Temperature acquisition method and device of object to be measured, storage medium and electronic device

By using sub-table query technology in the NTC thermistor temperature measurement system, combining the time difference value and resistance value to match the temperature value, the problem of difficulty in taking into account both accuracy and efficiency in temperature measurement is solved, and efficient and accurate temperature measurement is achieved.

CN119714584APending Publication Date: 2025-03-28SHANGHAI RUIPU ENERGY CO LTD +1
0 Cites 0 Cited by

Patent Information

Application Number
CN202411843000.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-12
Publication Date
2025-03-28

AI Technical Summary

Technical Problem

When the prior art performs temperature measurement through NTC thermistors, it is difficult to take into account both the temperature measurement accuracy and the measurement efficiency.

Method used

By determining in the temperature measurement system whether the time difference between the first moment and the target moment is greater than the preset threshold value, the resistance value is obtained and the temperature value is matched according to the mapped data, and a sub-table query is used to improve efficiency.

Benefits of technology

While retaining the accuracy of querying temperatures by table-checking method, the efficiency of temperature query is improved, and the problem of difficulty in taking into account both accuracy and efficiency in NTC thermistor temperature measurement is solved.

✦ Generated by Eureka AI based on patent content.
Patent Text Reader

Abstract

The embodiment of the invention provides a temperature acquisition method and device of a to-be-measured object, a storage medium and an electronic device.The method comprises the steps that under the condition that it is determined that the time difference value between a first moment and a target moment is larger than a first preset threshold value, the first resistance value of a temperature measurement system at the first moment is determined, the target moment is the moment when the temperature of the to-be-measured object is measured through the temperature measurement system last time, the first resistance value is used for matching a first temperature value according to the first mapping data, and the first temperature value is the temperature of the to-be-measured object at the first moment; determining second mapping data in the first mapping data according to the first resistance value; under the condition that it is determined that the resistance value of the temperature measuring system is changed into a second resistance value at the second moment, a second temperature value is matched in second mapping data according to the second resistance value, the second temperature value is the temperature of the to-be-measured object at the second moment, and the time difference value between the second moment and the first moment is smaller than a first preset threshold value.
Need to check novelty before this filing date? Find Prior Art