Aging analysis method and related equipment
Through the aging analysis method based on the aging unit library, the degree of chip aging is accurately evaluated, and the aging analysis problem in integrated circuit design is solved, and the accurate evaluation and timing analysis of the impact of chip aging is achieved, ensuring the long-term reliability of the product.
Patent Information
- Application Number
- CN202411623437.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-13
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2044-11-13
AI Technical Summary
How to accurately evaluate the degree of chip aging in integrated circuit design and ensure the long-term and reliable operation of the product, it faces the problem of aging analysis method that is difficult to effectively solve in the existing technology.
An aging analysis method is provided. By obtaining the design object to be checked in time, the delayed aging rate of the standard unit is determined based on the aging unit library. The aging unit library includes multiple sub-aging unit libraries, which characterize the delayed aging rate under different aging mechanisms, and perform timing analysis after aging.
The accurate evaluation of the chip aging degree is achieved, and the aging degree of standard units under different excitation waveform conditions can be more accurately characterized, ensuring that the design object still meets the timing requirements after aging, and improving the long-term reliability of the integrated circuit.