Time division multiplexing hemispherical resonator gyroscope circuit phase error testing device and method

Abstract

The invention discloses a time division multiplexing hemispherical resonator gyroscope circuit phase error testing device and method. The testing device comprises an SOC control module, an excitation signal amplification module, a switch module, an electrode and a detection signal amplification module. According to the test method, switching of two working states of X-electrode excitation detection and Y-electrode excitation detection is guaranteed through a switch control signal generated in the SOC control module, and the phase-locked loop calculates X-direction excitation and Y-direction excitation and detection circuit phase errors according to an excitation signal and a detection signal. According to the invention, the circuit phase error under the time division multiplexing scheme is tested, and the influence of the characteristics of hardware circuits such as detection and excitation amplification modules on the system phase error can be measured; meanwhile, the working state is switched on the X channel and the Y channel in the testing process, and the system phase error caused by the switching-on time difference and the switching-off time difference of the two channel switch modules can be measured.

Description

Technical Field

[0001] The invention belongs to the technical field of hemispherical resonant gyro error testing, and discloses a time-division multiplexing hemispherical resonant gyro circuit phase error testing device and method. Background Art

[0002] As the Columbia vibratory gyroscope with the highest accuracy index at present, the hemispherical resonant gyroscope has the advantages of high resolution, small size, low power consumption, small number of parts and short startup time compared to the widely used optical gyroscope. In particular, in recent years, various research institutions in the United States, France and other countries have successively launched ultra-high precision gyroscope systems with zero bias stability better than 0.0001° / h, making the hemispherical resonant gyroscope expected to become a "disruptive technology" that will change the field of inertial navigation in the 21st century.

[0003] During the processing of hemispherical resonant gyroscopes, axial non-uniformity, assembly errors, and circuit hardware differences will seriously restrict the improvement of gyroscope accuracy. The errors can be decomposed into: detection and excitation gain error, phase error, and damping unevenness error. Error suppression measures mainly include improving the processing quality of the resonator, improving the assembly process, optimizing the hardware circuit solution, and software algorithm compensation. Time division multiplexing technology is the most effective way to optimize the circuit. Through switch control, the electrodes work in different modes such as excitation or detection at different times, effectively avoiding the coupling crosstalk of the excitation signal to the detection loop. At the same time, the signal detection and excitation of the resonator in the X and Y directions use the same circuit multiplexing form, which solves the gain error caused by the differences in different channel circuits.

[0004] When the time-division multiplexing hemispherical resonant gyroscope is working, it needs to use a switch chip to switch the state. However, the signal turn-on time and turn-off time of switches in different channels are different, which will introduce additional phase errors between the X and Y channels, restricting the accuracy of the gyroscope system. Summary of the invention

[0005] In order to solve the technical problem of phase error in a time-division multiplexed hemispherical resonant gyro circuit, the present invention detects the phase error in the time-division multiplexed hemispherical resonant gyro circuit and measures its long-term stability and temperature change characteristics to provide a numerical reference for system phase error compensation.

[0006] The invention discloses a time-division multiplexing hemispherical resonant gyro circuit phase error testing device, the time-division multiplexing hemispherical resonant gyro circuit phase error testing device comprises a SOC control module, an excitation signal amplification module, a switch module, an electrode and a detection signal amplification module;

[0007] The excitation signal amplification module is used to provide excitation signals for electrodes in the X and Y channels;

[0008] The detection signal amplification module is used to sample and amplify the X and Y channel signals and then input them into the SOC control module;

[0009] The electrodes consist of eight groups of discrete electrodes, which are evenly distributed outside the resonator at 45° intervals;

[0010] The switch module responds to the control signal generated by the switch signal generating module to ensure that the system switches between the X and Y working states;

[0011] The SOC control module includes a phase-locked loop, an excitation signal generating module, a switch signal generating module and a detection signal sampling module; the sinusoidal signal generated by the excitation signal generating module is used as the input of the excitation amplification module and the reference signal of the phase-locked loop at the same time, the switch signal generating module is used to generate a control signal for controlling the switching of the working states in the X and Y directions, and the output of the detection signal sampling module is used as another input signal of the phase-locked loop; the phase-locked loop is used to solve the phase error of the X and Y channels.

