Semiconductor laser bar detection device and method

Abstract

The invention relates to the technical field of semiconductor laser detection, in particular to a semiconductor laser bar detection device and method. The device comprises a detection support and a detection clamp, the detection clamp is movably installed on the detection support, detection probes are movably installed on the detection support and the detection clamp, the detection clamp comprises a back plate and a positioning block, the back plate is horizontally arranged, the positioning block is vertically installed on the back plate, and the positioning block is movably installed on the back plate. And the positioning block is provided with a vertical strip-shaped groove for placing a semiconductor laser bar. The detection support and the detection clamp facilitate test connection of the semiconductor laser bar, the detection shell is used for isolating the detection environment of the semiconductor laser bar, interference of moisture and impurities in air on detection of the semiconductor laser bar by the detection probe is reduced, and the back plate is beneficial to fixing the positioning block on the horizontal plane. The positioning block is used for clamping the to-be-detected semiconductor laser bar, so that the to-be-detected semiconductor laser bar is prevented from shaking to interfere with detection.

Description

Technical Field

[0001] The present invention relates to the technical field of semiconductor laser detection, and in particular to a semiconductor laser bar detection device and method. Background Art

[0002] High-power semiconductor lasers have shown broad application prospects in many fields. In the industrial field, their excellent performance has been widely recognized. In the field of medical aesthetics, they can be used for treatments such as laser hair removal, and are increasingly widely used in the military.

[0003] The optical consistency of an integrated array depends not only on the optical properties of a single laser itself, but also on the array assembly process. In modern laser technology, optical consistency is one of the key factors to ensure the efficient operation of laser arrays. The optical properties of a single laser, such as wavelength, power, and beam quality, are certainly important, but the overall performance of the array is also significantly affected by the assembly process. Every detail of the assembly process, from material selection to assembly accuracy, is directly related to the optical consistency of the array. The optical consistency of an integrated array depends not only on the optical properties of a single laser, but also on the sophisticated assembly process. From the selection of soft solder alloys to the optimization of the vertical stacking structure, to the design of the macro channel water cooling base, each link provides a solid foundation for achieving efficient and stable optical output.

[0004] Therefore, it is necessary to test the optical properties and optical output stability of a single laser bar after power-on to ensure that the processed and produced semiconductor laser bars meet the quality requirements. However, the assembled array is too small and thin, making it difficult to clamp and place vertically, resulting in problems such as difficult testing and complicated operation. The existing integrated bar array testing tools have simple structures, great safety hazards, waste of manpower, low efficiency, and cannot fully meet the testing requirements. Summary of the invention

[0005] In order to solve the clamping stability problem during single-shot semiconductor laser bar testing and improve the safety and accuracy of semiconductor laser bar testing, the present invention provides a semiconductor laser bar testing device and method.

[0006] On the one hand, the present invention provides a semiconductor laser bar detection device adopts the following technical solution:

[0007] A semiconductor laser bar detection device comprises a detection bracket and a detection fixture, wherein the detection fixture is movably mounted on the detection bracket, the detection bracket and the detection fixture are sealed and installed in a detection shell, detection probes are movably mounted on the detection bracket and the detection fixture, and the detection probe detects the semiconductor laser bar in the closed isolation environment of the detection shell, the detection fixture comprises a back plate and a positioning block, the back plate is horizontally placed, the positioning block is vertically mounted on the back plate, a vertical strip groove for placing the semiconductor laser bar is formed on the positioning block, and the back plate and the positioning block cooperate with each other to vertically install and position the semiconductor laser bar.

[0008] The detection bracket and the detection fixture are used to fix the semiconductor laser bar to be detected, which is convenient for the test connection of the semiconductor laser bar. The detection shell is used to isolate the detection environment of the semiconductor laser bar and reduce the interference of moisture and impurities in the air with the detection probe on the detection of the semiconductor laser bar. The back plate is conducive to fixing the positioning block on the horizontal plane. The positioning block is used to clamp the semiconductor laser bar to be detected to prevent the shaking of the semiconductor laser bar to be detected from interfering with the detection.

