A method, device and system for optimizing connection of equipment under test during production test

Abstract

The present invention relates to the field of equipment testing, and in particular to a method, device and system for optimizing the connection of a tested device during a production test process. The method comprises: determining a tested device electrically connected to a power supply device at every preset period, and sequentially powering on the tested devices that have not been powered on; selecting some of the tested devices that have been powered on to pair and make communication connections; performing communication quality detection on the tested devices that are in communication connection; adjusting the data transmission time period of the test device for communication quality detection so that the test device has idle time; pairing with the unpaired tested device during the idle time; if a tested device completes the communication quality detection, powering off the tested device and making a communication connection with the idle preset frequency band with the paired but uncommunicatively connected tested device; and performing all steps after the communication connection with the newly-communicatively connected tested device. The present invention solves the problem of low test efficiency due to the long waiting time for equipment switching.

Description

Technical Field

[0001] The present invention relates to the field of equipment testing, and in particular to a method, device and system for optimizing the connection of equipment under test in a production testing process. Background Art

[0002] After production, communication equipment needs to go through a series of factory tests, among which the wireless connection function test of communication equipment is a very critical test item. During the process of wireless connection function testing, communication equipment needs to go through the process of equipment power-on, communication connection, and communication testing.

[0003] Currently, when testing the wireless connection function of a communication device, multiple communication devices are usually powered on, connected, and tested at the same time.

[0004] When switching devices, the power-on process and communication connection process of the newly connected device require a waiting period. Even if multiple devices are connected at the same time, this waiting period cannot be avoided. This waiting period will increase the time required for the overall test and reduce the test efficiency. There is a problem of low test efficiency due to the waiting time for device switching. Summary of the invention

[0005] Based on this, it is necessary to provide a method, device and system for optimizing the connection of the equipment under test in the production test process to address the above problems.

[0006] The embodiment of the present invention is implemented as follows: a method for optimizing the connection of a device under test during a production test process is applied to a test device. The method for optimizing the connection of a device under test during a production test process includes:

[0007] S101, determining the devices under test that are electrically connected to the power supply device every preset period, and powering on the devices under test that have not been powered on in turn;

[0008] S102, selecting some powered-on devices under test for pairing according to the number of preset frequency bands and performing communication connection through the paired preset frequency bands;

[0009] S103, performing communication quality detection on the device under test in the communication connection, and determining the progress of the communication quality detection;

[0010] S104, adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process;

[0011] S105, pairing with an unpaired device under test during idle time;

[0012] S106, determining whether any device under test has completed the communication quality detection, and if so, powering off the device under test and establishing a communication connection with an idle preset frequency band and a paired but unconnected device under test;

[0013] S107, repeat S103-S106 until the detection process is completed.

[0014] In one embodiment, the present invention provides a device for optimizing the connection of a device under test during a production test process, the device for optimizing the connection of a device under test during a production test process comprising:

[0015] A power-on module, used to determine the devices under test that are electrically connected to the power supply device every preset period, and to power on the devices under test that have not been powered on in turn;

[0016] A connection module, used for selecting some powered-on devices under test for pairing according to the number of preset frequency bands and performing communication connection through the paired preset frequency bands;

[0017] A detection module, used to perform communication quality detection on the device under test of the communication connection and determine the progress of the communication quality detection;

[0018] An adjustment module, used for adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process;

[0019] A pairing module, used for pairing with an unpaired device under test during idle time;

[0020] The replacement module is used to determine whether there is a device under test that has completed the communication quality detection. If so, the device under test is powered off and the idle preset frequency band is connected to the paired but unconnected device under test for communication.

[0021] In one of the embodiments, the present invention provides a system for optimizing the connection of a device under test during a production test process, the system comprising a power supply device, a computer device, and a plurality of product devices;

[0022] The power supply device is electrically connected to a plurality of the product devices and is used to power the product devices;

[0023] The computer device is connected to the power supply device and a plurality of the product devices, and is used to execute the steps of the method for optimizing the connection of the device under test in the production test process;

[0024] The product device is used to pair and connect with the computer device after power-on and complete communication quality detection.