[0012] Furthermore, the eight groups of discrete electrodes are divided into four directions of X+, X-, Y+ and Y-, two electrodes are arranged opposite to each other in each direction, and the opposite electrodes are short-circuited in pairs.

[0013] Furthermore, the excitation signal amplification module includes a first high-voltage amplifier circuit, a second high-voltage amplifier circuit and an inverting circuit, wherein the inverting circuit and the second high-voltage amplifier circuit are combined to provide an inverted excitation signal for the X- and Y- electrodes in the X and Y channels; the first high-voltage amplifier circuit provides an inverted excitation signal for the X+ and Y+ electrodes in the X and Y channels.

[0014] Furthermore, the detection signal amplification module includes a first sampling circuit, a second sampling circuit and a differential amplifier circuit; the first sampling circuit includes a first sampling resistor and a first operational amplifier; the second sampling circuit includes a second sampling resistor and a second operational amplifier; the output ends of the first operational amplifier and the second operational amplifier are connected to the differential amplifier circuit.

[0015] Furthermore, the switch module includes 4 groups of switches, switch S1, switch S2, switch S3, and switch S4; and is divided into a first switch group and a second switch group, the first switch includes a first switch S3, a first switch S4, a second switch S3, and a second switch S4, the second switch includes a first switch S1, a first switch S2, a second switch S1, and a second switch S2, and two switches in the same group of the 4 groups of switches are disconnected at the same time; the first X- is connected to the negative input of the second operational amplifier through the first switch S1; the first X+ is connected to the negative input of the first operational amplifier through the second switch S1; the first Y- is connected to the negative input of the second operational amplifier through the first switch S2; the first Y+ is connected to the negative input of the first operational amplifier through the second switch S2; the second X- is connected to the second high-voltage amplifier circuit through the first switch S4; the second X+ is connected to the first high-voltage amplifier circuit through the second switch S4; the second Y- is connected to the second high-voltage amplifier circuit through the first switch S3; the second Y+ is connected to the first high-voltage amplifier circuit through the second switch S3.

[0016] A time-division multiplexing hemispherical resonant gyro circuit phase error testing method is also provided, and the time-division multiplexing hemispherical resonant gyro circuit phase error testing method comprises the following steps:

[0017] Step 701: The excitation signal generating module generates two sinusoidal signals with a frequency of ω0;

[0018] Step 702: the excitation signal amplification module performs inversion and high-voltage amplification on one sinusoidal signal, and performs only high-voltage amplification on the other sinusoidal signal;

[0019] Step 703: The switch signal generating module controls the switch module so that the switch groups S1 and S4, and S2 and S3 are switched on and off alternately, corresponding to the test states of the X and Y channels respectively;

[0020] Step 704: the first sampling circuit and the second sampling circuit in the detection signal amplification module sample the X and Y channel signals according to the on-off status of the second switch group, and then output them through the differential amplifier circuit;

[0021] Step 705: the detection signal sampling module collects the output signal of the detection signal amplification module and transmits it to the phase-locked loop;

[0022] Step 706: The phase-locked loop calculates the phase error and variation characteristics of the X and Y channels according to the reference signal and the detection signal.

[0023] Furthermore, in step 701, the sinusoidal signal is also used as a reference signal input of a phase-locked loop:

[0024] V in =V ref ·sin(ω0t)

[0025] Among them, Vref is the amplitude of the excitation sinusoidal signal.

[0026] Furthermore, in step 702, the two signals after passing through the excitation signal amplification module are expressed as:

[0027] V in+ =G1V ref ·sin(ω0t)

[0028] V in- =-G1V ref ·sin(ω0t)

[0029] Among them, G1 represents the gain of the high-voltage amplifier circuit, V in+ Represents the signal of the first high-voltage amplifier circuit, V in- Represents the signal of the second high-voltage amplifier circuit.

[0030] Furthermore, in step 703, the control logic sequence of the switch signal generating module is: [S1=1, S2=0, S3=0, S4=1], [S1=0, S2=0, S3=0, S4=0], [S1=0, S2=1, S3=1, S4=0], which respectively correspond to the three state switchings of X channel detection and excitation, idle state, and Y channel detection and excitation, wherein the number 1 represents the switch-on state, and the number 0 represents the switch-off state; the output of the detection signal sampling module is used as another input signal of the phase-locked loop, and the phase errors of the X and Y channels are solved.

