between the adjacent sampling point and interpolation point is 3°, and the azimuth angle difference is 3°. Figure 5

[0064] It should be noted that Figure 4 the sampling sphere shown in FIG. 8 is not corresponding to the developed plane of the sampling sphere shown in FIG. 9. Specifically, the sampling points and the interpolation points on the sampling sphere shown in FIG. 8 are converted to the developed plane of the sampling sphere, and the sampling points and the interpolation points are not uniformly distributed, which is different from FIG. 8. And the sampling points and the interpolation points on the developed plane of the sampling sphere shown in FIG. 9 are converted to the sampling sphere, and the distribution of the sampling points and the interpolation points is also not uniform, which is different from FIG. 9. Figure 5 Figure 4 Figure 5 Figure 5 Figure 4

[0065] In the embodiments of the present application, the corresponding interpolation rule and the sampling rule can be used, or the interpolation rule and the sampling rule shown in FIG. 8 and FIG. 9 can be used. Figure 4 Figure 5 ​​​​​​​​The corresponding interpolation rule and sampling rule are as follows. Figure 5 The corresponding interpolation rule and sampling rule are as follows. Figure 5 When the sampling points and interpolation points on the unfolded surface of the sampling sphere shown in FIG. 1 are converted to the sampling sphere, the distribution of the sampling points and interpolation points on the sampling sphere should be denser near the two poles.

[0066] Based on the above Figure 4 and Figure 5 It can be seen that if the radio frequency parameters of the measured antenna at the interpolation points can be obtained, the sampling interval in the air interface test data can be reduced, and the precision of the air interface test data can be improved without increasing the test time. The process of obtaining the radio frequency parameters of the measured antenna at the interpolation points is introduced below.

[0067] S302, determining the associated sampling points of each interpolation point according to the lobe width, the air interface test data, and the position data of each interpolation point.

[0068] Any associated sampling point of the interpolation point corresponds to a spherical center angle of the interpolation point that is less than or equal to the sampling interval of the air interface test data and the spherical center angle corresponding to one-half of the lobe width. The spherical center angle corresponding to one-half of the lobe width refers to the angle between the line connecting the interpolation point to the center of the sampling sphere and the line connecting any associated sampling point of the interpolation point to the center of the sampling sphere.

[0069] One-half of the lobe width refers to one-half of the lobe width of the measured antenna, which can also be referred to as half lobe width. For example, when the measured antenna is a standard half-wave dipole, the lobe width can be as shown in FIG. 1. Figure 6 The spherical center angle corresponding to the half lobe width is ρ in FIG. 1. Figure 6

[0070] Please refer to Figure 7 , a method for determining the associated sampling points of the interpolation points provided by the embodiments of the present application. As shown in FIG. 1, the method can include the following steps. Figure 7

[0071] S701, determining the smaller value between the sampling interval and the spherical center angle corresponding to the half lobe width as the first spherical center angle.

[0072] For example, when the sampling interval is 3° and the spherical center angle corresponding to the half lobe width is 5°, the embodiments of the present application can take 3° as the first spherical center angle.

[0073] S702, determining the associated points of the interpolation points according to the position data of the interpolation points and the first spherical center angle.

[0074] ​​The embodiment of the present application can first determine the associated region of the interpolation point according to the position data of the interpolation point, and then take the sampling points in the associated region as the associated points of the interpolation point.

[0075] The associated region is a region on the sampling spherical surface, and the sampling points in the associated region correspond to a central angle of the spherical surface that is less than or equal to the first central angle. In other words, the angle between the line connecting the sampling points in the associated region to the center of the sampling spherical surface and the line connecting the interpolation point to the center of the sampling spherical surface is less than or equal to the first central angle.

[0076] For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles. Figure 4 Figure 8 For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles. Figure 8 For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles. Figure 8 For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles.

[0077] For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles. Figure 5 For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles. Figure 9 For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles. Figure 9 For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles. Figure 9 For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles.

[0078] For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles.

[0079] For example, if the corresponding sampling rule and interpolation rule are adopted, the distribution of the interpolation points and the sampling points on the sampling spherical surface is more dense near the two poles.

[0080] For the convenience of description, the above analysis function F(θ, ψ) is referred to as a boundary function in the embodiments of the present application. It should be understood that, in the case where the first spherical central angle η is known at the coordinates (α, β) of the interpolation point, if the coordinates (θ i , ψ i ) of a certain sampling point make the boundary function F(θ, ψ) greater than 0, it indicates that the sampling point (θ i , ψ i ) is in the associated region of the interpolation point (α, β), and the sampling point (θ i , ψ i ) is the associated sampling point of the interpolation point (α, β). Conversely, if the coordinates (θ i , ψ i ) of a certain sampling point make the boundary function F(θ, ψ) less than 0, it indicates that the sampling point (θ i , ψ i ) is out of the associated region of the interpolation point (α, β), and the sampling point (θ i , ψ i ) is not the associated sampling point of the interpolation point (α, β).