[0009] Furthermore, a heat dissipation device, a dehumidification device and an air filtering device are installed in the detection shell, and the heat dissipation device, the dehumidification device and the air filtering device utilize the convection of the air in the detection shell to cool down, dehumidify and filter dust of the air in the detection shell.

[0010] The heat dissipation device is used to cool the air in the detection housing and the semiconductor laser bar being detected to prevent high temperature from affecting the detection of the semiconductor laser bar. The dehumidification device and the air filter are used to filter and remove moisture and impurities in the air in the detection housing to prevent moisture and impurities from affecting the detection of the semiconductor laser bar.

[0011] Furthermore, the heat dissipation device includes a straight blower, which blows air directly towards the detection fixture and the semiconductor laser bar being detected, a cooling plate is installed at the front end of the air outlet of the straight blower, and the cooling plate cools the air blown out by the straight blower, and the cooling plate is externally connected to a heat exchange device, and the dehumidification device includes a cyclone fan, and the air outlet direction of the cyclone fan is horizontally along the inner wall of the detection shell, and a water absorbent plate is installed at the front end of the air inlet of the cyclone fan, and the water absorbent plate is an annular belt-shaped and circulated, and the water absorbent plate is externally connected to pass through a dryer, and a temperature sensor and a humidity sensor are arranged in the detection shell, and the air filtering device includes a circulating fan, and the air inlet end and the air outlet end of the circulating fan are respectively connected to the two sides of the detection shell through pipes, and an adsorption filter element and an electrostatic generator are installed at the air inlet front end or the air outlet front end of the circulating fan.

[0012] The straight blower can quickly blow cold air onto the semiconductor laser bar being tested to quickly cool it down. The swirl fan can use the blowing air to form a swirl in the detection shell, which is beneficial to circulate and quickly dry the air and mechanism surface in the detection shell. The circulating fan can use the blowing air to convectively circulate the air in the detection shell, which is beneficial to fully filter the air in the detection shell.

[0013] Furthermore, a placement box is provided in the detection shell, and the placement box is a sealed box body. One side of the placement box is connected to the outside of the detection shell through an outer sealed door control, and the other side is connected to the inside of the detection shell through an inner sealed door control. An operating mechanism is installed near the detection bracket and the detection fixture.

[0014] The placement box is used to place the semiconductor laser bar to be tested. The inner sealing door and the outer sealing door are opened and closed alternately to control the connection between the inside and the outside of the detection shell, which is convenient for placing the semiconductor laser bar from the outside and reduces pollution and interference to the inside of the detection shell.

[0015] Furthermore, the detection bracket includes a detection platform, a sliding frame and a mounting platform, the detection platform and the sliding frame are mounted and fixed on the mounting platform, the detection platform is mounted on the mounting platform through legs, the sliding frame includes a vertical frame, a sliding rail and a sliding block, the vertical frame is fixedly mounted on the mounting platform, the sliding rail is vertically fixedly mounted on the vertical frame, the sliding block is slidably mounted on the sliding rail and is controlled to slide along the sliding rail by a linear motor.

[0016] The legs of the test bench can be insulated and connected to the installation platform to avoid interference and leakage during detection. The sliding frame can easily control the contact and disconnection of the detection end and the start and end of the detection.

[0017] Furthermore, the back plate is fixedly mounted on the detection table, a metal sheet is mounted on the back plate, a positioning clamping groove is provided on the positioning block, both sides of the positioning clamping groove are squeezed toward the middle, a mobile chuck is mounted on the sliding block, the detection probe is clamped and fixed on the mobile chuck, the mobile chuck is telescopically mounted on the sliding block by a telescopic rod, and the mobile chuck is controlled to be clamped and released by a clamping bolt.