[0031] Furthermore, in step 704, the X and Y channel signals can be expressed as:

[0032]

[0033] Where G2 is the gain of the first sampling circuit and the second sampling circuit, which can be expressed as G2 = -R1 / R S1 =-R2 / R S2 , R1 is the first transresistance, R2 is the second transresistance, R S0 is the first sampling resistor, R 12 is the second sampling resistor; G3 is the gain of the differential amplifier circuit, and The system phase error is caused by the difference in the opening and closing time of the X and Y channel switch modules.

[0034] The beneficial effects achieved by the present invention are:

[0035] The hemispherical resonant gyroscope using the time division multiplexing scheme of the present invention can effectively avoid the coupling crosstalk of the excitation signal to the detection loop, and at the same time reduce the gain error caused by the difference of different channel circuits.

[0036] The present invention tests the circuit phase error under the time division multiplexing scheme, and can measure the influence of hardware circuit characteristics such as detection and excitation amplification modules on the system phase error.

[0037] During the test process of the present invention, the working state is switched between the X channel and the Y channel, and the system phase error caused by the difference in the opening and closing time of the two-channel switch modules can be measured.

[0038] The test device of the present invention is simple, and only needs to add a sampling resistor and a phase-locked loop algorithm based on the original hardware. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 This is a hardware system diagram of a time-division multiplexed hemispherical resonant gyroscope;

[0040] Figure 2 It is a schematic diagram of the time-division multiplexing hemispherical resonant gyro switch control signal and the gyro working status;

[0041] Figure 3 A schematic diagram of the phase error of the detection signal when the on and off times of the switch module are equal;

[0042] Figure 4 A schematic diagram of detecting the phase error of a signal when the on and off times of a switch module are not equal;

[0043] Figure 5 This is a diagram of a phase error test device for a time-division multiplexed hemispherical resonant gyro circuit;

[0044] Figure 6 It is a schematic diagram of the switch control signal and the gyroscope working state under the phase error test;

[0045] Figure 7 The flowchart of the phase error test method of the time-division multiplexed hemispherical resonant gyroscope circuit is shown in FIG. DETAILED DESCRIPTION

[0046] The present invention will be further described below in conjunction with specific embodiments, and the advantages and features of the present invention will become clearer as the description proceeds. However, these embodiments are exemplary only and do not constitute any limitation to the scope of the present invention. It should be understood by those skilled in the art that the details and forms of the technical solution of the present invention may be modified or replaced without departing from the spirit and scope of the present invention, but these modifications and replacements all fall within the scope of protection of the present invention.

[0047] Embodiment 1

[0048] The purpose of the present invention is to provide a time-division multiplexing hemispherical resonant gyroscope hardware system, which includes a SOC control module, an excitation signal amplifying module, a switch module, electrodes and a detection signal amplifying module.

[0049] The SOC control module includes a detection signal sampling module, a signal solution module, a closed-loop control module, an excitation signal generation module, and a switch signal generation module. The sinusoidal signal generated by the excitation signal generation module is used as the input of the excitation amplifier module and the reference signal of the phase-locked loop. The switch signal generation module is used to generate a control signal to control the switching of the working state in the X and Y directions. The output of the detection signal sampling module is used as another input signal of the phase-locked loop, and the phase error of the X and Y channels is solved.

[0050] The excitation signal amplification module includes a first high-voltage amplification circuit, a second high-voltage amplification circuit and an inverting circuit, wherein the inverting circuit and the second high-voltage amplification circuit can provide inverted excitation signals for the X- and Y-electrodes in the X and Y channels.

[0051] The detection signal amplification module includes a first sampling circuit, a second sampling circuit and a differential amplification circuit, wherein the two groups of sampling circuits sample and amplify the two-channel signals after passing through the excitation signal amplification module, the switch module and the electrodes and then input them into the SOC control module.

[0052] The first sampling circuit and the second sampling circuit are obtained by adding sampling resistors at the input ends of operational amplifiers based on the original first current-to-voltage conversion circuit and the second current-to-voltage conversion circuit.

[0053] The electrodes are composed of eight groups of discrete electrodes, which are evenly distributed outside the resonator at an interval of 45°, and are divided into four directions: X+, X-, Y+ and Y-. Two electrodes are arranged opposite to each other in each direction, and the opposite electrodes are short-circuited in pairs.

