Abnormity detection and evaluation method for main transformer synthetic data set
By calculating the mutual information values between the input variables and the target variables, and optimizing the DBN structure with GB-RBM and GA genetic algorithms, using the K-means clustering method to identify abnormal data, solving the problem of inaccurate capture of complex abnormal patterns in the existing technology, and achieving more efficient and accurate abnormal detection.
Patent Information
- Application Number
- CN202411768164.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-04
- Publication Date
- 2025-03-28
AI Technical Summary
The existing main transformer abnormality detection and evaluation methods rely on simple feature extraction methods and models that cannot effectively adapt to the actual data distribution, resulting in the inability to accurately capture complex abnormal patterns in the data, affecting detection accuracy, and overfitting may occur, resulting in wasted computing resources.
By calculating the mutual information values between the input variables and the target variables, filter out input variables with high correlation with the label variables, build an input matrix, and use the GB-RBM algorithm for feature extraction. Combined with the GA genetic algorithm, the number of hidden layer nodes of DBN is optimized, and the abnormal data is identified and separated by K-means clustering method, and the effect of abnormal detection is finally evaluated through the clustering density and resolution.
It improves the sensitivity of the model to abnormal patterns, enhances the accuracy of detection, reduces the risk of overfitting, improves the adaptability and efficiency of the model, and ensures the reliability and effectiveness of the detection results.