[0018] The metal sheet is used to detect the power supply, and the positioning groove is conducive to clamping firmly to prevent the semiconductor laser bar from shaking during detection.

[0019] Furthermore, the detection probe includes a contact head, a spring rod and a wiring head, the contact head is telescopically set by the spring rod, the wiring head is fixedly set on the top of the spring rod, the wiring head is connected to the contact head through a wire, the wiring head and the metal sheet are respectively connected to the positive and negative poles of an independent power supply, and a power stabilizer and a power monitor are connected and installed on the independent power supply.

[0020] The spring rod is helpful to control the elastic extrusion contact of the contact head on the semiconductor laser bar, reducing poor contact caused by shaking or uneven installation angle.

[0021] Furthermore, a detection camera is installed on one side of the detection fixture that clamps the semiconductor laser bar. The detection camera includes a camera and a display. The camera captures the test status of the semiconductor laser bar clamped by the detection fixture. The camera is communicatively connected to the display.

[0022] The detection camera is used to assist in observing and detecting the light-emitting state of the semiconductor laser bar, which is beneficial to protecting the eyes of the detection personnel and improving the accuracy of the detection.

[0023] On the other hand, the present invention provides a semiconductor laser bar detection method using the following technical solution:

[0024] A semiconductor laser bar detection method includes the following detection steps:

[0025] Placing the semiconductor laser bar in the detection housing, and then sealing the detection housing;

[0026] Dehumidification device and air filter device are used to dehumidify the air in the detection housing and filter dust impurities;

[0027] The ambient temperature inside the detection housing is adjusted by using the heat dissipation device, and the heat dissipation device is continuously turned on to cool down the inside of the detection housing;

[0028] Place the semiconductor laser bar vertically and clamp it on the detection fixture, then control the detection bracket to drive the detection probe to move and contact one end of the semiconductor laser bar and press it tightly, and place the other end of the semiconductor laser bar in contact with the metal sheet;

[0029] Start the independent power supply, wait for the independent power supply to run smoothly, and then use the detection camera to observe and detect the status of the semiconductor laser bars.

[0030] Placing the semiconductor laser bar in a closed environment for testing is conducive to avoiding interference of the external environment on the testing process. The heat dissipation device is conducive to alleviating the heating problem of the semiconductor laser bar during power-on testing, improving the effectiveness of the test and avoiding burning of the test equipment. The test fixture is conducive to stably clamping the semiconductor laser bar being tested.

[0031] Furthermore, the semiconductor laser bar status data detected by the detection camera is stored in a database, and a data statistics and analysis system is established in the database to evaluate the production quality of the semiconductor laser bars.

[0032] By establishing a database to collect and store the inspection data of semiconductor laser bars, it is beneficial to analyze the production quality and life prediction of semiconductor laser bars through big data.

[0033] In summary, the present invention has the following beneficial technical effects:

[0034] 1. The detection bracket and the detection fixture are used to fix the semiconductor laser bar to be detected, which is convenient for the test connection of the semiconductor laser bar. The detection shell is used to isolate the detection environment of the semiconductor laser bar and reduce the interference of moisture and impurities in the air on the detection of the semiconductor laser bar by the detection probe. The back plate is conducive to fixing the positioning block on the horizontal plane. The positioning block is used to clamp the semiconductor laser bar to be detected to prevent the shaking of the semiconductor laser bar to be detected from interfering with the detection.

[0035] 2. The heat dissipation device is used to cool the air in the detection housing and the semiconductor laser bar being detected to prevent high temperature from affecting the detection of the semiconductor laser bar. The dehumidification device and air filter are used to filter and remove moisture and impurities in the air in the detection housing to prevent moisture and impurities from affecting the detection of the semiconductor laser bar.

[0036] 3. The straight hair dryer can quickly blow cold air onto the semiconductor laser bar being tested to quickly cool it down. The swirl fan can use the air to form a swirl in the detection housing, which is conducive to circulating and quickly drying the air and mechanism surface in the detection housing. The circulating fan can use the air to perform convection circulation on the air in the detection housing, which is conducive to fully filtering the air in the detection housing.