[0054] The switch module responds to the control signal generated by the switch signal generating module to ensure that the system switches between the two working states X and Y. The switch module includes 4 groups of switches, switch S1, switch S2, switch S3, and switch S4; and is divided into a first switch group and a second switch group, the first switch group includes a first switch S3, a first switch S4, a second switch S3, and a second switch S4, the second switch group includes a first switch S1, a first switch S2, a second switch S1, and a second switch S2, and two switches in the same group of the 4 groups of switches are disconnected at the same time; the first X- is connected to the negative input of the second operational amplifier through the first switch S1; the first X+ is connected to the negative input of the first operational amplifier through the second switch S1; the first Y- is connected to the negative input of the second operational amplifier through the first switch S2; the first Y+ is connected to the negative input of the first operational amplifier through the second switch S2; the second X- is connected to the second high-voltage amplifier circuit through the first switch S4; the second X+ is connected to the first high-voltage amplifier circuit through the second switch S4; the second Y- is connected to the second high-voltage amplifier circuit through the first switch S3; the second Y+ is connected to the first high-voltage amplifier circuit through the second switch S3.

[0055] Figure 2A schematic diagram of the time-division multiplexing switch control signal and the gyro working state switching in this embodiment is given. The logic sequence of the four groups of switch signal control is: [S1=1, S2=0, S3=0, S4=0], [S1=0, S2=0, S3=0, S4=0], [S1=0, S2=0, S3=0, S4=1], [S1=0, S2=0, S3=0, S4=0], [S1=0, S2=1, S3=0, S4=0], [S1=0, S2=0, S3=0, S4=0], [S1=0, S2=0, S3=0, S4=0], [S1=0, S2=0, S3=1, S4=0], which correspond to different state switching such as X channel detection, idle state, X channel excitation, idle state, Y channel detection, idle state, Y channel excitation, etc., respectively, where the number 1 represents the switch on state and the number 0 represents the switch off state. The existence of the idle state can effectively avoid the signal interference of the previous state on the latter state when switching between the detection and excitation states, and effectively improve the quality of the excitation and detection signals.

[0056] When the system is working, the excitation signal can be expressed as:

[0057] f=f0·sin(ω0t+φ0) (1)

[0058] Among them, ω0 is the resonant frequency of the oscillator, f0 is the excitation signal amplitude, and φ0 is the excitation signal phase. The duration of the detection and excitation states of the X and Y channels can be expressed as:

[0059]

[0060] In this embodiment, the duration of the hemispherical resonant gyroscope system working in the detection and excitation states is just a single vibration cycle of the resonator, and the duration of the idle state is set to half of the vibration cycle of the resonator, that is:

[0061]

[0062] Embodiment 2

[0063] In this embodiment, the system phase error caused by the difference in the opening and closing time of the switch module is analyzed. Based on the system described in the first embodiment, when the switch control signals are [S1=1, S2=0, S3=0, S4=0] and [S1=0, S2=1, S3=0, S4=0], the system collects the vibration signals of the X channel and the Y channel respectively, and the corresponding displacement vibration signal can be expressed as:

[0064] x=a·cosθ·cos(ω0t) (4)

[0065] y=a·sinθ·cos(ω0t) (5)

[0066] Where a is the amplitude of the vibration signal, and θ is the vibration angle. To facilitate comparative analysis, the vibration angle can be controlled at 45° in actual work, and then x=y.

[0067] Figure 3 The schematic diagram of the phase error of the detection signals of the X and Y channels when the switch module is turned on and off at the same time is given. on It is defined as the time from when the switch control signal voltage rises to 50% of the threshold voltage to when the effective signal passes through the switch module. The off time t off It is defined as the time from when the switch control signal voltage drops to 50% of the threshold voltage until the effective signal is completely cut off. When the switch modules S1 and S2 meet t on1 =t on2 ,t off1 =t off2 When the X and Y channel detection signals are switched, they remain completely synchronized and no additional phase error is introduced.

