Photosensitive resin composition and pattern forming method

By using a photosensitive resin composition containing a silicone resin and a photoradical generator, the problem in the prior art that it is difficult to form a cured film with high chemical resistance and copper migration resistance when cold cured below 150°C is solved, and the effect of forming a high-performance cured film under low temperature conditions is achieved.

CN119689781APending Publication Date: 2025-03-25SHIN ETSU CHEMICAL CO LTD
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Patent Information

Application Number
CN202411331128.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Priority Date
2023-09-25
Filing Date
2024-09-24
Publication Date
2025-03-25

AI Technical Summary

Technical Problem

When the conventional photosensitive resin composition is cooled at 150° C. or less, it is difficult to form a cured film with high chemical resistance and high copper migration resistance.

Method used

A photosensitive resin composition comprising a silicone resin and a photoradical generator is used, wherein the silicone resin has a silenide structure, a polysiloxane structure and a fluorene structure in the main chain and an acryloyl group or a methacryloyl group in the side chain.

Benefits of technology

Even when the curing is cold at 150°C or below, fine-sized patterns can be formed and have high chemical resistance or copper migration resistance.

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Abstract

The photosensitive resin composition includes: (A) a silicone resin having a silicon phenylene structure, a polysiloxane structure, and a fluorene structure in a main chain and having an acryloyl group or a methacryloyl group in a side chain; and (B) a photoradical generator.
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