[0025] The embodiment of the present invention provides a method for optimizing the connection of the tested device in the production test process. The method determines the tested device that is electrically connected to the power supply device every preset period, and sequentially powers on the tested devices that have not been powered on; selects the tested devices that are partially powered on according to the number of preset frequency bands for pairing and performs communication connection through the paired preset frequency bands; performs communication quality detection on the tested devices that are in communication connection, and determines the progress of the communication quality detection; adjusts the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process; pairs with the unpaired tested device through the idle time; determines whether there is a tested device that has completed the communication quality detection, and if so, powers off the tested device and performs communication connection with the paired but uncommunicatively connected tested device with the idle preset frequency band; repeats the above steps until the detection process is completed. In this way, when the tested device performs communication quality detection, the data transmission frame is adjusted to obtain the idle time, and the idle time is used to pair with the unpaired tested device, thereby reducing the waiting time during the communication connection process, increasing the test efficiency, and solving the problem of low test efficiency due to the waiting time of device switching. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a flow chart of a method for optimizing the connection of a device under test in a production test process in one embodiment;

[0027] Figure 2 A logic diagram of a method for optimizing the connection of a device under test in a production test process in one embodiment;

[0028] Figure 3 It is a structural block diagram of a device for optimizing the connection of a device under test in a production test process in an embodiment;

[0029] Figure 4 It is a structural block diagram of a system for optimizing the connection of a device under test in a production test process in one embodiment;

[0030] Figure 5 FIG. 4 is a block diagram of the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0031] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0032] It is understood that the terms "first", "second", etc. used in the present invention may be used herein to describe various elements, but unless otherwise specified, these elements are not limited by these terms. These terms are only used to distinguish a first element from another element. For example, a first xx script may be referred to as a second xx script, and similarly, a second xx script may be referred to as a first xx script without departing from the scope of the present invention.

[0033] like Figure 1 , Figure 2 As shown, in one embodiment, a method for optimizing the connection of a device under test during a production test process is proposed, which may specifically include the following steps:

[0034] S101, determining the devices under test that are electrically connected to the power supply device every preset period, and powering on the devices under test that have not been powered on in turn;

[0035] S102, selecting some powered-on devices under test for pairing according to the number of preset frequency bands and performing communication connection through the paired preset frequency bands;

[0036] S103, performing communication quality detection on the device under test in the communication connection, and determining the progress of the communication quality detection;

[0037] S104, adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process;

[0038] S105, pairing with an unpaired device under test during idle time;

[0039] S106, determining whether any device under test has completed the communication quality detection, and if so, powering off the device under test and establishing a communication connection with an idle preset frequency band and a paired but unconnected device under test;

[0040] S107, repeat S103-S106 until the detection process is completed.

[0041] In this embodiment, the preset period is related to the detection period of the device under test, and can be set to half of the average value of the historical detection periods of the device under test or even a smaller value.

[0042] In this embodiment, the unpowered devices under test are powered on in sequence to prevent excessive instantaneous current when they are powered on at the same time. The power supply device has limited interfaces, and the electrical connection of the devices under test can only be achieved when the interfaces are free. Therefore, it is normal to power on in sequence.

[0043] In this embodiment, the device under test is electrically connected to the power supply device and the device under test is powered on. Electrical connection between the device under test and the power supply device means that the power input terminal of the device under test is connected to the power output terminal of the power supply device, which does not mean that power flows into the device under test, for example, when the hard / software switch is in the off state, when the power supply device does not output voltage, etc. The operation process is implemented manually or by machine, specifically, the plugging and unplugging of the interface. Powering on the device under test will only occur after the device under test and the power supply device are electrically connected, for example, when the test device controls the output voltage of the power supply device, when the hard / software switch is closed, etc. The operation process is implemented by the setting of the program, specifically, the opening and closing of the input switch is realized by the program. The test device is also connected to the power supply device to control the voltage output of the power supply device.

[0044] In this embodiment, the frequency bands supported by the device under test can be evenly divided into several parts, for example, 10 parts. The divided frequency bands are preset frequency bands, and the number of preset frequency bands is 10, which also means that the maximum number of devices under test that can be paired is 10. The number of preset frequency bands is the maximum number of devices under test that can be paired and connected for communication at the same time.

[0045] In this embodiment, pairing requires pairing waiting time, and communication quality detection after communication connection also requires detection time. The optimization process is mainly reflected in two aspects: one is to let other tested devices power on in advance when the tested device is performing communication quality detection, and the other is to let other tested devices pair in advance when the tested device is performing communication quality detection.