[0037] 4. The placement box is used to place the semiconductor laser bar to be tested. The inner sealing door and the outer sealing door are opened and closed alternately to control the connection between the inside and the outside of the detection shell, which is convenient for placing the semiconductor laser bar from the outside and reduces pollution and interference to the inside of the detection shell.

[0038] 5. The legs of the test bench can be insulated and connected to the installation platform to avoid interference and leakage in the test. The sliding frame is convenient for controlling the contact and disconnection of the test end, and convenient for controlling the start and end of the test. The metal sheet is used to detect the power supply. The positioning clamp groove is conducive to clamping firmly to avoid the semiconductor laser bar shaking during the test. The spring rod is conducive to controlling the elastic extrusion of the contact head to contact the semiconductor laser bar, reducing the poor contact caused by shaking or uneven installation angle. The detection camera is used to assist in observing and detecting the luminescence status of the semiconductor laser bar, which is conducive to protecting the eyes of the inspectors and improving the accuracy of the detection.

[0039] 6. Placing the semiconductor laser bar in a closed environment for testing is conducive to avoiding interference of the external environment on the testing process. The heat dissipation device is conducive to alleviating the heating problem of the semiconductor laser bar during power-on testing, improving the effectiveness of the test and avoiding burning of the test equipment. The test fixture is conducive to stably clamping the semiconductor laser bar being tested. By establishing a database to collect and store the test data of the semiconductor laser bar, it is conducive to the production quality and life prediction of the semiconductor laser bar through big data analysis. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 It is a schematic diagram of the external structure of the present invention;

[0041] Figure 2 for Figure 1 Schematic diagram from another perspective;

[0042] Figure 3 This is a schematic diagram of the structure of the detection bracket and the detection fixture of the present invention;

[0043] Figure 4 It is a schematic diagram of the internal perspective structure of the present invention.

[0044] Description of reference numerals:

[0045] 1. Detection housing, 11. Heat dissipation device, 111. Straightening hair dryer, 112. Refrigeration sheet, 113. Heat exchange device, 114. Temperature sensor, 12. Dehumidification device, 121. Cyclone fan, 122. Water absorption sheet, 123. Dryer, 124. Humidity sensor, 13. Air filter, 131. Circulation fan, 132. Adsorption filter element, 134. Electrostatic generator, 14. Placement box, 141. Outer sealing door, 142. Inner sealing door, 15. Operating mechanism, 2. Detection bracket, 21. Detection table, 211 , legs, 22, sliding frame, 221, stand, 222, sliding track, 223, sliding block, 23, installation platform, 3, detection fixture, 31, back plate, 311, metal sheet, 32, positioning block, 321, positioning clamp groove, 33, movable clamp, 331, telescopic rod, 332, clamping bolt, 4, detection probe, 41, contact head, 42, spring rod, 43, terminal, 431, independent power supply, 432, power stabilizer, 433, power monitor, 5, detection camera, 51, camera, 52, display. DETAILED DESCRIPTION

[0046] The following will be combined with the attached Figure 1-Figure 4, the technical solutions in the embodiments of the present invention are clearly and completely described. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0047] In the description of the present invention, it should be understood that the terms "longitudinal", "lateral", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside" and "outside" etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0048] The small units are fixed on the aluminum nitride ceramic heat sink by soft solder alloy. This step is the key to ensure the stability of the array and the heat dissipation efficiency. Soft solder alloy is widely used in the assembly of laser arrays due to its good thermal conductivity and plasticity. Aluminum nitride ceramic heat sink is an ideal heat dissipation material due to its excellent thermal conductivity and mechanical strength. Through precise welding process, the small units can be firmly fixed on the heat sink, ensuring that the array can maintain stable optical performance under long-term high-power operation. The bar spacing constitutes a standard structure, and the small units are evenly spaced to form a vertically stacked structure. This structural design is not only beautiful, but also has significant functional advantages. The standardized design of the bar spacing ensures that each small unit is accurately positioned in the array, thereby ensuring the uniformity and consistency of the beam. The vertical stacking structure further optimizes the space utilization, allowing the entire array to achieve efficient optical output in a compact space.