[0081] In the embodiments of the present application, the electronic device performing the processing method of the air interface test data can also input the position data of a certain interpolation point, the coordinates of each sampling point (contained in the air interface test data), and the first spherical central angle into the above formula (2) to obtain all the sampling points satisfying F(θ, ψ) greater than 0, that is, all the associated sampling points of the interpolation point.

[0082] S303, determining the radio frequency parameter of the interpolation point according to the spherical central angle corresponding to the associated sampling point and the interpolation point of the interpolation point, and the radio frequency parameter of the associated sampling point of the interpolation point.

[0083] The radio frequency parameter of the interpolation point is positively correlated with the radio frequency parameter of the associated point of the interpolation point, and negatively correlated with the spherical central angle corresponding to the associated sampling point and the interpolation point of the interpolation point. That is, under the condition that other conditions remain unchanged, the greater the radio frequency parameter of the associated point of the interpolation point, the greater the radio frequency parameter of the interpolation point; the greater the spherical central angle corresponding to the associated sampling point and the interpolation point of the interpolation point, the smaller the radio frequency parameter of the interpolation point.

[0084] Exemplarily, the weight of each associated sampling point can be determined according to the spherical central angle corresponding to each associated sampling point and the interpolation point of the interpolation point. For example, the coordinates of the interpolation point are (α, β), the coordinates of any associated sampling point of the interpolation point are (θ i , ψ i ), and the weight w i of the sampling point can be determined by the following formula (3).

[0085] wi =-ln(arccos(sinβcosαsinψ i cosθ i +sinβsinαsinψ i sinθ i +cosβcosψ i )) Formula (3).

[0086] In the above formula (3), the weight is negatively correlated with the associated sampling point (θ i , ψ i ) is the spherical center angle corresponding to the interpolation point (α, β). In other words, the associated sampling point (θ i , ψ i ) and the larger the sphere center angle corresponding to the interpolation point (α, β), the greater the weight w i On the contrary, the associated sampling point (θ i , ψ i ) The smaller the sphere center angle corresponding to the interpolation point (α, β), the greater the weight w i The bigger it is.

[0087] It should be understood that the larger the spherical center angle between the associated sampling point of the interpolation point and the interpolation point, the farther the distance between the associated sampling point of the interpolation point and the interpolation point. Figure 10 As shown, the spherical center angle corresponding to the second interpolation point 901 and the first associated sampling point 1001 is greater than the spherical center angle corresponding to the second interpolation point 901 and the second associated sampling point 1002. Therefore, the distance L1 between the second interpolation point 901 and the first associated sampling point 1001 is also greater than the distance L2 between the second interpolation point 901 and the second associated sampling point 1002. Because the antenna's RF parameters vary smoothly in space, the greater the distance between the interpolation point's associated sampling point and the interpolation point, the greater the difference in RF parameters between the interpolation point's associated sampling point and the interpolation point. Therefore, the weight is negatively correlated with the spherical center angle corresponding to the interpolation point's associated sampling point. This can make the subsequently calculated RF parameters of the interpolation point closer to the actual RF parameters of the interpolation point, which is beneficial to improving the accuracy of interpolation.

[0088] In an embodiment of the present application, the electronic device that executes the method for processing air interface test data can determine the radio frequency parameters of the interpolation point by using the following formula (4).

[0089]

[0090] Among them, K is the associated sampling point data of the interpolation point, w i is the weight of the sampling point, P i is the RF parameter of the sampling point, and P0 is the RF parameter of the interpolation point.

[0091] Through the above formula (3) and formula (4), the radio frequency parameter of the interpolation point is positively correlated with the radio frequency parameter of the associated point of the interpolation point, and negatively correlated with the central angle of the interpolation point corresponding to the associated sampling point and the interpolation point, so that the calculated radio frequency parameter of the interpolation point is closer to the actual radio frequency parameter of the interpolation point, and the accuracy of interpolation is improved.

[0092] Through experimental testing, the interpolation accuracy of the air interface test data processing method provided in the embodiments of the present application is higher. Taking the radio frequency parameter TRP as an example, through experimental testing, the difference between the TRP of the interpolation point calculated by the air interface test data processing method provided in the embodiments of the present application and the TRP actually tested for the interpolation point is less than or equal to the darkroom measurement fluctuation range (1dB), and the difference is small.