[0046] In this embodiment, the communication quality detection can be that the test device sends a test instruction, and the device under test returns a return instruction after receiving the test instruction. The test device evaluates the communication quality according to the data volume, time and other indicators of the test instruction and the return instruction. For a device under test, the communication quality detection needs to be performed once for each preset frequency band. Therefore, the progress of the communication quality detection can be understood as the progress of the preset frequency band being detected.

[0047] In this embodiment, the shorter the data sending time period, the shorter the data sending interval, that is, the device sends and receives data more frequently, and the power consumption of the test device and the device under test will also be greater. Generally, it is necessary to set a suitable data sending time period. This suitable data sending time period can be several times of the minimum data sending time period, for example 3-5 times.

[0048] In this embodiment, the unpaired device under test in S105 must be a device under test that has been powered on. Therefore, it is required that there is always a device under test that has been powered on waiting for pairing, so as to improve the efficiency of production testing.

[0049] In this embodiment, the completion of the communication quality detection of the device under test in S106 means that the device under test performs a communication quality detection on all preset frequency bands. When the device under test is powered off, the interface electrically connecting the device under test to the power supply device is disconnected.

[0050] In this embodiment, after S106, it also includes updating the average pairing time according to the progress of the communication quality detection of all paired devices under test; updating the preset communication quality detection time according to the progress of the communication quality detection of the powered-off devices under test. Updating the average pairing time according to the progress of the communication quality detection of all paired devices under test is essentially to obtain the pairing time in the progress of the communication quality detection of all paired devices under test. The average value of all pairing time can be calculated to update the average pairing time, or the average value of the pairing time of the latest number of preset frequency bands can be calculated to update the average pairing time. After the device under test is powered off, the maximum detection time in the progress of the communication quality detection of the device under test is the communication quality detection time of the device under test. Therefore, the average value of the communication quality detection time of all powered-off devices under test can be obtained to update the preset communication quality detection time. When updating the average pairing time and the preset communication quality detection time, it is necessary to remove the data of the devices under test with abnormal conditions such as unqualified communication quality detection, abnormal pairing time, and abnormal communication connection time.

[0051] In this embodiment, since the number of preset frequency bands is consistent with the number of devices under test for communication connection, when a device under test is powered off, a preset frequency band will be vacated, and this preset frequency band is the idle preset frequency band. The frequency band used for pairing and the frequency band for communication connection can be different or the same.

[0052] The embodiment of the present invention provides a method for optimizing the connection of the tested device in the production test process. The method determines the tested device that is electrically connected to the power supply device every preset period, and sequentially powers on the tested device that has not been powered on; selects the tested devices that are partially powered on according to the number of preset frequency bands for pairing and performs communication connection through the paired preset frequency bands; performs communication quality detection on the tested device that is in communication connection, and determines the progress of the communication quality detection; adjusts the data sending time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process; pairs with the unpaired tested device through the idle time; determines whether there is a tested device that has completed the communication quality detection, and if so, powers off the tested device and performs communication connection with the paired but uncommunicatively connected tested device through the idle preset frequency band; repeats the above steps until the detection process is completed. In this way, when the tested device performs communication quality detection, the data sending frame is adjusted to obtain the idle time, and the idle time is used to pair with the unpaired tested device, thereby reducing the waiting time during the communication connection process, increasing the test efficiency, and solving the problem of low test efficiency due to the long waiting time for device switching.

[0053] In one embodiment, the step of sequentially powering on the tested devices that have not been powered on includes:

[0054] Select the first device under test to power on according to the time sequence of electrical connection between the device under test and the power supply device;

[0055] Determine whether the number of the tested devices that are powered on is greater than or equal to a preset number. If not, select the next tested device to be powered on according to the time sequence of the electrical connection between the tested devices and the power supply device. If yes, determine whether any tested device is powered off.

[0056] If a device under test is powered off, the next device under test is selected for powering on based on the time sequence in which the devices under test were connected to the test device;

[0057] If no device under test is powered off, powering on the device under test is suspended until a device under test is powered off.

[0058] In this embodiment, the time sequence of the electrical connection between the devices under test and the power supply device can be determined by the time sequence of the hardware interfaces of the power supply device being connected. The first device under test here is counted from the device under test that has not been powered on.