[0049] This structure is mounted on a macro channel water cooling base, which helps to dissipate heat through the backplane of the stacked array. The macro channel water cooling base is designed to efficiently remove the heat generated by the array during operation through a water cooling system. The macro channels inside the water cooling base can evenly distribute the cooling water to ensure that each small unit can be fully cooled. Dissipating heat through the backplane of the stacked array not only improves the heat dissipation efficiency, but also enhances the overall stability of the array, ensuring that the array can still maintain excellent optical performance under long-term high-load operation.

[0050] Embodiment 1:

[0051] The embodiment of the present invention discloses a semiconductor laser bar detection device, referring to Figure 1 and Figure 2, comprising a detection bracket 2 and a detection fixture 3, the detection fixture 3 is movably mounted on the detection bracket 2, the detection bracket 2 and the detection fixture 3 are sealed and installed in a detection housing 1, and a detection probe 4 is movably mounted on the detection bracket 2 and the detection fixture 3, and the detection probe 4 detects the semiconductor laser bar in the closed isolation environment of the detection housing 1;

[0052] The detection fixture 3 includes a back plate 31 and a positioning block 32. The back plate 31 is placed horizontally, and the positioning block 32 is vertically installed on the back plate 31. The positioning block 32 is provided with a vertical strip groove for placing the semiconductor laser bar. The back plate 31 and the positioning block 32 cooperate with each other to vertically install and position the semiconductor laser bar.

[0053] When in use, the semiconductor laser bar is placed in the vertical strip groove on the positioning block 32 and clamped, and the semiconductor laser bar is powered on to test the status data of the semiconductor laser bar.

[0054] Embodiment 2:

[0055] On the basis of Example 1, add:

[0056] Reference Figure 1-Figure 4 A heat sink 11, a dehumidifier 12 and an air filter 13 are installed in the detection housing 1. The heat sink 11, the dehumidifier 12 and the air filter 13 utilize the convection of the air in the detection housing 1 to cool, dehumidify and filter dust from the air in the detection housing 1.

[0057] Reference Figure 1-Figure 4 The heat dissipation device 11 includes a straight blower 111, and the straight blower 111 blows air directly toward the detection fixture 3 and the semiconductor laser bar to be detected. A cooling plate 112 is installed at the front end of the air outlet of the straight blower 111, and the cooling plate 112 cools the air blown out by the straight blower 111. The cooling plate 112 is externally connected to a heat exchange device 113. The dehumidification device 12 includes a cyclone fan 121, and the air outlet direction of the cyclone fan 121 is along the horizontal direction of the inner wall of the detection housing 1. The air inlet front of the cyclone fan 121 is A water-absorbing sheet 122 is installed at the end, and the water-absorbing sheet 122 is annular and circulated. The water-absorbing sheet 122 is externally connected to a dryer 123. A temperature sensor 114 and a humidity sensor 124 are arranged in the detection shell 1. The air filtering device 13 includes a circulating fan 131. The air inlet end and the air outlet end of the circulating fan 131 are respectively connected to the two sides of the detection shell 1 through pipelines. An adsorption filter element 132 and an electrostatic generator 134 are installed at the air inlet front end or the air outlet front end of the circulating fan 131.