[0093] Based on the above description, the air interface test data processing method provided in the embodiments of the present application can interpolate the regions between the sampling points on the sampling sphere, and estimate the radio frequency parameter of the interpolation point according to the radio frequency parameters of the sampling points near the interpolation point, so that the interpolation point can be used as a new sampling point, thereby increasing the density of the sampling points on the sampling sphere, and improving the accuracy of the air interface test data without increasing the time length of the OTA test.

[0094] Further, the radio frequency parameter of the interpolation point obtained in S303 and the air interface test data included in the first data in S301 are used as test data of the measured antenna; and the performance of the measured antenna is evaluated based on the test data of the measured antenna. It should be understood that the new air interface test data obtained by combining the radio frequency parameter of the interpolation point obtained in S303 and the air interface test data included in the first data in S301 has higher accuracy than the air interface test data included in the first data in S301. Therefore, evaluating the performance of the measured antenna based on the new air interface test data is beneficial to improving the accuracy of the evaluation.

[0095] The embodiments of the present application also provide a computer storage medium, which stores computer instructions, when the computer instructions run on an electronic device, the electronic device executes the related method steps to realize the method in the above embodiments.

[0096] The embodiments of the present application also provide a computer program product, when the computer program product runs on a computer, the computer executes the related steps to realize the method in the above embodiments.

[0097] In addition, the embodiment of the present application further provides an apparatus, which can be a chip, a component or a module, and the apparatus can comprise a processor and a memory connected with each other; the memory is used for storing computer-executed instructions; when the apparatus is running, the processor can execute the computer-executed instructions stored in the memory, so that the chip executes the method in each method embodiment described above. It should be noted that all related contents of each step involved in the above method embodiments can be referred to the function description of the corresponding function module, and will not be repeated here.

[0098] The electronic device, the computer storage medium, the computer program product or the chip provided by the embodiment of the present application are all used for executing the corresponding method provided above, so the beneficial effects achieved thereby can refer to the beneficial effects of the corresponding method provided above, which will not be repeated here.

[0099] The above mainly introduces the scheme provided by the embodiment of the present application from the perspective of the electronic device. In order to realize the above functions, it contains the corresponding hardware structure and / or software module for executing each function. Those skilled in the art should easily realize that the units and algorithm steps of each example described in connection with the embodiments disclosed herein can be realized in the form of hardware or a combination of hardware and computer software. Whether a certain function is executed in the form of hardware or computer software driving hardware depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0100] The embodiment of the present application can divide the function modules of the device involved in the above method examples, for example, each function module can be divided according to each function, or two or more functions can be integrated in one processing module. The integrated module can be realized in the form of hardware or software function module. It should be noted that the division of modules in the embodiment of the present application is illustrative, and is only a logical function division. When actually implemented, there can be another division method.

[0101] The functions or actions or operations or steps in the above embodiments can be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented by software, the computer program instructions can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the flow or function described in the embodiments of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable devices. The computer instructions can be stored in a computer-readable storage medium or transferred from one computer-readable storage medium to another computer-readable storage medium, for example, the computer instructions can be transferred from one website, computer, server or data center to another website, computer, server or data center through wired (such as coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (such as infrared, wireless, microwave, etc.) manner. The computer-readable storage medium can be any available medium that can be accessed by a computer or include one or more data storage devices such as servers, data centers, etc. that can be integrated with the medium. The available medium can be a magnetic medium (such as a floppy disk, a hard disk, a magnetic tape), an optical medium (such as a DVD), or a semiconductor medium (such as a solid state disk (SSD)), etc.

[0102] Although the present application is described in conjunction with specific features and embodiments thereof, it is evident that many alternatives, modifications and combinations of features will be apparent to those skilled in the art in view of the foregoing description. Accordingly, the description and drawings are to be regarded as illustrative in nature and not as restrictive. The scope of the present application is defined by the appended claims, and all changes that come within the meaning and range of equivalents are intended to be embraced therein. It will be apparent to those skilled in the art that various modifications and variations can be made to the present application without departing from the spirit or scope of the application. Thus, it is intended that the present application cover the modifications and variations of this application provided they come within the scope of the appended claims and their equivalents.