[0059] In this embodiment, there is a power-on waiting time when the device under test is powered on, so it is generally necessary to power on in advance, so the number of devices under test that are powered on must be greater than the number of preset frequency bands, that is, the preset number must be greater than the number of preset frequency bands. If the number of devices under test that are powered on is equal to the number of preset frequency bands, then a power-on waiting time is required before pairing, which seriously affects the production test efficiency. Of course, the preset number here can only be slightly greater than the number of preset frequency bands, for example, 20% more than the number of preset frequency bands. This is because the more devices under test that are powered on, the greater the load on the power supply device, which may affect the output voltage of the power supply device. And from the perspective of power consumption, the earlier the power is powered on, the more devices under test are powered on, and the more power is consumed, which is not conducive to cost saving.

[0060] In one embodiment, the selecting of some powered-on devices under test for pairing according to the number of preset frequency bands and performing communication connection through the paired preset frequency bands includes:

[0061] Selecting the same number of powered-on devices under test as the number of preset frequency bands according to the time sequence of electrical connection between the devices under test and the power supply device;

[0062] Pair the selected powered-on device under test with the preset frequency band one-to-one;

[0063] After pairing is completed, a communication connection is established with the selected powered-on device under test through the paired preset frequency band.

[0064] In this embodiment, it is also possible not to communicate with the selected powered-on device under test through the paired preset frequency band, and it is only necessary to ensure that the preset frequency band and the powered-on device under test are one-to-one. Because one device under test communicates with the test device once through all the preset frequency bands to perform communication quality detection.

[0065] In one embodiment, the performing communication quality detection on the device under test in the communication connection includes:

[0066] S401, sorting the preset frequency bands in ascending order and connecting the beginning and the end of the sorting to form a loop;

[0067] S402, for each device under test connected in communication, determine whether the device under test has completed a communication quality test through a preset frequency band of the communication connection, and if so, determine whether the next preset frequency band of the preset frequency band of the communication connection of the device under test is idle, and if so, control the test device to communicate with the device under test through the next preset frequency band;

[0068] S403, repeat S402 until the testing device is connected to the tested device once through each preset frequency band.

[0069] In this embodiment, the preset frequency bands may also be sorted in other orders. Connecting the beginning and the end of the sorting to form a cycle means that the next preset frequency band of the last sorted preset frequency band is the first sorted preset frequency band.

[0070] In this embodiment, the device under test completes a communication quality test through the preset frequency band of the communication connection, and the preset frequency band is in an idle state. Although it is in the communication connection state, no data is sent or received.

[0071] In this embodiment, in S403, a communication quality check is performed every time a communication connection is established.

[0072] In one embodiment, determining the progress of the communication quality detection includes:

[0073] Determine the pairing time for each device under test;

[0074] Monitor the testing time of each device under test;

[0075] The pairing time and detection time of each device under test are respectively determined as the progress of the communication quality detection of each device under test.

[0076] In this embodiment, for the progress of the communication quality detection of a device under test, the pairing time of the device under test is a fixed value, and the detection time is a variable value.

[0077] In one embodiment, determining the pairing duration of each device under test includes:

[0078] For each device under test, determine the time t1 when the device under test is first identified;

[0079] Determine the time t2 when the device under test is connected to the test device through communication;

[0080] Depend on Get the pairing time of the device under test.

[0081] In this embodiment, the process from the testing device identifying the device under test to the communication connection with the device under test is the pairing process, and the elapsed time is the pairing time.

[0082] In this embodiment, the device under test is paired with the test device for the first time, which generally takes a long time. Therefore, pairing is performed first during the communication quality detection of other devices under test to increase the efficiency of production testing.

[0083] In one embodiment, adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process includes:

[0084] Determine the average pairing time T1 according to the progress of the communication quality detection;

[0085] Depend on Get adjustment time;

[0086] According to the progress of the communication quality detection, it is determined whether there is a device under test whose detection time is equal to the adjustment time. If so, the device under test whose detection time is equal to the adjustment time is recorded as the adjustment device;

[0087] Obtain the data transmission time cycle of the adjustment device, shorten the data transmission time cycle, and record the time remaining after each data transmission time cycle is shortened as idle time;

[0088] Among them, T0 is the preset communication quality detection duration.