[0058] After the straight blower 111 is started, it blows air toward the semiconductor laser bar being tested. The cooling sheet 112 uses the semiconductor cooling sheet or the cold end of the compressor to absorb the heat in the air, and then blows the cold air onto the semiconductor laser bar. The swirl fan 121 blows air horizontally toward the inner wall of the detection shell 1, forming a vortex in the detection shell 1, fully blowing to each surface of the mechanism, drying and taking away moisture. The water absorbent sheet 122 is used to absorb water. After the water absorbent sheet 122 absorbs a certain amount of moisture, the water absorption capacity is gradually reduced, and then it is restored to the water absorption capacity after being dried by the dryer 123, which is convenient for recycling. The electrostatic generator 134 absorbs the smiling particles in the air through the static electricity generated.

[0059] Before testing, start the heat dissipation device 11, the dehumidification device 12 and the air filter device 13, and do not conduct the test until the temperature, humidity and impurity concentration in the monitored air are reduced to a reasonable range.

[0060] Reference Figure 1-Figure 4 A placement box 14 is provided in the detection shell 1. The placement box 14 is a sealed box body. One side of the placement box 14 is controlled to be connected to the outside of the detection shell 1 through an outer sealing door 141, and the other side is controlled to be connected to the inside of the detection shell 1 through an inner sealing door 142. An operating mechanism 15 is installed near the detection bracket 2 and the detection fixture 3.

[0061] When placing the semiconductor laser bar to be tested into the detection housing 1, first open the outer sealing door 141, place the semiconductor laser bar in the placement box 14, then close the outer sealing door 141, open the inner sealing door 142, and use the operating mechanism 15 to take out the semiconductor laser bar from the placement box 14.

[0062] Embodiment 3:

[0063] On the basis of Example 1, add:

[0064] Reference Figure 1-Figure 4 The detection bracket 2 includes a detection platform 21, a sliding frame 22 and a mounting platform 23. The detection platform 21 and the sliding frame 22 are fixedly installed on the mounting platform 23. The detection platform 21 is installed on the mounting platform 23 through the support legs 211. The sliding frame 22 includes a vertical frame 221, a sliding rail 222 and a sliding block 223. The vertical frame 221 is fixedly installed on the mounting platform 23. The sliding rail 222 is vertically fixedly installed on the vertical frame 221. The sliding block 223 is slidably installed on the sliding rail 222 and is controlled to slide along the sliding rail 222 by a linear motor.

[0065] The detection platform 21 is insulated and connected to the installation platform 23 via the legs 211 .

[0066] Reference Figure 1-Figure 4The back plate 31 is fixedly mounted on the detection table 21, a metal sheet 311 is mounted on the back plate 31, a positioning clamping groove 321 is provided on the positioning block 32, both sides of the positioning clamping groove 321 are squeezed toward the middle, a mobile chuck 33 is mounted on the sliding block 223, the detection probe 4 is clamped and fixed on the mobile chuck 33, the mobile chuck 33 is telescopically mounted on the sliding block 223 through a telescopic rod 331, and the mobile chuck 33 is clamped and released by a clamping bolt 332.

[0067] Reference Figure 1-Figure 4 The detection probe 4 includes a contact head 41, a spring rod 42 and a wiring head 43. The contact head 41 is telescopically set by the spring rod 42. The wiring head 43 is fixedly set on the top of the spring rod 42. The wiring head 43 is connected to the contact head 41 through a wire. The wiring head 43 and the metal sheet 311 are respectively connected to the positive and negative poles of the independent power supply 431. The independent power supply 431 is connected and installed with a power stabilizer 432 and a power monitor 433.

[0068] During detection, the sliding block 223 is started to move downward along the sliding track 222, and drives the detection probe 4 to move downward until two or more contact heads 41 are stably in contact with the semiconductor laser bar, and then the independent power supply 431 is started. After the independent power supply 431 is stabilized and controlled by the power stabilizer 432, the semiconductor laser bar is connected.

[0069] Reference Figure 1-Figure 4 A detection camera 5 is installed on one side of the detection fixture 3 that clamps the semiconductor laser bar. The detection camera 5 includes a camera 51 and a display 52. ​​The camera 51 captures the test status of the semiconductor laser bar clamped by the detection fixture 3. The camera 51 is communicatively connected to the display 52.

