Product process level determination method, device and equipment and storage medium
By calculating product process level based on normal distribution, the product process level is solved, and the accuracy of evaluating and comparing product processing quality is improved.
CN119722089APending Publication Date: 2025-03-28BOE TECHNOLOGY GROUP CO LTD +1
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Patent Information
- Application Number
- CN202311267506.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-09-27
- Publication Date
- 2025-03-28
AI Technical Summary
Technical Problem
The prior art is difficult to quantify the process level of the product, making it difficult to evaluate and improve the processing quality of the product.
Method used
By obtaining product parameter test data that complies with normal distribution and preset product parameter qualification range, the product pass rate is determined, and the product process level is calculated using the method in which the first integral of the standard normal distribution density function is equal to the pass rate.
Benefits of technology
Improve the accuracy and quantifiability of product process level, allowing more scientific evaluation and comparison of processing quality of different products.
✦ Generated by Eureka AI based on patent content.
Abstract
The invention discloses a product process level determination method and device, equipment and a storage medium. The method comprises the following steps: acquiring a group of product parameter test data obeying normal distribution and a preset product parameter qualification range; for the obtained product parameter test data, determining the product qualification rate according to the product parameter qualification range; a preset deviation number a is obtained, and an interval number b is determined, so that a first integral of the standard normal distribution density function in a value range (a-b, a + b) is equal to the product qualification rate; and determining the product process level corresponding to the obtained product parameter test data based on the preset deviation number a and the determined interval number b.
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