Design method of modular missile-borne testing device for penetration environment

Through modular design and inner chamber cover buffer technology, the problem of distortion in traditional bomb load testing devices in high overload environments is solved, high reliability and maintenance are achieved, and a variety of test needs are met.

CN119714000AActive Publication Date: 2025-03-28NANJING UNIV OF SCI & TECH
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Patent Information

Application Number
CN202411892313.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-20
Publication Date
2025-03-28
Estimated Expiration
2044-12-20

AI Technical Summary

Technical Problem

The traditional integrated design of the bomb load test device is prone to distortion in high overload environments and has high maintenance costs, making it difficult to deal with emergencies, resulting in poor reusability of the test functional components.

Method used

The modular design adopts the modular design, and the bomb-load test device is divided into multiple modules in the axial direction. Each module has an independent function. Through the buffering and isolation of the inner chamber cover, it realizes undistortion measurement under high overload, and optimizes the electrical connection method to reduce signal interference.

Benefits of technology

It realizes effective protection of bomb-load test devices in high overload environments, improves the reliability and repair of the test system, reduces maintenance costs, and supports a variety of testing needs.

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Abstract

The invention discloses a design method of a modular missile-borne testing device for a penetration environment, and belongs to the field of design of missile-borne testing devices under typical high-overload working conditions. The modular missile-borne testing device for the penetration environment is divided into n modules in the axial direction, n is larger than or equal to 3, and the modular missile-borne testing device comprises n-1 middle bins, a bottom bin located at the lowermost portion, a top cover and n-1 inner bin covers; according to a test requirement, carrying out function distribution on each chamber; the structure of each chamber is designed, so that the internal space of each chamber is matched with each functional component of the test system; an inner bin cover is designed, and the inner bin cover has the functions of bin chamber isolation and buffering; and other auxiliary structures are designed. According to the method, modular design is adopted for the missile-borne testing device, various testing requirements can be met, the accuracy of a testing result is improved, and meanwhile high maintainability and supportability are achieved.
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