[0068] Figure 4 The schematic diagram of the phase error of the detection signals of the two channels X and Y is given when the on and off time of the switch modules are equal. on1 ≠t on2 ,t off1 ≠t off2 When , the vibration signals corresponding to the X and Y channels are offset in the time domain. Therefore, the phase errors caused by the unequal opening and closing times of the switch module can be expressed as:

[0069] φ on =(t on2 -t on1 )·ω0 (6)

[0070] φ off =(t off2 -t off1 )·ω0 (7)

[0071] The typical value of the on-time fluctuation of a switch chip used in this embodiment is in the order of 10ns, and the resonant frequency of the resonator is about 9000Hz. According to formulas (6) and (7), the phase error can be calculated to be 5×10 -4 rad, which cannot meet the requirements of high-precision hemispherical resonant gyro system. Therefore, it is necessary to test the phase error of the time-division multiplexed hemispherical resonant gyro circuit and measure its long-term stability and temperature change characteristics to provide a numerical reference for system phase error compensation.

[0072] Embodiment 3

[0073] Figure 5A diagram of a time-division multiplexed hemispherical resonant gyro circuit phase error test device in this embodiment is given. The time-division multiplexed hemispherical resonant gyro circuit phase error test device includes a SOC control module, an excitation signal amplification module, a switch module, electrodes, and a detection signal amplification module.

[0074] The SOC control module includes a phase-locked loop, an excitation signal generation module, a switch signal generation module, and a detection signal sampling module. The sinusoidal signal generated by the excitation signal generation module is used as the input of the excitation amplifier module and the reference signal of the phase-locked loop; the switch signal generation module is used to generate a control signal to control the switching of the working state in the X and Y directions, such as Figure 6 As shown in the figure, a schematic diagram of the switch control signal and the gyroscope working state under the phase error test is given. The logic sequence of the four groups of switch signal control is: [S1=1, S2=0, S3=0, S4=1], [S1=0, S2=0, S3=0, S4=0], [S1=0, S2=1, S3=1, S4=0], which respectively correspond to the three state switchings of X channel detection and excitation, idle state, and Y channel detection and excitation. The number 1 represents the switch-on state, and the number 0 represents the switch-off state. The output of the detection signal sampling module is used as another input signal of the phase-locked loop, and the phase errors of the X and Y channels are solved.

[0075] The excitation signal amplification module includes a first high-voltage amplification circuit, a second high-voltage amplification circuit and an inverting circuit, wherein the inverting circuit and the second high-voltage amplification circuit can provide inverted excitation signals for the X- and Y-electrodes in the X and Y channels.

[0076] The switch module responds to the control signal generated by the switch signal generating module to ensure that the system switches between the X and Y working states.

[0077] The electrodes are composed of eight groups of discrete electrodes, which are evenly distributed around the circumference at an interval of 45°. Opposite electrodes are short-circuited in pairs, and are divided into four directions: X+, X-, Y+, and Y-. When the system works in the X channel detection and excitation state, the X+ and X- direction electrodes are connected to the circuit; when the system works in the Y channel detection and excitation state, the Y+ and Y- direction electrodes are connected to the circuit; when the system works in the idle state, the electrodes in the four directions are not connected.

[0078] The detection signal amplification module includes a first sampling circuit, a second sampling circuit and a differential amplification circuit, wherein the two groups of sampling circuits sample and amplify the two-channel signals after passing through the excitation signal amplification module, the switch module and the electrodes and then input them into the SOC control module.

[0079] The first sampling circuit and the second sampling circuit are obtained by adding sampling resistors at the input end of the operational amplifier on the basis of the original first current-to-voltage conversion circuit and the second current-to-voltage conversion circuit. The current-to-voltage conversion circuit includes an operational amplifier, a transresistor and a capacitor. The transresistor and the capacitor are connected in parallel to the negative input and output ends of the operational amplifier.

[0080] In actual use, the following conditions must be met:

[0081] R s1 =R s2 (8)

[0082] R S1 is the first sampling resistor, R S2 is the second sampling resistor.

[0083] Embodiment 4

[0084] The time division multiplexing hemispherical resonant gyro circuit phase error test method comprises the following steps:

[0085] Step 701: The excitation signal generating module generates two sinusoidal signals with a frequency of v0.

[0086] It is also used as the reference signal input of the phase-locked loop, expressed as:

[0087] V in =V ref ·sin(ω0t) (9)

[0088] Where V ref is the amplitude of the excitation sinusoidal signal.

[0089] Step 702: the excitation signal amplification module performs inversion and high-voltage amplification on one sinusoidal signal, and performs only high-voltage amplification on the other sinusoidal signal.