[0089] In this embodiment, the specific method for determining the average pairing time T1 according to the progress of the communication quality detection can be: obtaining the latest pairing time in the progress of the communication quality detection of the tested devices whose number is the number of preset frequency bands, and determining the average pairing time T1 based on the obtained pairing time.

[0090] In this embodiment, the preset communication quality detection time duration may be obtained from an average value of historical communication quality detection time durations.

[0091] In this embodiment, the data sending time cycle that has not been shortened is continuous, and each data sending time cycle is disconnected after the data sending time cycle is shortened, and the disconnected part is the idle time, that is, the arrangement is shortened data sending time cycle-idle time-shortened data sending time cycle-idle time.

[0092] In one embodiment, shortening the data transmission time period includes:

[0093] Determine all time slots A within the data transmission time period;

[0094] Determine a time slot B participating in communication quality detection within a data transmission time period;

[0095] Depend on Get the duty cycle;

[0096] Determine whether the duty cycle is greater than or equal to 1 / 2. If so, shorten the data transmission time period to the time period occupied by time slot B. If not, determine whether the duty cycle is greater than or equal to 1 / 4.

[0097] If the duty cycle is greater than or equal to 1 / 4, the data transmission time period is shortened to 1 / 2 of the original period;

[0098] If the duty cycle is not greater than or equal to 1 / 4, the data transmission time period is shortened to twice the time period occupied by time slot B;

[0099] Wherein, a is the number of time slots A, and b is the number of time slots B.

[0100] In this embodiment, the length of each time slot in the data transmission time period is fixed, so a is a fixed value, and a is set to a multiple of 4. The time slot B participating in the communication quality detection in the data transmission time period refers to the time slot B of the test instruction sent in the data transmission time period, and the time slot B can be continuous or disconnected. If all time slots A participate in the communication quality detection, that is, time slot A is time slot B, then there is no idle time slot, so the power consumption of the test equipment will be very large, and because the test equipment is connected to multiple devices under test, all frequency bands are always transmitting data, which will cause network congestion and affect the results of communication quality detection. Therefore, there are usually several idle time slots in time slot A, for example, there is only one time slot B, but there are 3 idle time slots, and these idle time slots generally do not transmit data. Therefore, these idle time slots can be used to pair the devices under test. Although the pairing process is also a process of data sending and receiving, only a few frequency bands or even only one frequency band uses idle time slots for pairing each time, which will not bring huge power consumption to the test equipment, and the impact on the network is also very small.

[0101] In this embodiment, if the duty cycle is greater than or equal to 1 / 2, then there is no need to leave empty time slots. At this time, the time left after shortening is the sum of the time slots in time slot A excluding time slot B. If the duty cycle is between 1 / 2 and 1 / 4, the data transmission time period is shortened to 1 / 2 of the original time slot, so that there can be empty time slots in the data transmission time period. If the duty cycle is less than 1 / 4, then the number of empty time slots in the shortened data transmission time period is the same as the number of time slots B. When shortening the data transmission time period, try to make empty time slots exist in the data transmission time period to avoid increased power consumption and network congestion. Only when the duty cycle is greater than or equal to 1 / 2, there is no need to leave empty time slots, because the maximum amount of data sent in each time slot is fixed. If the duty cycle is greater than or equal to 1 / 2 and there are still empty time slots, then the time left after the data transmission time period is shortened, that is, the idle time, is very short or even non-existent, and pairing during the idle time is also a process of data transmission, and it is also necessary to leave empty time slots as much as possible.

[0102] like Figure 3 As shown, in one embodiment, a device for optimizing the connection of a device under test during a production test process is provided, which may specifically include:

[0103] A power-on module, used to determine the devices under test that are electrically connected to the power supply device every preset period, and to power on the devices under test that have not been powered on in turn;

[0104] A connection module, used for selecting some powered-on devices under test for pairing according to the number of preset frequency bands and performing communication connection through the paired preset frequency bands;

[0105] A detection module, used to perform communication quality detection on the device under test of the communication connection and determine the progress of the communication quality detection;

[0106] An adjustment module, used for adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process;

[0107] A pairing module, used for pairing with an unpaired device under test during idle time;

[0108] The replacement module is used to determine whether there is a device under test that has completed the communication quality detection. If so, the device under test is powered off and the idle preset frequency band is connected to the paired but unconnected device under test for communication.