[0070] Embodiment 4:

[0071] The embodiment of the present invention discloses a semiconductor laser bar detection method, comprising the following detection steps:

[0072] Placing the semiconductor laser bar in the detection housing 1, and then closing the detection housing 1;

[0073] The dehumidification device 12 and the air filter device 13 are used to dehumidify the air in the detection housing 1 and filter dust impurities;

[0074] The ambient temperature in the detection housing 1 is adjusted by using the heat dissipation device 11, and the heat dissipation device 11 is continuously turned on to cool down the inside of the detection housing 1;

[0075] Place the semiconductor laser bar vertically and clamp it on the detection fixture 3, then control the detection bracket 2 to drive the detection probe 4 to move to contact one end of the semiconductor laser bar and press it tightly, and the other end of the semiconductor laser bar is placed in contact with the metal sheet 311;

[0076] The independent power supply 431 is started, and after the independent power supply 431 runs stably, the detection camera 5 is used to observe and detect the state of the semiconductor laser bars.

[0077] The semiconductor laser bar status data detected by the detection camera 5 is stored in a database, and a data statistics and analysis system is established in the database to evaluate the production quality of the semiconductor laser bars.

[0078] The above contents are merely examples and explanations of the structure of the present invention. The technicians in this technical field may make various modifications or additions to the specific embodiments described or replace them in a similar manner. As long as they do not deviate from the structure of the invention or exceed the scope defined by the claims, they should all fall within the protection scope of the present invention.

Claims

1. A semiconductor laser bar detection device, comprising a detection bracket (2) and a detection fixture (3), wherein the detection fixture (3) is movably mounted on the detection bracket (2), and characterized in that: The detection bracket (2) and the detection fixture (3) are installed in a closed manner in the detection housing (1); a detection probe (4) is movably installed on the detection bracket (2) and the detection fixture (3); and the detection probe (4) detects the semiconductor laser bar in the closed isolation environment of the detection housing (1); The detection fixture (3) comprises a back plate (31) and a positioning block (32); the back plate (31) is placed horizontally; the positioning block (32) is vertically mounted on the back plate (31); a vertical strip groove for placing a semiconductor laser bar is formed on the positioning block (32); the back plate (31) and the positioning block (32) cooperate with each other to vertically mount and position the semiconductor laser bar.

2. The semiconductor laser bar detection device according to claim 1, characterized in that: A heat dissipation device (11), a dehumidification device (12) and an air filtering device (13) are installed in the detection housing (1); the heat dissipation device (11), the dehumidification device (12) and the air filtering device (13) utilize convection of the air in the detection housing (1) to cool down, dehumidify and filter dust from the air in the detection housing (1).

3. The semiconductor laser bar detection device according to claim 2, characterized in that: The heat dissipation device (11) comprises a straight blower (111), the straight blower (111) blows air directly toward the detection fixture (3) and the semiconductor laser bar being detected, a cooling plate (112) is installed at the front end of the air outlet of the straight blower (111), the cooling plate (112) cools the air blown out by the straight blower (111), the cooling plate (112) is externally connected to a heat exchange device (113), the dehumidification device (12) comprises a cyclone fan (121), the air outlet direction of the cyclone fan (121) is along the horizontal direction of the inner wall of the detection housing (1), and the air inlet front of the cyclone fan (121) is A water absorbing sheet (122) is installed at the end, the water absorbing sheet (122) is annular and circulates, the water absorbing sheet (122) is externally connected to a dryer (123), a temperature sensor (114) and a humidity sensor (124) are arranged in the detection shell (1), and the air filtering device (13) comprises a circulating fan (131), an air inlet end and an air outlet end of the circulating fan (131) are respectively connected to two sides of the detection shell (1) through pipelines, and an adsorption filter element (132) and an electrostatic generator (134) are installed at the air inlet front end or the air outlet front end of the circulating fan (131).