[0090] After the excitation signal amplification module, the two signals are expressed as:

[0091] V in+ =G1V ref ·sin(ω0t) (10)

[0092] V in- =-G1V ref ·sin(ω0t) (11)

[0093] Step 703: the switch signal generating module controls the switch modules 1 and 2, so that the switch groups S1 and S4, S2 and S3 are switched on and off alternately, corresponding to the test states of the X and Y channels respectively.

[0094] The control logic sequence of the four switch signal groups is: [S1=1, S2=0, S3=0, S4=1], [S1=0, S2=0, S3=0, S4=0], [S1=0, S2=1, S3=1, S4=0], which respectively correspond to the three state switching of X channel detection and excitation, idle state, and Y channel detection and excitation. The number 1 indicates the switch-on state, and the number 0 indicates the switch-off state. The output of the detection signal sampling module is used as another input signal of the phase-locked loop, and the phase error of the X and Y channels is calculated.

[0095] Step 704: the first sampling circuit and the second sampling circuit in the detection signal amplification module sample the X and Y channel signals according to the on-off status of the second switch group, and then output them through the differential amplifier circuit.

[0096] The X and Y channel signals can be expressed as:

[0097]

[0098] Where G2 is the gain of the first sampling circuit and the second sampling circuit, which can be expressed as G2 = -R1 / R S1 =-R2 / R S2 , G3 is the differential amplifier circuit gain, and The system phase error is caused by the difference in the opening and closing time of the X and Y channel switch modules.

[0099] Step 705: The detection signal sampling module collects the output signal of the detection signal amplifying module and transmits it to the phase-locked loop.

[0100] Step 706: The phase-locked loop calculates the phase error of the X and Y channels based on the reference signal and the detection signal. Changing characteristics.

[0101] The above are only specific steps of the present invention and do not constitute any limitation to the protection scope of the present invention; any technical solutions formed by equivalent transformation or equivalent replacement shall fall within the protection scope of the present invention; some parts not elaborated in detail in the present invention belong to the known technologies of those skilled in the art.

Claims

1. A time-division multiplexing hemispherical resonant gyro circuit phase error test device, characterized in that: The time-division multiplexing hemispherical resonant gyro circuit phase error test device comprises a SOC control module, an excitation signal amplification module, a switch module, electrodes and a detection signal amplification module; The excitation signal amplification module is used to provide excitation signals for electrodes in the X and Y channels; The detection signal amplification module is used to sample and amplify the X and Y channel signals and then input them into the SOC control module; The electrodes consist of eight groups of discrete electrodes, which are evenly distributed outside the resonator at 45° intervals; The switch module responds to the control signal generated by the switch signal generating module to ensure that the system switches between the X and Y working states; The SOC control module includes a phase-locked loop, an excitation signal generating module, a switch signal generating module and a detection signal sampling module; the sinusoidal signal generated by the excitation signal generating module is used as the input of the excitation amplification module and the reference signal of the phase-locked loop at the same time, the switch signal generating module is used to generate a control signal for controlling the switching of the working states in the X and Y directions, and the output of the detection signal sampling module is used as another input signal of the phase-locked loop; the phase-locked loop is used to solve the phase error of the X and Y channels.

2. The time-division multiplexed hemispherical resonant gyro circuit phase error test device according to claim 1, characterized in that: The eight groups of discrete electrodes are divided into four directions: X+, X-, Y+ and Y-. Two electrodes are arranged opposite to each other in each direction, and the opposite electrodes are short-circuited in pairs.

3. The time-division multiplexed hemispherical resonant gyro circuit phase error test device according to claim 2, characterized in that: The excitation signal amplification module includes a first high-voltage amplification circuit, a second high-voltage amplification circuit and an inverting circuit, wherein the inverting circuit and the second high-voltage amplification circuit are combined to provide an inverted excitation signal for the X- and Y- electrodes in the X and Y channels; the first high-voltage amplification circuit provides an inverted excitation signal for the X+ and Y+ electrodes in the X and Y channels.

4. The time-division multiplexed hemispherical resonant gyro circuit phase error test device according to claim 3, characterized in that: The detection signal amplification module includes a first sampling circuit, a second sampling circuit and a differential amplifier circuit; the first sampling circuit includes a first sampling resistor and a first operational amplifier; the second sampling circuit includes a second sampling resistor and a second operational amplifier; the output ends of the first operational amplifier and the second operational amplifier are connected to the differential amplifier circuit.