[0109] In this embodiment, the various modules of the device for optimizing the connection of the equipment under test in the production test process are modularized parts of the method of the present invention. For the specific explanation of each module, please refer to the corresponding content of the method of the present invention, and the embodiments of the present invention will not be repeated here.

[0110] like Figure 4 As shown, in one embodiment, a system for optimizing the connection of a device under test during a production test process is provided, which may specifically include: a power supply device, a computer device, and a plurality of product devices;

[0111] The power supply device is electrically connected to a plurality of the product devices and is used to power the product devices;

[0112] The computer device is connected to the power supply device and a plurality of the product devices, and is used to execute the steps of the method for optimizing the connection of the device under test in the production test process;

[0113] The product device is used to pair and connect with the computer device after power-on and complete communication quality detection.

[0114] In this embodiment, the computer device is the testing device, and the product device is the device under test.

[0115] In this embodiment, the device under test may be a communication device such as a router.

[0116] In this embodiment, the power supply device here only provides voltage for the product device so that the product device can be powered on. In order not to increase the power consumption of the power supply device, the voltage of the computer device is provided by other power supply devices. Therefore, the power supply device here is connected to the computer device only so that the computer device can obtain the time sequence of the interface of the power supply device connected to the product device and control the power supply device to power on the product device.

[0117] The embodiment of the present invention provides a test device connection optimization system in a production test process, which determines the test device electrically connected to the power supply device every preset period, and sequentially powers on the test device that has not been powered on; selects the partially powered-on test devices according to the number of preset frequency bands for pairing and performs communication connection through the paired preset frequency bands; performs communication quality detection on the test device that is in communication connection, and determines the progress of the communication quality detection; adjusts the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process; pairs with the unpaired test device through the idle time; determines whether there is a test device that has completed the communication quality detection, and if so, powers off the test device and performs communication connection with the paired but unconnected test device through the idle preset frequency band; repeats the above steps until the detection process is completed. In this way, when the test device performs communication quality detection, the data transmission frame is adjusted to obtain the idle time, and the idle time is used to pair with the unpaired test device, thereby reducing the waiting time during the communication connection process, increasing the test efficiency, and solving the problem of low test efficiency due to the long waiting time for device switching.

[0118] Figure 5 FIG. 2 shows an internal structure diagram of a computer device in one embodiment. Figure 5 As shown, the computer device includes a processor, a memory, a network interface, an input device and a display screen connected through a system bus. Among them, the memory includes a non-volatile storage medium and an internal memory. The non-volatile storage medium of the computer device stores an operating system and may also store a computer program. When the computer program is executed by the processor, the processor can implement a method for optimizing the connection of a device under test in a production test process provided by an embodiment of the present invention. The internal memory may also store a computer program. When the computer program is executed by the processor, the processor can execute a method for optimizing the connection of a device under test in a production test process provided by an embodiment of the present invention. The display screen of the computer device may be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device may be a touch layer covered on the display screen, or a button, trackball or touchpad provided on the housing of the computer device, or an external keyboard, touchpad or mouse, etc.

[0119] Those skilled in the art will understand that Figure 5The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present invention, and does not constitute a limitation on the computer device to which the solution of the present invention is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0120] In one embodiment, a device for optimizing the connection of a device under test during a production test process provided by an embodiment of the present invention can be implemented in the form of a computer program. The computer program can be used in Figure 5 The computer device shown in the figure is run. The memory of the computer device can store various program modules that constitute the device for optimizing the connection of the device under test in the production test process, for example, Figure 3 The power-on module, connection module, detection module, adjustment module, pairing module and replacement module shown in the figure. The computer program composed of each program module enables the processor to execute the steps of the method for optimizing the connection of the device under test in the production test process of each embodiment of the present invention described in this specification.

[0121] For example, Figure 5 The computer device shown can be Figure 3 In the production test process shown, the power-on module in the tested device connection optimization device executes step S101; the computer device can execute step S102 through the connection module; the computer device can execute step S103 through the detection module; the computer device can execute step S104 through the adjustment module; the computer device can execute step S105 through the pairing module; the computer device can execute step S106 through the replacement module.