Claims

1. A method for processing air interface test data, the method comprising: The method comprises the following steps: obtaining first data; the first data at least comprises air interface test data of a tested antenna, position data of each interpolation point, and lobe width of the tested antenna; the air interface test data comprises position data of each sampling point on a sampling sphere, and radio frequency parameters of the tested antenna at each sampling point; the center of the sampling sphere is the tested antenna; each interpolation point is located on the sampling sphere; each sampling point is uniformly distributed on the sampling sphere or an unfolded surface of the sampling sphere, and each interpolation point is obtained by uniformly interpolating a region between each sampling point at a first interpolation interval; determining an associated sampling point of each interpolation point according to the lobe width, the air interface test data, and the position data of each interpolation point; wherein any associated sampling point of the interpolation point corresponds to a central angle smaller than or equal to one half of a central angle corresponding to the lobe width and a central angle corresponding to adjacent sampling points in the air interface test data; determining radio frequency parameters of the interpolation point according to the associated sampling point of the interpolation point, the central angle corresponding to the interpolation point, and the radio frequency parameters of the associated sampling point of the interpolation point; wherein the radio frequency parameters of the interpolation point are positively correlated with the radio frequency parameters of the associated point of the interpolation point, and are negatively correlated with the central angle corresponding to the associated sampling point of the interpolation point and the interpolation point.

2. The method of claim 1, wherein, The first data further comprises a darkroom radius when performing air interface test, an antenna aperture of the tested antenna, and a wavelength of electromagnetic waves transmitted and received by the tested antenna. The method further comprises the following steps: determining the associated sampling point of each interpolation point according to the lobe width, the air interface test data, and the position data of each interpolation point, under the condition that a prior condition is satisfied; The prior condition at least comprises: the central angles corresponding to adjacent sampling points in the air interface test data are equal; the central angles corresponding to adjacent sampling points in the air interface test data are smaller than one half of the central angle corresponding to the lobe width and 7.5 degrees; and a product of one half of the darkroom radius and the wavelength of electromagnetic waves is greater than twice the square of the antenna aperture.

3. The method of claim 1, wherein, The method further comprises the following steps: performing air interface test on the tested antenna according to a preset sampling rule to obtain the air interface test data; performing simulation test on the tested antenna to obtain the lobe width; uniformly interpolating a region between each sampling point according to a preset interpolation rule to obtain the position data of each interpolation point.

4. The method according to any one of claims 1 to 3, characterized in that, The method further comprises the following steps: determining a first central angle; the first central angle is a smaller one of the central angle corresponding to the adjacent sampling points and the central angle corresponding to one half of the lobe width; determining a relevant region of the interpolation point according to the first solid angle and the position data of the interpolation point; any sampling point in the relevant region of the interpolation point has a solid angle corresponding to the interpolation point less than or equal to the first solid angle; determining a relevant sampling point of the interpolation point according to the relevant region of the interpolation point; wherein the sampling point in the relevant region of the interpolation point is the relevant sampling point of the interpolation point.

5. The method of claim 4, wherein, The position data of the sampling point refers to the coordinates of the sampling point in a rectangular coordinate system; the horizontal axis of the rectangular coordinate system is the azimuth angle of the sampling point in a spherical coordinate system with the measured antenna as the center, and the vertical axis of the rectangular coordinate system is the elevation angle of the sampling point in the spherical coordinate system. The position data of the interpolation point refers to the coordinates of the interpolation point in a rectangular coordinate system.

6. The method of claim 5, wherein, The determining of the relevant sampling point of the interpolation point according to the relevant region of the interpolation point comprises: determining an analytical function of the boundary of the relevant region of the interpolation point in the rectangular coordinate system; determining the relevant sampling point of the interpolation point according to the position data of the interpolation point and the analytical function; the relevant sampling point of the interpolation point satisfies: the position data of the interpolation point, the first solid angle, and the position data of the relevant sampling point of the interpolation point, when substituted into the analytical function, the function value of the analytical function is greater than 0.

7. The method according to any one of claims 1 to 3, characterized in that, The determining of the radio frequency parameter of the interpolation point according to the solid angle corresponding to the interpolation point and the radio frequency parameter of the relevant sampling point of the interpolation point comprises: determining the weight of each relevant sampling point of the interpolation point according to the solid angle corresponding to the interpolation point; the weight of the relevant sampling point of the interpolation point is negatively correlated with the solid angle corresponding to the interpolation point; calculating the weighted average of the radio frequency parameters of the relevant sampling points of the interpolation point based on the weights of the relevant sampling points of the interpolation point, to obtain the radio frequency parameter of the interpolation point.

8. An electronic device, comprising: comprise: one or more processors, one or more memories; the one or more memories are coupled with the one or more processors, and the one or more memories store a computer program; when the one or more processors execute the computer program, the electronic device performs the method for processing air interface test data according to any one of claims 1-7.

9. A computer-readable storage medium, characterized in that, The computer readable storage medium stores a computer program, and the computer program is executed by a processor to implement the method for processing air interface test data according to any one of claims 1-7.

10. A computer program product, characterised in that, The computer program is executed by a processor to implement the method for processing air interface test data according to any one of claims 1-7.

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