5. The time-division multiplexed hemispherical resonant gyro circuit phase error test device according to claim 4, characterized in that: The switch module includes 4 groups of switches, switch S1, switch S2, switch S3, and switch S4; and is divided into a first switch group and a second switch group, the first switch includes a first switch S3, a first switch S4, a second switch S3, and a second switch S4, the second switch includes a first switch S1, a first switch S2, a second switch S1, and a second switch S2, and two switches in the same group of the 4 groups of switches are disconnected at the same time; the first X- is connected to the negative input of the second operational amplifier through the first switch S1; the first X+ is connected to the negative input of the first operational amplifier through the second switch S1; the first Y- is connected to the negative input of the second operational amplifier through the first switch S2; the first Y+ is connected to the negative input of the first operational amplifier through the second switch S2; the second X- is connected to the second high-voltage amplifier circuit through the first switch S4; the second X+ is connected to the first high-voltage amplifier circuit through the second switch S4; the second Y- is connected to the second high-voltage amplifier circuit through the first switch S3; the second Y+ is connected to the first high-voltage amplifier circuit through the second switch S3.

6. A time-division multiplexing hemispherical resonant gyro circuit phase error test method, characterized in that: The time-division multiplexing hemispherical resonant gyro circuit phase error testing method comprises the following steps: Step 701: The excitation signal generating module generates two sinusoidal signals with a frequency of ω0; Step 702: the excitation signal amplification module performs inversion and high-voltage amplification on one sinusoidal signal, and performs only high-voltage amplification on the other sinusoidal signal; Step 703: The switch signal generating module controls the switch module so that the switch groups S1 and S4, and S2 and S3 are switched on and off alternately, corresponding to the test states of the X and Y channels respectively; Step 704: the first sampling circuit and the second sampling circuit in the detection signal amplification module sample the X and Y channel signals according to the on-off status of the second switch group, and then output them through the differential amplifier circuit; Step 705: the detection signal sampling module collects the output signal of the detection signal amplification module and transmits it to the phase-locked loop; Step 706: The phase-locked loop calculates the phase error and variation characteristics of the X and Y channels according to the reference signal and the detection signal.

7. The method for testing phase error of a time-division multiplexed hemispherical resonant gyro circuit according to claim 6, characterized in that: In step 701, the sinusoidal signal is also used as a reference signal input to the phase-locked loop: V in =V ref ·sin(ω0t) Among them, V ref is the amplitude of the excitation sinusoidal signal.

8. The method for testing phase error of a time-division multiplexed hemispherical resonant gyro circuit according to claim 6, characterized in that: In step 702, the two signals after the excitation signal amplification module are expressed as: V in+ =G1V ref ·sin(ω0t) V in- =-G1V ref ·sin(ω0t) Among them, G1 represents the gain of the high-voltage amplifier circuit, V in+ Represents the signal of the first high-voltage amplifier circuit, V in- Represents the signal of the second high-voltage amplifier circuit.

9. The method for testing phase error of a time-division multiplexed hemispherical resonant gyro circuit according to claim 6, characterized in that: In step 703, the control logic sequence of the switch signal generating module is: [S1=1, S2=0, S3=0, S4=1], [S1=0, S2=0, S3=0, S4=0], [S1=0, S2=1, S3=1, S4=0], which respectively correspond to the three state switching of X channel detection and excitation, idle state, and Y channel detection and excitation, wherein the number 1 represents the switch-on state, and the number 0 represents the switch-off state; the output of the detection signal sampling module is used as another input signal of the phase-locked loop, and the phase errors of the X and Y channels are solved.

10. The time-division multiplexed hemispherical resonant gyro circuit phase error testing method according to claim 6, characterized in that: In step 704, the X and Y channel signals can be expressed as: Where G2 is the gain of the first sampling circuit and the second sampling circuit, which can be expressed as G2 = -R1 / R S1 =-R2 / R S2 , R1 is the first transresistance, R2 is the second transresistance, R S1 is the first sampling resistor, R S2 is the second sampling resistor; G3 is the gain of the differential amplifier circuit, and The system phase error is caused by the difference in the opening and closing time of the X and Y channel switch modules.

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