[0122] In one embodiment, a computer device is provided, the computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the following steps are implemented:

[0123] S101, determining the devices under test that are electrically connected to the power supply device every preset period, and powering on the devices under test that have not been powered on in turn;

[0124] S102, selecting some powered-on devices under test for pairing according to the number of preset frequency bands and performing communication connection through the paired preset frequency bands;

[0125] S103, performing communication quality detection on the device under test in the communication connection, and determining the progress of the communication quality detection;

[0126] S104, adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process;

[0127] S105, pairing with an unpaired device under test during idle time;

[0128] S106, determining whether any device under test has completed the communication quality detection, and if so, powering off the device under test and establishing a communication connection with an idle preset frequency band and a paired but unconnected device under test;

[0129] S107, repeat S103-S106 until the detection process is completed.

[0130] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the processor performs the following steps:

[0131] S101, determining the devices under test that are electrically connected to the power supply device every preset period, and powering on the devices under test that have not been powered on in turn;

[0132] S102, selecting some powered-on devices under test for pairing according to the number of preset frequency bands and performing communication connection through the paired preset frequency bands;

[0133] S103, performing communication quality detection on the device under test in the communication connection, and determining the progress of the communication quality detection;

[0134] S104, adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process;

[0135] S105, pairing with an unpaired device under test during idle time;

[0136] S106, determining whether any device under test has completed the communication quality detection, and if so, powering off the device under test and establishing a communication connection with an idle preset frequency band and a paired but unconnected device under test;

[0137] S107, repeat S103-S106 until the detection process is completed.

[0138] It should be understood that, although each step in the flow chart of each embodiment of the present invention is shown in sequence according to the indication of the arrow, these steps are not necessarily performed in sequence according to the order indicated by the arrow. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be performed in other orders. Moreover, at least a portion of the steps in each embodiment may include a plurality of sub-steps or a plurality of stages, and these sub-steps or stages are not necessarily performed at the same time, but can be performed at different times, and the execution order of these sub-steps or stages is not necessarily performed in sequence, but can be performed in turn or alternately with at least a portion of other steps or sub-steps or stages of other steps.

[0139] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a computer program, and the program can be stored in a non-volatile computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided by the present invention can include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0140] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0141] The above-mentioned embodiments only express several implementation methods of the present invention, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the scope of the present invention. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention.

Claims

1. A method for optimizing the connection of a device under test during a production test process, applied to a test device, characterized in that: The method for optimizing the connection of the device under test during the production test process includes: S101, determining the devices under test that are electrically connected to the power supply device every preset period, and powering on the devices under test that have not been powered on in turn; S102, selecting some powered-on devices under test for pairing according to the number of preset frequency bands and performing communication connection through the paired preset frequency bands; S103, performing communication quality detection on the device under test in the communication connection, and determining the progress of the communication quality detection; S104, adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process; S105, pairing with an unpaired device under test during idle time; S106, determining whether any device under test has completed the communication quality detection, and if so, powering off the device under test and establishing a communication connection with an idle preset frequency band and a paired but unconnected device under test; S107, repeat S103-S106 until the detection process is completed; The step of determining the progress of the communication quality detection includes: Determine the pairing time for each device under test; Monitor the testing time of each device under test; The pairing time and detection time of each device under test are respectively determined as the progress of the communication quality detection of each device under test; The step of adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process includes: Determine the average pairing time T1 according to the progress of the communication quality detection; Depend on Get adjustment time; According to the progress of the communication quality detection, it is determined whether there is a device under test whose detection time is equal to the adjustment time. If so, the device under test whose detection time is equal to the adjustment time is recorded as the adjustment device; Obtain the data transmission time cycle of the adjustment device, shorten the data transmission time cycle, and record the time remaining after each data transmission time cycle is shortened as idle time; Among them, T0 is the preset communication quality detection duration.

2. The method for optimizing the connection of the equipment under test in the production test process according to claim 1, characterized in that: The step of sequentially powering on the devices under test that have not been powered on includes: Select the first device under test to power on according to the time sequence of electrical connection between the device under test and the power supply device; Determine whether the number of the tested devices that are powered on is greater than or equal to a preset number. If not, select the next tested device to be powered on according to the time sequence of the electrical connection between the tested devices and the power supply device. If yes, determine whether any tested device is powered off. If a device under test is powered off, the next device under test is selected for powering on based on the time sequence in which the devices under test were connected to the test device; If no device under test is powered off, powering on the device under test is suspended until a device under test is powered off.