4. A semiconductor laser bar detection device according to claim 1, 2 or 3, characterized in that: A placement box (14) is arranged inside the detection housing (1), and the placement box (14) is a sealed box body. One side of the placement box (14) is controlled to be connected to the outside of the detection housing (1) through an outer sealing door (141), and the other side of the placement box (14) is controlled to be connected to the inside of the detection housing (1) through an inner sealing door (142). An operating mechanism (15) is installed near the detection bracket (2) and the detection fixture (3).

5. The semiconductor laser bar detection device according to claim 1, characterized in that: The detection bracket (2) comprises a detection platform (21), a sliding frame (22) and a mounting platform (23); the detection platform (21) and the sliding frame (22) are fixedly mounted on the mounting platform (23); the detection platform (21) is mounted on the mounting platform (23) through legs (211); the sliding frame (22) comprises a stand (221), a sliding track (222) and a sliding block (223); the stand (221) is fixedly mounted on the mounting platform (23); the sliding track (222) is vertically fixedly mounted on the stand (221); the sliding block (223) is slidably mounted on the sliding track (222) and is controlled by a linear motor to slide along the sliding track (222).

6. The semiconductor laser bar detection device according to claim 5, characterized in that: The back plate (31) is fixedly mounted on the detection platform (21); a metal sheet (311) is mounted on the back plate (31); a positioning clamping groove (321) is arranged on the positioning block (32); two sides of the positioning clamping groove (321) are pressed toward the middle; a movable clamping head (33) is mounted on the sliding block (223); the detection probe (4) is clamped and fixed on the movable clamping head (33); the movable clamping head (33) is telescopically mounted on the sliding block (223) via a telescopic rod (331); the movable clamping head (33) is clamped and loosened via a clamping bolt (332).

7. The semiconductor laser bar detection device according to claim 6, characterized in that: The detection probe (4) comprises a contact head (41), a spring rod (42) and a wiring head (43); the contact head (41) is telescopically arranged by the spring rod (42); the wiring head (43) is fixedly arranged on the top of the spring rod (42); the wiring head (43) is connected to the contact head (41) through a wire; the wiring head (43) and the metal sheet (311) are respectively connected to the positive and negative electrodes of an independent power supply (431); and a power stabilizer (432) and a power monitor (433) are connected and installed on the independent power supply (431).

8. The semiconductor laser bar detection device according to claim 1, characterized in that: A detection camera (5) is installed on one side of the detection fixture (3) that clamps the semiconductor laser bar. The detection camera (5) comprises a camera head (51) and a display (52). The camera head (51) captures the test status of the semiconductor laser bar clamped by the detection fixture (3). The camera head (51) is communicatively connected to the display (52).

9. A semiconductor laser bar detection method, characterized in that: The following detection steps are included: Placing the semiconductor laser bar in the detection housing (1), and then sealing the detection housing (1); The dehumidification device (12) and the air filtering device (13) are used to dehumidify the air in the detection housing (1) and filter dust and impurities; Using the heat dissipation device (11) to adjust the ambient temperature inside the detection housing (1), and continuously opening the heat dissipation device (11) to cool the inside of the detection housing (1); The semiconductor laser bar is placed vertically and clamped on the detection fixture (3), and then the detection bracket (2) is controlled to drive the detection probe (4) to move and contact one end of the semiconductor laser bar and press it tightly, and the other end of the semiconductor laser bar is placed in contact with the metal sheet (311); The independent power supply (431) is started, and after the independent power supply (431) runs stably, the detection camera (5) is used to observe and detect the state of the semiconductor laser bars.

10. The semiconductor laser bar detection method according to claim 9, characterized in that: The semiconductor laser bar status data detected by the detection camera (5) is stored in a database, and a data statistics and analysis system is established in the database to evaluate the production quality of the semiconductor laser bar.

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