3. The method for optimizing the connection of the equipment under test in the production test process according to claim 1, characterized in that: The method of selecting some powered-on devices under test for pairing according to the number of preset frequency bands and performing communication connection through the paired preset frequency bands includes: Selecting the same number of powered-on devices under test as the number of preset frequency bands according to the time sequence of electrical connection between the devices under test and the power supply device; Pair the selected powered-on device under test with the preset frequency band one-to-one; After pairing is completed, a communication connection is established with the selected powered-on device under test through the paired preset frequency band.

4. The method for optimizing the connection of the equipment under test in the production test process according to claim 1, characterized in that: The communication quality detection of the device under test in the communication connection includes: S401, sorting the preset frequency bands in ascending order and connecting the beginning and the end of the sorting to form a loop; S402, for each device under test connected in communication, determine whether the device under test has completed a communication quality test through a preset frequency band of the communication connection, and if so, determine whether the next preset frequency band of the preset frequency band of the communication connection of the device under test is idle, and if so, control the test device to communicate with the device under test through the next preset frequency band; S403, repeat S402 until the testing device is connected to the tested device once through each preset frequency band.

5. The method for optimizing the connection of the equipment under test in the production test process according to claim 1, characterized in that: Determining the pairing time of each device under test includes: For each device under test, determine the time t1 when the device under test is first identified; Determine the time t2 when the device under test is connected to the test device through communication; Depend on Get the pairing time of the device under test.

6. The method for optimizing the connection of the equipment under test in the production test process according to claim 1, characterized in that: The method of shortening the data transmission time period includes: Determine all time slots A within the data transmission time period; Determine a time slot B participating in communication quality detection within a data transmission time period; Depend on Get the duty cycle; Determine whether the duty cycle is greater than or equal to 1 / 2. If so, shorten the data transmission time period to the time period occupied by time slot B. If not, determine whether the duty cycle is greater than or equal to 1 / 4. If the duty cycle is greater than or equal to 1 / 4, the data transmission time period is shortened to 1 / 2 of the original period; If the duty cycle is not greater than or equal to 1 / 4, the data transmission time period is shortened to twice the time period occupied by time slot B; Wherein, a is the number of time slots A, and b is the number of time slots B.

7. A device for optimizing the connection of a device under test during a production test process, characterized in that: The device for optimizing the connection of the equipment under test during the production test process comprises: A power-on module, used to determine the devices under test that are electrically connected to the power supply device every preset period, and to power on the devices under test that have not been powered on in turn; A connection module, used for selecting some powered-on devices under test for pairing according to the number of preset frequency bands and performing communication connection through the paired preset frequency bands; A detection module, used to perform communication quality detection on the device under test of the communication connection and determine the progress of the communication quality detection; An adjustment module, used for adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process; A pairing module, used for pairing with an unpaired device under test during idle time; The replacement module is used to determine whether a device under test has completed the communication quality detection. If so, the device under test is powered off and the idle preset frequency band is used to establish a communication connection with a paired but unconnected device under test; The step of determining the progress of the communication quality detection includes: Determine the pairing time for each device under test; Monitor the testing time of each device under test; The pairing time and detection time of each device under test are respectively determined as the progress of the communication quality detection of each device under test; The step of adjusting the data transmission time period of the test device for communication quality detection according to the progress of the communication quality detection so that the test device has idle time during the communication quality detection process includes: Determine the average pairing time T1 according to the progress of the communication quality detection; Depend on Get adjustment time; According to the progress of the communication quality detection, it is determined whether there is a device under test whose detection time is equal to the adjustment time. If so, the device under test whose detection time is equal to the adjustment time is recorded as the adjustment device; Obtain the data transmission time cycle of the adjustment device, shorten the data transmission time cycle, and record the time remaining after each data transmission time cycle is shortened as idle time; Among them, T0 is the preset communication quality detection duration.

8. A system for optimizing the connection of equipment under test during production testing, characterized in that: The device connection optimization system for the production test process includes power supply equipment, computer equipment and several product equipment; The power supply device is electrically connected to a plurality of the product devices and is used to power the product devices; The computer device is connected to the power supply device and a plurality of the product devices, and is used to perform the steps of the method for optimizing the connection of the device under test in the production test process according to any one of claims 1 to 6; The product device is used to pair and connect with the computer device after power-on and complete communication quality detection.

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